Application of electric currents or fields

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H01L21/326

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Current Industry

H01L21/326Application of electric currents or fields

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor processing systems with in-situ electrical bias
- Patent number 11,894,240
- Issue date Feb 6, 2024
- Tokyo Electron Limited
- David Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for test pattern forming and film property me...
- Patent number 11,699,622
- Issue date Jul 11, 2023
- Active Layer Parametrics, Inc.
- Bulent Mehmet Basol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically or temperature activated shape-memory materials for wa...
- Patent number 11,658,129
- Issue date May 23, 2023
- Micron Technology, Inc.
- Bret K. Street
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma annealing method and device for the same
- Patent number 11,511,316
- Issue date Nov 29, 2022
- Nissan Chemical Industries, Ltd.
- Hitoshi Furusho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with P-N-P junction and vertically aligned field...
- Patent number 11,482,521
- Issue date Oct 25, 2022
- GLOBALFOUNDRIES U.S. INC.
- Don R. Blackwell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact with a silicide region
- Patent number 11,411,094
- Issue date Aug 9, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Wen Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for test pattern forming and film property me...
- Patent number 11,289,386
- Issue date Mar 29, 2022
- Active Layer Parametrics, Inc.
- Bulent Mehmet Basol
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with adhesion layer
- Patent number 11,177,365
- Issue date Nov 16, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih Wei Bih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with adhesion layer and method of making
- Patent number 11,164,957
- Issue date Nov 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih Wei Bih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical fuse with metal line migration
- Patent number 11,152,300
- Issue date Oct 19, 2021
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active matrix substrate, optical shutter substrate, display device,...
- Patent number 11,024,656
- Issue date Jun 1, 2021
- SHARP KABUSHIKI KAISHA
- Tohru Okabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically or temperature activated shape-memory materials for wa...
- Patent number 10,861,797
- Issue date Dec 8, 2020
- Micron Technology, Inc.
- Bret K. Street
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
Porous silicon relaxation medium for dislocation free CMOS devices
- Patent number 10,804,166
- Issue date Oct 13, 2020
- ELPIS TECHNOLOGIES INC.
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicide implants
- Patent number 10,763,338
- Issue date Sep 1, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of making a short-circuited diode that prevents electrocution
- Patent number 10,756,201
- Issue date Aug 25, 2020
- John Jairo Pacheco Peña
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bottom-up method for forming wire structures upon a substrate
- Patent number 10,731,268
- Issue date Aug 4, 2020
- XTPL S.A.
- Filip Granek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for low resistivity physical vapor deposition o...
- Patent number 10,734,235
- Issue date Aug 4, 2020
- Applied Materials, Inc.
- Jothilingam Ramalingam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancing memory yield and performance through utilizing nanowire s...
- Patent number 10,679,719
- Issue date Jun 9, 2020
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic timing and reliability repair for nanowire circuits
- Patent number 10,665,320
- Issue date May 26, 2020
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of thinning and structuring semiconductor wafers by electri...
- Patent number 10,643,860
- Issue date May 5, 2020
- Infineon Technologies AG
- Nirdesh Ojha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor devices having a plurality of unit cell transistors t...
- Patent number 10,615,273
- Issue date Apr 7, 2020
- Cree, Inc.
- Yueying Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Control of directionality in atomic layer etching
- Patent number 10,559,475
- Issue date Feb 11, 2020
- Lam Research Corporation
- Andreas Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Porous silicon relaxation medium for dislocation free CMOS devices
- Patent number 10,541,177
- Issue date Jan 21, 2020
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a contact with a silicide region
- Patent number 10,535,748
- Issue date Jan 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Wen Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device with adhesion layer
- Patent number 10,490,649
- Issue date Nov 26, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih Wei Bih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Breakdown-based physical unclonable function
- Patent number 10,469,083
- Issue date Nov 5, 2019
- Imec VZW
- Erik Bury
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Conductivity based on selective etch for GaN devices and applicatio...
- Patent number 10,458,038
- Issue date Oct 29, 2019
- Yale University
- Yu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Logic timing and reliability repair for nanowire circuits
- Patent number 10,388,397
- Issue date Aug 20, 2019
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhancing memory yield and performance through utilizing nanowire s...
- Patent number 10,381,100
- Issue date Aug 13, 2019
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, method of fabricating the same, and apparatus...
- Patent number 10,361,208
- Issue date Jul 23, 2019
- Samsung Electronics Co., Ltd.
- Choong-rae Cho
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Contact with a Silicide Region
- Publication number 20220367667
