Base line obtained from computation, histogram

Industry

CPC
G01N2201/12784

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/12784Base line obtained from computation, histogram

Industries

Patents Grantslast 30 patents

Information Patent Grant
Focusing linear model correction and linear model correction for mu...
- Patent number 11,561,166
- Issue date Jan 24, 2023
- Viavi Solutions Inc.
- Lan Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing linear model correction and linear model correction for mu...
- Patent number 10,969,331
- Issue date Apr 6, 2021
- VIAVI Solutions Inc.
- Lan Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diamond ATR artefact correction
- Patent number 10,018,561
- Issue date Jul 10, 2018
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Automatic background removal for input data having consecutive inpu...
- Patent number 7,329,852
- Issue date Feb 12, 2008
- Lambda Solutions
- Canwen Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-calibration of an NDIR gas sensor
- Patent number 5,347,474
- Issue date Sep 13, 1994
- Gaztech Corporation
- Jacob Y. Wong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for reading a film image with controllable illumination a...
- Patent number 4,837,450
- Issue date Jun 6, 1989
- Canon Kabushiki Kaisha
- Seiichiro Satomura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETECTING FOODBORNE PATHOGENS USING SPECTRA...
- Publication number 20230266236
- Publication date Aug 24, 2023
- Hyperspectral Corp.
- Euan Mowat
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MU...
- Publication number 20230160812
- Publication date May 25, 2023
- VIAVI SOLUTIONS INC.
- Lan SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR DISPLAY DEVICE
- Publication number 20230123595
- Publication date Apr 20, 2023
- SAMSUNG DISPLAY CO., LTD.
- Sangjun SEOK
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSORS
- Publication number 20220276159
- Publication date Sep 1, 2022
- Drager Safety AG & Co. KGaA
- Håkon SAGBERG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING AN OPTICAL SOURCE FOR CALIBRATING AN OPTICA...
- Publication number 20220205840
- Publication date Jun 30, 2022
- University of Central Florida Research Foundation, Inc.
- Romain GAUME
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MU...
- Publication number 20210208059
- Publication date Jul 8, 2021
- VIAVI Solutions Inc.
- Lan SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MU...
- Publication number 20200018691
- Publication date Jan 16, 2020
- VIAVI Solutions Inc.
- Lan SUN
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION CURVE CREATION METHOD AND DEVICE, TARGET COMPONENT CALI...
- Publication number 20160091417
- Publication date Mar 31, 2016
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
Automatic background removal for input data
- Publication number 20060255249
- Publication date Nov 16, 2006
- Canwen Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic background removal for input data
- Publication number 20050285023
- Publication date Dec 29, 2005
- LAMBDA SOLUTIONS, INC.
- Canwen Liu
- G06 - COMPUTING CALCULATING COUNTING

Base line obtained from computation, histogram

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Focusing linear model correction and linear model correction for mu...

Focusing linear model correction and linear model correction for mu...

Diamond ATR artefact correction

Automatic background removal for input data having consecutive inpu...

Self-calibration of an NDIR gas sensor

Apparatus for reading a film image with controllable illumination a...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DETECTING FOODBORNE PATHOGENS USING SPECTRA...

FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MU...

INSPECTION APPARATUS AND INSPECTION METHOD FOR DISPLAY DEVICE

GAS SENSORS

METHOD FOR FABRICATING AN OPTICAL SOURCE FOR CALIBRATING AN OPTICA...

FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MU...

FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MU...

CALIBRATION CURVE CREATION METHOD AND DEVICE, TARGET COMPONENT CALI...

Automatic background removal for input data

Automatic background removal for input data