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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/04and forming a picture

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
- Patent number 12,270,770
- Issue date Apr 8, 2025
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for incorporating lidar-based techniques with a c...
- Patent number 12,263,024
- Issue date Apr 1, 2025
- GE Precision Healthcare LLC
- Arka Datta
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for peeling logs
- Patent number 12,263,616
- Issue date Apr 1, 2025
- Microtec S.R.L.
- Jöst Frank
- B27 - WORKING OR PRESERVING WOOD OR SIMILAR MATERIAL NAILING OR STAPLING MACH...
Information Patent Grant
Computed tomography scatter and crosstalk correction
- Patent number 12,266,036
- Issue date Apr 1, 2025
- General Electric Company
- Mingye Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Space-based x-ray imaging system
- Patent number 12,253,479
- Issue date Mar 18, 2025
- Jaywant Philip Parmar
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Scanning x-ray system
- Patent number 12,250,761
- Issue date Mar 11, 2025
- Moxtek, Inc.
- Rick Steck
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation CT apparatus, and method of manufactu...
- Patent number 12,243,903
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Takashi Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing grating devices with large aspect ratio
- Patent number 12,228,526
- Issue date Feb 18, 2025
- Koninklijke Philips N.V.
- Thomas Koehler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic inspection method, radiographic inspection apparatus,...
- Patent number 12,222,300
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Tatsuya Onishi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Data acquisition in charged particle microscopy
- Patent number 12,223,752
- Issue date Feb 11, 2025
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible and/or deformable mechanical elements with radiographic ma...
- Patent number 12,216,066
- Issue date Feb 4, 2025
- Science Applications International Corporation
- Theodore W. Eastes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for imaging a subject
- Patent number 12,201,466
- Issue date Jan 21, 2025
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PARTS AT TARGET TEMPERATURES
- Publication number 20250116618
- Publication date Apr 10, 2025
- WEST PHARMACEUTICAL SERVICES, INC.
- Md Abu HASAN
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
- Publication number 20250114052
- Publication date Apr 10, 2025
- GE Precision Healthcare LLC
- Changlyong Kim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER
- Publication number 20250108548
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...
- Publication number 20250110063
- Publication date Apr 3, 2025
- FUJIFILM CORPORATION
- Hisatsugu HORIUCHI
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20250110064
- Publication date Apr 3, 2025
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
- Publication number 20250108576
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
Component authentication using x-ray detectable unique features
- Publication number 20250111497
- Publication date Apr 3, 2025
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALCULATING ELASTIC MODULUS AND DEVICE FOR CALCULATING E...
- Publication number 20250110066
- Publication date Apr 3, 2025
- TOHOKU UNIVERSITY
- Wataru Yashiro
- G01 - MEASURING TESTING
Information Patent Application
ITEM INSPECTION SYSTEMS AND METHODS
- Publication number 20250110067
- Publication date Apr 3, 2025
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
IMAGING JIG AND INFORMATION PROCESSING APPARATUS
- Publication number 20250102450
- Publication date Mar 27, 2025
- FUJIFILM CORPORATION
- Eiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR ARRAY WITH STAGGERED DETECTOR MODULES
- Publication number 20250102449
- Publication date Mar 27, 2025
- REDLEN TECHNOLOGIES, INC.
- Michael K. JACKSON
- G01 - MEASURING TESTING
Information Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
- Publication number 20250105378
- Publication date Mar 27, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Sup KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY-TRANSMITTING MEMBER, X-RAY INSPECTION DEVICE, AND ARTICLE TO...
- Publication number 20250083427
- Publication date Mar 13, 2025
- TORAY INDUSTRIES, INC.
- Tomohiro TAKEHARA
- B32 - LAYERED PRODUCTS
Information Patent Application
Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...
- Publication number 20250085196
- Publication date Mar 13, 2025
- ANHUI UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Pingsong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...
- Publication number 20250085240
- Publication date Mar 13, 2025
- University of Florida Research Foundation, Incorporated
- Navid Asadi-Zanjani
- G01 - MEASURING TESTING
Information Patent Application
CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...
- Publication number 20250076221
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Mohammed Fadhel Al-Hamad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probabilistic Image Analysis
- Publication number 20250076219
- Publication date Mar 6, 2025
- Rapiscan Holdings, Inc.
- James Manalad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...
- Publication number 20250076223
- Publication date Mar 6, 2025
- AMOREPACIFIC CORPORATION
- Chaeyeon SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW
- Publication number 20250052698
- Publication date Feb 13, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD
- Publication number 20250052702
- Publication date Feb 13, 2025
- HÖRMANN KLATT CONVEYORS GMBH
- Peter Klatt
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...
- Publication number 20250054107
- Publication date Feb 13, 2025
- Billion Prima Sdn Bhd
- Ameer Safuan Bin MUHAMAD KAHIRI
- G06 - COMPUTING CALCULATING COUNTING

and forming a picture

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for monitoring feature sizes in digital X-ray i...

Material detection in X-ray security screening

System and method for incorporating lidar-based techniques with a c...

Apparatus for peeling logs

Computed tomography scatter and crosstalk correction

Targeted collimation of detectors using rear collimators

Space-based x-ray imaging system

Jet blades optical inspection

High-energy x-ray imaging system

Scanning x-ray system

X-ray phase imaging apparatus and X-ray phase imaging method

Radiation detector, radiation CT apparatus, and method of manufactu...

Inspection apparatus and inspection method

Combined scatter and transmission multi-view imaging system

X-ray inspection apparatus

Inspection device

Food product monitoring solution

Focusing grating devices with large aspect ratio

Non-destructive detection method and system for Conopomorpha sinens...

Imaging environment testing fixture and methods thereof

Radiographic inspection method, radiographic inspection apparatus,...

X-ray inspection apparatus

Apparatus for real-time monitoring of organic matter porosity evolu...

Inspection system for quality analysis of a product to be inspected

Data acquisition in charged particle microscopy

Flexible and/or deformable mechanical elements with radiographic ma...

Inspection device with integrated x-ray and weighing device

System and method for imaging a subject

Performance evaluation method for elastic material

Two-stage screening technique for prohibited objects at security ch...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

SCANNING PARTS AT TARGET TEMPERATURES

MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS

ARTICLE INSPECTION APPARATUS

METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER

System to Assess Golf ball quality using multiple orientations of x...

DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER

Component authentication using x-ray detectable unique features

METHOD FOR CALCULATING ELASTIC MODULUS AND DEVICE FOR CALCULATING E...

ITEM INSPECTION SYSTEMS AND METHODS

IMAGING JIG AND INFORMATION PROCESSING APPARATUS

RADIATION DETECTOR ARRAY WITH STAGGERED DETECTOR MODULES

Stack Cell for Easy Confirmation of Separator Folding, Separator In...

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

X-RAY-TRANSMITTING MEMBER, X-RAY INSPECTION DEVICE, AND ARTICLE TO...

Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...

X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...

CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...

Probabilistic Image Analysis

X-RAY IMAGING APPARATUS

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

Non-destructive Detection Method and System for Conopomorpha Sinens...

X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW

SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD

CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...