SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

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G01Q

Parent Industries

Current Industry

G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Sub Industries

G01Q10/00Scanning or positioning arrangements G01Q20/00Monitoring the movement or position of the probe G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus G01Q40/00Calibration G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00 G01Q80/00Applications, other than SPM, of scanning-probe techniques G01Q90/00Scanning-probe techniques or apparatus not otherwise provided for

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Patents Grantslast 30 patents

Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
Single-molecule force spectroscopy-infrared spectroscopy (SMFS-IR)...
- Patent number 12,320,826
- Issue date Jun 3, 2025
- Jilin University
- Wenke Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Carbon nanomaterial functionalized needle tip modified with low wor...
- Patent number 12,313,653
- Issue date May 27, 2025
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Information providing system, server device, and analyzer
- Patent number 12,306,208
- Issue date May 20, 2025
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 12,298,327
- Issue date May 13, 2025
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing interaction force between lignin and cell...
- Patent number 12,287,353
- Issue date Apr 29, 2025
- NANJING FORESTRY UNIVERSITY
- Caoxing Huang
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method of manufacturing a micro-fluid probe
- Patent number 12,286,344
- Issue date Apr 29, 2025
- CYTOSURGE AG
- Edin Sarajlic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micro-optomechanical system and method for the production thereof
- Patent number 12,282,040
- Issue date Apr 22, 2025
- Karlsruher Institut für Technologie
- Philipp-Immanuel Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection using thermal laser stimulation and atomic force m...
- Patent number 12,276,696
- Issue date Apr 15, 2025
- Intel Corporation
- Huei Hao Yap
- G01 - MEASURING TESTING
Information Patent Grant
Active bimodal AFM operation for measurements of optical interaction
- Patent number 12,270,827
- Issue date Apr 8, 2025
- ATTOCUBE SYSTEMS AG
- Alexander A. Govyadinov
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive stack without radiated field, sensor and magnetic...
- Patent number 12,274,177
- Issue date Apr 8, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Claude Fermon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopositioning systems and associated methods
- Patent number 12,266,501
- Issue date Apr 1, 2025
- The Texas A&M University System
- ChaBum Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Machine learning-driven operation of instrumentation with human in...
- Patent number 12,253,540
- Issue date Mar 18, 2025
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample in a scanning tunneling microscope usi...
- Patent number 12,253,538
- Issue date Mar 18, 2025
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Bohuslav Rezek
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample in an atomic force microscope using at...
- Patent number 12,253,539
- Issue date Mar 18, 2025
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Egor Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optogenetic imaging using semi-kinematic co...
- Patent number 12,251,272
- Issue date Mar 18, 2025
- INSCOPIX, INC.
- Kelvin Kao
- G01 - MEASURING TESTING
Information Patent Grant
Scattering-type scanning near-field optical microscopy with Akiyama...
- Patent number 12,247,998
- Issue date Mar 11, 2025
- The Research Foundation for the State University of New York
- Michael Dapolito
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis method, surface analysis system, and surface analy...
- Patent number 12,247,999
- Issue date Mar 11, 2025
- Resonac Corporation
- Yuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 12,241,911
- Issue date Mar 4, 2025
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Diffractive optical element for a test interferometer
- Patent number 12,235,097
- Issue date Feb 25, 2025
- Carl Zeiss SMT GmbH
- Alexander Winkler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for quantifying degree of blending of virgin and...
- Patent number 12,235,285
- Issue date Feb 25, 2025
- Tongji University
- Liping Liu
- G01 - MEASURING TESTING
Information Patent Grant
Photothermal imaging device and system
- Patent number 12,228,503
- Issue date Feb 18, 2025
- University of Notre Dame Du Lac
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Grant
Optical output system, measurement system, optical pump-probe scann...
- Patent number 12,222,365
- Issue date Feb 11, 2025
- GTHERANOSTICS CO., LTD.
- Hidemi Shigekawa
- G01 - MEASURING TESTING
Information Patent Grant
Conductive fixation for electron microscopy
- Patent number 12,224,154
- Issue date Feb 11, 2025
- University of Kansas
- Eduardo Rosa-Molinar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Nanomechanical profiling of breast cancer molecular subtypes
- Patent number 12,196,740
- Issue date Jan 14, 2025
- Universitat Basel
- Marija Plodinec
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyte detection and analysis
- Patent number 12,188,924
- Issue date Jan 7, 2025
