and measuring X-rays excited from incident proton beam

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CPC
G01N23/2257

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/2257and measuring X-rays excited from incident proton beam

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Patents Grantslast 30 patents

Information Patent Grant
Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...
- Patent number 12,061,159
- Issue date Aug 13, 2024
- FEI Company
- Daniel Totonjian
- G01 - MEASURING TESTING
Information Patent Grant
System and method of preparing integrated circuits for backside pro...
- Patent number 11,605,525
- Issue date Mar 14, 2023
- FEI Company
- James Vickers
- G01 - MEASURING TESTING
Information Patent Grant
MeV-based ion beam analysis apparatus
- Patent number 11,255,803
- Issue date Feb 22, 2022
- Forschungszentrum Juelich GmbH
- Soeren Moeller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for analysis of objects
- Patent number 10,705,036
- Issue date Jul 7, 2020
- Universita Della Calabria
- Patrizio Antici
- G01 - MEASURING TESTING
Information Patent Grant
Composition analysis method and composition analysis system
- Patent number 10,422,758
- Issue date Sep 24, 2019
- TOSHIBA MEMORY CORPORATION
- Shiro Takeno
- G01 - MEASURING TESTING
Information Patent Grant
Material characterization using ion channeling imaging
- Patent number 9,983,152
- Issue date May 29, 2018
- FEI Company
- Steven Randolph
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle microscope with improved spectroscopic functionality
- Patent number 9,812,287
- Issue date Nov 7, 2017
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray detector including integrated electron detector
- Patent number 9,341,585
- Issue date May 17, 2016
- Pulsetor, LLC
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Grant
Electron detector including an intimately-coupled scintillator-phot...
- Patent number 8,729,471
- Issue date May 20, 2014
- Pulsetor, LLC
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Grant
Bulk material analyser for on-conveyor belt analysis
- Patent number 6,362,477
- Issue date Mar 26, 2002
- Commonwealth Scientific and Industrial Research Organisation
- Brian Sowerby
- G01 - MEASURING TESTING
Information Patent Grant
X-ray radiography with highly charged ions
- Patent number 6,115,452
- Issue date Sep 5, 2000
- The Regents of the University of California
- Roscoe E. Marrs
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Thin film forming apparatus
- Patent number 5,305,366
- Issue date Apr 19, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Takehiko Nakahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Magnetic Deflector and Methods of Use Thereof
- Publication number 20240418662
- Publication date Dec 19, 2024
- University of North Texas
- Gary Alan Glass
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20230341341
- Publication date Oct 26, 2023
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
1 MEV TO 3 MEV DEUTERON/PROTON CYCLOTRON FOR MATERIAL ANALYSIS
- Publication number 20230204528
- Publication date Jun 29, 2023
- Best Theratronics Ltd.
- Richard Johnson
- G01 - MEASURING TESTING
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20210098228
- Publication date Apr 1, 2021
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEV-BASED ION BEAM ANALYSIS APPARATUS
- Publication number 20210080412
- Publication date Mar 18, 2021
- FORSCHUNGSZENTRUM JUELICH GMBH
- Soeren Moeller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190287762
- Publication date Sep 19, 2019
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ANALYSIS OF OBJECTS
- Publication number 20180209925
- Publication date Jul 26, 2018
- Institut National de la Recherche Scientifique
- PATRIZIO ANTICI
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL CHARACTERIZATION USING ION CHANNELING IMAGING
- Publication number 20180136147
- Publication date May 17, 2018
- FEI Company
- Steven Randolph
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITION ANALYSIS METHOD AND COMPOSITION ANALYSIS SYSTEM
- Publication number 20180080886
- Publication date Mar 22, 2018
- Kabushiki Kaisha Toshiba
- Shiro TAKENO
- G01 - MEASURING TESTING
Information Patent Application
X-ray detector including integrated electron detector
- Publication number 20140042316
- Publication date Feb 13, 2014
- PulseTor, LLC.
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DETECTOR INCLUDING AN INTIMATELY-COUPLED SCINTILLATOR-PHO...
- Publication number 20120025074
- Publication date Feb 2, 2012
- PulseTor, LLC.
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Analyzing Samples Using Particle Irradition
- Publication number 20070274455
- Publication date Nov 29, 2007
- The Board of Regents of the University of Texas System
- Constantine Tarawneh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring wall thickness of a vessel
- Publication number 20050254614
- Publication date Nov 17, 2005
- Kevin Scott McKinny
- G01 - MEASURING TESTING

and measuring X-rays excited from incident proton beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...

System and method of preparing integrated circuits for backside pro...

MeV-based ion beam analysis apparatus

Method and system for analysis of objects

Composition analysis method and composition analysis system

Material characterization using ion channeling imaging

Charged particle microscope with improved spectroscopic functionality

X-ray detector including integrated electron detector

Electron detector including an intimately-coupled scintillator-phot...

Bulk material analyser for on-conveyor belt analysis

X-ray radiography with highly charged ions

Thin film forming apparatus

Patents Applicationslast 30 patents

Magnetic Deflector and Methods of Use Thereof

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

1 MEV TO 3 MEV DEUTERON/PROTON CYCLOTRON FOR MATERIAL ANALYSIS

System and method of preparing integrated circuits for backside pro...

MEV-BASED ION BEAM ANALYSIS APPARATUS

System and method of preparing integrated circuits for backside pro...

METHOD AND SYSTEM FOR ANALYSIS OF OBJECTS

MATERIAL CHARACTERIZATION USING ION CHANNELING IMAGING

COMPOSITION ANALYSIS METHOD AND COMPOSITION ANALYSIS SYSTEM

X-ray detector including integrated electron detector

ELECTRON DETECTOR INCLUDING AN INTIMATELY-COUPLED SCINTILLATOR-PHO...

Methods and Systems for Analyzing Samples Using Particle Irradition

Method and apparatus for measuring wall thickness of a vessel