and measuring cathodoluminescence

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CPC
G01N23/2254

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/2254and measuring cathodoluminescence

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for projecting an array of multiple charged pa...
- Patent number 12,123,841
- Issue date Oct 22, 2024
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for quantitatively analyzing reservoir formation of ultra-de...
- Patent number 11,921,099
- Issue date Mar 5, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Fei Huo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Dislocation type and density discrimination in semiconductor materi...
- Patent number 11,782,001
- Issue date Oct 10, 2023
- ATTOLIGHT AG
- Marc Fouchier
- G01 - MEASURING TESTING
Information Patent Grant
Electric conductivity-measuring material, electric conductivity-mea...
- Patent number 11,698,399
- Issue date Jul 11, 2023
- National Institute of Advanced Industrial Science and Technology
- Nao Terasaki
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,519,871
- Issue date Dec 6, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 11,488,800
- Issue date Nov 1, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoscale optical tomography with cathodoluminescence spectroscopy
- Patent number 10,551,330
- Issue date Feb 4, 2020
- The Board of Trustees of the Leland Stanford Junior University
- Ashwin C. Atre
- G01 - MEASURING TESTING
Information Patent Grant
Object preparation device and particle beam device having an object...
- Patent number 10,483,084
- Issue date Nov 19, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for spectroscopic analysis
- Patent number 10,436,712
- Issue date Oct 8, 2019
- Carl Zeiss Microscopy GmbH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Grant
Object preparation device and particle beam device with an object p...
- Patent number 10,319,561
- Issue date Jun 11, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathodoluminescence-activated nanoscale imaging
- Patent number 10,161,890
- Issue date Dec 25, 2018
- The Regents of the University of California
- Naomi Ginsberg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for cathodoluminescence-based semiconductor wafer...
- Patent number 10,018,579
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Sameet K. Shriyan
- G01 - MEASURING TESTING
Information Patent Grant
Method of checking forsterite, apparatus that evaluates forsterite,...
- Patent number 9,939,382
- Issue date Apr 10, 2018
- JFE Steel Corporation
- Masayasu Nagoshi
- C21 - METALLURGY OF IRON
Information Patent Grant
Devices and methods for spectroscopic analysis
- Patent number 9,927,361
- Issue date Mar 27, 2018
- Carl Zeiss Microscopy GmbH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating semiconductor substrate
- Patent number 9,748,151
- Issue date Aug 29, 2017
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect observation method and defect observation device
- Patent number 9,569,836
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...
- Patent number 9,541,512
- Issue date Jan 10, 2017
- President and Fellows of Harvard College
- Ronald Walsworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing an object using a particle beam apparatus
- Patent number 9,535,020
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy GmbH
- Richard Schillinger
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable cathodoluminescence detection system and microscope empl...
- Patent number 9,228,962
- Issue date Jan 5, 2016
- Centre National de la Recherche
- Mathieu Kociak
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing a sample and charged particle beam device for a...
- Patent number 9,159,532
- Issue date Oct 13, 2015
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, image processing method
- Patent number 8,923,614
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Hideki Itai
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable cathodoluminescence detection system and microscope empl...
- Patent number 8,912,509
- Issue date Dec 16, 2014
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- G01 - MEASURING TESTING
Information Patent Grant
Deconvolution of time-gated cathodoluminescence images
- Patent number 8,674,320
- Issue date Mar 18, 2014
- Attolight SA
- Jean Berney
- G01 - MEASURING TESTING
Information Patent Grant
Detection device and particle beam device having a detection device
- Patent number 8,513,604
- Issue date Aug 20, 2013
- Carl Zeiss Microscopy GmbH
- Christian Thomas
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the time evolution of carriers p...
- Patent number 5,034,903
- Issue date Jul 23, 1991
- Robert R. Alfano
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for cathodoluminescence analysis
- Patent number 5,010,253
- Issue date Apr 23, 1991
- SIP-Societa' Italiana per l'Esercizio delle Telecomunicazioni P.A.
- Marco Braglia
- G01 - MEASURING TESTING
Information Patent Grant
Cathodoluminescence detector utilizing a hollow tube for directing...
- Patent number 4,900,932
- Issue date Feb 13, 1990
- Carl-Zeiss-Stiftung
- Norbert Schafer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Polishing State Analysis Prediction Program, Storage Device, Cathod...
- Publication number 20240217061
- Publication date Jul 4, 2024
- National University Corporation Nagaoka University of Technology
- Hideo Aida
- B24 - GRINDING POLISHING
Information Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
- Publication number 20240125718
- Publication date Apr 18, 2024
- Silanna UV Technologies Pte Ltd
- Petar Atanackovic
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTITATIVELY ANALYZING RESERVOIR FORMATION OF ULTRA-DE...
- Publication number 20240019414
- Publication date Jan 18, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Fei HUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
- Publication number 20230258587
- Publication date Aug 17, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Simon BURGESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PROJECTING AN ARRAY OF MULTIPLE CHARGED PA...
- Publication number 20230038465
- Publication date Feb 9, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20230035267
- Publication date Feb 2, 2023
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20220310353
- Publication date Sep 29, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISLOCATION TYPE AND DENSITY DISCRIMINATION IN SEMICONDUCTOR MATERI...
- Publication number 20220178854
- Publication date Jun 9, 2022
- ATTOLIGHT AG
- Marc Fouchier
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING SAMPLES WITH MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20200271598
- Publication date Aug 27, 2020
- ASML NETHERLANDS B.V.
- Kuo-Feng TSENG
- G01 - MEASURING TESTING
Information Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
- Publication number 20190103249
- Publication date Apr 4, 2019
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
- Publication number 20180286632
- Publication date Oct 4, 2018
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR SPECTROSCOPIC ANALYSIS
- Publication number 20180188175
- Publication date Jul 5, 2018
- CARL ZEISS MICROSCOPY GMBH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Application
CATHODOLUMINESCENCE-ACTIVATED NANOSCALE IMAGING
- Publication number 20180080885
- Publication date Mar 22, 2018
- The Regents of the University of California
- Naomi GINSBERG
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE OPTICAL TOMOGRAPHY WITH CATHODOLUMINESCENCE SPECTROSCOPY
- Publication number 20170052130
- Publication date Feb 23, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Ashwin C. Atre
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SEMICONDUCTOR SUBSTRATE
- Publication number 20160365293
- Publication date Dec 15, 2016
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi OHTSUKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS
- Publication number 20160178543
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Richard Schillinger
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE EMPL...
- Publication number 20150076364
- Publication date Mar 19, 2015
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR SPECTROSCOPIC ANALYSIS
- Publication number 20140339438
- Publication date Nov 20, 2014
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...
- Publication number 20140197310
- Publication date Jul 17, 2014
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Application
Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...
- Publication number 20140194314
- Publication date Jul 10, 2014
- President and Fellows of Harvard College
- Ronald Walsworth
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED P...
- Publication number 20140027632
- Publication date Jan 30, 2014
- GATAN, INC.
- David Stowe
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD
- Publication number 20130343649
- Publication date Dec 26, 2013
- Hitachi High-Technologies Corporation
- Hideki ITAI
- G01 - MEASURING TESTING
Information Patent Application
Deconvolution of Time-Gated Cathodoluminescence Images
- Publication number 20130193342
- Publication date Aug 1, 2013
- ATTOLIGHT SA
- Jean Berney
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE EMPL...
- Publication number 20130068966
- Publication date Mar 21, 2013
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- G01 - MEASURING TESTING
Information Patent Application
Detection device and particle beam device having a detection device
- Publication number 20110220793
- Publication date Sep 15, 2011
- Christian Thomas
- G01 - MEASURING TESTING