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- G01 - MEASURING TESTING
Information Patent Grant
Active noise isolation for tunneling applications (ANITA)
- Patent number 12,188,960
- Issue date Jan 7, 2025
- The Penn State Research Foundation
- Eric Hudson
- G01 - MEASURING TESTING
Information Patent Grant
Truncated nonlinear interferometer-based sensor system
- Patent number 12,181,773
- Issue date Dec 31, 2024
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic nano-positioning device
- Patent number 12,174,218
- Issue date Dec 24, 2024
- National Research Council of Canada
- Robert A. Wolkow
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD OF ALIGNMENT, FOCUSING, AND ME...
- Publication number 20250172585
- Publication date May 29, 2025
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR POSITIONING A MEASUREMENT SPOT USING A SCANNING PROBE M...
- Publication number 20250164523
- Publication date May 22, 2025
- Oxford Instruments Nanotechnology Tools Limited
- Joel Lefever
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20250164522
- Publication date May 22, 2025
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED...
- Publication number 20250155471
- Publication date May 15, 2025
- LEHIGH UNIVERSITY
- Xiaoji XU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING USING SEMI-KINEMATIC CO...
- Publication number 20250143836
- Publication date May 8, 2025
- Inscopix, Inc.
- Kelvin KAO
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20250147066
- Publication date May 8, 2025
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING SINGLE ELECTRON TRANSISTOR
- Publication number 20250142858
- Publication date May 1, 2025
- International Business Machines Corporation
- Chloé Bureau-Oxton
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE USED THEREIN
- Publication number 20250138047
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE, PROBE CONTROL APPARATUS AND METHOD
- Publication number 20250130251
- Publication date Apr 24, 2025
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-MICRO ELECTRODE FOR ELECTROCHEMICAL ANALYSIS AND METHOD OF MA...
- Publication number 20250125072
- Publication date Apr 17, 2025
- DONG-A UNIVERSITY RESEARCH FOUNDATION FOR INDUSTRY ACADEMY COOPERATION
- Hyo Jong LEE
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
METHOD FOR CHARACTERIZING INTERACTION FORCE BETWEEN LIGNIN AND CELL...
- Publication number 20250110152
- Publication date Apr 3, 2025
- NANJING FORESTRY UNIVERSITY
- Caoxing HUANG
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON H...
- Publication number 20250076339
- Publication date Mar 6, 2025
- SHENYANG INSTITUTE OF AUTOMATION , CHINESE ACADEMY OF SCIENCES
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
ELEMENT OF AN AFM TOOL
- Publication number 20250067768
- Publication date Feb 27, 2025
- ASML NETHERLANDS B.V.
- Mustafa Ümit ARABUL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR SCATTERING-TYPE SCANNING NEAR-FIELD OPTICA...
- Publication number 20250067770
- Publication date Feb 27, 2025
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Julia MUELLER-STAEHLER
- G01 - MEASURING TESTING
Information Patent Application
Detection of Probabilistic Process Windows
- Publication number 20250069843
- Publication date Feb 27, 2025
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF OPERATING SUCH A SYSTEM
- Publication number 20250067769
- Publication date Feb 27, 2025
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
Method For Producing A Substrate Comprising Scanning Probe Microsco...
- Publication number 20250067771
- Publication date Feb 27, 2025
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrica...
- Publication number 20250052781
- Publication date Feb 13, 2025
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND METHOD FOR INSPECTING THE DISPLAY DEVICE
- Publication number 20250057025
- Publication date Feb 13, 2025
- SAMSUNG DISPLAY CO., LTD.
- Seong Ji KO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING
- Publication number 20250017683
- Publication date Jan 16, 2025
- Inscopix, Inc.
- Mark O. TRULSON
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20250012778
- Publication date Jan 9, 2025
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME
- Publication number 20250004010
- Publication date Jan 2, 2025
- Nearfield Instruments B.V.
- Jakob VAN DE LAAR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE
- Publication number 20240426869
- Publication date Dec 26, 2024
- INFINITESIMA LIMITED
- Andrew David Laver Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240426870
- Publication date Dec 26, 2024
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM
- Publication number 20240418746
- Publication date Dec 19, 2024
- SHIMADZU CORPORATION
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...
- Publication number 20240410916
- Publication date Dec 12, 2024
- Tsinghua University
- Dameng Liu
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Application
METROLOGY DEVICE AND METHOD
- Publication number 20240410962
- Publication date Dec 12, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas MOHTASHAMI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND PROGRAM
- Publication number 20240402215
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...
- Publication number 20240393363
- Publication date Nov 28, 2024
- Nearfield Instruments B.V.
- Massoud Hemmasian Ettefagh
- G01 - MEASURING TESTING

SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Quality control evaluation method of cyanate ester matrix resin mat...

Single-molecule force spectroscopy-infrared spectroscopy (SMFS-IR)...

Carbon nanomaterial functionalized needle tip modified with low wor...

Information providing system, server device, and analyzer

Atomic force microscope

Method for characterizing interaction force between lignin and cell...

Method of manufacturing a micro-fluid probe

Micro-optomechanical system and method for the production thereof

Defect detection using thermal laser stimulation and atomic force m...

Active bimodal AFM operation for measurements of optical interaction

Magnetoresistive stack without radiated field, sensor and magnetic...

Nanopositioning systems and associated methods

Machine learning-driven operation of instrumentation with human in...

Method of examining a sample in a scanning tunneling microscope usi...

Method of examining a sample in an atomic force microscope using at...

Systems and methods for optogenetic imaging using semi-kinematic co...

Scattering-type scanning near-field optical microscopy with Akiyama...

Surface analysis method, surface analysis system, and surface analy...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Diffractive optical element for a test interferometer

Method and system for quantifying degree of blending of virgin and...

Photothermal imaging device and system

Optical output system, measurement system, optical pump-probe scann...

Conductive fixation for electron microscopy

Inspection apparatus and method of inspecting wafer

Nanomechanical profiling of breast cancer molecular subtypes

Methods and systems for analyte detection and analysis

Active noise isolation for tunneling applications (ANITA)

Truncated nonlinear interferometer-based sensor system

Atomic nano-positioning device

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE AND METHOD OF ALIGNMENT, FOCUSING, AND ME...

METHODS FOR POSITIONING A MEASUREMENT SPOT USING A SCANNING PROBE M...

SCANNING PROBE MICROSCOPE

TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED...

SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING USING SEMI-KINEMATIC CO...

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

SCANNING SINGLE ELECTRON TRANSISTOR

SCANNING PROBE MICROSCOPE AND SAMPLE USED THEREIN

PROBE DEVICE, PROBE CONTROL APPARATUS AND METHOD

ULTRA-MICRO ELECTRODE FOR ELECTROCHEMICAL ANALYSIS AND METHOD OF MA...

METHOD FOR CHARACTERIZING INTERACTION FORCE BETWEEN LIGNIN AND CELL...

SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON H...

ELEMENT OF AN AFM TOOL

METHOD AND APPARATUS FOR SCATTERING-TYPE SCANNING NEAR-FIELD OPTICA...

Detection of Probabilistic Process Windows

SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF OPERATING SUCH A SYSTEM

Method For Producing A Substrate Comprising Scanning Probe Microsco...

Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrica...

DISPLAY DEVICE AND METHOD FOR INSPECTING THE DISPLAY DEVICE

SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME

METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...

METROLOGY DEVICE AND METHOD

SCANNING PROBE MICROSCOPE AND PROGRAM

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROS...