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Arrangements for eliminating or compensation of measuring errors due to temperature or weight
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CPC
G01B5/0011
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B5/00
Measuring arrangements characterised by the use of mechanical means
Current Industry
G01B5/0011
Arrangements for eliminating or compensation of measuring errors due to temperature or weight
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Patents Grants
last 30 patents
Information
Patent Grant
High-stability step gauge and preparation method therefor
Patent number
10,488,191
Issue date
Nov 26, 2019
Taixi Gan
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus
Patent number
9,341,468
Issue date
May 17, 2016
Canon Kabushiki Kaisha
Tomofumi Nishikawara
G01 - MEASURING TESTING
Information
Patent Grant
Thickness measurement system and thickness measurement method
Patent number
9,062,963
Issue date
Jun 23, 2015
Kabushiki Kaisha Toshiba
Tetsuo Furuta
G01 - MEASURING TESTING
Information
Patent Grant
Method for calculating error compensation value of machine
Patent number
8,800,159
Issue date
Aug 12, 2014
Okuma Corporation
Tetsuya Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
Measuring instrument
Patent number
7,036,237
Issue date
May 2, 2006
Mitutoyo Corporation
Katsuyuki Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Coordinate measuring apparatus having a bending-resistant measuring...
Patent number
6,655,037
Issue date
Dec 2, 2003
Carl-Zeiss-Stiftung
Klaus-Dieter Götz
G01 - MEASURING TESTING
Information
Patent Grant
Tubing elongation correction system & methods
Patent number
6,450,259
Issue date
Sep 17, 2002
Halliburton Energy Services, Inc.
Haoshi Song
E21 - EARTH DRILLING MINING
Information
Patent Grant
Measuring machine
Patent number
6,370,787
Issue date
Apr 16, 2002
Mitutoyo Corporation
Shigeo Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Machine frame
Patent number
5,505,004
Issue date
Apr 9, 1996
C E Johansson AB
Bo Pettersson
G01 - MEASURING TESTING
Information
Patent Grant
Workpiece measuring machine
Patent number
5,402,981
Issue date
Apr 4, 1995
Renishaw Metrology Limited
David R. McMurtry
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Length measuring system
Patent number
5,279,043
Issue date
Jan 18, 1994
RSF Elektronik Gesellschaft M.B.H.
Heinz Rieder
G01 - MEASURING TESTING
Information
Patent Grant
Procedure and sliding support for a profilometer
Patent number
5,105,552
Issue date
Apr 21, 1992
Institut Superieur d'Etat de Surface (I S E S)
Jacques Bielle
G01 - MEASURING TESTING
Information
Patent Grant
Counterbalance control apparatus
Patent number
5,072,522
Issue date
Dec 17, 1991
LK Limited
Christopher Stott
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Error determination for multi-axis apparatus due to thermal distortion
Patent number
5,001,842
Issue date
Mar 26, 1991
Ferranti International plc
David A. Wright
G01 - MEASURING TESTING
Information
Patent Grant
Linear measuring device
Patent number
4,972,603
Issue date
Nov 27, 1990
Hans Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Coordinate positioning apparatus
Patent number
4,910,446
Issue date
Mar 20, 1990
Renishaw plc
David R. McMurtry
G01 - MEASURING TESTING
Information
Patent Grant
Vibration damped mounting for extensometer system
Patent number
4,879,906
Issue date
Nov 14, 1989
MTS Systems Corporation
Harry R. Meline
G01 - MEASURING TESTING
Information
Patent Grant
Active error compensation in a coordinate measuring machine
Patent number
4,782,598
Issue date
Nov 8, 1988
Digital Electronic Automation, Inc
Antonio Guarini
G01 - MEASURING TESTING
Information
Patent Grant
Base assembly for coordinate measuring machine
Patent number
4,763,420
Issue date
Aug 16, 1988
Brown & Sharpe Manufacturing Company
William J. McCabe
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Electronic test head positioner for test systems
Patent number
4,705,447
Issue date
Nov 10, 1987
inTEST Corporation
Nathan R. Smith
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Coordinate measuring machine
Patent number
4,682,418
Issue date
Jul 28, 1987
The Warner & Swasey Company
John J. Tuss
G01 - MEASURING TESTING
Information
Patent Grant
Active error compensation in a coordinated measuring machine
Patent number
4,663,852
Issue date
May 12, 1987
Digital Electronic Automation, Inc
Antonio Guarini
G01 - MEASURING TESTING
Information
Patent Grant
Instrument for measuring lengths
Patent number
4,631,830
Issue date
Dec 30, 1986
RSF Elektronik Gesellschaft M.B.H.
