and measuring secondary ion beam

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CPC
G01N23/2258

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2258and measuring secondary ion beam

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
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- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
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- Issue date Nov 5, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlative multimodal chemical imaging via machine learning
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- UT-Battelle, LLC
- Olga S. Ovchinnikova
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Information Patent Grant
Method and device for analysing SIMS mass spectrum data
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- Issue date Oct 10, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Patrick Philipp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Joint nanoscale three-dimensional imaging and chemical analysis
- Patent number 11,598,734
- Issue date Mar 7, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Tom Wirtz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High efficiency solar cell and method for manufacturing high effici...
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- Issue date Jan 10, 2023
- Shin-Etsu Chemical Co., Ltd.
- Hiroshi Hashigami
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
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- Issue date Aug 30, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam irradiation apparatus and control method
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- Issue date Aug 23, 2022
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- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
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Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
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- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method to qualify semiconductor st...
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- Issue date Jul 5, 2022
- Carl Zeiss SMT GmbH
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pan-sharpening for microscopy
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- Issue date Apr 26, 2022
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- Olga S. Ovchinnikova
- G01 - MEASURING TESTING
Information Patent Grant
Extraction system for charged secondary particles for use in a mass...
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- Issue date Aug 24, 2021
- Luxembourg Institute of Science and Technology (LIST)
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Information Patent Grant
High efficiency solar cell and method for manufacturing high effici...
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- Hiroshi Hashigami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pre-coated surfaces for imaging biomolecules
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- Issue date May 4, 2021
- Vanderbilt University
- Richard Caprioli
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detector and charged particle beam apparatus
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- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
SiC substrate evaluation method, SiC epitaxial wafer manufacturing...
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- Issue date Apr 13, 2021
- Showa Denko K.K.
- Shunsuke Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
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- Issue date Dec 29, 2020
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Extraction system for charged secondary particles for use in a mass...
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- Issue date Sep 8, 2020
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
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Information Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
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- Issue date Nov 19, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
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Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 10,446,383
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- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Method for multiplexed sample analysis by photoionizing secondary s...
- Patent number 10,408,814
- Issue date Sep 10, 2019
- The Board of Trustees ofthe Leland Stanford Junior University
- Robert M. Angelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass spectroscopic method, mass spectrometer and uses...
- Patent number 10,215,719
- Issue date Feb 26, 2019
- Ion-Tof Technologies GmbH
- Sven Kayser
- G01 - MEASURING TESTING
Information Patent Grant
Digital pore alteration methods and systems
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- Halliburton Energy Services, Inc.
- Joel Walls
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Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 10,114,004
- Issue date Oct 30, 2018
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for multiplexed sample analysis by photoionizing secondary s...
- Patent number 9,797,879
- Issue date Oct 24, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Robert M. Angelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for mass spectrometry
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- Issue date Aug 1, 2017
- TESCAN Brno, s.r.o.
- Libor Sedlacek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Float glass for chemical strengthening
- Patent number 9,714,193
- Issue date Jul 25, 2017
- Asahi Glass Company, Limited
- Yuichi Suzuki
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Susceptor
- Patent number 9,612,215
- Issue date Apr 4, 2017
- Toyo Tanso Co., Ltd.
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- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for a highly sensitive detection and quantification of biomo...
- Patent number 9,506,916
- Issue date Nov 29, 2016
- BioSIMS Technologies
- Camille Ripoll
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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- INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES
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- H01 - BASIC ELECTRIC ELEMENTS
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METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
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- Publication date Nov 7, 2024
- FEI Company
- Garrett Budnik
- G01 - MEASURING TESTING
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APPLICATION OF TOF-SIMS FOR ANALYSIS OF FORMATION FLUID SAMPLES AND...
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- G01 - MEASURING TESTING
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MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
- Publication number 20240090111
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- Ming Hong YANG
- H01 - BASIC ELECTRIC ELEMENTS
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SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
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- NOVA MEASURING INSTRUMENTS INC.
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Positive Electrode Active Material, and Positive Electrode and Lith...
- Publication number 20230387405
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- LG CHEM, LTD.
- Won Sig Jung
- H01 - BASIC ELECTRIC ELEMENTS
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METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
- Publication number 20230243767
- Publication date Aug 3, 2023
- FEI Company
- Garrett Budnik
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JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS
- Publication number 20230175993
- Publication date Jun 8, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
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SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
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NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20220404298
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- Ionwerks, Inc.
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INFORMATION PROCESSING APPARATUS AND CONTROL METHOD FOR INFORMATION...
- Publication number 20220252531
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- Canon Kabushiki Kaisha
- Akihiro Taya
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Highly Selective Chromatography-Molecular Rotational Resonance Spec...
- Publication number 20220196582
- Publication date Jun 23, 2022
- BrightSpec, Inc.
- Justin L. Neill
- G01 - MEASURING TESTING
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METHOD AND DEVICE FOR ANALYSING SIMS MASS SPECTRUM DATA
- Publication number 20220076935
- Publication date Mar 10, 2022
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Patrick Philipp
- H01 - BASIC ELECTRIC ELEMENTS
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CORRELATIVE MULTIMODAL CHEMICAL IMAGING VIA MACHINE LEARNING
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- Publication date Dec 9, 2021
- UT-Battelle, LLC
- Olga S. Ovchinnikova
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PAN-SHARPENING FOR MICROSCOPY
- Publication number 20210325428
- Publication date Oct 21, 2021
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G01 - MEASURING TESTING
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20210310970
- Publication date Oct 7, 2021
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
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JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS
- Publication number 20210302338
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- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
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PHOTOELECTRIC CONVERSION ELEMENT, PHOTOELECTRIC CONVERSION MODULE,...
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- RICOH COMPANY, LTD.
- Nozomu TAMOTO
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HIGH EFFICIENCY SOLAR CELL AND METHOD FOR MANUFACTURING HIGH EFFICI...
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- Hiroshi HASHIGAMI
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NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20210116402
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- Ionwerks, Inc.
- J. Albert Schultz
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INSPECTION SYSTEM AND INSPECTION METHOD TO QUALIFY SEMICONDUCTOR ST...
- Publication number 20210109046
- Publication date Apr 15, 2021
- Carl Zeiss SMT GMBH
- Brett Lewis
- H01 - BASIC ELECTRIC ELEMENTS
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CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
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SiC SUBSTRATE EVALUATION METHOD, SiC EPITAXIAL WAFER MANUFACTURING...
- Publication number 20200083123
- Publication date Mar 12, 2020
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- Shunsuke NOGUCHI
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HIGH EFFICIENCY SOLAR CELL AND METHOD FOR MANUFACTURING HIGH EFFICI...
- Publication number 20200058810
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- Shin-Etsu Chemical Co., Ltd.
- Hiroshi HASHIGAMI
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Extraction System For Charged Secondary Particles For Use In A Mass...
- Publication number 20200058480
- Publication date Feb 20, 2020
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- David Dowsett
- G01 - MEASURING TESTING
Information Patent Application
Extraction System For Charged Secondary Particles For Use In A Mass...
- Publication number 20200058481
- Publication date Feb 20, 2020
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- David Dowsett
- G01 - MEASURING TESTING
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CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190355549
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Shin IMAMURA
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SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20190339250
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- The Board of Trustees of the Leland Stanford Junior University
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SECONDARY ION MASS SPECTROSCOPIC METHOD, MASS SPECTROMETER AND USES...
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- ION-TOF TECHNOLOGIES GMBH
- Sven Kayser
- G01 - MEASURING TESTING

