Atomic force probe

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CPC
G05B2219/37119

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/37119Atomic force probe

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for forming nanometric features on surfaces
- Patent number 5,512,808
- Issue date Apr 30, 1996
- Massachusetts Institute of Technology
- Harry R. Clark
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus for forming nanometric features on surfaces
- Patent number 5,327,625
- Issue date Jul 12, 1994
- Massachusetts Institute of Technology
- Harry R. Clark
- G05 - CONTROLLING REGULATING