Applying a resonant signal

Industry

CPC
H01J49/4285

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/4285Applying a resonant signal

Industries

Patents Grantslast 30 patents

Information Patent Grant
Coupled-amplifier multi-frequency circuit topologies applicable to...
- Patent number 11,935,735
- Issue date Mar 19, 2024
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coupled-amplifier multi-frequency circuit topologies applicable to...
- Patent number 11,418,228
- Issue date Aug 16, 2022
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion traps that apply an inverse mathieu q scan
- Patent number 11,289,321
- Issue date Mar 29, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion traps that apply an inverse Mathieu q scan
- Patent number 11,120,984
- Issue date Sep 14, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Traveling wave multipole
- Patent number 11,087,968
- Issue date Aug 10, 2021
- Thermo Finnigan LLC.
- David A. Schell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion resonance excitation operation method and device by applying a...
- Patent number 10,991,568
- Issue date Apr 27, 2021
- BEIJING INSTITUTE OF TECHNOLOGY
- Wei Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for ejection of ions from an ion trap
- Patent number 10,515,792
- Issue date Dec 24, 2019
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed precursor isolation for mass spectrometry
- Patent number 10,256,083
- Issue date Apr 9, 2019
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with spatially extended ion trapping region
- Patent number 10,224,196
- Issue date Mar 5, 2019
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow through MS3 for improved selectivity
- Patent number 10,074,525
- Issue date Sep 11, 2018
- DH Technologies Development Pte. Ltd.
- Bruce Andrew Collings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed precursor isolation for mass spectrometry
- Patent number 10,068,752
- Issue date Sep 4, 2018
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for multipole operation
- Patent number 10,026,602
- Issue date Jul 17, 2018
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for ejection of ions from an ion trap
- Patent number 9,922,813
- Issue date Mar 20, 2018
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for multipole operation
- Patent number 9,524,860
- Issue date Dec 20, 2016
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap analyzer and ion trap mass spectrometry analysis method
- Patent number 9,502,228
- Issue date Nov 22, 2016
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with spatially extended ion trapping region
- Patent number 9,425,035
- Issue date Aug 23, 2016
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion selection method in ion trap and ion trap system
- Patent number 9,396,923
- Issue date Jul 19, 2016
- Shimadzu Corporation
- Kei Kodera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for increased ion throughput in tandem mass s...
- Patent number 9,343,281
- Issue date May 17, 2016
- Agilent Technologies, Inc.
- Curt A. Flory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for providing a substantially quadrupole field...
- Patent number 9,324,554
- Issue date Apr 26, 2016
- DH Technologies Development Pte. Ltd.
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Step-scan ion trap mass spectrometry for high speed proteomics
- Patent number 8,507,846
- Issue date Aug 13, 2013
- Academia Sinica
- Chung-Hsuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Linear ion trap
- Patent number 8,212,208
- Issue date Jul 3, 2012
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for axial ejection and in-trap fragmentation using auxiliary...
- Patent number 7,692,143
- Issue date Apr 6, 2010
- MDS Analytical Technologies, a business unit of MDS Inc.
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a mass spectrometer to provide resonant excitat...
- Patent number 7,601,952
- Issue date Oct 13, 2009
- MDS Analytical Technologies, a business unit of MDS Inc.
- Jim Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 7,075,069
- Issue date Jul 11, 2006
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 6,633,033
- Issue date Oct 14, 2003
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High pressure MS/MS system
- Patent number 6,093,929
- Issue date Jul 25, 2000
- MDS Inc.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling the ion generation rate for mass selective l...
- Patent number 5,710,427
- Issue date Jan 20, 1998
- Bruker-Franzen Analytik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass selective notch filter with quadrupole excision fields
- Patent number 5,672,870
- Issue date Sep 30, 1997
- Hewlett-Packard Company
- Curt A. Flory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass selective multinotch filter with orthogonal excision fields
- Patent number 5,598,001
- Issue date Jan 28, 1997
- Hewlett-Packard Company
- Curt A. Flory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for the digital generation of an additional alter...
- Patent number 5,438,195
- Issue date Aug 1, 1995
- Bruker Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION CYCLOTRON RESONANCE SEPARATOR APPARATUS AND METHOD OF USE THEREOF
- Publication number 20240312773
- Publication date Sep 19, 2024
- W. Davis Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COUPLED-AMPLIFIER MULTI-FREQUENCY CIRCUIT TOPOLOGIES APPLICABLE TO...
- Publication number 20220360286
- Publication date Nov 10, 2022
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP
- Publication number 20180204714
- Publication date Jul 19, 2018
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP
- Publication number 20170221695
- Publication date Aug 3, 2017
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap with Spatially Extended Ion Trapping Region
- Publication number 20170140916
- Publication date May 18, 2017
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTIPOLE OPERATION
- Publication number 20170098536
- Publication date Apr 6, 2017
- Thermo Finnigan LLC
- Philip M. REMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap With Spatially Extended Ion Trapping Region
- Publication number 20150294850
- Publication date Oct 15, 2015
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SELECTION METHOD IN ION TRAP AND ION TRAP SYSTEM
- Publication number 20150255263
- Publication date Sep 10, 2015
- SHIMADZU CORPORATION
- Kei Kodera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap With Spatially Extended Ion Trapping Region
- Publication number 20140299761
- Publication date Oct 9, 2014
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR PROVIDING A SUBSTANTIALLY QUADRUPOLE FIELD...
- Publication number 20130240724
- Publication date Sep 19, 2013
- DH Technologies Development Pte. Ltd.
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STEP-SCAN ION TRAP MASS SPECTROMETRY FOR HIGH SPEED PROTEOMICS
- Publication number 20130032709
- Publication date Feb 7, 2013
- ACADEMIA SINICA
- Chung-Hsuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Linear Ion Trap
- Publication number 20110049358
- Publication date Mar 3, 2011
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR AXIAL EJECTION AND IN-TRAP FRAGMENTATION USING AUXILIARY...
- Publication number 20080078927
- Publication date Apr 3, 2008
- MDS Analytical Technologies, a business unit of MDS Inc. doing business throu...
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A MASS SPECTROMETER TO PROVIDE RESONANT EXCITAT...
- Publication number 20080017789
- Publication date Jan 24, 2008
- MDS Analytical Technologies, a business unit of MDS Inc.
- Jim Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20030205667
- Publication date Nov 6, 2003
- Hitachi, Ltd
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20020008199
- Publication date Jan 24, 2002
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS

