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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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Patents Grantslast 30 patents

Information Patent Grant
Display method, sample analyzer, and recording medium
- Patent number 12,241,904
- Issue date Mar 4, 2025
- SUSMEX CORPORATION
- Kazuma Moriura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Forecasting of disinfection byproducts
- Patent number 12,235,256
- Issue date Feb 25, 2025
- AMS Trace Metals, Inc.
- Michael J. West
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Automatic analyzer and method thereof
- Patent number 12,216,134
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takaaki Hagiwara
- G01 - MEASURING TESTING
Information Patent Grant
Quality control support method, quality control support system, qua...
- Patent number 12,203,950
- Issue date Jan 21, 2025
- Sysmex Corporation
- Shrey Singh
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample processing system
- Patent number 12,181,384
- Issue date Dec 31, 2024
- Beckman Coulter, Inc.
- Michael Eberhardt
- G01 - MEASURING TESTING
Information Patent Grant
Display method, sample analyzer, and recording medium
- Patent number 12,175,055
- Issue date Dec 24, 2024
- Sysmex Corporation
- Kazuma Moriura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection system for automated detection of particulate mat...
- Patent number 12,169,921
- Issue date Dec 17, 2024
- Baxter International Inc.
- Armin Kappeler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Examination system, examination device, and examination method for...
- Patent number 12,152,269
- Issue date Nov 26, 2024
- Hitachi, Ltd.
- Takahide Yokoi
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Grant
United states systems and methods for fluid and component handling
- Patent number 12,146,891
- Issue date Nov 19, 2024
- Labrador Diagnostics LLC
- James R. Wasson
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and apparatus for monitoring microbial contaminants in an in...
- Patent number 12,140,522
- Issue date Nov 12, 2024
- Crawford Dow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Automated tissue section capture, indexing and storage system and m...
- Patent number 12,135,261
- Issue date Nov 5, 2024
- TissueVision, Inc.
- Sean E. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Sample discrimination system and sample automatic processing appara...
- Patent number 12,123,885
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Tooru Miyasaka
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer with a control unit for displaying background ma...
- Patent number 12,111,327
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Satoru Chida
- G01 - MEASURING TESTING
Information Patent Grant
Cell picking device
- Patent number 12,099,072
- Issue date Sep 24, 2024
- Shimadzu Corporation
- Mika Okada
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
User interface for a fluorescence assay
- Patent number 12,099,010
- Issue date Sep 24, 2024
- Luminex Corporation
- Alpar Erdei
- G01 - MEASURING TESTING
Information Patent Grant
Material tester
- Patent number 12,078,617
- Issue date Sep 3, 2024
- Shimadzu Corporation
- Keisuke Horie
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection automation system and specimen inspection method
- Patent number 12,066,448
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Satohiro Hamano
- G01 - MEASURING TESTING
Information Patent Grant
System and method for evaluating chemical compound data using and a...
- Patent number 12,061,613
- Issue date Aug 13, 2024
- ACCENCIO LLC
- Kevin Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring apparatus for a liquid handling apparatus for measuring p...
- Patent number 12,044,691
- Issue date Jul 23, 2024
- EPPENDORF SE
- Markus Lapczyna
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automatic analyzer
- Patent number 12,044,692
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Susumu Sakairi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for providing quality assurance for validation...
- Patent number 12,038,448
- Issue date Jul 16, 2024
- Walter LLC
- Walter J. Hinchman
- G01 - MEASURING TESTING
Information Patent Grant
Compound distribution in microfluidic devices
- Patent number 12,019,083
- Issue date Jun 25, 2024
- EMULATE, Inc.
- Josiah Sliz
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Instrument monitoring system
- Patent number 12,003,904
- Issue date Jun 4, 2024
- Agilent Technologies, Inc.
- Rick Fasani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automatic analyzer
- Patent number 12,000,849
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Walk-away time visualization methods and systems
- Patent number 11,977,090
- Issue date May 7, 2024
- Siemens Healthcare Diagnostics Inc.
- Heinrich Helmut Degen
- G01 - MEASURING TESTING
Information Patent Grant
Remote automated chemical crossover system for use with an automate...
- Patent number 11,971,421
- Issue date Apr 30, 2024
- Elemental Scientific, Inc.
- Tyler Yost
- G01 - MEASURING TESTING
Information Patent Grant
Calibration curve setting method, specimen analysis method, calibra...
- Patent number 11,965,899
- Issue date Apr 23, 2024
- Sysmex Corporation
- Akihito Kato
- G01 - MEASURING TESTING
Information Patent Grant
Detection of nuclease edited sequences in automated modules and ins...
- Patent number 11,965,154
- Issue date Apr 23, 2024
- Inscripta, Inc.
- Eileen Spindler
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Indicating a status of an analytical instrument on a screen of the...
- Patent number 11,965,900
- Issue date Apr 23, 2024
- Wyatt Technology, LLC
- Vivianna Day
- G01 - MEASURING TESTING
Information Patent Grant
System and method for dispense characterization
- Patent number 11,959,931
