Applying a notched broadband signal

Industry

CPC
H01J49/428

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/428Applying a notched broadband signal

Industries

Patents Grantslast 30 patents

Information Patent Grant
Coupled-amplifier multi-frequency circuit topologies applicable to...
- Patent number 11,935,735
- Issue date Mar 19, 2024
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Logical operations in mass spectrometry
- Patent number 11,545,353
- Issue date Jan 3, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coupled-amplifier multi-frequency circuit topologies applicable to...
- Patent number 11,418,228
- Issue date Aug 16, 2022
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion traps that apply an inverse mathieu q scan
- Patent number 11,289,321
- Issue date Mar 29, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Logical operations in mass spectrometry
- Patent number 11,127,581
- Issue date Sep 21, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion traps that apply an inverse Mathieu q scan
- Patent number 11,120,984
- Issue date Sep 14, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Traveling wave multipole
- Patent number 11,087,968
- Issue date Aug 10, 2021
- Thermo Finnigan LLC.
- David A. Schell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion resonance excitation operation method and device by applying a...
- Patent number 10,991,568
- Issue date Apr 27, 2021
- BEIJING INSTITUTE OF TECHNOLOGY
- Wei Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for ejection of ions from an ion trap
- Patent number 10,515,792
- Issue date Dec 24, 2019
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed precursor isolation for mass spectrometry
- Patent number 10,256,083
- Issue date Apr 9, 2019
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with spatially extended ion trapping region
- Patent number 10,224,196
- Issue date Mar 5, 2019
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexing of ions for improved sensitivity
- Patent number 10,163,617
- Issue date Dec 25, 2018
- DH Technologies Development Pte. Ltd.
- Bruce Andrew Collings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow through MS3 for improved selectivity
- Patent number 10,074,525
- Issue date Sep 11, 2018
- DH Technologies Development Pte. Ltd.
- Bruce Andrew Collings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed precursor isolation for mass spectrometry
- Patent number 10,068,752
- Issue date Sep 4, 2018
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for multipole operation
- Patent number 10,026,602
- Issue date Jul 17, 2018
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for ejection of ions from an ion trap
- Patent number 9,922,813
- Issue date Mar 20, 2018
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for ion isolation using a dual waveform
- Patent number 9,818,595
- Issue date Nov 14, 2017
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device allowing improved reaction monitoring of gas phase reactions...
- Patent number 9,653,279
- Issue date May 16, 2017
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for multipole operation
- Patent number 9,524,860
- Issue date Dec 20, 2016
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap analyzer and ion trap mass spectrometry analysis method
- Patent number 9,502,228
- Issue date Nov 22, 2016
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with spatially extended ion trapping region
- Patent number 9,425,035
- Issue date Aug 23, 2016
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion selection method in ion trap and ion trap system
- Patent number 9,396,923
- Issue date Jul 19, 2016
- Shimadzu Corporation
- Kei Kodera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for increased ion throughput in tandem mass s...
- Patent number 9,343,281
- Issue date May 17, 2016
- Agilent Technologies, Inc.
- Curt A. Flory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for providing a substantially quadrupole field...
- Patent number 9,324,554
- Issue date Apr 26, 2016
- DH Technologies Development Pte. Ltd.
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multinotch isolation for MS3 mass analysis
- Patent number 9,048,074
- Issue date Jun 2, 2015
- Thermo Finnigan LLC.
- Michael W. Senko
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 8,952,320
- Issue date Feb 10, 2015
- Micromass UK Limited
- Robert Harold Bateman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Step-scan ion trap mass spectrometry for high speed proteomics
- Patent number 8,507,846
- Issue date Aug 13, 2013
- Academia Sinica
- Chung-Hsuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel ion parking in ion traps
- Patent number 8,334,503
- Issue date Dec 18, 2012
- Purdue Research Foundation
- Scott A. Mcluckey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 8,288,720
- Issue date Oct 16, 2012
- Shimadzu Corporation
- Junichi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Linear ion trap
- Patent number 8,212,208
- Issue date Jul 3, 2012
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Capacitive Coupling Compensation for Direct Current Electrodes in I...
