Adhesion force microscopy

Industry

CPC
G01Q60/28

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/28Adhesion force microscopy

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Patents Grantslast 30 patents

Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In situ mechanical characterization of a single cell-cell adhesion...
- Patent number 11,846,611
- Issue date Dec 19, 2023
- Nutech Ventures
- Ruiguo Yang
- G01 - MEASURING TESTING
Information Patent Grant
Determining interfacial tension for fluid-fluid-solid environments
- Patent number 11,243,156
- Issue date Feb 8, 2022
- International Business Machines Corporation
- Michael Engel
- G01 - MEASURING TESTING
Information Patent Grant
Passive semiconductor device assembly technology
- Patent number 10,983,143
- Issue date Apr 20, 2021
- NU NANO LTD
- James Vicary
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling a probe using constant command signals
- Patent number 10,895,584
- Issue date Jan 19, 2021
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and method for measuring adhesion force between gas...
- Patent number 10,775,406
- Issue date Sep 15, 2020
- China University of Geosciences (Wuhan)
- Fulong Ning
- E21 - EARTH DRILLING MINING
Information Patent Grant
Cantilever set for atomic force microscopes, substrate surface insp...
- Patent number 10,352,964
- Issue date Jul 16, 2019
- Samsung Electronics Co., Ltd.
- Kyeong-mi Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining antifouling ability of a material surface an...
- Patent number 10,006,934
- Issue date Jun 26, 2018
- Industrial Technology Research Institute
- Feng-Sheng Kao
- G01 - MEASURING TESTING
Information Patent Grant
Processes for surface measurement and modification by scanning prob...
- Patent number 8,997,261
- Issue date Mar 31, 2015
- Centre National de la Recherche Scientifique CNRS
- Olivier Noel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,844,061
- Issue date Sep 23, 2014
- Hitachi, Ltd.
- Shuichi Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,342,008
- Issue date Jan 1, 2013
- Hitachi, Ltd.
- Shuichi Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Characterization tools for toner adhesion and adhesion distribution
- Patent number 8,132,451
- Issue date Mar 13, 2012
- Xerox Corporation
- Kock-Yee Law
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for the detection of forces in the sub-microne...
- Patent number 8,132,268
- Issue date Mar 6, 2012
- Technische Universitaet Muenchen
- Thorsten Hugel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for determining material properties
- Patent number 7,810,382
- Issue date Oct 12, 2010
- Karlsruher Institut für Technologie
- Thomas Schimmel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,631,548
- Issue date Dec 15, 2009
- Hitachi, Ltd.
- Shuichi Baba
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining tribological properties of a sample surface...
- Patent number 7,360,404
- Issue date Apr 22, 2008
- Fraunhofer-Gesellschaft zur Förderung der Angelwandten Forschung E.V.
- Michael Reinstadtler
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for simultaneously determining the adhesion, fric...
- Patent number 6,880,386
- Issue date Apr 19, 2005
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Hans-Ulrich Krotil
- G01 - MEASURING TESTING
Information Patent Grant
Resistive cantilever spring for probe microscopy
- Patent number 6,578,410
- Issue date Jun 17, 2003
- Jacob Israelachvili
- G01 - MEASURING TESTING
Information Patent Grant
Adhesion measuring method
- Patent number 5,477,732
- Issue date Dec 26, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MODIFIED METHOD TO FIT CELL ELASTIC MODULUS BASED ON SNEDDON MODEL
- Publication number 20220043025
- Publication date Feb 10, 2022
- DALIAN UNIVERSITY OF TECHNOLOGY
- Wei ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING INTERFACIAL TENSION FOR FLUID-FLUID-SOLID ENVIRONMENTS
- Publication number 20220011212
- Publication date Jan 13, 2022
- International Business Machines Corporation
- Michael Engel
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND METHOD FOR MEASURING ADHESION FORCE BETWEEN GAS...
- Publication number 20200174037
- Publication date Jun 4, 2020
- China University of Geosciences (Wuhan)
- Fulong NING
- E21 - EARTH DRILLING MINING
Information Patent Application
Passive Semiconductor Device Assembly Technology
- Publication number 20200003801
- Publication date Jan 2, 2020
- Nu Nano Ltd
- James Vicary
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTROLLING A PROBE
- Publication number 20190094267
- Publication date Mar 28, 2019
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Application
A METHOD TO MEASURE NANOSCALE MECHANICAL PROPERTIES USING ATOMIC FO...
- Publication number 20180364277
- Publication date Dec 20, 2018
- Sean Andrew Cantrell
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING ANTIFOULING ABILITY OF A MATERIAL SURFACE AN...
- Publication number 20170299627
- Publication date Oct 19, 2017
- Industrial Technology Research Institute
- Feng-Sheng KAO
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER SET FOR ATOMIC FORCE MICROSCOPES, SUBSTRATE SURFACE INSP...
- Publication number 20170212145
- Publication date Jul 27, 2017
- KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Kyeong-mi LEE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20140298548
- Publication date Oct 2, 2014
- Shuichi BABA
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20130205454
- Publication date Aug 8, 2013
- Hitachi, Ltd
- Shuichi BABA
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROCESSES FOR SURFACE MEASUREMENT AND MODIFICATION BY SCANNING PROB...
- Publication number 20130047302
- Publication date Feb 21, 2013
- UNIVERSITE DU MAINE (LE MANS)
- Olivier Noel
- B82 - NANO-TECHNOLOGY
Information Patent Application
NOVEL CHARACTERIZATION TOOLS FOR TONER ADHESION AND ADHESION DISTRI...
- Publication number 20100313644
- Publication date Dec 16, 2010
- Xerox Corporation
- Kock-Yee LAW
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For The Detection Of Forces In The Sub-Microne...
- Publication number 20100011472
- Publication date Jan 14, 2010
- Thorsten Hugel
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20090158828
- Publication date Jun 25, 2009
- Shuichi BABA
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method using a disk drive slider and/or a peltier pla...
- Publication number 20090151434
- Publication date Jun 18, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Dongman Kim
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Determining Material Properties
- Publication number 20080134771
- Publication date Jun 12, 2008
- Universität Karlsruhe (TH) Forrchungsuniversität Gegründet 1825
- Thomas Schimmel
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20070266780
- Publication date Nov 22, 2007
- SHUICHI BABA
- G01 - MEASURING TESTING
Information Patent Application
Method for determining tribological properties of a sample surface...
- Publication number 20060150719
- Publication date Jul 13, 2006
- Michael Reinstadtler
- G01 - MEASURING TESTING

