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G01N27/628
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N27/00
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
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G01N27/628
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Patents Grants
last 30 patents
Information
Patent Grant
Detection and analysis of olefins in petroleum by electrospray ioni...
Patent number
11,821,868
Issue date
Nov 21, 2023
ExxonMobil Technology and Engineering Company
Ashley M. Wittrig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods of rapid and autonomous detection of aerosol pa...
Patent number
11,658,021
Issue date
May 23, 2023
Zeteo Tech, Inc.
Wayne A. Bryden
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for structural analysis of organic compound
Patent number
11,545,350
Issue date
Jan 3, 2023
Shimadzu Corporation
Koichi Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for measuring the chirality of molecules
Patent number
11,404,257
Issue date
Aug 2, 2022
Centre National de la Recherche Scientifique
Yann Mairesse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Energy beam input to atom probe specimens from multiple angles
Patent number
11,340,256
Issue date
May 24, 2022
Cameca Instruments, Inc.
Joseph Hale Bunton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Composition analysis technology of ultramicro volume liquid by lase...
Patent number
11,227,752
Issue date
Jan 18, 2022
GUANGZHOU INSTITUTE OF GEOCHEMISTRY, CHINESE ACADEMY OF SCIENCES
Xing Ding
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photo-ionization device with improved linearity and stability
Patent number
11,143,619
Issue date
Oct 12, 2021
Nanova Environmental, Inc.
Biyan Chen
G01 - MEASURING TESTING
Information
Patent Grant
Sample ionisation using a pulsed laser source
Patent number
10,832,899
Issue date
Nov 10, 2020
Micromass UK Limited
Paul Murray
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for the preparation of samples for ionization by...
Patent number
10,679,837
Issue date
Jun 9, 2020
Eckhard Belau
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensor
Patent number
9,874,544
Issue date
Jan 23, 2018
Lite-On Opto Technology (Changzhou) Co., Ltd.
Chiou-yueh Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for ion detection
Patent number
9,857,340
Issue date
Jan 2, 2018
John N. Driscoll
G01 - MEASURING TESTING
Information
Patent Grant
Split-ring resonator plasma source
Patent number
9,784,712
Issue date
Oct 10, 2017
Anders Persson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for in vivo desorption ionization of biological t...
Patent number
9,709,529
Issue date
Jul 18, 2017
Semmelweis Egyetem
Zoltan Takats
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for ion detection
Patent number
9,423,386
Issue date
Aug 23, 2016
John N. Driscoll
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for remotely monitoring properties of gases an...
Patent number
7,560,869
Issue date
Jul 14, 2009
The Trustees of Princeton University
Richard B. Miles
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for local surface analysis
Patent number
6,809,317
Issue date
Oct 26, 2004
Interuniversitair Microelektronica Centrum (IMEC)
Wilfried Vandervorst
G01 - MEASURING TESTING
Information
Patent Grant
Laser-induced ionisation spectroscopy, particularly for coal
Patent number
6,771,368
Issue date
Aug 3, 2004
Generation Technology Research Pty Ltd.
Bruce Leonard Chadwick
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and residuals inspection system
Patent number
6,184,686
Issue date
Feb 6, 2001
Jordan Valley Applied Radiation Ltd.
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for isotopic analysis
Patent number
5,864,398
Issue date
Jan 26, 1999
Rutgers, The State University
Daniel E. Murnick
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for isotopic analysis
Patent number
5,783,445
Issue date
Jul 21, 1998
Rutgers, The State University
Daniel E. Murnick
G01 - MEASURING TESTING
Information
Patent Grant
Optogalvanic spectroscopy with phase independent detection
Patent number
5,706,082
Issue date
Jan 6, 1998
Alimenterics Inc.
Michael J. Colgan
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for isotopic analysis
Patent number
5,394,236
Issue date
Feb 28, 1995
Rutgers, The State University
Daniel E. Murnick
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus of quantitative non-resonant photoionization o...
Patent number
5,365,063
Issue date
Nov 15, 1994
Max-Planck-Gesellschaft Zur Foerderung; Der Wissenschaften E.B.