- Publication number 20240404820
- Publication date Dec 5, 2024
- Infineon Technologies Austria AG
- Jens Repp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION CYCLOTRON RESONANCE SEPARATOR APPARATUS AND METHOD OF USE THEREOF
- Publication number 20240312773
- Publication date Sep 19, 2024
- W. Davis Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COUPLED-AMPLIFIER MULTI-FREQUENCY CIRCUIT TOPOLOGIES APPLICABLE TO...
- Publication number 20220360286
- Publication date Nov 10, 2022
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOGICAL OPERATIONS IN MASS SPECTROMETRY
- Publication number 20210375612
- Publication date Dec 2, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOGICAL OPERATIONS IN MASS SPECTROMETRY
- Publication number 20210013023
- Publication date Jan 14, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP
- Publication number 20180204714
- Publication date Jul 19, 2018
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP
- Publication number 20170221695
- Publication date Aug 3, 2017
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap with Spatially Extended Ion Trapping Region
- Publication number 20170140916
- Publication date May 18, 2017
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTIPOLE OPERATION
- Publication number 20170098536
- Publication date Apr 6, 2017
- Thermo Finnigan LLC
- Philip M. REMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTING PRECURSOR ION POPULATIONS IN MASS SPECTROMETRY USING DYNA...
- Publication number 20160020083
- Publication date Jan 21, 2016
- President and Fellows of Harvard College
- Graeme Conrad McAlister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap With Spatially Extended Ion Trapping Region
- Publication number 20150294850
- Publication date Oct 15, 2015
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SELECTION METHOD IN ION TRAP AND ION TRAP SYSTEM
- Publication number 20150255263
- Publication date Sep 10, 2015
- SHIMADZU CORPORATION
- Kei Kodera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTINOTCH ISOLATION FOR MS3 MASS ANALYSIS
- Publication number 20140339421
- Publication date Nov 20, 2014
- Michael W. Senko
- G01 - MEASURING TESTING
Information Patent Application
Ion Trap With Spatially Extended Ion Trapping Region
- Publication number 20140299761
- Publication date Oct 9, 2014
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM MASS SPECTROMETRY USING COMPOSITE WAVEFORMS
- Publication number 20130299693
- Publication date Nov 14, 2013
- Yu Xia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR PROVIDING A SUBSTANTIALLY QUADRUPOLE FIELD...
- Publication number 20130240724
- Publication date Sep 19, 2013
- DH Technologies Development Pte. Ltd.
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STEP-SCAN ION TRAP MASS SPECTROMETRY FOR HIGH SPEED PROTEOMICS
- Publication number 20130032709
- Publication date Feb 7, 2013
- ACADEMIA SINICA
- Chung-Hsuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20120049059
- Publication date Mar 1, 2012
- Shimadzu Corporation
- Junichi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Linear Ion Trap
- Publication number 20110049358
- Publication date Mar 3, 2011
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20100084547
- Publication date Apr 8, 2010
- Micromass UK Limited
- Steven Derek Pringle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel ion parking in ion traps
- Publication number 20100084548
- Publication date Apr 8, 2010
- Scott A. McLuckey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20090194688
- Publication date Aug 6, 2009
- Micromass UK Limited
- Robert Harold Bateman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR AXIAL EJECTION AND IN-TRAP FRAGMENTATION USING AUXILIARY...
- Publication number 20080078927
- Publication date Apr 3, 2008
- MDS Analytical Technologies, a business unit of MDS Inc. doing business throu...
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A MASS SPECTROMETER TO PROVIDE RESONANT EXCITAT...
- Publication number 20080017789
- Publication date Jan 24, 2008
- MDS Analytical Technologies, a business unit of MDS Inc.
- Jim Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-resolution ion isolation utilizing broadband waveform signals
- Publication number 20070084994
- Publication date Apr 19, 2007
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for accurate mass determination with ion trap/time-of-flight...
- Publication number 20050151073
- Publication date Jul 14, 2005
- Yoshiaki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20050067565
- Publication date Mar 31, 2005
- Hitachi., Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chemical substance detection apparatus and chemical substance detec...
- Publication number 20050009172
- Publication date Jan 13, 2005
- Hideo Yamakoshi
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Application
Ion trap mass spectrometer
- Publication number 20030213908
- Publication date Nov 20, 2003
- Shimadzu Corporation
- Yoshikatsu Umemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20030205667
- Publication date Nov 6, 2003
- Hitachi, Ltd
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS

Applying a notched broadband signal

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Coupled-amplifier multi-frequency circuit topologies applicable to...

Logical operations in mass spectrometry

Coupled-amplifier multi-frequency circuit topologies applicable to...

Ion traps that apply an inverse mathieu q scan

Logical operations in mass spectrometry

Ion traps that apply an inverse Mathieu q scan

Traveling wave multipole

Ion resonance excitation operation method and device by applying a...

Systems and methods for ejection of ions from an ion trap

Multiplexed precursor isolation for mass spectrometry

Ion trap with spatially extended ion trapping region

Multiplexing of ions for improved sensitivity

Flow through MS3 for improved selectivity

Multiplexed precursor isolation for mass spectrometry

Systems and methods for multipole operation

Systems and methods for ejection of ions from an ion trap

Systems and methods for ion isolation using a dual waveform

Device allowing improved reaction monitoring of gas phase reactions...

Systems and methods for multipole operation

Ion trap analyzer and ion trap mass spectrometry analysis method

Ion trap with spatially extended ion trapping region

Ion selection method in ion trap and ion trap system

Methods and apparatus for increased ion throughput in tandem mass s...

Methods and systems for providing a substantially quadrupole field...

Multinotch isolation for MS3 mass analysis

Mass spectrometer

Step-scan ion trap mass spectrometry for high speed proteomics

Parallel ion parking in ion traps

Ion trap mass spectrometer

Linear ion trap

Patents Applicationslast 30 patents

Capacitive Coupling Compensation for Direct Current Electrodes in I...

ION CYCLOTRON RESONANCE SEPARATOR APPARATUS AND METHOD OF USE THEREOF

COUPLED-AMPLIFIER MULTI-FREQUENCY CIRCUIT TOPOLOGIES APPLICABLE TO...

LOGICAL OPERATIONS IN MASS SPECTROMETRY

LOGICAL OPERATIONS IN MASS SPECTROMETRY

SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP

SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP

Ion Trap with Spatially Extended Ion Trapping Region

SYSTEMS AND METHODS FOR MULTIPOLE OPERATION

ADJUSTING PRECURSOR ION POPULATIONS IN MASS SPECTROMETRY USING DYNA...

Ion Trap With Spatially Extended Ion Trapping Region

ION SELECTION METHOD IN ION TRAP AND ION TRAP SYSTEM

MULTINOTCH ISOLATION FOR MS3 MASS ANALYSIS

Ion Trap With Spatially Extended Ion Trapping Region

TANDEM MASS SPECTROMETRY USING COMPOSITE WAVEFORMS

METHODS AND SYSTEMS FOR PROVIDING A SUBSTANTIALLY QUADRUPOLE FIELD...

STEP-SCAN ION TRAP MASS SPECTROMETRY FOR HIGH SPEED PROTEOMICS

Ion Trap Mass Spectrometer

Linear Ion Trap

Mass Spectrometer

Parallel ion parking in ion traps

Mass Spectrometer

METHOD FOR AXIAL EJECTION AND IN-TRAP FRAGMENTATION USING AUXILIARY...

METHOD OF OPERATING A MASS SPECTROMETER TO PROVIDE RESONANT EXCITAT...

High-resolution ion isolation utilizing broadband waveform signals

Method for accurate mass determination with ion trap/time-of-flight...

Mass spectrometer

Chemical substance detection apparatus and chemical substance detec...

Ion trap mass spectrometer

Apparatus for mass spectrometry on an ion-trap method