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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating or analysing materials by the use of optical means
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G01N21/6404
Atomic fluorescence
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Patents Grants
last 30 patents
Information
Patent Grant
Spectrometer and fabrication method thereof
Patent number
11,927,534
Issue date
Mar 12, 2024
BOE Technology Group Co., Ltd.
Xianqin Meng
G01 - MEASURING TESTING
Information
Patent Grant
Atomic fluorescence analysis method and device using water as carri...
Patent number
11,835,455
Issue date
Dec 5, 2023
CHONGQING MINTAI NEW AGROTECH DEVELOPMENT GROUP CO., LTD.
Mei Yang
G01 - MEASURING TESTING
Information
Patent Grant
Controlling alkaline earth atoms for quantum computing and metrolog...
Patent number
11,293,851
Issue date
Apr 5, 2022
California Institute of Technology
Alexandre Cooper-Roy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Signal augmentation method in spectroscopy device using vapor cell...
Patent number
11,287,369
Issue date
Mar 29, 2022
Korea Research Institute of Standards and Science
Taek Jeong
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for detecting mercury isotopes in natural gas
Patent number
11,119,084
Issue date
Sep 14, 2021
PetroChina Company Limited
Guangyou Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and devices for detecting mercury isotopes in oil-gas sources
Patent number
11,119,085
Issue date
Sep 14, 2021
PetroChina Company Limited
Guangyou Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Portable multi-spectrometry system for chemical and biological sens...
Patent number
11,022,489
Issue date
Jun 1, 2021
The United States of America, as represented by the Secretary of the Navy
Kin Chiu Ng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Atomic beam optical clock with pulse modulated broad-spectrum clock...
Patent number
10,879,918
Issue date
Dec 29, 2020
Wenzhou Collaborative Innovation Center of Laser and Optoelectronics
Jingbiao Chen
G01 - MEASURING TESTING
Information
Patent Grant
Controlling alkaline earth atoms for quantum computing and metrolog...
Patent number
10,809,177
Issue date
Oct 20, 2020
California Institute of Technology
Alexandre Cooper-Roy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Gas analyzer including a radiation source comprising a black-body r...
Patent number
10,466,174
Issue date
Nov 5, 2019
Infineon Technologies AG
Christoph Glacer
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting an article and apparatus for measuring the ar...
Patent number
10,234,389
Issue date
Mar 19, 2019
CM VISUAL TECHNOLOGY CORPORATION
Wang-Yang Li
G02 - OPTICS
Information
Patent Grant
Multi-cell apparatus and method for single ion addressing
Patent number
10,145,792
Issue date
Dec 4, 2018
Honeywell International Inc.
Matthew Edward Lewis Jungwirth
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Grant
Die-integrated aspheric mirror
Patent number
10,119,913
Issue date
Nov 6, 2018
Honeywell International Inc.
James Edward Goeders
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Atomic source with heater on thermal isolation die
Patent number
9,983,131
Issue date
May 29, 2018
Honeywell International Inc.
Robert Compton
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sub-doppler intermodulated laser-induced-fluorescence spectrometer
Patent number
9,976,955
Issue date
May 22, 2018
Arizona Board of Regents on behalf of Arizona State University
Damian Kokkin
G01 - MEASURING TESTING
Information
Patent Grant
Separated parallel beam generation for atom interferometry
Patent number
9,952,154
Issue date
Apr 24, 2018
The Charles Stark Draper Laboratory, Inc.
Matthew A. Sinclair
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Radioactive anomaly detector
Patent number
9,869,637
Issue date
Jan 16, 2018
Raytheon Company
Eric J. Griffin
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Fiber-optic fluorescence sensor for highly sensitive and specific d...
Patent number
9,851,338
Issue date
Dec 26, 2017
SPI—Security Protection International/Securite Protection Internationale
Yasser Chiniforooshan
G02 - OPTICS
Information
Patent Grant
Apparatus and method for liquid sample introduction
Patent number
9,804,183
Issue date
Oct 31, 2017
Thermo Electron Manufacturing Limited
Ruan Hattingh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Die-integrated aspheric mirror
Patent number
9,791,370
Issue date
Oct 17, 2017
Honeywell International Inc.
James Goeders
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Fluorescence axial localization with nanometer accuracy and precision
Patent number
9,103,784
Issue date
Aug 11, 2015
Iowa State University Research Foundation, Inc.
