based on the Kerr effect

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G01R15/243

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00

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G01R15/243based on the Kerr effect

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic property measuring systems, methods of measuring magnetic...
- Patent number 11,237,224
- Issue date Feb 1, 2022
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for detecting magneto-optic Kerr effect
- Patent number 10,948,733
- Issue date Mar 16, 2021
- The Regents of the University of California
- Xiangdong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Conductor to which current detection head is fixed, and current det...
- Patent number 8,947,072
- Issue date Feb 3, 2015
- Toyota Jidosha Kabushiki Kaisha
- Yusuke Seo
- G01 - MEASURING TESTING
Information Patent Grant
Current measurement technique and current measurement apparatus
- Patent number 7,239,124
- Issue date Jul 3, 2007
- Hitachi Global Storage Technologies Japan, Ltd.
- Hiroshi Ikekame
- G01 - MEASURING TESTING
Information Patent Grant
Current measurement technique and current measurement apparatus
- Patent number 6,833,694
- Issue date Dec 21, 2004
- Hitachi, Ltd.
- Hiroshi Ikekame
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring device for an encapsulated high-voltage switching...
- Patent number 3,939,412
- Issue date Feb 17, 1976
- Siemens Aktiengesellschaft
- Wolfgang Hermstein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONDUCTOR TO WHICH CURRENT DETECTION HEAD IS FIXED, AND CURRENT DET...
- Publication number 20130063128
- Publication date Mar 14, 2013
- Toyota Jidosha Kabushiki Kaisha
- Yusuke Seo
- G01 - MEASURING TESTING
Information Patent Application
Current measurement technique and current measurement apparatus
- Publication number 20050007093
- Publication date Jan 13, 2005
- Hiroshi Ikekame
- G01 - MEASURING TESTING
Information Patent Application
Current measurement technique and current measurement apparatus
- Publication number 20040051515
- Publication date Mar 18, 2004
- Hiroshi Ikekame
- G01 - MEASURING TESTING