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Wen Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING MICROELECTRONIC DEVICES AND RELATED MICROEL...
- Publication number 20220336280
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Brandon P. Wirz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...
- Publication number 20220216118
- Publication date Jul 7, 2022
- Active Layer Parametrics, Inc.
- Bulent Mehmet BASOL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESSING SYSTEMS WITH IN-SITU ELECTRICAL BIAS
- Publication number 20210313189
- Publication date Oct 7, 2021
- TOKYO ELECTRON LIMITED
- David Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH P-N-P JUNCTION AND VERTICALLY ALIGNED FIELD...
- Publication number 20210249406
- Publication date Aug 12, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Don R. Blackwell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically or Temperature Activated Shape-Memory Materials for Wa...
- Publication number 20210066212
- Publication date Mar 4, 2021
- Micron Technology, Inc.
- Bret K. Street
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Application
PROCESS OF MAKING A SHORT-CIRCUITED DIODE THAT PREVENTS ELECTROCUTION
- Publication number 20200266283
- Publication date Aug 20, 2020
- JORGE LUIS JIMENEZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...
- Publication number 20200219778
- Publication date Jul 9, 2020
- Active Layer Parametrics, Inc.
- Bulent Mehmet BASOL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming a Contact with a Silicide Region
- Publication number 20200152763
- Publication date May 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Wen Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH ADHESION LAYER
- Publication number 20200098892
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih Wei BIH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH ADHESION LAYER AND METHOD OF MAKING
- Publication number 20200098891
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih Wei BIH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POROUS SILICON RELAXATION MEDIUM FOR DISLOCATION FREE CMOS DEVICES
- Publication number 20200043811
- Publication date Feb 6, 2020
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically or Temperature Activated Shape-Memory Materials for Wa...
- Publication number 20200020646
- Publication date Jan 16, 2020
- Micron Technology, Inc.
- Bret K. Street
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Application
Enhancing Memory Yield and Performance Through Utilizing Nanowire S...
- Publication number 20190355437
- Publication date Nov 21, 2019
- Synopsys, Inc.
- JAMIL KAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic Timing and Reliability Repair for Nanowire Circuits
- Publication number 20190333600
- Publication date Oct 31, 2019
- Synopsys, Inc.
- JAMIL KAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods of Thinning and Structuring Semiconductor Wafers by Electri...
- Publication number 20190295855
- Publication date Sep 26, 2019
- INFINEON TECHNOLOGIES AG
- Nirdesh Ojha
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONFORMAL METAL DIFFUSION BARRIER AND PLASMA TREATMENT FOR OXIDIZED...
- Publication number 20190273147
- Publication date Sep 5, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Wen CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF FABRICATING THE SAME, AND APPARATUS...
- Publication number 20190244961
- Publication date Aug 8, 2019
- Samsung Electronics Co., Ltd.
- Choong-rae CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL OF DIRECTIONALITY IN ATOMIC LAYER ETCHING
- Publication number 20190157105
- Publication date May 23, 2019
- LAM RESEARCH CORPORATION
- Andreas Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOTTOM-UP METHOD FOR FORMING WIRE STRUCTURES UPON A SUBSTRATE
- Publication number 20190106804
- Publication date Apr 11, 2019
- XTPL S.A.
- Filip Granek
- B82 - NANO-TECHNOLOGY
Information Patent Application
POROUS SILICON RELAXATION MEDIUM FOR DISLOCATION FREE CMOS DEVICES
- Publication number 20190109056
- Publication date Apr 11, 2019
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICIDE IMPLANTS
- Publication number 20190067436
- Publication date Feb 28, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES HAVING A PLURALITY OF UNIT CELL TRANSISTORS T...
- Publication number 20180374943
- Publication date Dec 27, 2018
- Cree, Inc.
- Yueying Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL OF DIRECTIONALITY IN ATOMIC LAYER ETCHING
- Publication number 20180366343
- Publication date Dec 20, 2018
- LAM RESEARCH CORPORATION
- Andreas Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FRABRICCATING SEMICONDUCTOR DEVICE WITH ADHESION LAYER
- Publication number 20180350946
- Publication date Dec 6, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih Wei BIH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR LOW RESISTIVITY PHYSICAL VAPOR DEPOSITION O...
- Publication number 20180337052
- Publication date Nov 22, 2018
- Applied Materials, Inc.
- Jothilingam RAMALINGAM
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180308700
- Publication date Oct 25, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Yu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device with Reduced Parasitic Capacitance
- Publication number 20180286984
- Publication date Oct 4, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Chewn-Pu Jou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL OF DIRECTIONALITY IN ATOMIC LAYER ETCHING
- Publication number 20180247832
- Publication date Aug 30, 2018
- LAM RESEARCH CORPORATION
- Andreas Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FULLY-DEPLETED SILICON-ON-INSULATOR TRANSISTORS
- Publication number 20180240815
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Terence B. HOOK
- H01 - BASIC ELECTRIC ELEMENTS

Application of electric currents or fields

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor processing systems with in-situ electrical bias

Methods and apparatus for test pattern forming and film property me...