Sanjeevi Sivasankar
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device for measuring singlet oxygen luminescence
Patent number
9,080,976
Issue date
Jul 14, 2015
Humbolt-Universitaet zu Berlin
Steffen Hackbarth
G01 - MEASURING TESTING
Information
Patent Grant
System and method for tomographic retrieval of parameter profile fr...
Patent number
8,594,972
Issue date
Nov 26, 2013
The Johns Hopkins University
Larry J. Paxton
G01 - MEASURING TESTING
Information
Patent Grant
Mercury measuring apparatus for measuring mercury contained in samp...
Patent number
8,223,332
Issue date
Jul 17, 2012
Nippon Instruments Corporation
Yasuyuki Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for analyzing a volume of gas
Patent number
8,004,682
Issue date
Aug 23, 2011
Infineon Technologies AG
Werner Weber
G01 - MEASURING TESTING
Information
Patent Grant
Remote laser assisted biological aerosol standoff detection in atmo...
Patent number
7,700,929
Issue date
Apr 20, 2010
The United States of America as represented by the Secretary of the Navy
Antonio Ting
G01 - MEASURING TESTING
Information
Patent Grant
Remote laser assisted biological aerosol standoff detection in atmo...
Patent number
7,683,346
Issue date
Mar 23, 2010
The United States of America as represented by the Secretary of the Navy
Antonio C Ting
G01 - MEASURING TESTING
Information
Patent Grant
Plasma extraction microcavity plasma device and method
Patent number
7,482,750
Issue date
Jan 27, 2009
The Board of Trustees of the University of Illinois
J. Gary Eden
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring mercury in a gas sample
Patent number
7,454,952
Issue date
Nov 25, 2008
Thermo Fisher Scientific Inc.
Dieter Kita
G01 - MEASURING TESTING
Information
Patent Grant
Pump-and-probe method for estimating strength of forming photochemi...
Patent number
7,425,452
Issue date
Sep 16, 2008
Japan Science and Technology Agency
Yoshizumi Kajii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Magnetic Field Sensor and Method for Measuring a Magnetic Field
Publication number
20230266415
Publication date
Aug 24, 2023
ROBERT BOSCH GmbH
Andreas Brenneis
G01 - MEASURING TESTING
Information
Patent Application
MINIATURE ATOMIC SPECTROSCOPY REFERENCE CELL SYSTEM
Publication number
20230258562
Publication date
Aug 17, 2023
ColdQuanta, Inc.
Timothy George Ballance
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCING NOISE DURING AES DETECTION
Publication number
20230214443
Publication date
Jul 6, 2023
HANGZHOU PUYU TECHNOLOGY DEVELOPMENT CO., LTD.
Ziyang GUO
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC FLUORESCENCE ANALYSIS METHOD AND DEVICE USING WATER AS CARR...
Publication number
20210364435
Publication date
Nov 25, 2021
Chongqing Mintai New Agrotech Development Group C., Ltd.
Mei YANG
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER AND FABRICATION METHOD THEREOF
Publication number
20210231565
Publication date
Jul 29, 2021
BOE TECHNOLOGY GROUP CO., LTD.
Xianqin MENG
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL AUGMENTATION METHOD IN SPECTROSCOPY DEVICE USING VAPOR CELL...
Publication number
20210156794
Publication date
May 27, 2021
Korea Research Institute of Standards and Science
Taek Jeong
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING ALKALINE EARTH ATOMS FOR QUANTUM COMPUTING AND METROLOG...
Publication number
20210072139
Publication date
Mar 11, 2021
California Institute of Technology
Alexandre Cooper-Roy
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Application
METHODS AND DEVICES FOR DETECTING MERCURY ISOTOPES IN OIL-GAS SOURCES
Publication number
20200132649
Publication date
Apr 30, 2020
Petrochina Company Limited
Guangyou ZHU
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR DETECTING MERCURY ISOTOPES IN NATURAL GAS
Publication number
20200132648
Publication date
Apr 30, 2020
Petrochina Company Limited
Guangyou ZHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROLLING ALKALINE EARTH ATOMS FOR QUANTUM COMPUTING AND METROLOG...
Publication number
20200116623
Publication date
Apr 16, 2020
California Institute of Technology
Alexandre Cooper-Roy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-INVASIVE AND MINIMALLY-INVASIVE DETECTION OF SERUM IRON IN REAL...
Publication number
20200003755
Publication date
Jan 2, 2020
Ghassan S. Kassab
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE MULTI-SPECTROMETRY SYSTEM FOR CHEMICAL AND BIOLOGICAL SENS...
