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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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Patents Grantslast 30 patents

Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,285,656
- Issue date Apr 29, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
System and method for utilization of photon counting for colorizati...
- Patent number 12,287,298
- Issue date Apr 29, 2025
- Kub Technologies Inc
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for a specimen container for use in cabinet x-ray...
- Patent number 12,281,971
- Issue date Apr 22, 2025
- Kub Technologies Inc
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Grant
High resolution continuous rotation industrial radiography imaging...
- Patent number 12,281,993
- Issue date Apr 22, 2025
- Illinois Tool Works Inc.
- Camaron Mitchell Lemmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Movable detection device and detection method
- Patent number 12,281,994
- Issue date Apr 22, 2025
- Nutech Company Limited
- Kejin Gao
- G01 - MEASURING TESTING
Information Patent Grant
State change tracking device, X-ray imaging system, state change tr...
- Patent number 12,276,622
- Issue date Apr 15, 2025
- Konica Minolta, Inc.
- Tadashi Arimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Artificial intelligence-based dual energy x-ray image motion correc...
- Patent number 12,274,575
- Issue date Apr 15, 2025
- GE Precision Healthcare LLC
- Balázs P. Cziria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying foil position in power storage device and me...
- Patent number 12,276,621
- Issue date Apr 15, 2025
- PRIME PLANET ENERGY & SOLUTIONS, INC.
- Hisataka Fujimaki
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection device
- Patent number 12,276,623
- Issue date Apr 15, 2025
- Hamamatsu Photonics K.K.
- Kunihiko Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
- Patent number 12,270,770
- Issue date Apr 8, 2025
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for incorporating lidar-based techniques with a c...
- Patent number 12,263,024
- Issue date Apr 1, 2025
- GE Precision Healthcare LLC
- Arka Datta
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for peeling logs
- Patent number 12,263,616
- Issue date Apr 1, 2025
- Microtec S.R.L.
- Jöst Frank
- B27 - WORKING OR PRESERVING WOOD OR SIMILAR MATERIAL NAILING OR STAPLING MACH...
Information Patent Grant
Computed tomography scatter and crosstalk correction
- Patent number 12,266,036
- Issue date Apr 1, 2025
- General Electric Company
- Mingye Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Space-based x-ray imaging system
- Patent number 12,253,479
- Issue date Mar 18, 2025
- Jaywant Philip Parmar
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Scanning x-ray system
- Patent number 12,250,761
- Issue date Mar 11, 2025
- Moxtek, Inc.
- Rick Steck
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation CT apparatus, and method of manufactu...
- Patent number 12,243,903
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Takashi Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing grating devices with large aspect ratio
- Patent number 12,228,526
- Issue date Feb 18, 2025
- Koninklijke Philips N.V.
- Thomas Koehler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
Nanophotonic Scintillators for High-Energy Particles Detection, Ima...
- Publication number 20250137942
- Publication date May 1, 2025
- Massachusetts Institute of Technology
- Marin Soljacic
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137945
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE EQUIPMENT QUALITY CONTROL
- Publication number 20250137943
- Publication date May 1, 2025
- CARESTREAM HEALTH, INC.
- Luca BOGONI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...
- Publication number 20250130181
- Publication date Apr 24, 2025
- Canon Kabushiki Kaisha
- NAOTO SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN...
- Publication number 20250130182
- Publication date Apr 24, 2025
- RTX Corporation
- Lei Chen
- G01 - MEASURING TESTING
Information Patent Application
UNDERWATER X-RAY IMAGING EMITTER AND FLOAT ASSEMBLY
- Publication number 20250123221
- Publication date Apr 17, 2025
- UT-Battelle, LLC
- Paul B. Rose
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250124564
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Baggage Inspection Device
- Publication number 20250123224
- Publication date Apr 17, 2025
- The Nippon Signal Co., Ltd.
- Kazuaki TAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250123222
- Publication date Apr 17, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250125431
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PARTS AT TARGET TEMPERATURES
- Publication number 20250116618
- Publication date Apr 10, 2025
- WEST PHARMACEUTICAL SERVICES, INC.
- Md Abu HASAN
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
- Publication number 20250114052
- Publication date Apr 10, 2025
- GE Precision Healthcare LLC
- Changlyong Kim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER
- Publication number 20250108548
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
- Publication number 20250108576
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...
- Publication number 20250110063
- Publication date Apr 3, 2025
- FUJIFILM CORPORATION
- Hisatsugu HORIUCHI
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20250110064
- Publication date Apr 3, 2025
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING ELASTIC MODULUS AND DEVICE FOR CALCULATING E...
- Publication number 20250110066
- Publication date Apr 3, 2025
- TOHOKU UNIVERSITY
- Wataru Yashiro
- G01 - MEASURING TESTING
Information Patent Application
Component authentication using x-ray detectable unique features
- Publication number 20250111497
- Publication date Apr 3, 2025
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ITEM INSPECTION SYSTEMS AND METHODS
- Publication number 20250110067
- Publication date Apr 3, 2025
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
IMAGING JIG AND INFORMATION PROCESSING APPARATUS
- Publication number 20250102450
- Publication date Mar 27, 2025
- FUJIFILM CORPORATION
- Eiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR ARRAY WITH STAGGERED DETECTOR MODULES
- Publication number 20250102449
- Publication date Mar 27, 2025
- REDLEN TECHNOLOGIES, INC.
- Michael K. JACKSON
- G01 - MEASURING TESTING
Information Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
- Publication number 20250105378
- Publication date Mar 27, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Sup KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...
- Publication number 20250085196
- Publication date Mar 13, 2025
- ANHUI UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Pingsong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...
- Publication number 20250085240
- Publication date Mar 13, 2025
- University of Florida Research Foundation, Incorporated
- Navid Asadi-Zanjani
- G01 - MEASURING TESTING
Information Patent Application
X-RAY-TRANSMITTING MEMBER, X-RAY INSPECTION DEVICE, AND ARTICLE TO...
- Publication number 20250083427
- Publication date Mar 13, 2025
- TORAY INDUSTRIES, INC.
- Tomohiro TAKEHARA
- B32 - LAYERED PRODUCTS