and measuring cathodoluminescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Apparatus and method for projecting an array of multiple charged pa...

Method for improving an EBSD/TKD map

Method for quantitatively analyzing reservoir formation of ultra-de...

Methods of inspecting samples with multiple beams of charged particles

Dislocation type and density discrimination in semiconductor materi...

Electric conductivity-measuring material, electric conductivity-mea...

Method of examining a sample using a charged particle microscope

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Nanoscale optical tomography with cathodoluminescence spectroscopy

Object preparation device and particle beam device having an object...

Devices and methods for spectroscopic analysis

Object preparation device and particle beam device with an object p...

Cathodoluminescence-activated nanoscale imaging

System and method for cathodoluminescence-based semiconductor wafer...

Method of checking forsterite, apparatus that evaluates forsterite,...

Devices and methods for spectroscopic analysis

Method for evaluating semiconductor substrate

Defect observation method and defect observation device

Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...

Analyzing an object using a particle beam apparatus

Adjustable cathodoluminescence detection system and microscope empl...

Method of analyzing a sample and charged particle beam device for a...

Image processing apparatus, image processing method

Adjustable cathodoluminescence detection system and microscope empl...

Deconvolution of time-gated cathodoluminescence images

Detection device and particle beam device having a detection device

Apparatus and method for measuring the time evolution of carriers p...

Detection system for cathodoluminescence analysis

Cathodoluminescence detector utilizing a hollow tube for directing...

Patents Applicationslast 30 patents

Polishing State Analysis Prediction Program, Storage Device, Cathod...

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

METHOD FOR QUANTITATIVELY ANALYZING RESERVOIR FORMATION OF ULTRA-DE...

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

APPARATUS AND METHOD FOR PROJECTING AN ARRAY OF MULTIPLE CHARGED PA...

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

DISLOCATION TYPE AND DENSITY DISCRIMINATION IN SEMICONDUCTOR MATERI...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHODS OF INSPECTING SAMPLES WITH MULTIPLE BEAMS OF CHARGED PARTICLES

OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...

OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...

DEVICES AND METHODS FOR SPECTROSCOPIC ANALYSIS

CATHODOLUMINESCENCE-ACTIVATED NANOSCALE IMAGING

NANOSCALE OPTICAL TOMOGRAPHY WITH CATHODOLUMINESCENCE SPECTROSCOPY

METHOD FOR EVALUATING SEMICONDUCTOR SUBSTRATE

ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS

ADJUSTABLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE EMPL...

DEVICES AND METHODS FOR SPECTROSCOPIC ANALYSIS

METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...

Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...

SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED P...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD

Deconvolution of Time-Gated Cathodoluminescence Images

ADJUSTABLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE EMPL...

Detection device and particle beam device having a detection device