Publication number
20190301931
Publication date
Oct 3, 2019
The United States of America, as represented by the Secretary of the Navy
Kin Chiu Ng
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20180164215
Publication date
Jun 14, 2018
Infineon Technologies AG
Christoph Glacer
G01 - MEASURING TESTING
Information
Patent Application
DIE-INTEGRATED ASPHERIC MIRROR
Publication number
20180003636
Publication date
Jan 4, 2018
HONEYWELL INTERNATIONAL INC.
James Edward Goeders
B82 - NANO-TECHNOLOGY
Information
Patent Application
Separated Parallel Beam Generation for Atom Interferometry
Publication number
20170370840
Publication date
Dec 28, 2017
The Charles Stark Draper Laboratory, Inc.
Matthew A. Sinclair
G01 - MEASURING TESTING
Information
Patent Application
FIBER-OPTIC FLUORESCENCE SENSOR FOR HIGHLY SENSITIVE AND SPECIFIC D...
Publication number
20170370894
Publication date
Dec 28, 2017
Yasser CHINIFOROOSHAN
G02 - OPTICS
Information
Patent Application
METHOD FOR INSPECTING AN ARTICLE AND APPARATUS FOR MEASURING THE AR...
Publication number
20170205347
Publication date
Jul 20, 2017
CHI MEI VISUAL TECHNOLOGY CORPORATION
Wang-Yang Li
G02 - OPTICS
Information
Patent Application
SUB-DOPPLER INTERMODULATED LASER-INDUCED-FLUORESCENCE SPECTROMETER
Publication number
20170191932
Publication date
Jul 6, 2017
Arizona Board of Regents on behalf of Arizona State University
Damian Kokkin
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CELL APPARATUS AND METHOD FOR SINGLE ION ADDRESSING
Publication number
20170122868
Publication date
May 4, 2017
HONEYWELL INTERNATIONAL INC.
Matthew Edward Lewis Jungwirth
G01 - MEASURING TESTING
Information
Patent Application
DIE-INTEGRATED ASPHERIC MIRROR
Publication number
20160305882
Publication date
Oct 20, 2016
Honeywell International Inc.
James Goeders
B82 - NANO-TECHNOLOGY
Information
Patent Application
ATOMIC SOURCE WITH HEATER ON THERMAL ISOLATION DIE
Publication number
20150226669
Publication date
Aug 13, 2015
Honeywell International Inc.
Robert Compton
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR LIQUID SAMPLE INTRODUCTION
Publication number
20140283627
Publication date
Sep 25, 2014
THERMO ELECTRON MANUFACTURING LIMITED
Ruan HATTINGH
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
MEASURING DEVICE FOR MEASURING SINGLET OXYGEN LUMINESCENCE
Publication number
20140045272
Publication date
Feb 13, 2014
Humboldt-Universitaet zu Berlin
Steffen Hackbarth
G01 - MEASURING TESTING
Information
Patent Application
HEATING COMBUSTION TUBE, PYROLYSIS APPARATUS AND MERCURY ANALYZING...
Publication number
20130236361
Publication date
Sep 12, 2013
NIPPON INSTRUMENTS CORPORATION
Tomoaki Watanabe
G01 - MEASURING TESTING
Information
Patent Application
MICROWAVE PLASMA ATOMIC FLUORESCENCE MERCURY ANALYSIS SYSTEM
Publication number
20120224175
Publication date
Sep 6, 2012
Philippe Minghetti
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Tomographic Retrieval of Parameter Profile fr...
Publication number
20120116713
Publication date
May 10, 2012
Larry J. Paxton
G01 - MEASURING TESTING
Information
Patent Application
MERCURY MEASURING APPARATUS FOR MEASURING MERCURY CONTAINED IN SAMP...
Publication number
20110299072
Publication date
Dec 8, 2011
NIPPON INSTRUMENTS CORPORATION
Yasuyuki Yamada
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR ANALYZING A VOLUME OF GAS
Publication number
20090260417
Publication date
Oct 22, 2009
INFINEON TECHNOLOGIES AG
Werner Weber
G01 - MEASURING TESTING
Information
Patent Application
Remote Laser Assisted Biological Aerosol Standoff Detection in Atmo...
Publication number
20090184258
Publication date
Jul 23, 2009
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Antonio C. Ting
G01 - MEASURING TESTING
Information
Patent Application
Remote Laser Assisted Biological Aerosol Standoff Detection in Atmo...
Publication number
20080048129
Publication date
Feb 28, 2008
Antonio C. Ting
G01 - MEASURING TESTING