Electrically or temperature activated shape-memory materials for wa...

Plasma annealing method and device for the same

Integrated circuit with P-N-P junction and vertically aligned field...

Contact with a silicide region

Methods and apparatus for test pattern forming and film property me...

Semiconductor device with adhesion layer

Semiconductor device with adhesion layer and method of making

Electrical fuse with metal line migration

Active matrix substrate, optical shutter substrate, display device,...

Electrically or temperature activated shape-memory materials for wa...

Porous silicon relaxation medium for dislocation free CMOS devices

Silicide implants

Process of making a short-circuited diode that prevents electrocution

Bottom-up method for forming wire structures upon a substrate

Systems and methods for low resistivity physical vapor deposition o...

Enhancing memory yield and performance through utilizing nanowire s...

Logic timing and reliability repair for nanowire circuits

Methods of thinning and structuring semiconductor wafers by electri...

Semiconductor devices having a plurality of unit cell transistors t...

Control of directionality in atomic layer etching

Porous silicon relaxation medium for dislocation free CMOS devices

Method of forming a contact with a silicide region

Method of fabricating semiconductor device with adhesion layer

Breakdown-based physical unclonable function

Conductivity based on selective etch for GaN devices and applicatio...

Logic timing and reliability repair for nanowire circuits

Enhancing memory yield and performance through utilizing nanowire s...

Semiconductor device, method of fabricating the same, and apparatus...

Patents Applicationslast 30 patents

Contact with a Silicide Region

METHOD OF MANUFACTURING MICROELECTRONIC DEVICES AND RELATED MICROEL...

METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...

SEMICONDUCTOR PROCESSING SYSTEMS WITH IN-SITU ELECTRICAL BIAS

INTEGRATED CIRCUIT WITH P-N-P JUNCTION AND VERTICALLY ALIGNED FIELD...

Electrically or Temperature Activated Shape-Memory Materials for Wa...

PROCESS OF MAKING A SHORT-CIRCUITED DIODE THAT PREVENTS ELECTROCUTION

METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...

Method of Forming a Contact with a Silicide Region

SEMICONDUCTOR DEVICE WITH ADHESION LAYER

SEMICONDUCTOR DEVICE WITH ADHESION LAYER AND METHOD OF MAKING

POROUS SILICON RELAXATION MEDIUM FOR DISLOCATION FREE CMOS DEVICES

Electrically or Temperature Activated Shape-Memory Materials for Wa...

Enhancing Memory Yield and Performance Through Utilizing Nanowire S...

Logic Timing and Reliability Repair for Nanowire Circuits

Methods of Thinning and Structuring Semiconductor Wafers by Electri...

CONFORMAL METAL DIFFUSION BARRIER AND PLASMA TREATMENT FOR OXIDIZED...

SEMICONDUCTOR DEVICE, METHOD OF FABRICATING THE SAME, AND APPARATUS...

CONTROL OF DIRECTIONALITY IN ATOMIC LAYER ETCHING

BOTTOM-UP METHOD FOR FORMING WIRE STRUCTURES UPON A SUBSTRATE

POROUS SILICON RELAXATION MEDIUM FOR DISLOCATION FREE CMOS DEVICES

SILICIDE IMPLANTS

SEMICONDUCTOR DEVICES HAVING A PLURALITY OF UNIT CELL TRANSISTORS T...

CONTROL OF DIRECTIONALITY IN ATOMIC LAYER ETCHING

METHOD OF FRABRICCATING SEMICONDUCTOR DEVICE WITH ADHESION LAYER

SYSTEMS AND METHODS FOR LOW RESISTIVITY PHYSICAL VAPOR DEPOSITION O...

SEMICONDUCTOR DEVICE

Semiconductor Device with Reduced Parasitic Capacitance

CONTROL OF DIRECTIONALITY IN ATOMIC LAYER ETCHING

FULLY-DEPLETED SILICON-ON-INSULATOR TRANSISTORS