Stefan Kaesdorf
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and process for improved photoionization and detection
Patent number
5,206,594
Issue date
Apr 27, 1993
Mine Safety Appliances Company
Edward C. Zipf
G01 - MEASURING TESTING
Information
Patent Grant
Analysis of radiofrequency discharges in plasma
Patent number
5,135,604
Issue date
Aug 4, 1992
Board of Supervisors of Louisiana State University and Agricultural and Mecha...
Devendra Kumar
G01 - MEASURING TESTING
Information
Patent Grant
Method of and apparatus for analyzing granular materials
Patent number
5,122,752
Issue date
Jun 16, 1992
Hitachi, Ltd.
Masataka Koga
G01 - MEASURING TESTING
Information
Patent Grant
Laser enhanced ionization detector for Raman spectroscopy
Patent number
5,088,820
Issue date
Feb 18, 1992
University of Florida
James D. Winefordner
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring breakdown plasma
Patent number
5,070,300
Issue date
Dec 3, 1991
Hitachi, Ltd.
Tetsuya Matsui
G01 - MEASURING TESTING
Information
Patent Grant
Laser-enhanced flame ionization detection
Patent number
4,657,872
Issue date
Apr 14, 1987
Cornell Research Foundation, Inc.
Terrill A. Cool
G01 - MEASURING TESTING
Information
Patent Grant
Discharge cell for optogalvanic spectroscopy having orthogonal rela...
Patent number
4,585,344
Issue date
Apr 29, 1986
The United States of America as represented by the administrator of the Natio...
Christopher R. Webster
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
Publication number
20230039261
Publication date
Feb 9, 2023
Zeteo Tech, Inc.
WAYNE A. BRYDEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRUCTURAL ANALYSIS METHOD FOR ORGANIC COMPOUND
Publication number
20210358733
Publication date
Nov 18, 2021
Shimadzu Corporation
Koichi TANAKA
G01 - MEASURING TESTING
Information
Patent Application
DETECTION AND ANALYSIS OF OLEFINS IN PETROLEUM BY ELECTROSPRAY IONI...
Publication number
20210302371
Publication date
Sep 30, 2021
ExxonMobil Research and Engineering Company
Ashley M. Wittrig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRUCTURAL ANALYSIS OF IONISED MOLECULES
Publication number
20210270773
Publication date
Sep 2, 2021
Thermo Fisher Scientific (Bremen) GmbH
Alexander A. MAKAROV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...
Publication number
20210148858
Publication date
May 20, 2021
IAS Inc.
Katsuhiko KKAWABATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PRETREATMENT DEVICE FOR MALDI
Publication number
20210101153
Publication date
Apr 8, 2021
Shimadzu Corporation
Kenta TERASHIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPOSITION ANALYSIS TECHNOLOGY OF ULTRAMICRO VOLUME LIQUID BY LASE...
Publication number
20200395201
Publication date
Dec 17, 2020
Guangzhou Institute of Geochemistry, Chinese Academy of Sciences
Xing DING
G01 - MEASURING TESTING
Information
Patent Application
GAS SENSOR
Publication number
20170254779
Publication date
Sep 7, 2017
LITE-ON OPTO TECHNOLOGY (CHANGZHOU) CO., LTD.
Chiou-yueh Wang
G01 - MEASURING TESTING
Information
Patent Application
Split-Ring Resonator Plasma Source
Publication number
20160123927
Publication date
May 5, 2016
Anders PERSSON
G01 - MEASURING TESTING
Information
Patent Application
ATMOSPHERIC PRESSURE LASER-INDUCED ACOUSTIC DESORPTION CHEMICAL ION...
Publication number
20130210162
Publication date
Aug 15, 2013
Florida State University Research Foundation, Inc.
LEONARD NYADONG
G01 - MEASURING TESTING
Information
Patent Application
Mass Spectrometer
Publication number
20110315874
Publication date
Dec 29, 2011
SHIMADZU CORPORATION
Masahiro Ikegami
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR REMOTELY MONITORING PROPERTIES OF GASES AN...
Publication number
20090001889
Publication date
Jan 1, 2009
Richard B. Miles
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for local surface analysis
Publication number
20030127591
Publication date
Jul 10, 2003
Wilfried Vandervorst
G01 - MEASURING TESTING