Applying a resonant signal

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Coupled-amplifier multi-frequency circuit topologies applicable to...

Coupled-amplifier multi-frequency circuit topologies applicable to...

Ion traps that apply an inverse mathieu q scan

Ion traps that apply an inverse Mathieu q scan

Traveling wave multipole

Ion resonance excitation operation method and device by applying a...

Systems and methods for ejection of ions from an ion trap

Multiplexed precursor isolation for mass spectrometry

Ion trap with spatially extended ion trapping region

Flow through MS3 for improved selectivity

Multiplexed precursor isolation for mass spectrometry

Systems and methods for multipole operation

Systems and methods for ejection of ions from an ion trap

Systems and methods for multipole operation

Ion trap analyzer and ion trap mass spectrometry analysis method

Ion trap with spatially extended ion trapping region

Ion selection method in ion trap and ion trap system

Methods and apparatus for increased ion throughput in tandem mass s...

Methods and systems for providing a substantially quadrupole field...

Step-scan ion trap mass spectrometry for high speed proteomics

Linear ion trap

Method for axial ejection and in-trap fragmentation using auxiliary...

Method of operating a mass spectrometer to provide resonant excitat...

Apparatus for mass spectrometry on an ion-trap method

Apparatus for mass spectrometry on an ion-trap method

High pressure MS/MS system

Method for controlling the ion generation rate for mass selective l...

Mass selective notch filter with quadrupole excision fields

Mass selective multinotch filter with orthogonal excision fields

Method and device for the digital generation of an additional alter...

Patents Applicationslast 30 patents

ION CYCLOTRON RESONANCE SEPARATOR APPARATUS AND METHOD OF USE THEREOF

COUPLED-AMPLIFIER MULTI-FREQUENCY CIRCUIT TOPOLOGIES APPLICABLE TO...

SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP

SYSTEMS AND METHODS FOR EJECTION OF IONS FROM AN ION TRAP

Ion Trap with Spatially Extended Ion Trapping Region

SYSTEMS AND METHODS FOR MULTIPOLE OPERATION

Ion Trap With Spatially Extended Ion Trapping Region

ION SELECTION METHOD IN ION TRAP AND ION TRAP SYSTEM

Ion Trap With Spatially Extended Ion Trapping Region

METHODS AND SYSTEMS FOR PROVIDING A SUBSTANTIALLY QUADRUPOLE FIELD...

STEP-SCAN ION TRAP MASS SPECTROMETRY FOR HIGH SPEED PROTEOMICS

Linear Ion Trap

METHOD FOR AXIAL EJECTION AND IN-TRAP FRAGMENTATION USING AUXILIARY...

METHOD OF OPERATING A MASS SPECTROMETER TO PROVIDE RESONANT EXCITAT...

Apparatus for mass spectrometry on an ion-trap method

Apparatus for mass spectrometry on an ion-trap method