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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/006at wafer scale level

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic prioritization of selector VT scans
- Patent number 12,106,813
- Issue date Oct 1, 2024
- Micron Technology, Inc.
- Pitamber Shukla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for preparing semiconductor device including an electronic f...
- Patent number 11,935,605
- Issue date Mar 19, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory management device, system and method
- Patent number 11,749,343
- Issue date Sep 5, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Nitin Chawla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for converting a floating gate non-volatile memory cell to a...
- Patent number 11,665,915
- Issue date May 30, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Fabio De Santis
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer-scale memory techniques
- Patent number 11,621,257
- Issue date Apr 4, 2023
- Micron Technology, Inc.
- Brent Keeth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test circuit and device wafer
- Patent number 11,557,360
- Issue date Jan 17, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure mode analysis method for memory device
- Patent number 11,443,825
- Issue date Sep 13, 2022
- Winbond Electronics Corp.
- Yu-Feng Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory management device, system and method
- Patent number 11,257,543
- Issue date Feb 22, 2022
- STMICROELECTRONICS INTERNATIONAL N.V.
- Nitin Chawla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnetic field transducer mounting methods for MTJ device testers
- Patent number 11,162,981
- Issue date Nov 2, 2021
- Integrated Silicon Solution, (Cayman) Inc.
- Danny Yam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Failure analyzing apparatus and failure analyzing method
- Patent number 11,162,995
- Issue date Nov 2, 2021
- TOSHIBA MEMORY CORPORATION
- Yukinobu Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Data reading method, device, and medium of non-volatile memory
- Patent number 11,152,041
- Issue date Oct 19, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Tao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnet mounting apparatus for MTJ device testers
- Patent number 10,962,590
- Issue date Mar 30, 2021
- Spin Memory, Inc.
- Danny Yam
- G11 - INFORMATION STORAGE
Information Patent Grant
Artificial intelligence based monitoring of solid state drives and...
- Patent number 10,930,365
- Issue date Feb 23, 2021
- Intel Corporation
- Pavel Poliakov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer burn-in test circuit and semiconductor memory including the same
- Patent number 10,845,408
- Issue date Nov 24, 2020
- SK hynix Inc.
- Young Jae Choi
- G01 - MEASURING TESTING
Information Patent Grant
Modifying a manufacturing process of integrated circuits based on l...
- Patent number 10,810,345
- Issue date Oct 20, 2020
- International Business Machines Corporation
- Steven B. Gold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated wafer-level processing system
- Patent number 10,748,877
- Issue date Aug 18, 2020
- International Business Machines Corporation
- Philip G. Emma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layered semiconductor device, and production method therefor
- Patent number 10,714,151
- Issue date Jul 14, 2020
- ULTRAMEMORY INC.
- Yasutoshi Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field transducer mounting apparatus for MTJ device testers
- Patent number 10,684,310
- Issue date Jun 16, 2020
- Spin Memory, Inc.
- Danny Yam
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for converting a floating gate non-volatile memory cell to a...
- Patent number 10,658,364
- Issue date May 19, 2020
- STMicroelectronics S.r.l.
- Fabio De Santis
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and system including the same
- Patent number 10,650,908
- Issue date May 12, 2020
- SK hynix Inc.
- Young Mok Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory test apparatus
- Patent number 10,636,509
- Issue date Apr 28, 2020
- TOSHIBA MEMORY CORPORATION
- Tetsuharu Kojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Short circuit detecting device of stacked memory chips and method t...
- Patent number 10,509,070
- Issue date Dec 17, 2019
- Samsung Electronics Co., Ltd.
- Won-Joo Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for provisioning a remote resource for an electro...
- Patent number 10,424,373
- Issue date Sep 24, 2019
- Blackberry Limited
- Michael Knowles
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing and setting performance parameters in a semiconductor devic...
- Patent number 10,365,318
- Issue date Jul 30, 2019
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in test circuit and semiconductor memory including the same
- Patent number 10,352,993
- Issue date Jul 16, 2019
- SK hynix Inc.
- Young Jae Choi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional semiconductor memory devices including stair stru...
- Patent number 10,332,611
- Issue date Jun 25, 2019
- Samsung Electronics Co., Ltd.
- Kwang-Soo Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for measuring performance of memory array
- Patent number 10,319,456
- Issue date Jun 11, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Hsu Chiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated wafer-level processing system
- Patent number 10,304,802
- Issue date May 28, 2019
- International Business Machines Corporation
- Philip G. Emma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for detecting a poor contact of a power pad
- Patent number 10,283,213
- Issue date May 7, 2019
- SK hynix Inc.
- Nak Kyu Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Screening method for magnetic storage device, screening apparatus f...
- Patent number 10,236,077
- Issue date Mar 19, 2019
- TOSHIBA MEMORY CORPORATION
- Yosuke Kobayashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC PRIORITIZATION OF SELECTOR VT SCANS
- Publication number 20250022523
