arrangements using polarisation

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G02B21/0068

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GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B21/00Microscopes

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G02B21/0068arrangements using polarisation

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Patents Grantslast 30 patents

Information Patent Grant
Systems, methods, and apparatus for differential phase contrast mic...
- Patent number 12,251,219
- Issue date Mar 18, 2025
- The General Hospital Corporation
- Charles P. Lin
- G01 - MEASURING TESTING
Information Patent Grant
Acousto-optic deflector and telecommunication system
- Patent number 12,212,365
- Issue date Jan 28, 2025
- IntraAction Inc.
- Khanh Le
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Microscope and method of microscopy for providing illumination ligh...
- Patent number 12,146,832
- Issue date Nov 19, 2024
- Carl Zeiss Microscopy GmbH
- Daniel Schwedt
- G01 - MEASURING TESTING
Information Patent Grant
Differential dark-field confocal microscopic measurement apparatus...
- Patent number 12,111,453
- Issue date Oct 8, 2024
- Harbin Institute of Technology
- Jian Liu
- G02 - OPTICS
Information Patent Grant
Handheld confocal scanning optical microscope systems having oscill...
- Patent number 12,053,261
- Issue date Aug 6, 2024
- CALIBER IMAGING & DIAGNOSTICS, INC.
- William J. Fox
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and systems for stimulated emission depletion microscopy
- Patent number 11,965,831
- Issue date Apr 23, 2024
- The Regents of the University of Colorado, a Body Corporate
- Juliet T. Gopinath
- G01 - MEASURING TESTING
Information Patent Grant
Background-suppressed STED nanoscope
- Patent number 11,914,129
- Issue date Feb 27, 2024
- The Johns Hopkins University
- Taekjip Ha
- G01 - MEASURING TESTING
Information Patent Grant
Automated real-time particle characterization and three-dimensional...
- Patent number 11,892,390
- Issue date Feb 6, 2024
- New York University
- David G. Grier
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Acousto-optic laser microscopy system
- Patent number 11,885,949
- Issue date Jan 30, 2024
- IntraAction Corp.
- Khanh Le
- G02 - OPTICS
Information Patent Grant
Oblique plane microscope for imaging a sample
- Patent number 11,874,450
- Issue date Jan 16, 2024
- Leica Microsystems CMS GmbH
- Benjamin Deissler
- G02 - OPTICS
Information Patent Grant
Polarimeter with multiple independent tunable channels and method f...
- Patent number 11,867,891
- Issue date Jan 9, 2024
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G02 - OPTICS
Information Patent Grant
Methods and systems for stimulated emission depletion microscopy
- Patent number 11,828,680
- Issue date Nov 28, 2023
- The Regents of the University of Colorado, a Body Corporate
- Juliet T. Gopinath
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatus for differential phase contrast mic...
- Patent number 11,690,540
- Issue date Jul 4, 2023
- The General Hospital Corporation
- Charles P. Lin
- G01 - MEASURING TESTING
Information Patent Grant
Beam manipulation device for a scanning microscope, and microscope
- Patent number 11,668,916
- Issue date Jun 6, 2023
- Carl Zeiss Microscopy GmbH
- Matthias Wald
- G02 - OPTICS
Information Patent Grant
Broadband illumination tuning
- Patent number 11,662,562
- Issue date May 30, 2023
- KLA Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Grant
Method for imaging a sample by means of a light-sheet microscope
- Patent number 11,586,027
- Issue date Feb 21, 2023
- Leica Microsystems CMS GmbH
- Theo Larrieu
- G02 - OPTICS
Information Patent Grant
Lighting device for an imaging optical device, and detection method
- Patent number 11,561,382
- Issue date Jan 24, 2023
- Schott AG
- Theis Stüven
- G02 - OPTICS
Information Patent Grant
Confocal optical system and components thereof
- Patent number 11,543,640
- Issue date Jan 3, 2023
- Laxco Incorporated
- Congliang Chen
- G02 - OPTICS
Information Patent Grant
Optical assembly for scanning excitation radiation and/or manipulat...
- Patent number 11,525,989
- Issue date Dec 13, 2022
- Carl Zeiss Microscopy GmbH
- Tiemo Anhut
- G02 - OPTICS
Information Patent Grant
Method of scanning a sample with a light beam focused by a microsco...
- Patent number 11,513,327
- Issue date Nov 29, 2022
- Deutsches Krebsforschungszentrum
- Johann Engelhardt
- G02 - OPTICS
Information Patent Grant
Apparatus for selectively shaping phase fronts of a light beam, and...
- Patent number 11,460,618
- Issue date Oct 4, 2022
- ABBERIOR INSTRUMENTS GMBH
- Matthias Reuss
- G02 - OPTICS
Information Patent Grant
Light microscope and method for providing structured illumination l...
- Patent number 11,454,792
- Issue date Sep 27, 2022
- Carl Zeiss Microscopy GmbH
- Gerhard Krampert
- G01 - MEASURING TESTING
Information Patent Grant
Modular, electro-optical device for increasing the imaging field of...
- Patent number 11,294,165
- Issue date Apr 5, 2022
- The Board of Trustees of the Leland Stanford Junior University
- Karl A. Deisseroth
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Segmented birefringent chromatic beam shaping device
- Patent number 11,294,109
- Issue date Apr 5, 2022
- Deutsches Krebsforschungszentrum
- Johann Engelhardt
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and observation method
- Patent number 11,287,625
- Issue date Mar 29, 2022
- Nikon Corporation
- Yosuke Fujikake
- G02 - OPTICS
Information Patent Grant
Optical polarization tractography systems, methods and devices
- Patent number 11,287,623
- Issue date Mar 29, 2022
- The Curators of the University of Missouri
- Gang Yao
- G01 - MEASURING TESTING
Information Patent Grant
Birefringent lens interferometer for use in microscopy and other ap...
- Patent number 11,209,776
- Issue date Dec 28, 2021
- CellOptic, Inc.
- Gary Brooker
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Microscopy method using temporal focus modulation, and microscope
- Patent number 11,194,144
- Issue date Dec 7, 2021
- Carl Zeiss Microscopy GmbH
- Ralf Netz
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect measuring apparatus and method by microscopic scatte...
- Patent number 11,175,220
- Issue date Nov 16, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Jianda Shao
- G01 - MEASURING TESTING
Information Patent Grant
Structured illumination microscope, structured illumination method,...
- Patent number 11,009,692
- Issue date May 18, 2021
- Nikon Corporation
- Fumihiro Dake
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR STIMULATED EMISSION DEPLETION MICROSCOPY
- Publication number 20250102436
- Publication date Mar 27, 2025
- THE REGENTS OF THE UNIV. OF CO., A BODY CORPORATE
- Juliet T. GOPINATH
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE WITH A PHOTONIC INTEGRATED CIRCUIT
- Publication number 20250076629
- Publication date Mar 6, 2025
- Honeywell International Inc.
- Ryadh Abdullah Zakaria
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MICROSCOPE INCLUDING REMOTE FOCUSING SYSTEM
- Publication number 20250052989
- Publication date Feb 13, 2025
- UNM Rainforest Innovations
- Tonmoy Chakraborty
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR NANOSCALE AXIAL LOCALIZATION AND SUPER RESOLU...
- Publication number 20240345376
- Publication date Oct 17, 2024
- THE GEORGE WASHINGTON UNIVERSITY
- Inhee Chung
- G02 - OPTICS
Information Patent Application
ACOUSTO-OPTIC DEFLECTOR AND TELECOMMUNICATION SYSTEM
- Publication number 20240340086
- Publication date Oct 10, 2024
- Khanh Le
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DIFFERENTIAL DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS...
- Publication number 20240310613
- Publication date Sep 19, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G02 - OPTICS
Information Patent Application
FOCUSING DEVICE, FOCUSING SYSTEM, MICROSCOPE AND METHOD FOR IMAGING...
- Publication number 20240264420
- Publication date Aug 8, 2024
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...
- Publication number 20240142758
- Publication date May 2, 2024
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY
- Publication number 20240126058
- Publication date Apr 18, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Dongkyun Kang
- G01 - MEASURING TESTING
Information Patent Application
Intraoral scanner with optical system for minimizing stray light
- Publication number 20240004175
- Publication date Jan 4, 2024
- 3SHAPE A/S
- Alexander Bruun CHRISTIANSEN
- G02 - OPTICS
Information Patent Application
IMAGE SCANNING APPARATUS AND METHOD
- Publication number 20230418037
- Publication date Dec 28, 2023
- FFEI LIMITED
- Martin GOUCH
- G02 - OPTICS
Information Patent Application
SUPER-RESOLUTION MICROSCOPIC IMAGING METHOD AND APPARATUS BASED ON...
- Publication number 20230296871
- Publication date Sep 21, 2023
- Zhejiang University
- Cuifang KUANG
- G02 - OPTICS
Information Patent Application
SYSTEMS, METHODS, AND APPARATUS FOR DIFFERENTIAL PHASE CONTRAST MIC...
- Publication number 20230284939
- Publication date Sep 14, 2023
- The General Hospital Corporation
- Charles P. Lin
- G01 - MEASURING TESTING
Information Patent Application
PHASE-SHIFTING DIFFRACTION PHASE INTERFEROMETRY
- Publication number 20230168482
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G02 - OPTICS
Information Patent Application
CONFOCAL SCANNER AND CONFOCAL MICROSCOPE
- Publication number 20220291494
- Publication date Sep 15, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Takayuki KEI
- G02 - OPTICS
Information Patent Application
BACKGROUND-SUPPRESSED STED NANOSCOPE
- Publication number 20220187584
- Publication date Jun 16, 2022
- The Johns Hopkins University
- Taekjip Ha
- G02 - OPTICS
Information Patent Application
MICROSCOPE AND METHOD FOR MICROSCOPY
- Publication number 20210404964
- Publication date Dec 30, 2021
- CARL ZEISS MICROSCOPY GMBH
- Daniel Schwedt
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR STIMULATED EMISSION DEPLETION MICROSCOPY
- Publication number 20210372927
- Publication date Dec 2, 2021
- The Regents of the University of Colorado, a Body Corporate
- Juliet T. GOPINATH
- G02 - OPTICS
Information Patent Application
Oblique Plane Microscope for Imaging a Sample
- Publication number 20210318530
- Publication date Oct 14, 2021
- Leica Microsystems CMS GmbH
- Benjamin DEISSLER
- G02 - OPTICS
Information Patent Application
BROADBAND ILLUMINATION TUNING
- Publication number 20210247601
- Publication date Aug 12, 2021
- KLA Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
OPTICAL ASSEMBLY FOR SCANNING EXCITATION RADIATION AND/OR MANIPULAT...
- Publication number 20210157113
- Publication date May 27, 2021
- CARL ZEISS MICROSCOPY GMBH
- Tiemo Anhut
- G02 - OPTICS
Information Patent Application
METHOD FOR IMAGING A SAMPLE BY MEANS OF A LIGHT-SHEET MICROSCOPE
- Publication number 20210041681
- Publication date Feb 11, 2021
- Leica Microsystems CMS GmbH
- Theo LARRIEU
- G02 - OPTICS
Information Patent Application
SURFACE DEFECT MEASURING APPARATUS AND METHOD BY MICROSCOPIC SCATTE...
- Publication number 20210010927
- Publication date Jan 14, 2021
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Jianda Shao
- G02 - OPTICS
Information Patent Application
AUTOMATED REAL-TIME PARTICLE CHARACTERIZATION AND THREE-DIMENSIONAL...
- Publication number 20200319086
- Publication date Oct 8, 2020
- NEW YORK UNIVERSITY
- David G. GRIER
- G01 - MEASURING TESTING
Information Patent Application
Microscopy Method Using Temporal Focus Modulation, and Microscope
- Publication number 20200310095
- Publication date Oct 1, 2020
- CARL ZEISS MICROSOPY GMBH
- Ralf Netz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF SCANNING A SAMPLE WITH A LIGHT BEAM FOCUSED BY A MICROSCO...
- Publication number 20200310094
- Publication date Oct 1, 2020
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Johann Engelhardt
- G02 - OPTICS
Information Patent Application
POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...
- Publication number 20200271911
- Publication date Aug 27, 2020
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND APPARATUS FOR DIFFERENTIAL PHASE CONTRAST MIC...
- Publication number 20200237272
- Publication date Jul 30, 2020
- The General Hospital Corporation
- Charles P. Lin
- G01 - MEASURING TESTING
Information Patent Application
BIREFRINGENT LENS INTERFEROMETER FOR USE IN MICROSCOPY AND OTHER AP...
- Publication number 20200241472
- Publication date Jul 30, 2020
- Celloptic, Inc.
- Gary BROOKER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
LIGHTING DEVICE FOR AN IMAGING OPTICAL DEVICE, AND DETECTION METHOD
- Publication number 20200241270
- Publication date Jul 30, 2020
- SCHOTT AG
- Theis Stüven
- G02 - OPTICS

arrangements using polarisation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, methods, and apparatus for differential phase contrast mic...

Acousto-optic deflector and telecommunication system

Microscope and method of microscopy for providing illumination ligh...

Differential dark-field confocal microscopic measurement apparatus...

Handheld confocal scanning optical microscope systems having oscill...

Methods and systems for stimulated emission depletion microscopy

Background-suppressed STED nanoscope

Automated real-time particle characterization and three-dimensional...

Acousto-optic laser microscopy system

Oblique plane microscope for imaging a sample

Polarimeter with multiple independent tunable channels and method f...

Methods and systems for stimulated emission depletion microscopy

Systems, methods, and apparatus for differential phase contrast mic...

Beam manipulation device for a scanning microscope, and microscope

Broadband illumination tuning

Method for imaging a sample by means of a light-sheet microscope

Lighting device for an imaging optical device, and detection method

Confocal optical system and components thereof

Optical assembly for scanning excitation radiation and/or manipulat...

Method of scanning a sample with a light beam focused by a microsco...

Apparatus for selectively shaping phase fronts of a light beam, and...

Light microscope and method for providing structured illumination l...

Modular, electro-optical device for increasing the imaging field of...

Segmented birefringent chromatic beam shaping device

Microscope and observation method

Optical polarization tractography systems, methods and devices

Birefringent lens interferometer for use in microscopy and other ap...

Microscopy method using temporal focus modulation, and microscope

Surface defect measuring apparatus and method by microscopic scatte...

Structured illumination microscope, structured illumination method,...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR STIMULATED EMISSION DEPLETION MICROSCOPY

IMAGING DEVICE WITH A PHOTONIC INTEGRATED CIRCUIT

MICROSCOPE INCLUDING REMOTE FOCUSING SYSTEM

SYSTEM AND METHOD FOR NANOSCALE AXIAL LOCALIZATION AND SUPER RESOLU...

ACOUSTO-OPTIC DEFLECTOR AND TELECOMMUNICATION SYSTEM

DIFFERENTIAL DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS...

FOCUSING DEVICE, FOCUSING SYSTEM, MICROSCOPE AND METHOD FOR IMAGING...

POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...

METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY

Intraoral scanner with optical system for minimizing stray light

IMAGE SCANNING APPARATUS AND METHOD

SUPER-RESOLUTION MICROSCOPIC IMAGING METHOD AND APPARATUS BASED ON...

SYSTEMS, METHODS, AND APPARATUS FOR DIFFERENTIAL PHASE CONTRAST MIC...

PHASE-SHIFTING DIFFRACTION PHASE INTERFEROMETRY

CONFOCAL SCANNER AND CONFOCAL MICROSCOPE

BACKGROUND-SUPPRESSED STED NANOSCOPE

MICROSCOPE AND METHOD FOR MICROSCOPY

METHODS AND SYSTEMS FOR STIMULATED EMISSION DEPLETION MICROSCOPY

Oblique Plane Microscope for Imaging a Sample

BROADBAND ILLUMINATION TUNING

OPTICAL ASSEMBLY FOR SCANNING EXCITATION RADIATION AND/OR MANIPULAT...

METHOD FOR IMAGING A SAMPLE BY MEANS OF A LIGHT-SHEET MICROSCOPE

SURFACE DEFECT MEASURING APPARATUS AND METHOD BY MICROSCOPIC SCATTE...

AUTOMATED REAL-TIME PARTICLE CHARACTERIZATION AND THREE-DIMENSIONAL...

Microscopy Method Using Temporal Focus Modulation, and Microscope

METHOD OF SCANNING A SAMPLE WITH A LIGHT BEAM FOCUSED BY A MICROSCO...

POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...

SYSTEMS, METHODS, AND APPARATUS FOR DIFFERENTIAL PHASE CONTRAST MIC...

BIREFRINGENT LENS INTERFEROMETER FOR USE IN MICROSCOPY AND OTHER AP...

LIGHTING DEVICE FOR AN IMAGING OPTICAL DEVICE, AND DETECTION METHOD