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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

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Patents Grantslast 30 patents

Information Patent Grant
Automated tomography field ion microscope
- Patent number 11,791,129
- Issue date Oct 17, 2023
- Centre National de la Recherche Scientifique
- François Vurpillot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for atomic probe tomography
- Patent number 10,903,045
- Issue date Jan 26, 2021
- Imec VZW
- Paul van der Heide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe with vacuum differential
- Patent number 10,614,995
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Thomas F. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of a malleable lamella for correlative atomic-resolutio...
- Patent number 9,797,923
- Issue date Oct 24, 2017
- FEI Company
- Roger Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive probe and method for producing the same
- Patent number 7,710,012
- Issue date May 4, 2010
- Hitachi High-Technologies Corporation
- Tadashi Fujieda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser stimulated atom probe characterization of semiconductor and d...
- Patent number 7,122,806
- Issue date Oct 17, 2006
- William W. Chism II
- G01 - MEASURING TESTING
Information Patent Grant
Scanning atom probe
- Patent number 6,797,952
- Issue date Sep 28, 2004
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Subpicosecond atomic and molecular motion detection and signal tran...
- Patent number 5,151,594
- Issue date Sep 29, 1992
- International Business Machines Corporation
- Gary M. McClelland
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC GRID FINGER DETECTION
- Publication number 20250166964
- Publication date May 22, 2025
- FEI Company
- Tomas Onderlicka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE
- Publication number 20220139666
- Publication date May 5, 2022
- Centre National de la Recherche Scientifique
- François VURPILLOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Characterization method for a reservoir micro pore structure and a...
- Publication number 20150371818
- Publication date Dec 24, 2015
- Petrochina Company Limited
- Jianming Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE PULSE ENERGY
- Publication number 20110260054
- Publication date Oct 27, 2011
- Imago Scientific Instruments Corporation
- Joseph H. Bunton
- B82 - NANO-TECHNOLOGY
Information Patent Application
CONDUCTIVE PROBE AND METHOD FOR PRODUCING THE SAME
- Publication number 20080067407
- Publication date Mar 20, 2008
- Tadashi Fujieda
- B82 - NANO-TECHNOLOGY
Information Patent Application
Short duration variable amplitude high voltage pulse generator
- Publication number 20070018504
- Publication date Jan 25, 2007
- Scott Albert Wiener
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Laser stimulated atom probe characterization of semiconductor and d...
- Publication number 20050017174
- Publication date Jan 27, 2005
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
Scanning atom probe
- Publication number 20030066962
- Publication date Apr 10, 2003
- Takashi Kaito
- B82 - NANO-TECHNOLOGY

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Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated tomography field ion microscope

Atom probe inspection device, field ion microscope, and distortion...

Method and apparatus for atomic probe tomography

Atom probe with vacuum differential

Fabrication of a malleable lamella for correlative atomic-resolutio...

Conductive probe and method for producing the same

Laser stimulated atom probe characterization of semiconductor and d...

Scanning atom probe

Subpicosecond atomic and molecular motion detection and signal tran...

Patents Applicationslast 30 patents

AUTOMATIC GRID FINGER DETECTION

AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE

ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...

Characterization method for a reservoir micro pore structure and a...

ATOM PROBE PULSE ENERGY

CONDUCTIVE PROBE AND METHOD FOR PRODUCING THE SAME

Short duration variable amplitude high voltage pulse generator

Laser stimulated atom probe characterization of semiconductor and d...

Scanning atom probe