SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

CPC
G01Q

Parent Industries

Current Industry

G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Sub Industries

G01Q10/00Scanning or positioning arrangements G01Q20/00Monitoring the movement or position of the probe G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus G01Q40/00Calibration G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00 G01Q80/00Applications, other than SPM, of scanning-probe techniques G01Q90/00Scanning-probe techniques or apparatus not otherwise provided for

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Probe tip X-Y location identification using a charged particle beam
- Patent number 12,169,208
- Issue date Dec 17, 2024
- Innovatum Instruments Inc.
- Richard E Stallcup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for performing subsurface imaging using vibrat...
- Patent number 12,169,187
- Issue date Dec 17, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nano robotic system for high throughput single cell DNA sequencing
- Patent number 12,163,979
- Issue date Dec 10, 2024
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Thin film metrology
- Patent number 12,158,332
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih Hung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 12,153,068
- Issue date Nov 26, 2024
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of probabilistic process windows
- Patent number 12,142,454
- Issue date Nov 12, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing process with atomic level inspection
- Patent number 12,131,957
- Issue date Oct 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining dimensions of features of a subsurface topogr...
- Patent number 12,123,895
- Issue date Oct 22, 2024
- Nearfield Instruments B.V.
- Paul Zabbal
- G01 - MEASURING TESTING
Information Patent Grant
Probe chip, scan head, scanning probe microscopy device and use of...
- Patent number 12,117,467
- Issue date Oct 15, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optogenetic imaging
- Patent number 12,109,074
- Issue date Oct 8, 2024
- INSCOPIX, INC.
- Mark O. Trulson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Micro probe array device and manufacturing method of the device
- Patent number 12,109,409
- Issue date Oct 8, 2024
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for measuring optical constants of thin film of fluorine-con...
- Patent number 12,105,018
- Issue date Oct 1, 2024
- Shin-Etsu Chemical Co., Ltd.
- Takashi Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated III-V/silicon atomic force microscopy active optical probe
- Patent number 12,072,351
- Issue date Aug 27, 2024
- ACTOPROBE LLC
- Alexander A. Ukhanov
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Device for detection of cellular stress
- Patent number 12,055,536
- Issue date Aug 6, 2024
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for measuring heat distribution of specific space...
- Patent number 12,038,455
- Issue date Jul 16, 2024
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Method of providing a MEMS device comprising a pyramidal protrusion...
- Patent number 12,013,415
- Issue date Jun 18, 2024
- SmartTip B.V.
- Edin Sarajlic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for electrically examining electronic components of an integ...
- Patent number 12,007,408
- Issue date Jun 11, 2024
- Forschungszentrum Juelich GmbH
- Bert Voigtlaender
- G01 - MEASURING TESTING
Information Patent Grant
Polaritonic fiber probe and method for nanoscale mapping
- Patent number 12,007,409
- Issue date Jun 11, 2024
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 12,000,861
- Issue date Jun 4, 2024
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Science-driven automated experiments
- Patent number 11,982,684
- Issue date May 14, 2024
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting thickness of bonded rubber of carbon black in...
- Patent number 11,976,193
- Issue date May 7, 2024
- SICHUAN UNIVERSITY OF SCIENCE & ENGINEERING
- Jian Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS nanopositioner and method of fabrication
- Patent number 11,973,441
- Issue date Apr 30, 2024
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM
- Publication number 20240418746
- Publication date Dec 19, 2024
- SHIMADZU CORPORATION
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...
- Publication number 20240410916
- Publication date Dec 12, 2024
- Tsinghua University
- Dameng Liu
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Application
METROLOGY DEVICE AND METHOD
- Publication number 20240410962
- Publication date Dec 12, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas MOHTASHAMI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND PROGRAM
- Publication number 20240402215
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...
- Publication number 20240393363
- Publication date Nov 28, 2024
- Nearfield Instruments B.V.
- Massoud Hemmasian Ettefagh
- G01 - MEASURING TESTING
Information Patent Application
MASK CHARACTERIZATION METHODS AND APPARATUSES
- Publication number 20240385111
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Cheng Chen
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE SUPERCONDUCTING DEVICES AND METHODS THEREOF
- Publication number 20240389476
- Publication date Nov 21, 2024
- The Regents of the University of California
- Shane Cybart
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY IMAGING
- Publication number 20240385212
- Publication date Nov 21, 2024
- Alentic Microscience Inc.
- Alan Marc Fine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION
- Publication number 20240371707
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCES...
- Publication number 20240369594
- Publication date Nov 7, 2024
- United Microelectronics Corp.
- Po-Jen HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY
- Publication number 20240361351
- Publication date Oct 31, 2024
- ICSPI CORP.
- David MORRIS
- G01 - MEASURING TESTING
Information Patent Application
DECOUPLED OPTICAL FORCE NANOSCOPY
- Publication number 20240345129
- Publication date Oct 17, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Yang Zhao
- G01 - MEASURING TESTING
Information Patent Application
SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS
- Publication number 20240319304
- Publication date Sep 26, 2024
- B. G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD.
- Yishay MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR IDENTIFICATION OF ION CHANNELS
- Publication number 20240296910
- Publication date Sep 5, 2024
- Ohio State Innovation Foundation
- Mustafa Demirtas
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...
- Publication number 20240288467
- Publication date Aug 29, 2024
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Application
MEMS Nanopositioner and Method of Fabrication
- Publication number 20240283378
- Publication date Aug 22, 2024
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD
- Publication number 20240280605
- Publication date Aug 22, 2024
- WINBOND ELECTRONICS CORP.
- Hsueh-Cheng LIAO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...
- Publication number 20240272197
- Publication date Aug 15, 2024
- Technische Universitat Wien
- Markus VALTINER
- G01 - MEASURING TESTING
Information Patent Application
LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...
- Publication number 20240275130
- Publication date Aug 15, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...
- Publication number 20240264199
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Egor UKRAINTSEV
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...
- Publication number 20240264198
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Bohuslav REZEK
- G01 - MEASURING TESTING

SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Probe tip X-Y location identification using a charged particle beam

Nanoscale scanning sensors

Method of and system for performing subsurface imaging using vibrat...

Systems and approaches for semiconductor metrology and surface anal...

Nano robotic system for high throughput single cell DNA sequencing

Thin film metrology

Atomic-force microscopy for identification of surfaces

Detection of probabilistic process windows

Manufacturing process with atomic level inspection

Method of determining dimensions of features of a subsurface topogr...

Probe chip, scan head, scanning probe microscopy device and use of...

Systems and methods for optogenetic imaging

Micro probe array device and manufacturing method of the device

Method for measuring optical constants of thin film of fluorine-con...

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Integrated III-V/silicon atomic force microscopy active optical probe

Automated optimization of AFM light source positioning

Device for detection of cellular stress

Measuring method for measuring heat distribution of specific space...

Method of providing a MEMS device comprising a pyramidal protrusion...

Method for electrically examining electronic components of an integ...

Polaritonic fiber probe and method for nanoscale mapping

System and method for a non-tapping mode scattering-type scanning n...

Metrological scanning probe microscope

Methods and systems for scanning probe sample property measurement...

System and method for generating and analyzing roughness measuremen...

Science-driven automated experiments

Method for detecting thickness of bonded rubber of carbon black in...

Methods and devices for extending a time period until changing a me...

MEMS nanopositioner and method of fabrication

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...

METROLOGY DEVICE AND METHOD

SCANNING PROBE MICROSCOPE AND PROGRAM

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...

MASK CHARACTERIZATION METHODS AND APPARATUSES

HIGH TEMPERATURE SUPERCONDUCTING DEVICES AND METHODS THEREOF

MICROSCOPY IMAGING

MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCES...

METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY

DECOUPLED OPTICAL FORCE NANOSCOPY

SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

POSITIONING SYSTEM AND METHOD

SYSTEMS AND METHODS FOR IDENTIFICATION OF ION CHANNELS

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...

MEMS Nanopositioner and Method of Fabrication

MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...

LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...

A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...