- Issue date Apr 16, 2024
- Ventana Medical Systems, Inc.
- Aaron Ewoniuk
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SEMI-AUTOMATED PATCH-CLAMP APPARATUS AND A METHOD FOR CARRYING OUT...
- Publication number 20250076278
- Publication date Mar 6, 2025
- Sophion Bioscience A/S
- Jens HENNEKE
- G01 - MEASURING TESTING
Information Patent Application
A DEVICE FOR AN AUTOMATED DETERMINATION OF AN ANALYTE IN LIQUID PHA...
- Publication number 20250060387
- Publication date Feb 20, 2025
- MICROANALYSIS Sp. z o.o.
- Lukasz TYMECK
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20250044311
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Kenshiro SAKATA
- G01 - MEASURING TESTING
Information Patent Application
SELF-CONTAINED MODULAR ANALYTICAL CARTRIDGE AND PROGRAMMABLE REAGEN...
- Publication number 20250041855
- Publication date Feb 6, 2025
- Leslie Don Roberts
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Fully Automatic Instrument System for Biochemical Assays
- Publication number 20250044310
- Publication date Feb 6, 2025
- Alamar Biosciences, Inc.
- Yuling Luo
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL TESTING SYSTEMS WITH TEST METHOD VERIFICATIONS
- Publication number 20250035653
- Publication date Jan 30, 2025
- Illinois Tool Works Inc.
- Daniel Vincent Caesar
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPARATION VALIDATION
- Publication number 20250035655
- Publication date Jan 30, 2025
- Beckman Coulter, Inc.
- Brahim De Jesus SAHDALA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20250027964
- Publication date Jan 23, 2025
- HITACHI HIGH-TECH CORPORATION
- Fuyuki MUKAI
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION APPARATUS
- Publication number 20250004004
- Publication date Jan 2, 2025
- FUJIFILM CORPORATION
- Yoshinobu MIURA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND SYSTEM FOR ASSIGNING PROCESSING STEPS TO A LA...
- Publication number 20240418737
- Publication date Dec 19, 2024
- Beckman Coulter, Inc.
- Eric VARLET
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TESTING QUALITY VERIFICATION
- Publication number 20240410910
- Publication date Dec 12, 2024
- Assaya LLC
- CLAS SIVERTSEN
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE SENSOR FOR ROUND BALERS
- Publication number 20240410852
- Publication date Dec 12, 2024
- Deere & Company
- Mohan A. Vadnere
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
METHOD FOR DETERMINING, IN REAL-TIME AND CONTINUOUSLY, AN AMOUNT OF...
- Publication number 20240410807
- Publication date Dec 12, 2024
- UBY
- Laurent MAREUGE
- G01 - MEASURING TESTING
Information Patent Application
CELL PICKING DEVICE
- Publication number 20240402208
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Mika OKADA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Method, System, and Apparatus for Controlling Multiple Experimental...
- Publication number 20240395040
- Publication date Nov 28, 2024
- Shimadzu Corporation
- Risa NIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER AND OPERATION METHOD THEREOF
- Publication number 20240377421
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Naohiko Fukaya
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20240353437
- Publication date Oct 24, 2024
- Hitachi High-Tech Corporation
- Yuki MIYADA
- G01 - MEASURING TESTING
Information Patent Application
AUTONOMOUS ANALYSIS DEVICE, DATA PROCESSING DEVICE, DATA PROCESSING...
- Publication number 20240353436
- Publication date Oct 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayuko GOTO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD
- Publication number 20240329070
- Publication date Oct 3, 2024
- SYSMEX CORPORATION
- Masashi TADA
- G01 - MEASURING TESTING
Information Patent Application
System and Method For Dispense Characterization
- Publication number 20240329074
- Publication date Oct 3, 2024
- Ventana Medical Systems, Inc.
- Aaron Ewoniuk
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic Analysis Device and Reagent Management Method
- Publication number 20240319216
- Publication date Sep 26, 2024
- Hitachi High-Tech Corporation
- Kanoh SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
REMOTE AUTOMATED CHEMICAL CROSSOVER SYSTEM FOR USE WITH AN AUTOMATE...
- Publication number 20240302392
- Publication date Sep 12, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM INCLUDING ROBOTIC ACTUATOR FOR DIPPING ELECTRICAL SENSOR FOR...
- Publication number 20240288457
- Publication date Aug 29, 2024
- HEXAGONFAB LIMITED
- Lukas James VASADI
- G01 - MEASURING TESTING
Information Patent Application
Reagent Cartridges and Related Systems and Methods
- Publication number 20240288462
- Publication date Aug 29, 2024
- Illumina, Inc.
- James Osmus
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240280597
- Publication date Aug 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL TESTING SYSTEMS WITH CUSTOMIZABLE DATA PARSERS AND WORKFLO...
- Publication number 20240280599
- Publication date Aug 22, 2024
- Illinois Tool Works Inc.
- Jason Morse
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTIMIZING AN INSTRUMENT SYSTEM WORKFLOW
- Publication number 20240272183
- Publication date Aug 15, 2024
- Berkeley Lights, Inc.
- Darshan Thaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240272186
- Publication date Aug 15, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY OPERATION MANAGEMENT SYSTEM, OPERATION MANAGEMENT SERVER...
- Publication number 20240264186
- Publication date Aug 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Kenji KAWASAKI
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENT MONITORING SYSTEM
- Publication number 20240267656
- Publication date Aug 8, 2024
- Agilent Technologies, Inc.
- Rick Fasani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Display method, sample analyzer, and recording medium

