Atomic force probe

Follow

Industry

CPC
G05B2219/37119

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/37119Atomic force probe

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for forming nanometric features on surfaces
- Patent number 5,512,808
- Issue date Apr 30, 1996
- Massachusetts Institute of Technology
- Harry R. Clark
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus for forming nanometric features on surfaces
- Patent number 5,327,625
- Issue date Jul 12, 1994
- Massachusetts Institute of Technology
- Harry R. Clark
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents