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G01N2021/3527
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/3527
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Patents Grants
last 30 patents
Information
Patent Grant
Optical analysis device, optical analysis method, and optical analysis
Patent number
11,099,128
Issue date
Aug 24, 2021
Hitachi, Ltd.
Shunsuke Kono
G01 - MEASURING TESTING
Information
Patent Grant
Crossed biased filtering NDIR gas sensing methodology
Patent number
8,143,580
Issue date
Mar 27, 2012
Jacob Y. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Saturation filtering NDIR gas sensing methodology
Patent number
8,003,944
Issue date
Aug 23, 2011
Airware, Inc.
Jacob Y. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Optical path structure for open path emissions sensing with particu...
Patent number
6,900,893
Issue date
May 31, 2005
SPX Corporation
Theresa A. Foley
G01 - MEASURING TESTING
Information
Patent Grant
Optical path structure for open path emissions sensing with opposed...
Patent number
6,833,922
Issue date
Dec 21, 2004
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Grant
Optical path structure for open path emissions sensing
Patent number
6,744,516
Issue date
Jun 1, 2004
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Grant
Optical path structure for open path emissions sensing with spinnin...
Patent number
6,744,059
Issue date
Jun 1, 2004
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Grant
Optical path structure for open path emissions sensing with spinnin...
Patent number
6,723,990
Issue date
Apr 20, 2004
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Grant
2806957
Patent number
2,806,957
Issue date
Sep 17, 1957
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
GAS SUPPLY AND DISCHARGE ADAPTER AND GAS DETECTION DEVICE
Publication number
20220291116
Publication date
Sep 15, 2022
KYOCERA CORPORATION
Daisuke UEYAMA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND OPTICAL ANALYSIS
Publication number
20200124526
Publication date
Apr 23, 2020
Hitachi, Ltd
Shunsuke KONO
G01 - MEASURING TESTING
Information
Patent Application
Saturation Filtering NDIR Gas Sensing Methodology
Publication number
20100258728
Publication date
Oct 14, 2010
AIRWARE
Jacob Y. Wong
G01 - MEASURING TESTING
Information
Patent Application
Optical path structure for open path emissions sensing with opposed...
Publication number
20030063283
Publication date
Apr 3, 2003
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Application
Optical path structure for open path emissions sensing with particu...
Publication number
20030058451
Publication date
Mar 27, 2003
SPX Corporation
Theresa A. Foley
G01 - MEASURING TESTING
Information
Patent Application
Optical path structure for open path emissions sensing with spinnin...
Publication number
20030057373
Publication date
Mar 27, 2003
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Application
Optical path structure for open path emissions sensing with spinnin...
Publication number
20030057383
Publication date
Mar 27, 2003
SPX Corporation
John DiDomenico
G01 - MEASURING TESTING
Information
Patent Application
Optical path structure for open path emissions sensing
Publication number
20030043378
Publication date
Mar 6, 2003
John DiDomenico
G01 - MEASURING TESTING