Forecasting of disinfection byproducts

Automatic analyzer and method thereof

Quality control support method, quality control support system, qua...

Automated sample processing system

Display method, sample analyzer, and recording medium

Visual inspection system for automated detection of particulate mat...

Examination system, examination device, and examination method for...

United states systems and methods for fluid and component handling

Method and apparatus for monitoring microbial contaminants in an in...

Automated tissue section capture, indexing and storage system and m...

Sample discrimination system and sample automatic processing appara...

Automatic analyzer with a control unit for displaying background ma...

Cell picking device

User interface for a fluorescence assay

Material tester

Specimen inspection automation system and specimen inspection method

System and method for evaluating chemical compound data using and a...

Measuring apparatus for a liquid handling apparatus for measuring p...

Automatic analyzer

Systems and methods for providing quality assurance for validation...

Compound distribution in microfluidic devices

Instrument monitoring system

Automatic analyzer

Walk-away time visualization methods and systems

Remote automated chemical crossover system for use with an automate...

Calibration curve setting method, specimen analysis method, calibra...

Detection of nuclease edited sequences in automated modules and ins...

Indicating a status of an analytical instrument on a screen of the...

System and method for dispense characterization

Patents Applicationslast 30 patents

SEMI-AUTOMATED PATCH-CLAMP APPARATUS AND A METHOD FOR CARRYING OUT...

A DEVICE FOR AN AUTOMATED DETERMINATION OF AN ANALYTE IN LIQUID PHA...

AUTOMATIC ANALYZER

SELF-CONTAINED MODULAR ANALYTICAL CARTRIDGE AND PROGRAMMABLE REAGEN...

Fully Automatic Instrument System for Biochemical Assays

MATERIAL TESTING SYSTEMS WITH TEST METHOD VERIFICATIONS

SAMPLE PREPARATION VALIDATION

AUTOMATIC ANALYSIS DEVICE

EXAMINATION APPARATUS

APPARATUS, METHOD AND SYSTEM FOR ASSIGNING PROCESSING STEPS TO A LA...

MACHINE TESTING QUALITY VERIFICATION

MOISTURE SENSOR FOR ROUND BALERS

METHOD FOR DETERMINING, IN REAL-TIME AND CONTINUOUSLY, AN AMOUNT OF...

CELL PICKING DEVICE

Method, System, and Apparatus for Controlling Multiple Experimental...

AUTOMATIC ANALYZER AND OPERATION METHOD THEREOF

Automatic Analyzer

AUTONOMOUS ANALYSIS DEVICE, DATA PROCESSING DEVICE, DATA PROCESSING...

SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD

System and Method For Dispense Characterization

Automatic Analysis Device and Reagent Management Method

REMOTE AUTOMATED CHEMICAL CROSSOVER SYSTEM FOR USE WITH AN AUTOMATE...

SYSTEM INCLUDING ROBOTIC ACTUATOR FOR DIPPING ELECTRICAL SENSOR FOR...

Reagent Cartridges and Related Systems and Methods

AUTOMATIC ANALYZER

MATERIAL TESTING SYSTEMS WITH CUSTOMIZABLE DATA PARSERS AND WORKFLO...

SYSTEMS AND METHODS FOR OPTIMIZING AN INSTRUMENT SYSTEM WORKFLOW

AUTOMATIC ANALYZER

LABORATORY OPERATION MANAGEMENT SYSTEM, OPERATION MANAGEMENT SERVER...

INSTRUMENT MONITORING SYSTEM