- Publication date Jan 16, 2025
- Micron Technology, Inc.
- Pitamber Shukla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICE FOR SUPPORTING DYNAMIC ALLOCATION OF MEMORY AND METH...
- Publication number 20240331790
- Publication date Oct 3, 2024
- SK HYNIX INC.
- Tae Ho LIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD
- Publication number 20220139453
- Publication date May 5, 2022
- STMicroelectronics International N.V.
- Nitin CHAWLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD
- Publication number 20200411089
- Publication date Dec 31, 2020
- STMicroelectronics International N.V.
- Nitin CHAWLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA READING METHOD, DEVICE, AND MEDIUM OF NON-VOLATILE MEMORY
- Publication number 20200294560
- Publication date Sep 17, 2020
- Semiconductor Manufacturing International (Shanghai) Corporation
- Tao WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CONVERTING A FLOATING GATE NON-VOLATILE MEMORY CELL TO A...
- Publication number 20200258885
- Publication date Aug 13, 2020
- STMICROELECTRONICS INTERNATIONAL N.V.
- Fabio DE SANTIS
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic Field Transducer Mounting Methods for MTJ Device Testers
- Publication number 20200166544
- Publication date May 28, 2020
- Spin Memory, Inc.
- Danny YAM
- G11 - INFORMATION STORAGE
Information Patent Application
LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR
- Publication number 20200090708
- Publication date Mar 19, 2020
- UltraMemory Inc.
- Yasutoshi YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER BURN-IN TEST CIRCUIT AND SEMICONDUCTOR MEMORY INCLUDING THE SAME
- Publication number 20190293712
- Publication date Sep 26, 2019
- SK HYNIX INC.
- Young Jae CHOI
- G01 - MEASURING TESTING
Information Patent Application
FAILURE ANALYZING APPARATUS AND FAILURE ANALYZING METHOD
- Publication number 20190285686
- Publication date Sep 19, 2019
- Toshiba Memory Corporation
- Yukinobu HAYASHIDA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR CONVERTING A FLOATING GATE NON-VOLATILE MEMORY CELL TO A...
- Publication number 20190267380
- Publication date Aug 29, 2019
- STMICROELECTRONICS INTERNATIONAL N.V.
- Fabio DE SANTIS
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED WAFER-LEVEL PROCESSING SYSTEM
- Publication number 20190229095
- Publication date Jul 25, 2019
- International Business Machines Corporation
- Philip G. Emma
- G02 - OPTICS
Information Patent Application
Magnet Mounting Apparatus for MTJ Device Testers
- Publication number 20190195944
- Publication date Jun 27, 2019
- Spin Transfer Technologies, Inc.
- Danny YAM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING PERFORMANCE OF MEMORY ARRAY
- Publication number 20190066815
- Publication date Feb 28, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Hsu Chiu
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR PROVISIONING A REMOTE RESOURCE FOR AN ELECTRO...
- Publication number 20180374534
- Publication date Dec 27, 2018
- BlackBerry Limited
- Michael KNOWLES
- G11 - INFORMATION STORAGE
Information Patent Application
SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD T...
- Publication number 20180356458
- Publication date Dec 13, 2018
- Samsung Electronics Co., Ltd.
- Won-Joo YUN
- G01 - MEASURING TESTING
Information Patent Application
TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...
- Publication number 20180306854
- Publication date Oct 25, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SCREENING METHOD FOR MAGNETIC STORAGE DEVICE, SCREENING APPARATUS F...
- Publication number 20180268920
- Publication date Sep 20, 2018
- Toshiba Memory Corporation
- Yosuke KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SEMICONDUCTOR TEST METHOD
- Publication number 20180233215
- Publication date Aug 16, 2018
- SK HYNIX INC.
- Min Sik HAN
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES INCLUDING STAIR STRU...
- Publication number 20180174661
- Publication date Jun 21, 2018
- KWANG-SOO KIM
- G11 - INFORMATION STORAGE
Information Patent Application
DRIFT ACCELERATION IN RESISTANCE VARIABLE MEMORY
- Publication number 20150294718
- Publication date Oct 15, 2015
- Micron Technology, Inc.
- Alessandro Calderoni
- G11 - INFORMATION STORAGE
Information Patent Application
DETECTING DEFECTIVE CONNECTIONS IN STACKED MEMORY DEVICES
- Publication number 20150179280
- Publication date Jun 25, 2015
- International Business Machines Corporation
- Charles A. Kilmer
- G11 - INFORMATION STORAGE
Information Patent Application
TESTER AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20140375349
- Publication date Dec 25, 2014
- Samsung Electronics Co., Ltd.
- Chang-Hwan Lee
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE INCLUDING STACKED CHIPS AND METHOD OF FABRICA...
- Publication number 20140347943
- Publication date Nov 27, 2014
- Samsung Electronics Co., Ltd.
- Taek-Sung KIM
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...
- Publication number 20140110711
- Publication date Apr 24, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G01 - MEASURING TESTING
Information Patent Application
STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...
- Publication number 20140110710
- Publication date Apr 24, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G01 - MEASURING TESTING
Information Patent Application
DRIFT ACCELERATION IN RESISTANCE VARIABLE MEMORY
- Publication number 20140098593
- Publication date Apr 10, 2014
- Micron Technology, Inc.
- Alessandro Calderoni
- G11 - INFORMATION STORAGE
Information Patent Application
PROBELESS TESTING OF PAD BUFFERS ON WAFER
- Publication number 20140082445
- Publication date Mar 20, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
REPAIR SYSTEM FOR REPAIRING DEFECT USING E FUSES AND METHOD OF CONT...
- Publication number 20140063993
- Publication date Mar 6, 2014
- SK HYNIX INC.
- Jun Gi CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE FAILURE ANALYSIS SYSTEM AND SEMICONDUCTOR MEMO...
- Publication number 20140043360
- Publication date Feb 13, 2014
- Kabushiki Kaisha Toshiba
- Mami KODAMA
- G01 - MEASURING TESTING

