APC advanced process control applications

Industry

CPC
G05B2219/32135

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Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32135APC advanced process control applications

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Dispatch system and dispatch method for manufacturing mold
- Patent number 11,872,725
- Issue date Jan 16, 2024
- ZHONG CHUAN TECHNOLOGY LIMITED
- Yu-Pau Lin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Use of an advanced multivariable controller to control alphabutol u...
- Patent number 10,377,681
- Issue date Aug 13, 2019
- Axens
- Jean-Marc Bader
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor fabrication component retuning
- Patent number 9,323,244
- Issue date Apr 26, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Keung Hui
- G05 - CONTROLLING REGULATING
Information Patent Grant
Economics-based coordination of advanced process control and real-t...
- Patent number 9,268,317
- Issue date Feb 23, 2016
- Shell Oil Company
- Pierre Christian Marie Carrette
- G05 - CONTROLLING REGULATING
Information Patent Grant
Advanced process control system and method utilizing virtual metrol...
- Patent number 8,688,256
- Issue date Apr 1, 2014
- National Cheng Kung University
- Fan-Tien Cheng
- G05 - CONTROLLING REGULATING
Information Patent Grant
Two-dimensional multi-products multi-tools advanced process control
- Patent number 8,406,904
- Issue date Mar 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Wei Hsu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for estimating context offsets for run-to-run con...
- Patent number 8,355,810
- Issue date Jan 15, 2013
- Applied Materials, Inc.
- Jianping Zou
- G05 - CONTROLLING REGULATING
Information Patent Grant
Providing a dynamic sampling plan for integrated metrology
- Patent number 7,577,537
- Issue date Aug 18, 2009
- International Business Machines Corporation
- Gary W. Behm
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Applying a self-adaptive filter to a drifting process
- Patent number 7,424,392
- Issue date Sep 9, 2008
- Advanced Micro Devices, Inc.
- Jin Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and system of providing a dynamic sampling plan for integrat...
- Patent number 7,398,172
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Gary W. Behm
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,324,866
- Issue date Jan 29, 2008
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Imai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
ECONOMICS-BASED COORDINATION OF ADVANCED PROCESS CONTROL AND REAL-T...
- Publication number 20120239167
- Publication date Sep 20, 2012
- Pierre Christian Marie Carrette
- G05 - CONTROLLING REGULATING
Information Patent Application
TWO-DIMENSIONAL MULTI-PRODUCTS MULTI-TOOLS ADVANCED PROCESS CONTROL
- Publication number 20120215337
- Publication date Aug 23, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Wei Hsu
- G05 - CONTROLLING REGULATING
Information Patent Application
ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROL...
- Publication number 20120029662
- Publication date Feb 2, 2012
- FORESIGHT TECHNOLOGY COMPANY, LTD.
- Fan-Tien CHENG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR ESTIMATING CONTEXT OFFSETS FOR RUN-TO-RUN CON...
- Publication number 20100191363
- Publication date Jul 29, 2010
- Applied Materials, Inc.
- Jianping Zou
- G05 - CONTROLLING REGULATING
Information Patent Application
Configurable advanced process control
- Publication number 20090005888
- Publication date Jan 1, 2009
- Nital S. Patel
- G05 - CONTROLLING REGULATING
Information Patent Application
PROVIDING A DYNAMIC SAMPLING PLAN FOR INTEGRATED METROLOGY
- Publication number 20080167830
- Publication date Jul 10, 2008
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM OF PROVIDING A DYNAMIC SAMPLING PLAN FOR INTEGRAT...
- Publication number 20070282549
- Publication date Dec 6, 2007
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20060161288
- Publication date Jul 20, 2006
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Imai
- G05 - CONTROLLING REGULATING

APC advanced process control applications

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dispatch system and dispatch method for manufacturing mold

Use of an advanced multivariable controller to control alphabutol u...

Semiconductor fabrication component retuning

Economics-based coordination of advanced process control and real-t...

Advanced process control system and method utilizing virtual metrol...

Two-dimensional multi-products multi-tools advanced process control

Method and system for estimating context offsets for run-to-run con...

Providing a dynamic sampling plan for integrated metrology

Applying a self-adaptive filter to a drifting process

Method and system of providing a dynamic sampling plan for integrat...

Method for manufacturing semiconductor device

Patents Applicationslast 30 patents

ECONOMICS-BASED COORDINATION OF ADVANCED PROCESS CONTROL AND REAL-T...

TWO-DIMENSIONAL MULTI-PRODUCTS MULTI-TOOLS ADVANCED PROCESS CONTROL

ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROL...

METHOD AND SYSTEM FOR ESTIMATING CONTEXT OFFSETS FOR RUN-TO-RUN CON...

Configurable advanced process control

PROVIDING A DYNAMIC SAMPLING PLAN FOR INTEGRATED METROLOGY

METHOD AND SYSTEM OF PROVIDING A DYNAMIC SAMPLING PLAN FOR INTEGRAT...

Method for manufacturing semiconductor device