and measuring secondary ion beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and approaches for semiconductor metrology and surface anal...

Single cell analysis using secondary ion mass spectrometry

Correlative multimodal chemical imaging via machine learning

Method and device for analysing SIMS mass spectrum data

Systems and approaches for semiconductor metrology and surface anal...

Joint nanoscale three-dimensional imaging and chemical analysis

High efficiency solar cell and method for manufacturing high effici...

Systems and approaches for semiconductor metrology and surface anal...

Charged particle beam irradiation apparatus and control method

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Inspection system and inspection method to qualify semiconductor st...

Pan-sharpening for microscopy

Extraction system for charged secondary particles for use in a mass...

High efficiency solar cell and method for manufacturing high effici...

Pre-coated surfaces for imaging biomolecules

Charged particle detector and charged particle beam apparatus

SiC substrate evaluation method, SiC epitaxial wafer manufacturing...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Extraction system for charged secondary particles for use in a mass...

Method for characterizing a sample combining an X-ray characterizat...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Method for multiplexed sample analysis by photoionizing secondary s...

Secondary ion mass spectroscopic method, mass spectrometer and uses...

Digital pore alteration methods and systems

Single cell analysis using secondary ion mass spectrometry

Method for multiplexed sample analysis by photoionizing secondary s...

Device for mass spectrometry

Float glass for chemical strengthening

Susceptor

Method for a highly sensitive detection and quantification of biomo...

Patents Applicationslast 30 patents

MEASUREMENT OF LATERAL DOPANT CONCENTRATION AND DISTRIBUTION IN HIG...

METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

APPLICATION OF TOF-SIMS FOR ANALYSIS OF FORMATION FLUID SAMPLES AND...

MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

Positive Electrode Active Material, and Positive Electrode and Lith...

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

INFORMATION PROCESSING APPARATUS AND CONTROL METHOD FOR INFORMATION...

Highly Selective Chromatography-Molecular Rotational Resonance Spec...

METHOD AND DEVICE FOR ANALYSING SIMS MASS SPECTRUM DATA

CORRELATIVE MULTIMODAL CHEMICAL IMAGING VIA MACHINE LEARNING

PAN-SHARPENING FOR MICROSCOPY

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS

PHOTOELECTRIC CONVERSION ELEMENT, PHOTOELECTRIC CONVERSION MODULE,...

HIGH EFFICIENCY SOLAR CELL AND METHOD FOR MANUFACTURING HIGH EFFICI...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

INSPECTION SYSTEM AND INSPECTION METHOD TO QUALIFY SEMICONDUCTOR ST...

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

SiC SUBSTRATE EVALUATION METHOD, SiC EPITAXIAL WAFER MANUFACTURING...

HIGH EFFICIENCY SOLAR CELL AND METHOD FOR MANUFACTURING HIGH EFFICI...

Extraction System For Charged Secondary Particles For Use In A Mass...

Extraction System For Charged Secondary Particles For Use In A Mass...

CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

SECONDARY ION MASS SPECTROSCOPIC METHOD, MASS SPECTROMETER AND USES...