Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

G01N23/005by using neutrons G01N23/02by transmitting the radiation through the material G01N23/025using neutrons G01N23/04and forming a picture G01N23/043using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images G01N23/046using tomography G01N23/05using neutrons G01N23/06and measuring the absorption G01N23/063X-ray absorption fine structure G01N23/066Gamma-ray resonance absorption G01N23/08using electric detection means G01N23/083the radiation being X-rays G01N23/087using polyenergetic X-rays G01N23/09the radiation being neutrons G01N23/10the material being confined in a container G01N23/12the material being a flowing fluid or a flowing granular solid G01N23/125with immerged detecting head G01N23/14specially adapted for controlling or monitoring operations or for signalling G01N23/16the material being a moving sheet or a sheet or tube examined by a scanning probe G01N23/18Investigating the presence of flaws G01N23/185in tyres G01N23/20by using diffraction of the radiation G01N23/20008Constructional details; Accessories G01N23/20016Goniometers G01N23/20025Sample holders or supports G01N23/20033provided with temperature control or heating devices G01N23/20041for high pressure testing G01N23/2005Details concerning the preparation of powder samples G01N23/20058by measuring diffraction of electrons G01N23/20066by measuring inelastic scatter of gamma rays G01N23/20075by measuring interferences of X-rays G01N23/20083by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement G01N23/20091by measuring the energy-dispersion spectrum of diffracted radiation G01N23/201by measuring small-angle scattering G01N23/202using neutrons G01N23/203by measuring back scattering G01N23/204using neutrons G01N23/205by means of diffraction cameras G01N23/2055Analysing diffraction patterns G01N23/206the radiation being neutrons G01N23/207by means of diffractometry using detectors G01N23/2073using neutron detectors G01N23/2076for spectrometry, i.e. using an analysing crystal G01N23/22by measuring secondary emission G01N23/2202Preparing specimens G01N23/2204Specimen supports; Sample conveying means G01N23/2206using a combination of at least two kinds of measurements, with at least one measurement of secondary emission G01N23/2208using a combination of at least two kinds of measurements, each one being of a secondary emission kind G01N23/221by activation analysis G01N23/222using neutrons G01N23/223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence G01N23/225using electron or ion microprobe or incident electron or ion beam G01N23/2251with incident electron beam G01N23/2252and measuring excited X-rays G01N23/2254and measuring cathodoluminescence G01N23/2255with incident ion beam G01N23/2257and measuring X-rays excited from incident proton beam G01N23/2258and measuring secondary ion beam G01N23/227by measuring photoelectric effect G01N23/2273by measuring photoelectron spectrum G01N23/2276by measuring Auger electrons