at wafer scale level

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dynamic prioritization of selector VT scans

Method for preparing semiconductor device including an electronic f...

Memory management device, system and method

Method for converting a floating gate non-volatile memory cell to a...

Wafer-scale memory techniques

Memory test circuit and device wafer

Failure mode analysis method for memory device

Memory management device, system and method

Magnetic field transducer mounting methods for MTJ device testers

Failure analyzing apparatus and failure analyzing method

Data reading method, device, and medium of non-volatile memory

Magnet mounting apparatus for MTJ device testers

Artificial intelligence based monitoring of solid state drives and...

Wafer burn-in test circuit and semiconductor memory including the same

Modifying a manufacturing process of integrated circuits based on l...

Integrated wafer-level processing system

Layered semiconductor device, and production method therefor

Magnetic field transducer mounting apparatus for MTJ device testers

Method for converting a floating gate non-volatile memory cell to a...

Semiconductor device and system including the same

Memory test apparatus

Short circuit detecting device of stacked memory chips and method t...

System and method for provisioning a remote resource for an electro...

Testing and setting performance parameters in a semiconductor devic...

Wafer burn-in test circuit and semiconductor memory including the same

Three-dimensional semiconductor memory devices including stair stru...

Apparatus and method for measuring performance of memory array

Integrated wafer-level processing system

Semiconductor device for detecting a poor contact of a power pad

Screening method for magnetic storage device, screening apparatus f...

Patents Applicationslast 30 patents

DYNAMIC PRIORITIZATION OF SELECTOR VT SCANS

STORAGE DEVICE FOR SUPPORTING DYNAMIC ALLOCATION OF MEMORY AND METH...

MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD

MEMORY MANAGEMENT DEVICE, SYSTEM AND METHOD

DATA READING METHOD, DEVICE, AND MEDIUM OF NON-VOLATILE MEMORY

METHOD FOR CONVERTING A FLOATING GATE NON-VOLATILE MEMORY CELL TO A...

Magnetic Field Transducer Mounting Methods for MTJ Device Testers

LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR

WAFER BURN-IN TEST CIRCUIT AND SEMICONDUCTOR MEMORY INCLUDING THE SAME

FAILURE ANALYZING APPARATUS AND FAILURE ANALYZING METHOD

METHOD FOR CONVERTING A FLOATING GATE NON-VOLATILE MEMORY CELL TO A...

INTEGRATED WAFER-LEVEL PROCESSING SYSTEM

Magnet Mounting Apparatus for MTJ Device Testers

APPARATUS AND METHOD FOR MEASURING PERFORMANCE OF MEMORY ARRAY

SYSTEM AND METHOD FOR PROVISIONING A REMOTE RESOURCE FOR AN ELECTRO...

SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD T...

TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...

SCREENING METHOD FOR MAGNETIC STORAGE DEVICE, SCREENING APPARATUS F...

SEMICONDUCTOR TEST DEVICE AND SEMICONDUCTOR TEST METHOD

THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES INCLUDING STAIR STRU...

DRIFT ACCELERATION IN RESISTANCE VARIABLE MEMORY

DETECTING DEFECTIVE CONNECTIONS IN STACKED MEMORY DEVICES

TESTER AND TEST SYSTEM INCLUDING THE SAME

SEMICONDUCTOR PACKAGE INCLUDING STACKED CHIPS AND METHOD OF FABRICA...

STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...

STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...

DRIFT ACCELERATION IN RESISTANCE VARIABLE MEMORY

PROBELESS TESTING OF PAD BUFFERS ON WAFER

REPAIR SYSTEM FOR REPAIRING DEFECT USING E FUSES AND METHOD OF CONT...

SEMICONDUCTOR DEVICE FAILURE ANALYSIS SYSTEM AND SEMICONDUCTOR MEMO...