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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/04and forming a picture

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing grating devices with large aspect ratio
- Patent number 12,228,526
- Issue date Feb 18, 2025
- Koninklijke Philips N.V.
- Thomas Koehler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic inspection method, radiographic inspection apparatus,...
- Patent number 12,222,300
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Tatsuya Onishi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Data acquisition in charged particle microscopy
- Patent number 12,223,752
- Issue date Feb 11, 2025
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible and/or deformable mechanical elements with radiographic ma...
- Patent number 12,216,066
- Issue date Feb 4, 2025
- Science Applications International Corporation
- Theodore W. Eastes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for imaging a subject
- Patent number 12,201,466
- Issue date Jan 21, 2025
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Transmission electron microscopy with square beams
- Patent number 12,205,789
- Issue date Jan 21, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Industrial x-ray workpiece measuring system and method for operatin...
- Patent number 12,203,876
- Issue date Jan 21, 2025
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
Pulse frequency adjustment
- Patent number 12,203,879
- Issue date Jan 21, 2025
- SMITHS DETECTION FRANCE S.A.S.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
CT system
- Patent number 12,203,877
- Issue date Jan 21, 2025
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Michael Salamon
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring and/or calibrating a device designed for the...
- Patent number 12,203,878
- Issue date Jan 21, 2025
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Felix Porsch
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for adaptive blending in computed tomography im...
- Patent number 12,205,253
- Issue date Jan 21, 2025
- GE Precision Healthcare LLC
- Brian Edward Nett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
Battery module and method of manufacturing the same
- Patent number 12,191,462
- Issue date Jan 7, 2025
- LG ENERGY SOLUTION, LTD.
- Yongjin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Apparatus, system and method for radiation based imaging
- Patent number 12,186,118
- Issue date Jan 7, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Hongjun Zhang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW
- Publication number 20250052698
- Publication date Feb 13, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD
- Publication number 20250052702
- Publication date Feb 13, 2025
- HÖRMANN KLATT CONVEYORS GMBH
- Peter Klatt
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...
- Publication number 20250054107
- Publication date Feb 13, 2025
- Billion Prima Sdn Bhd
- Ameer Safuan Bin MUHAMAD KAHIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYSING A GEOLOGICAL SAMPLE
- Publication number 20250052700
- Publication date Feb 13, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD
- Publication number 20250045984
- Publication date Feb 6, 2025
- Nuctech Company Limited
- Li ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETR...
- Publication number 20250044243
- Publication date Feb 6, 2025
- ECOLE POLYTECHNIQUE
- Philippe ZEITOUN
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION APPARATUS AND OBSERVATION METHOD
- Publication number 20250044244
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Hisaya HOTAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES
- Publication number 20250035562
- Publication date Jan 30, 2025
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
RADIATION INSPECTION SYSTEM
- Publication number 20250035568
- Publication date Jan 30, 2025
- Nuctech Company Limited
- Qiangqiang WANG
- G01 - MEASURING TESTING
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
- Publication number 20250037286
- Publication date Jan 30, 2025
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOMOGRAPHIC ANALYSIS METHOD
- Publication number 20250035567
- Publication date Jan 30, 2025
- SAFRAN AIRCRAFT ENGINES
- Pierre Alfred Jean DUCHENE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY SHIELDING DEVICE
- Publication number 20250037891
- Publication date Jan 30, 2025
- Simon Edward Kozin
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Inspection System
- Publication number 20250027888
- Publication date Jan 23, 2025
- The Nippon Signal Co., Ltd.
- Kazuaki TAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POWERLINE INSPECTION
- Publication number 20250029224
- Publication date Jan 23, 2025
- Abhinav Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Transmission electron microscopy with square beams
- Publication number 20250029806
- Publication date Jan 23, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chua
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR MONITORING EVENTS RELATED TO X-RAY TUBES
- Publication number 20250024578
- Publication date Jan 16, 2025
- GE Precision Healthcare LLC
- Munish Vishwas lnamdar
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DETECTOR WITH FOCALLY ALIGNED PIXELS
- Publication number 20250020599
- Publication date Jan 16, 2025
- GENERAL ELECTRIC COMPANY
- Matthew Edward Dragovich
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...
- Publication number 20250020600
- Publication date Jan 16, 2025
- GENERAL ELECTRIC COMPANY
- Mohamed Rahmane
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...
- Publication number 20250012740
- Publication date Jan 9, 2025
- KIOXIA Corporation
- Takeshi OWAKI
- G01 - MEASURING TESTING
Information Patent Application
INTELLIGENT DATA ACQUISITION SYSTEM AND METHOD FOR PIPELINES
- Publication number 20250003544
- Publication date Jan 2, 2025
- Shuyong Paul Du
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...
- Publication number 20250003892
- Publication date Jan 2, 2025
- Anritsu Corporation
- Takeshi YAMAZAKI
- G06 - COMPUTING CALCULATING COUNTING

and forming a picture

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection device

Food product monitoring solution

Focusing grating devices with large aspect ratio

Non-destructive detection method and system for Conopomorpha sinens...

Imaging environment testing fixture and methods thereof

Radiographic inspection method, radiographic inspection apparatus,...

X-ray inspection apparatus

Apparatus for real-time monitoring of organic matter porosity evolu...

Inspection system for quality analysis of a product to be inspected

Data acquisition in charged particle microscopy

Flexible and/or deformable mechanical elements with radiographic ma...

Inspection device with integrated x-ray and weighing device

System and method for imaging a subject

Performance evaluation method for elastic material

Two-stage screening technique for prohibited objects at security ch...

Device and method for the additive manufacture of a workpiece

Transmission electron microscopy with square beams

Industrial x-ray workpiece measuring system and method for operatin...

Pulse frequency adjustment

CT system

Method for monitoring and/or calibrating a device designed for the...

Systems and methods for adaptive blending in computed tomography im...

Structure information acquisition method and structure information...

Battery module and method of manufacturing the same

Spent or decommissioned accumulator treatment plant and process

Apparatus, system and method for radiation based imaging

Method and device for controlling output beam of ray machine in ima...

Secondary image removal using high resolution x-ray transmission so...

System and method for inspecting defects of structure by using X-ray

Method and apparatus of stationary-source nonplanar-trajectory narr...

Patents Applicationslast 30 patents

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

Non-destructive Detection Method and System for Conopomorpha Sinens...

X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW

SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD

CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

METHOD OF ANALYSING A GEOLOGICAL SAMPLE

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD

PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETR...

OBSERVATION APPARATUS AND OBSERVATION METHOD

METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

RADIATION INSPECTION SYSTEM

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

INTERFACE DETECTION IN RECIPROCAL SPACE

TOMOGRAPHIC ANALYSIS METHOD

X-RAY SHIELDING DEVICE

Inspection System

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

SYSTEM AND METHOD FOR POWERLINE INSPECTION

Transmission electron microscopy with square beams

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

METHODS AND SYSTEMS FOR MONITORING EVENTS RELATED TO X-RAY TUBES

DETECTOR WITH FOCALLY ALIGNED PIXELS

APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...

TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...

INTELLIGENT DATA ACQUISITION SYSTEM AND METHOD FOR PIPELINES

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...