and forming a picture

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system utilizing imaging analysis for golf balls

System and method for utilization of photon counting for colorizati...

Parameterizing x-ray scattering measurement using slice-and-image t...

System and method for a specimen container for use in cabinet x-ray...

High resolution continuous rotation industrial radiography imaging...

Movable detection device and detection method

State change tracking device, X-ray imaging system, state change tr...

Artificial intelligence-based dual energy x-ray image motion correc...

Method for identifying foil position in power storage device and me...

Foreign matter inspection device

Systems and methods for monitoring feature sizes in digital X-ray i...

Material detection in X-ray security screening

System and method for incorporating lidar-based techniques with a c...

Apparatus for peeling logs

Computed tomography scatter and crosstalk correction

Targeted collimation of detectors using rear collimators

Space-based x-ray imaging system

Jet blades optical inspection

High-energy x-ray imaging system

Scanning x-ray system

X-ray phase imaging apparatus and X-ray phase imaging method

Radiation detector, radiation CT apparatus, and method of manufactu...

Inspection apparatus and inspection method

Combined scatter and transmission multi-view imaging system

X-ray inspection apparatus

Inspection device

Food product monitoring solution

Focusing grating devices with large aspect ratio

Non-destructive detection method and system for Conopomorpha sinens...

Imaging environment testing fixture and methods thereof

Patents Applicationslast 30 patents

X-RAY INSPECTION APPARATUS

Nanophotonic Scintillators for High-Energy Particles Detection, Ima...

X-RAY INSPECTION APPARATUS

PROTECTIVE EQUIPMENT QUALITY CONTROL

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...

COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN...

UNDERWATER X-RAY IMAGING EMITTER AND FLOAT ASSEMBLY

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

Baggage Inspection Device

X-RAY INSPECTION APPARATUS

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

SCANNING PARTS AT TARGET TEMPERATURES

ARTICLE INSPECTION APPARATUS

MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS

METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER

System to Assess Golf ball quality using multiple orientations of x...

METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER

DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

METHOD FOR CALCULATING ELASTIC MODULUS AND DEVICE FOR CALCULATING E...

Component authentication using x-ray detectable unique features

ITEM INSPECTION SYSTEMS AND METHODS

IMAGING JIG AND INFORMATION PROCESSING APPARATUS

RADIATION DETECTOR ARRAY WITH STAGGERED DETECTOR MODULES

Stack Cell for Easy Confirmation of Separator Folding, Separator In...

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...

X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...

X-RAY-TRANSMITTING MEMBER, X-RAY INSPECTION DEVICE, AND ARTICLE TO...