Heinz Rieder
G01 - MEASURING TESTING
Information
Patent Grant
Bridge type coordinate measuring machine
Patent number
4,630,374
Issue date
Dec 23, 1986
The Warner & Swasey Company
Freddie L. Raleigh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining the position or dimensions of...
Patent number
4,611,156
Issue date
Sep 9, 1986
Dr. Johannes Heidenhain GmbH
Kurt Feichtinger
G01 - MEASURING TESTING
Information
Patent Grant
Error correction system for measuring instrument
Patent number
4,608,758
Issue date
Sep 2, 1986
Dr. Johannes Heidenhain GmbH
Karl-Hermann Voelk
G01 - MEASURING TESTING
Information
Patent Grant
Electronic test head positioner for test systems
Patent number
4,589,815
Issue date
May 20, 1986
inTEST Corporation
Nathan R. Smith
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Positioner for maintaining an object in a substantially weightless...
Patent number
4,588,346
Issue date
May 13, 1986
inTEST Corporation
Nathan R. Smith
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Error correction system for length or angle measuring instrument
Patent number
4,569,138
Issue date
Feb 11, 1986
Dr. Johannes Heidenhain GmbH
Rainer Tute
G01 - MEASURING TESTING
Information
Patent Grant
Measuring instrument
Patent number
4,561,185
Issue date
Dec 31, 1985
Mitutoyo Mfg. Co., Ltd.
Hideo Sakata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH-STABILITY STEP GAUGE AND PREPARATION METHOD THEREFOR
Publication number
20180259327
Publication date
Sep 13, 2018
Taixi GAN
G01 - MEASURING TESTING
Information
Patent Application
THICKNESS MEASUREMENT SYSTEM AND THICKNESS MEASUREMENT METHOD
Publication number
20140268183
Publication date
Sep 18, 2014
Kabushiki Kaisha Toshiba
Tetsuo Furuta
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS
Publication number
20140211214
Publication date
Jul 31, 2014
Canon Kabushiki Kaisha
Tomofumi Nishikawara
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALCULATING ERROR COMPENSATION VALUE OF MACHINE
Publication number
20120304478
Publication date
Dec 6, 2012
OKUMA CORPORATION
Tetsuya Matsushita
G01 - MEASURING TESTING
Information
Patent Application
Measuring instrument
Publication number
20040250434
Publication date
Dec 16, 2004
Mitutoyo Corporation
Katsuyuki Ogura
G01 - MEASURING TESTING
Information
Patent Application
COORDINATE MEASURING APPARATUS HAVING A BENDING-RESISTANT MEASURING...
Publication number
20020189117
Publication date
Dec 19, 2002
KLAUS-DIETER GOTZ
G01 - MEASURING TESTING
Information
Patent Application
TUBING ELONGATION CORRECTION SYSTEM & METHODS
Publication number
20020139527
Publication date
Oct 3, 2002
Haoshi Song
G01 - MEASURING TESTING
Information
Patent Application
MEASURING MACHINE
Publication number
20020020073
Publication date
Feb 21, 2002
SHIGEO KIKUCHI
G01 - MEASURING TESTING