and measuring the absorption

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CPC
G01N23/06

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/06and measuring the absorption

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Methods for correlative microscopy
- Patent number 12,123,047
- Issue date Oct 22, 2024
- Leica Mikrosysteme GmbH
- Julia König
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Airfoil tip cleaning and assessment systems and methods
- Patent number 12,044,632
- Issue date Jul 23, 2024
- RTX Corporation
- Christopher James Pelliccione
- G08 - SIGNALLING
Information Patent Grant
Systems and methods for monitoring slope stability
- Patent number 11,971,373
- Issue date Apr 30, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Grant
Distributed ledger for physical material
- Patent number 11,946,870
- Issue date Apr 2, 2024
- MAT International Holdings, LLC
- Catherine E. McManus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluation of resin alloy
- Patent number 11,933,741
- Issue date Mar 19, 2024
- LG Chem, Ltd.
- Narae Cho
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing property characteristic of transmission s...
- Patent number 11,933,744
- Issue date Mar 19, 2024
- China Institute of Atomic Energy
- Zhongqi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Fluid level and composition sensor
- Patent number 11,796,376
- Issue date Oct 24, 2023
- Tigmill Technologies, LLC
- Bobby David Strong
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and control method thereof
- Patent number 11,742,172
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
- Patent number 11,730,434
- Issue date Aug 22, 2023
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sealing integrity evaluation device for high-temperature and high-...
- Patent number 11,733,121
- Issue date Aug 22, 2023
- Southwest Petroleum University
- Zhi Zhang
- E21 - EARTH DRILLING MINING
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,714,053
- Issue date Aug 1, 2023
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method for scanning a sample by a charged particle beam system
- Patent number 11,658,004
- Issue date May 23, 2023
- ASML Netherlands B.V.
- Adam Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector and radiographic imaging device
- Patent number 11,624,716
- Issue date Apr 11, 2023
- FUJIFILM Corporation
- Shinichi Ushikura
- G01 - MEASURING TESTING
Information Patent Grant
Qualification process for cryo-electron microscopy samples as well...
- Patent number 11,609,171
- Issue date Mar 21, 2023
- Xtal Concepts GmbH
- Annette Eckhardt
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and analyzing method thereof
- Patent number 11,555,779
- Issue date Jan 17, 2023
- Electronics and Telecommunications Research Institute
- Moon Youn Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing sample for thin film property measurement...
- Patent number 11,543,376
- Issue date Jan 3, 2023
- Seoul National University R&DB Foundation
- Ki-Bum Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, systems, and computer program products for determining a p...
- Patent number 11,531,019
- Issue date Dec 20, 2022
- Troxler Electronic Laboratories, Inc.
- Robert Ernest Troxler
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method and apparatus comprising a buoyancy material and a...
- Patent number 11,474,053
- Issue date Oct 18, 2022
- Johnson Matthey Public Limited Company
- Christopher Bowdon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Metrology method and system
- Patent number 11,450,541
- Issue date Sep 20, 2022
- Nova Ltd.
- Vladimir Machavariani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and devices for determining metrology sites
- Patent number 11,436,506
- Issue date Sep 6, 2022
- Carl Zeiss SMT GmbH
- Abhilash Srikantha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Environment information collecting system and aircraft
- Patent number 11,429,104
- Issue date Aug 30, 2022
- Yokogawa Electric Corporation
- Koichi Taniguchi
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Scanning method and apparatus comprising a buoyancy material for sc...
- Patent number 11,402,339
- Issue date Aug 2, 2022
- Johnson Matthey Public Limited Company
- Christopher Bowdon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation detector, radiation inspecting device, and method for pro...
- Patent number 11,402,517
- Issue date Aug 2, 2022
- Nihon Kessho Kogaku Co., Ltd.
- Makoto Otake
- G01 - MEASURING TESTING
Information Patent Grant
Thermally guided chemical etching of a substrate and real-time moni...
- Patent number 11,313,813
- Issue date Apr 26, 2022
- Momentum Optics LLC
- Jeremy Goeckeritz
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Nuclear gauges and methods of configuration and calibration of nucl...
- Patent number 11,313,983
- Issue date Apr 26, 2022
- Troxler Electronic Laboratories, Inc.
- Robert Ernest Troxler
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Radiation detector
- Patent number 11,313,812
- Issue date Apr 26, 2022
- Konica Minolta, Inc.
- Junichiro Otaki
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measuring the density of material including...
- Patent number 11,307,154
- Issue date Apr 19, 2022
- Troxler Electronic Laboratories, Inc.
- Robert Ernest Troxler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,280,748
- Issue date Mar 22, 2022
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Charged particle beam device, method for processing sample, and obs...
- Patent number 11,268,915
- Issue date Mar 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,243,327
- Issue date Feb 8, 2022
- Southern Innovation International Pty Ltd
- Paul Scoullar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESS AND APPARATUS FOR CHECKING A GAS MEASURING DEVICE
- Publication number 20240418657
- Publication date Dec 19, 2024
- Drager Safety AG & Co. KGaA
- Sebastian DRAACK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY
- Publication number 20240410842
- Publication date Dec 12, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Application
RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE
- Publication number 20240379258
- Publication date Nov 14, 2024
- Nuctech Company Limited
- Yaohong LIU
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...
- Publication number 20240337610
- Publication date Oct 10, 2024
- FEI Company
- Wouter René J. Van den Broek
- G01 - MEASURING TESTING
Information Patent Application
BIOMATERIAL DETECTION SENSOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240280513
- Publication date Aug 22, 2024
- Samsung Electronics Co., Ltd.
- Jae Hong LEE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Detectors For Microscopy
- Publication number 20240242929
- Publication date Jul 18, 2024
- FEI Company
- Luigi Mele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam System
- Publication number 20240186108
- Publication date Jun 6, 2024
- Hitachi High-Tech Corporation
- Hirokazu TAMAKI
- G01 - MEASURING TESTING
Information Patent Application
OFF LINE QUALITY CONTROL OF A BEAM SHAPING DEVICE FOR RADIATION THE...
- Publication number 20240068963
- Publication date Feb 29, 2024
- ION BEAM APPLICATIONS
- Lucian HOTOIU
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORM...
- Publication number 20240035988
- Publication date Feb 1, 2024
- BEIJING UNIVERSITY OF TECHNOLOGY
- Lihua Wang
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE
- Publication number 20240003833
- Publication date Jan 4, 2024
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Application
WIDE RANGE MULTI-PHASE FLOW METER
- Publication number 20230417583
- Publication date Dec 28, 2023
- Saudi Arabian Oil Company
- Salman D. Gamber
- E21 - EARTH DRILLING MINING
Information Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
- Publication number 20230404499
- Publication date Dec 21, 2023
- HOLOGIC, INC.
- Kenneth DEFREITAS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
AIRFOIL TIP CLEANING AND ASSESSMENT SYSTEMS AND METHODS
- Publication number 20230366835
- Publication date Nov 16, 2023
- Raytheon Technologies Corporation
- Ron I. PRIHAR
- G08 - SIGNALLING
Information Patent Application
RADIATION DETECTOR, RADIATION IMAGING SYSTEM, RADIATION IMAGE PROCE...
- Publication number 20230341568
- Publication date Oct 26, 2023
- Canon Kabushiki Kaisha
- ZEMPEI WADA
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM
- Publication number 20230296639
- Publication date Sep 21, 2023
- FEI Company
- Vojtech DOLEZAL
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
RADIATION IMAGING APPARATUS, IMAGE PROCESSING APPARATUS, OPERATION...
- Publication number 20230204522
- Publication date Jun 29, 2023
- Canon Kabushiki Kaisha
- Takashi Takasaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CALIBRATION SAMPLE SET AND METHOD FOR LI-ION BATTERY GAUGING SYSTEMS
- Publication number 20230184698
- Publication date Jun 15, 2023
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander BRITTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTER-IMPLEMENTED METHOD FOR MONITORING THE STATUS OF A DEVICE F...
- Publication number 20230175988
- Publication date Jun 8, 2023
- VOLUME GRAPHICS GMBH
- Sven GONDROM-LINKE
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20230160841
- Publication date May 25, 2023
- SAKI CORPORATION
- Yosuke YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING APPARATUS
- Publication number 20230160839
- Publication date May 25, 2023
- Canon Kabushiki Kaisha
- Hiroaki Niwa
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR DETERMINING A P...
- Publication number 20230094204
- Publication date Mar 30, 2023
- TROXLER ELECTRONIC LABORATORIES, INC.
- Robert Ernest Troxler
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND SYSTEM
- Publication number 20230074398
- Publication date Mar 9, 2023
- NOVA LTD
- VLADIMIR MACHAVARIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CORRELATIVE MICROSCOPY
- Publication number 20220403440
- Publication date Dec 22, 2022
- Leica Mikrosysteme GmbH
- Julia KÖNIG
- G01 - MEASURING TESTING
Information Patent Application
FIBER OPTICS PLATE, SCINTILLATOR PANEL, RADIATION DETECTOR, ELECTRO...
- Publication number 20220340480
- Publication date Oct 27, 2022
- Hamamatsu Photonics K.K.
- Tomoyuki NAKAYAMA
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
SCANNING SYSTEM AND METHOD FOR SCANNING VESSELS
- Publication number 20220334037
- Publication date Oct 20, 2022
- JOHNSON MATTHEY PUBLIC LIMITED COMPANY
- Owen John Lloyd JONES
- G05 - CONTROLLING REGULATING
Information Patent Application
RADIATION IMAGING SYSTEM AND CONTROL APPARATUS
- Publication number 20220276183
- Publication date Sep 1, 2022
- Canon Kabushiki Kaisha
- Eriko Sato
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY GUIDED CHEMICAL ETCHING OF A SUBSTRATE AND REAL-TIME MONI...
- Publication number 20220252529
- Publication date Aug 11, 2022
- Momentum Optics LLC
- Jeremy Goeckeritz
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
Scanning Method And Apparatus Comprising A Buoyancy Material For Sc...
- Publication number 20220244198
- Publication date Aug 4, 2022
- Johnson Matthey Public Limited Company
- Christopher Bowdon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