Adhesion force microscopy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Modified method to fit cell elastic modulus based on Sneddon model

In situ mechanical characterization of a single cell-cell adhesion...

Determining interfacial tension for fluid-fluid-solid environments

Passive semiconductor device assembly technology

Method of controlling a probe using constant command signals

Testing device and method for measuring adhesion force between gas...

Cantilever set for atomic force microscopes, substrate surface insp...

Method for determining antifouling ability of a material surface an...

Processes for surface measurement and modification by scanning prob...

Scanning probe microscope

Scanning probe microscope

Characterization tools for toner adhesion and adhesion distribution

Apparatus and method for the detection of forces in the sub-microne...

Method and device for determining material properties

Scanning probe microscope

Method for determining tribological properties of a sample surface...

Method and device for simultaneously determining the adhesion, fric...

Resistive cantilever spring for probe microscopy

Adhesion measuring method

Patents Applicationslast 30 patents

MODIFIED METHOD TO FIT CELL ELASTIC MODULUS BASED ON SNEDDON MODEL

DETERMINING INTERFACIAL TENSION FOR FLUID-FLUID-SOLID ENVIRONMENTS

TESTING DEVICE AND METHOD FOR MEASURING ADHESION FORCE BETWEEN GAS...

Passive Semiconductor Device Assembly Technology

METHOD OF CONTROLLING A PROBE

A METHOD TO MEASURE NANOSCALE MECHANICAL PROPERTIES USING ATOMIC FO...

METHOD FOR DETERMINING ANTIFOULING ABILITY OF A MATERIAL SURFACE AN...

CANTILEVER SET FOR ATOMIC FORCE MICROSCOPES, SUBSTRATE SURFACE INSP...

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

PROCESSES FOR SURFACE MEASUREMENT AND MODIFICATION BY SCANNING PROB...

NOVEL CHARACTERIZATION TOOLS FOR TONER ADHESION AND ADHESION DISTRI...

Apparatus And Method For The Detection Of Forces In The Sub-Microne...

Scanning Probe Microscope

Apparatus and method using a disk drive slider and/or a peltier pla...

Method and Device for Determining Material Properties

Scanning Probe Microscope

Method for determining tribological properties of a sample surface...