Particle spectrometer or separator tubes

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

H01J49/00Particle spectrometer or separator tubes

H01J49/0004Imaging particle spectrometry H01J49/0009Calibration of the apparatus H01J49/0013Miniaturised spectrometers H01J49/0018Microminiaturised spectrometers H01J49/0022Portable spectrometers H01J49/0027Methods for using particle spectrometers H01J49/0031Step by step routines describing the use of the apparatus H01J49/0036Step by step routines describing the handling of the data generated during a measurement H01J49/004Combinations of spectrometers, tandem spectrometers H01J49/0045characterised by the fragmentation or other specific reaction H01J49/005by collision with gas H01J49/0054by an electron beam H01J49/0059by a photon beam, photo-dissociation H01J49/0063by applying a resonant excitation voltage H01J49/0068by collision with a surface H01J49/0072by ion/ion reaction H01J49/0077specific reactions other than fragmentation H01J49/0081Tandem in time H01J49/0086Accelerator mass spectrometers H01J49/009Spectrometers having multiple channels, parallel analysis H01J49/0095Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions H01J49/02Details H01J49/022Circuit arrangements H01J49/025Detectors specially adapted to particle spectrometers H01J49/027detecting image current induced by the movement of charged particles H01J49/04Arrangements for introducing or extracting samples to be analysed H01J49/0404Capillaries used for transferring samples or ions H01J49/0409Sample holders or containers H01J49/0413for automated handling H01J49/0418for laser desorption H01J49/0422for gaseous samples H01J49/0427using a membrane permeable to gases H01J49/0431for liquid samples H01J49/0436using a membrane permeable to liquids H01J49/044with means for preventing droplets from entering the analyzer; Desolvation of droplets H01J49/0445with means for introducing as a spray, a jet or an aerosol H01J49/045with means for using a nebulising gas H01J49/0454with means for vaporising using mechanical energy H01J49/0459for solid samples H01J49/0463Desorption by laser or particle beam, followed by ionisation as a separate step H01J49/0468with means for heating or cooling the sample H01J49/0472with means for pyrolysis H01J49/0477using a hot fluid H01J49/0481with means for collisional cooling H01J49/0486with means for monitoring the sample temperature H01J49/049with means for applying heat to desorb the sample; Evaporation H01J49/0495Vacuum locks; Valves H01J49/06Electron- or ion-optical arrangements H01J49/061Ion deflecting means H01J49/062Ion guides H01J49/063Multipole ion guides H01J49/065having stacked electrodes H01J49/066Ion funnels H01J49/067Ion lenses, apertures, skimmers H01J49/068Mounting, supporting, spacing, or insulating electrodes H01J49/08Electron sources H01J49/10Ion sources Ion guns H01J49/102using reflex discharge H01J49/105using high-frequency excitation H01J49/107Arrangements for using several ion sources H01J49/12using an arc discharge H01J49/123Duoplasmatrons H01J49/126Other arc discharge ion sources using an applied magnetic field H01J49/14using particle bombardment H01J49/142using a solid target which is not previously vapourised H01J49/145using chemical ionisation H01J49/147with electrons H01J49/16using surface ionisation H01J49/161using photoionisation H01J49/162Direct photo-ionisation H01J49/164Laser desorption/ionisation H01J49/165Electrospray ionisation H01J49/167Capillaries and nozzles specially adapted therefor H01J49/168field ionisation H01J49/18using spark ionisation H01J49/20Magnetic deflection H01J49/22Electrostatic deflection H01J49/24Vacuum systems H01J49/26Mass spectrometers or separator tubes H01J49/28Static spectrometers H01J49/282using electrostatic analysers H01J49/284using electrostatic and magnetic sectors with simple focusing H01J49/286with energy analysis H01J49/288using crossed electric and magnetic fields perpendicular to the beam H01J49/30using magnetic analysers H01J49/305with several sectors in tandem H01J49/32using double focusing H01J49/322with a magnetic sector of 90 degrees H01J49/324with an electrostatic section of 90 degrees H01J49/326with magnetic and electrostatic sectors of 90 degrees H01J49/328with a cycloidal trajectory by using crossed electric and magnetic fields H01J49/34Dynamic spectrometers H01J49/36Radio frequency spectrometers H01J49/38Omegatrons Using ion cyclotron resonance H01J49/40Time-of-flight spectrometers H01J49/401characterised by orthogonal acceleration H01J49/403characterised by the acceleration optics and/or the extraction fields H01J49/405characterised by the reflectron H01J49/406with multiple reflections H01J49/408with multiple changes of direction H01J49/42Stability-of-path spectrometers H01J49/4205Device types H01J49/421Mass filters H01J49/4215Quadrupole mass filters H01J49/422Two-dimensional RF ion traps H01J49/4225Multipole linear ion traps H01J49/423with radial ejection H01J49/4235Stacked rings or stacked plates H01J49/424Three-dimensional ion traps H01J49/4245Electrostatic ion traps H01J49/425with a logarithmic radial electric potential H01J49/4255with particular constructional features H01J49/426Methods for controlling ions H01J49/4265Controlling the number of trapped ions, preventing space charge effects H01J49/427Ejection and selection methods H01J49/4275Applying a non-resonant auxiliary oscillating voltage H01J49/428Applying a notched broadband signal H01J49/4285Applying a resonant signal H01J49/429Scanning an electric parameter H01J49/4295Storage methods H01J49/44Energy spectrometers H01J49/443Dynamic spectrometers H01J49/446Time-of-flight spectrometers H01J49/46Static spectrometers H01J49/463using static magnetic fields H01J49/466using crossed electric and magnetic fields perpendicular to the beam H01J49/48using electrostatic analysers H01J49/482with cylindrical mirrors H01J49/484with spherical mirrors H01J49/486with plane mirrors H01J49/488with retarding grids