and measuring the absorption

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods for correlative microscopy

Airfoil tip cleaning and assessment systems and methods

Systems and methods for monitoring slope stability

Distributed ledger for physical material

Method for evaluation of resin alloy

Method for characterizing property characteristic of transmission s...

Fluid level and composition sensor

Charged particle beam device and control method thereof

Specimen radiography system comprising cabinet and a specimen drawe...

Sealing integrity evaluation device for high-temperature and high-...

Conveyor system and measuring device for determining water content...

Method for scanning a sample by a charged particle beam system

Radiation detector and radiographic imaging device

Qualification process for cryo-electron microscopy samples as well...

Sample analyzer and analyzing method thereof

Method for manufacturing sample for thin film property measurement...

Methods, systems, and computer program products for determining a p...

Scanning method and apparatus comprising a buoyancy material and a...

Metrology method and system

Method and devices for determining metrology sites

Environment information collecting system and aircraft

Scanning method and apparatus comprising a buoyancy material for sc...

Radiation detector, radiation inspecting device, and method for pro...

Thermally guided chemical etching of a substrate and real-time moni...

Nuclear gauges and methods of configuration and calibration of nucl...

Radiation detector

Methods and systems for measuring the density of material including...

Conveyor system and measuring device for determining water content...

Charged particle beam device, method for processing sample, and obs...

System and method for material characterization

Patents Applicationslast 30 patents

PROCESS AND APPARATUS FOR CHECKING A GAS MEASURING DEVICE

SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY

RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE

RAY SCANNING APPARATUS

AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...

BIOMATERIAL DETECTION SENSOR AND METHOD OF MANUFACTURING THE SAME

Detectors For Microscopy

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

Charged Particle Beam System

OFF LINE QUALITY CONTROL OF A BEAM SHAPING DEVICE FOR RADIATION THE...

DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORM...

METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE

WIDE RANGE MULTI-PHASE FLOW METER

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...

AIRFOIL TIP CLEANING AND ASSESSMENT SYSTEMS AND METHODS

RADIATION DETECTOR, RADIATION IMAGING SYSTEM, RADIATION IMAGE PROCE...

CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM

RADIATION IMAGING APPARATUS, IMAGE PROCESSING APPARATUS, OPERATION...

CALIBRATION SAMPLE SET AND METHOD FOR LI-ION BATTERY GAUGING SYSTEMS

COMPUTER-IMPLEMENTED METHOD FOR MONITORING THE STATUS OF A DEVICE F...

INSPECTION DEVICE

RADIATION IMAGING APPARATUS

METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR DETERMINING A P...

METROLOGY METHOD AND SYSTEM

METHODS FOR CORRELATIVE MICROSCOPY

FIBER OPTICS PLATE, SCINTILLATOR PANEL, RADIATION DETECTOR, ELECTRO...

SCANNING SYSTEM AND METHOD FOR SCANNING VESSELS

RADIATION IMAGING SYSTEM AND CONTROL APPARATUS

THERMALLY GUIDED CHEMICAL ETCHING OF A SUBSTRATE AND REAL-TIME MONI...

Scanning Method And Apparatus Comprising A Buoyancy Material For Sc...