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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/04and forming a picture

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Space-based x-ray imaging system
- Patent number 12,253,479
- Issue date Mar 18, 2025
- Jaywant Philip Parmar
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Scanning x-ray system
- Patent number 12,250,761
- Issue date Mar 11, 2025
- Moxtek, Inc.
- Rick Steck
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation CT apparatus, and method of manufactu...
- Patent number 12,243,903
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Takashi Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing grating devices with large aspect ratio
- Patent number 12,228,526
- Issue date Feb 18, 2025
- Koninklijke Philips N.V.
- Thomas Koehler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic inspection method, radiographic inspection apparatus,...
- Patent number 12,222,300
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Tatsuya Onishi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Data acquisition in charged particle microscopy
- Patent number 12,223,752
- Issue date Feb 11, 2025
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible and/or deformable mechanical elements with radiographic ma...
- Patent number 12,216,066
- Issue date Feb 4, 2025
- Science Applications International Corporation
- Theodore W. Eastes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for imaging a subject
- Patent number 12,201,466
- Issue date Jan 21, 2025
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Transmission electron microscopy with square beams
- Patent number 12,205,789
- Issue date Jan 21, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Industrial x-ray workpiece measuring system and method for operatin...
- Patent number 12,203,876
- Issue date Jan 21, 2025
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
Pulse frequency adjustment
- Patent number 12,203,879
- Issue date Jan 21, 2025
- SMITHS DETECTION FRANCE S.A.S.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
CT system
- Patent number 12,203,877
- Issue date Jan 21, 2025
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Michael Salamon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY-TRANSMITTING MEMBER, X-RAY INSPECTION DEVICE, AND ARTICLE TO...
- Publication number 20250083427
- Publication date Mar 13, 2025
- TORAY INDUSTRIES, INC.
- Tomohiro TAKEHARA
- B32 - LAYERED PRODUCTS
Information Patent Application
Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...
- Publication number 20250085196
- Publication date Mar 13, 2025
- ANHUI UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Pingsong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...
- Publication number 20250085240
- Publication date Mar 13, 2025
- University of Florida Research Foundation, Incorporated
- Navid Asadi-Zanjani
- G01 - MEASURING TESTING
Information Patent Application
CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...
- Publication number 20250076221
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Mohammed Fadhel Al-Hamad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probabilistic Image Analysis
- Publication number 20250076219
- Publication date Mar 6, 2025
- Rapiscan Holdings, Inc.
- James Manalad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...
- Publication number 20250076223
- Publication date Mar 6, 2025
- AMOREPACIFIC CORPORATION
- Chaeyeon SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW
- Publication number 20250052698
- Publication date Feb 13, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD
- Publication number 20250052702
- Publication date Feb 13, 2025
- HÖRMANN KLATT CONVEYORS GMBH
- Peter Klatt
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...
- Publication number 20250054107
- Publication date Feb 13, 2025
- Billion Prima Sdn Bhd
- Ameer Safuan Bin MUHAMAD KAHIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYSING A GEOLOGICAL SAMPLE
- Publication number 20250052700
- Publication date Feb 13, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD
- Publication number 20250045984
- Publication date Feb 6, 2025
- Nuctech Company Limited
- Li ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETR...
- Publication number 20250044243
- Publication date Feb 6, 2025
- ECOLE POLYTECHNIQUE
- Philippe ZEITOUN
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION APPARATUS AND OBSERVATION METHOD
- Publication number 20250044244
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Hisaya HOTAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES
- Publication number 20250035562
- Publication date Jan 30, 2025
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
- Publication number 20250037286
- Publication date Jan 30, 2025
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION INSPECTION SYSTEM
- Publication number 20250035568
- Publication date Jan 30, 2025
- Nuctech Company Limited
- Qiangqiang WANG
- G01 - MEASURING TESTING
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHIC ANALYSIS METHOD
- Publication number 20250035567
- Publication date Jan 30, 2025
- SAFRAN AIRCRAFT ENGINES
- Pierre Alfred Jean DUCHENE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY SHIELDING DEVICE
- Publication number 20250037891
- Publication date Jan 30, 2025
- Simon Edward Kozin
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Inspection System
- Publication number 20250027888
- Publication date Jan 23, 2025
- The Nippon Signal Co., Ltd.
- Kazuaki TAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING

and forming a picture

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Targeted collimation of detectors using rear collimators

Space-based x-ray imaging system

Jet blades optical inspection

High-energy x-ray imaging system

Scanning x-ray system

X-ray phase imaging apparatus and X-ray phase imaging method

Radiation detector, radiation CT apparatus, and method of manufactu...

Inspection apparatus and inspection method

Combined scatter and transmission multi-view imaging system

X-ray inspection apparatus

Inspection device

Food product monitoring solution

Focusing grating devices with large aspect ratio

Non-destructive detection method and system for Conopomorpha sinens...

Imaging environment testing fixture and methods thereof

Radiographic inspection method, radiographic inspection apparatus,...

X-ray inspection apparatus

Apparatus for real-time monitoring of organic matter porosity evolu...

Inspection system for quality analysis of a product to be inspected

Data acquisition in charged particle microscopy

Flexible and/or deformable mechanical elements with radiographic ma...

Inspection device with integrated x-ray and weighing device

Performance evaluation method for elastic material

Two-stage screening technique for prohibited objects at security ch...

System and method for imaging a subject

Device and method for the additive manufacture of a workpiece

Transmission electron microscopy with square beams

Industrial x-ray workpiece measuring system and method for operatin...

Pulse frequency adjustment

CT system

Patents Applicationslast 30 patents

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

X-RAY-TRANSMITTING MEMBER, X-RAY INSPECTION DEVICE, AND ARTICLE TO...

Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...

X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...

CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...

Probabilistic Image Analysis

X-RAY IMAGING APPARATUS

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

Non-destructive Detection Method and System for Conopomorpha Sinens...

X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW

SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD

CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

METHOD OF ANALYSING A GEOLOGICAL SAMPLE

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD

PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETR...

OBSERVATION APPARATUS AND OBSERVATION METHOD

METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

INTERFACE DETECTION IN RECIPROCAL SPACE

RADIATION INSPECTION SYSTEM

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

TOMOGRAPHIC ANALYSIS METHOD

X-RAY SHIELDING DEVICE

Inspection System

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...