Investigating materials by wave or particle radiation

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N2223/00Investigating materials by wave or particle radiation

G01N2223/01by radioactivity, nuclear decay G01N2223/03by transmission G01N2223/04and measuring absorption G01N2223/041X-ray absorption fine structure [EXAFS] G01N2223/043gamma ray resonance absorption (Mossbauer effect) G01N2223/045combination of at least 2 measurements (transmission and scatter) G01N2223/05by diffraction, scatter or reflection G01N2223/051correcting for scatter G01N2223/052reflection G01N2223/053back scatter G01N2223/054small angle scatter G01N2223/055scatter raster collimator G01N2223/056diffraction G01N2223/0561diffraction cameras G01N2223/0563measure of energy-dispersion spectrum of diffracted radiation G01N2223/0565diffraction of electrons G01N2223/0566analysing diffraction pattern G01N2223/0568spectro-diffractometry G01N2223/063inelastic scatter G01N2223/064interference of radiation G01N2223/07secondary emission G01N2223/071combination of measurements, at least 1 secondary emission G01N2223/072combination of measurements, 2 kinds of secondary emission G01N2223/073use of a laser G01N2223/074activation analysis G01N2223/0745neutron-gamma activation analysis G01N2223/076X-ray fluorescence G01N2223/0763Compton background correcting G01N2223/0766X-ray fluorescence with indicator, tags G01N2223/079incident electron beam and measuring excited X-rays G01N2223/08incident electron beam and measuring cathode luminescence (U.V.) G01N2223/081incident ion beam G01N2223/0813incident ion beam and measuring X-rays [PIXE] G01N2223/0816incident ion beam and measuring secondary ion beam [SIMS] G01N2223/084photo-electric effect G01N2223/085photo-electron spectrum [ESCA, XPS] G01N2223/086Auger electrons G01N2223/09exo-electron emission G01N2223/095tribo-emission G01N2223/10Different kinds of radiation or particles G01N2223/1003monochromatic G01N2223/1006different radiations G01N2223/101electromagnetic radiation G01N2223/1013gamma G01N2223/1016X-ray G01N2223/102beta or electrons G01N2223/104ions G01N2223/1045alpha G01N2223/105molecular or atomic beams G01N2223/106neutrons G01N2223/1063fast G01N2223/1066thermal G01N2223/107protons G01N2223/108positrons electron-positron annihilation G01N2223/11neutrino G01N2223/20Sources of radiation G01N2223/201betatron G01N2223/202isotopes G01N2223/203synchrotron G01N2223/204source created from radiated target G01N2223/205natural source G01N2223/206sources operating at different energy levels G01N2223/30Accessories, mechanical or electrical features G01N2223/301portable apparatus G01N2223/302comparative arrangements G01N2223/303calibrating, standardising G01N2223/3032periodic calibration G01N2223/3035phantom G01N2223/3037standards (constitution) G01N2223/304electric circuits, signal processing G01N2223/305computer simulations G01N2223/306computer control G01N2223/307cuvettes-sample holders G01N2223/3075correcting for the properties of the container G01N2223/308support of radiation source G01N2223/309support of sample holder G01N2223/31temperature control G01N2223/3103cooling, cryostats G01N2223/3106heating, furnaces G01N2223/311high pressure testing, anvil cells G01N2223/312powder preparation G01N2223/313filters, rotating filter disc G01N2223/314chopper G01N2223/315monochromators G01N2223/316collimators G01N2223/317windows G01N2223/318protective films G01N2223/319using opaque penetrant medium G01N2223/32adjustments of elements during operation G01N2223/321manipulator for positioning a part G01N2223/322immerged detecting head G01N2223/323irradiation range monitor G01N2223/33scanning G01N2223/3301beam is modified for scan G01N2223/3302object and detector fixed G01N2223/3303object fixed source and detector move G01N2223/3304helicoidal scan G01N2223/3305detector fixed source and body moving G01N2223/3306object rotates