and measuring absorption

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CPC
G01N2223/04

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/04and measuring absorption

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector unit with three-side buttable read-out integrate...
- Patent number 12,358,735
- Issue date Jul 15, 2025
- Redlen Technologies, Inc.
- Glenn Bindley
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Battery module comprising metal particle-dispersed thermal conducti...
- Patent number 12,355,044
- Issue date Jul 8, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Been You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed neutron apparatus and method for using same to analyze core...
- Patent number 12,332,193
- Issue date Jun 17, 2025
- Core Laboratories LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a film comprising cavities with determinat...
- Patent number 12,325,171
- Issue date Jun 10, 2025
- ALEPH SAS
- Jan Gaudaen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Degradable microsphere and use thereof
- Patent number 12,325,767
- Issue date Jun 10, 2025
- Tsinghua University
- Jianbin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration sample set and method for li-ion battery gauging systems
- Patent number 12,320,762
- Issue date Jun 3, 2025
- Thermo Fisher Scientific Messtechnik GmbH
- Alexander Britting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission image-based non-destructive inspecting method, method...
- Patent number 12,315,135
- Issue date May 27, 2025
- RAYDISOFT INC.
- Seok Won Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for defects detection and classification using...
- Patent number 12,307,668
- Issue date May 20, 2025
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
System and method for utilization of photon counting for colorizati...
- Patent number 12,287,298
- Issue date Apr 29, 2025
- Kub Technologies Inc
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying foil position in power storage device and me...
- Patent number 12,276,621
- Issue date Apr 15, 2025
- PRIME PLANET ENERGY & SOLUTIONS, INC.
- Hisataka Fujimaki
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Low-temperature perovskite scintillators and devices with low-tempe...
- Patent number 12,164,067
- Issue date Dec 10, 2024
- Michael Saliba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Radiation detector and method for manufacturing radiation detector
- Patent number 12,140,715
- Issue date Nov 12, 2024
- Kyoto University
- Keiji Abe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated circumferential pipe scanning system
- Patent number 12,135,297
- Issue date Nov 5, 2024
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Grant
Methods for correlative microscopy
- Patent number 12,123,047
- Issue date Oct 22, 2024
- Leica Mikrosysteme GmbH
- Julia König
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method and system to characterize and monitor the sharpness of a di...
- Patent number 12,118,701
- Issue date Oct 15, 2024
- AGFA NV
- Marc Cresens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring the relative permeability of proppe...
- Patent number 12,092,592
- Issue date Sep 17, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD
- Publication number 20250231124
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250172510
- Publication date May 29, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MATERIAL
- Publication number 20250146957
- Publication date May 8, 2025
- Smiths Detection France S.A.S.
- Serge MAITREJEAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
- Publication number 20250105378
- Publication date Mar 27, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Sup KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
Material Detection in X-Ray Security Screening
- Publication number 20240302300
- Publication date Sep 12, 2024
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEUTERATED INDOLE HEPTAMETHINE CYANINE DYES
- Publication number 20240280577
- Publication date Aug 22, 2024
- UNIVERSITY OF NOTRE DAME DU LAC
- Bradley D. Smith
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CT SCANNER CALIBRATION
- Publication number 20240272095
- Publication date Aug 15, 2024
- JAMES R. GLIDEWELL DENTAL CERAMICS, INC.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
- Publication number 20240219323
- Publication date Jul 4, 2024
- SMITHS DETECTION GERMANY GMBH
- Philipp FISCHER
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM
- Publication number 20240192152
- Publication date Jun 13, 2024
- Hitachi, Ltd
- Toshiaki TANIGAKI
- G01 - MEASURING TESTING
Information Patent Application
Simulating Dissolution of Scale in Wells
- Publication number 20240167997
- Publication date May 23, 2024
- Saudi Arabian Oil Company
- Mohammed Sayed
- G01 - MEASURING TESTING
Information Patent Application
LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW-TEMPE...
- Publication number 20240168182
- Publication date May 23, 2024
- Michael Saliba
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING THE RELATIVE PERMEABILITY OF PROPPE...
- Publication number 20240159692
- Publication date May 16, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan LI
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Determining the Location of Artefacts and/or...
- Publication number 20240133822
- Publication date Apr 25, 2024
- The Australian National University
- Roland Fleddermann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20240102949
- Publication date Mar 28, 2024
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Method for Constraining 3D Fracture Model Properties Us...
- Publication number 20240060418
- Publication date Feb 22, 2024
- Saudi Arabian Oil Company
- Otto Meza Camargo
- E21 - EARTH DRILLING MINING
Information Patent Application
A SCREENING SYSTEM
- Publication number 20240044813
- Publication date Feb 8, 2024
- Halo X Ray Technologies Limited
- Anthony DICKEN
- G01 - MEASURING TESTING
Information Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
- Publication number 20240044815
- Publication date Feb 8, 2024
- NEC Corporation
- Masahiro KAJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
- Publication number 20240044816
- Publication date Feb 8, 2024
- NEC Corporation
- Masahiro KAJI
- G06 - COMPUTING CALCULATING COUNTING

and measuring absorption

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiation detector unit with three-side buttable read-out integrate...

Battery module comprising metal particle-dispersed thermal conducti...

Pulsed neutron apparatus and method for using same to analyze core...

Method for manufacturing a film comprising cavities with determinat...

Automatic particle beam focusing

Degradable microsphere and use thereof

Calibration sample set and method for li-ion battery gauging systems

Transmission image-based non-destructive inspecting method, method...

Methods and systems for defects detection and classification using...

System and method for utilization of photon counting for colorizati...

Parameterizing x-ray scattering measurement using slice-and-image t...

Method for identifying foil position in power storage device and me...

Material detection in X-ray security screening

Inspection apparatus and inspection method

X-ray inspection apparatus

Spectrometer

X-ray inspection apparatus

X-ray detector system with at least two stacked flat Bragg diffractors

Two-stage screening technique for prohibited objects at security ch...

Spent or decommissioned accumulator treatment plant and process

Method and device for controlling output beam of ray machine in ima...

System and method for inspecting defects of structure by using X-ray

Low-temperature perovskite scintillators and devices with low-tempe...

Radiation detector and method for manufacturing radiation detector

Automated circumferential pipe scanning system

Methods for correlative microscopy

Method and system to characterize and monitor the sharpness of a di...

Inspection system, determination processing apparatus, and inspecti...

Scan procedure generation systems and methods to generate scan proc...

Device and method for measuring the relative permeability of proppe...

Patents Applicationslast 30 patents

INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD

X-RAY INSPECTION APPARATUS

SPECTROMETER

DETERMINATION OF MATERIAL

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

Stack Cell for Easy Confirmation of Separator Folding, Separator In...

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

PATTERNED X-RAY EMITTING TARGET

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

Material Detection in X-Ray Security Screening

X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...

DEUTERATED INDOLE HEPTAMETHINE CYANINE DYES

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

CT SCANNER CALIBRATION

X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM

Simulating Dissolution of Scale in Wells

LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW-TEMPE...

DEVICE AND METHOD FOR MEASURING THE RELATIVE PERMEABILITY OF PROPPE...

Calibration Method and Device Therefor

Method and System for Determining the Location of Artefacts and/or...

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

Systems and Method for Constraining 3D Fracture Model Properties Us...

A SCREENING SYSTEM

SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...

SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...