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Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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Industry
CPC
G01N23/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Sub Industries
G01N23/005
by using neutrons
G01N23/02
by transmitting the radiation through the material
G01N23/025
using neutrons
G01N23/04
and forming a picture
G01N23/043
using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
G01N23/046
using tomography
G01N23/05
using neutrons
G01N23/06
and measuring the absorption
G01N23/063
X-ray absorption fine structure
G01N23/066
Gamma-ray resonance absorption
G01N23/08
using electric detection means
G01N23/083
the radiation being X-rays
G01N23/087
using polyenergetic X-rays
G01N23/09
the radiation being neutrons
G01N23/10
the material being confined in a container
G01N23/12
the material being a flowing fluid or a flowing granular solid
G01N23/125
with immerged detecting head
G01N23/14
specially adapted for controlling or monitoring operations or for signalling
G01N23/16
the material being a moving sheet or a sheet or tube examined by a scanning probe
G01N23/18
Investigating the presence of flaws
G01N23/185
in tyres
G01N23/20
by using diffraction of the radiation
G01N23/20008
Constructional details; Accessories
G01N23/20016
Goniometers
G01N23/20025
Sample holders or supports
G01N23/20033
provided with temperature control or heating devices
G01N23/20041
for high pressure testing
G01N23/2005
Details concerning the preparation of powder samples
G01N23/20058
by measuring diffraction of electrons
G01N23/20066
by measuring inelastic scatter of gamma rays
G01N23/20075
by measuring interferences of X-rays
G01N23/20083
by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
G01N23/20091
by measuring the energy-dispersion spectrum of diffracted radiation
G01N23/201
by measuring small-angle scattering
G01N23/202
using neutrons
G01N23/203
by measuring back scattering
G01N23/204
using neutrons
G01N23/205
by means of diffraction cameras
G01N23/2055
Analysing diffraction patterns
G01N23/206
the radiation being neutrons
G01N23/207
by means of diffractometry using detectors
G01N23/2073
using neutron detectors
G01N23/2076
for spectrometry, i.e. using an analysing crystal
G01N23/22
by measuring secondary emission
G01N23/2202
Preparing specimens
G01N23/2204
Specimen supports; Sample conveying means
G01N23/2206
using a combination of at least two kinds of measurements, with at least one measurement of secondary emission
G01N23/2208
using a combination of at least two kinds of measurements, each one being of a secondary emission kind
G01N23/221
by activation analysis
G01N23/222
using neutrons
G01N23/223
by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N23/225
using electron or ion microprobe or incident electron or ion beam
G01N23/2251
with incident electron beam
G01N23/2252
and measuring excited X-rays
G01N23/2254
and measuring cathodoluminescence
G01N23/2255
with incident ion beam
G01N23/2257
and measuring X-rays excited from incident proton beam
G01N23/2258
and measuring secondary ion beam
G01N23/227
by measuring photoelectric effect
G01N23/2273
by measuring photoelectron spectrum
G01N23/2276
by measuring Auger electrons
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