G01N2223/3307source and detector fixed object moves G01N2223/3308object translates G01N2223/331rocking curve analysis G01N2223/335electronic scanning G01N2223/34sensing means for gap between source and detector G01N2223/345mathematical transformations on beams or signals G01N2223/348ellipsoidal collector G01N2223/351prohibiting charge accumulation on sample substrate G01N2223/40Imaging G01N2223/401image processing G01N2223/402mapping distribution of elements G01N2223/403mapping with false colours G01N2223/404contrast medium G01N2223/405mapping of a material property G01N2223/406fluoroscopic image G01N2223/407stimulable phosphor sheet G01N2223/408display on monitor G01N2223/409embedding or impregnating the object G01N2223/41imaging specifically internal structure G01N2223/411tv imaging from fluorescent screen G01N2223/412use of image converter tube [PMT] G01N2223/413sensor array [CCD] G01N2223/414stereoscopic system G01N2223/415radiographic film G01N2223/416wrap around G01N2223/417recording with co-ordinate markings G01N2223/418electron microscope G01N2223/419computed tomograph G01N2223/42image digitised, -enhanced in an image processor G01N2223/421digitised image, analysed in real time (recognition algorithms) G01N2223/422windows within the image G01N2223/423multispectral imaging-multiple energy imaging G01N2223/424energy substraction image processing (dual energy processing) G01N2223/425temporal (time difference) substraction processing G01N2223/426image comparing, unknown with known substance G01N2223/427stepped imaging (selected area of sample is changed) G01N2223/50Detectors G01N2223/501array G01N2223/5015linear array G01N2223/502ionisation chamber G01N2223/503auxiliary reference detector G01N2223/504pin-diode G01N2223/505scintillation G01N2223/5055scintillation crystal coupled to PMT G01N2223/506time-of-flight G01N2223/507secondary-emission detector G01N2223/508photo-acoustic G01N2223/509infra-red G01N2223/60Specific applications or type of materials G01N2223/601density profile G01N2223/602crystal growth G01N2223/603superlattices G01N2223/604monocrystal G01N2223/605phases G01N2223/606texture G01N2223/607strain G01N2223/608supraconductors G01N2223/61thin films, coatings G01N2223/611patterned objects electronic devices G01N2223/6113printed circuit board [PCB] G01N2223/6116semiconductor wafer G01N2223/612biological material G01N2223/6123bone mineral G01N2223/6126tissue G01N2223/613moisture G01N2223/614road surface G01N2223/615composite materials, multilayer laminates G01N2223/616earth materials G01N2223/617ash in coal G01N2223/618food G01N2223/619wood G01N2223/62powders G01N2223/621tobacco G01N2223/622paper G01N2223/623plastics G01N2223/624steel, castings G01N2223/625nuclear fuels, laser imploded targets G01N2223/626radioactive material G01N2223/6265sample with radioactive tracer, tag, label G01N2223/627tyres G01N2223/628tubes, pipes G01N2223/629welds, bonds, sealing compounds G01N2223/63turbine blades G01N2223/631large structures, walls G01N2223/632residual life, life expectancy G01N2223/633thickness, density, surface weight (unit area) G01N2223/634wear behaviour, roughness G01N2223/635fluids, granulates G01N2223/636fluid sample with radioactive sources G01N2223/637liquid G01N2223/638gas G01N2223/639material in a container G01N2223/64multiple-sample chamber, multiplicity of materials G01N2223/641particle sizing G01N2223/642moving sheet, web G01N2223/6425correcting for web flutter G01N2223/643object on conveyor G01N2223/645quality control G01N2223/646flaws, defects G01N2223/6462microdefects G01N2223/6464radioactive substance into defect site G01N2223/6466flaws comparing to predetermined standards G01N2223/6468at different temperatures G01N2223/647leak detection G01N2223/648voids G01N2223/649porosity G01N2223/65cavitation pits G01N2223/651dust G01N2223/652impurities, foreign matter, trace amounts G01N2223/66multiple steps inspection