beta or electrons

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CPC
G01N2223/102

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/102beta or electrons

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron diffraction intensity from single crystal silicon in a pho...
- Patent number 11,915,837
- Issue date Feb 27, 2024
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Nanopatterned electron beams for temporal coherence and determinist...
- Patent number 11,798,706
- Issue date Oct 24, 2023
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis device including a spectrometer to detect characteri...
- Patent number 11,740,190
- Issue date Aug 29, 2023
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic transmission electron microscopy sample preparation
- Patent number 11,703,429
- Issue date Jul 18, 2023
- NANOSOFT, LLC.
- Michael Godfrin
- G01 - MEASURING TESTING
Information Patent Grant
Multi-degree-of-freedom sample holder
- Patent number 11,670,478
- Issue date Jun 6, 2023
- Zhejiang University
- Hongtao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shutter assembly for x-ray detection
- Patent number 11,577,320
- Issue date Feb 14, 2023
- Thermo Electron Scientific Instruments LLC
- Justin Morrow
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Image processing device, image processing method and charged partic...
- Patent number 11,430,106
- Issue date Aug 30, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Marking paper products
- Patent number 10,380,388
- Issue date Aug 13, 2019
- Xyleco, Inc.
- Marshall Medoff
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Nano-level evaluation of kerogen-rich reservoir rock
- Patent number 10,379,068
- Issue date Aug 13, 2019
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Grant
Scanning transmission electron microscope and method of image gener...
- Patent number 10,340,118
- Issue date Jul 2, 2019
- Jeol Ltd.
- Ryusuke Sagawa
- G01 - MEASURING TESTING
Information Patent Grant
Nano-level evaluation of kerogen-rich reservoir rock
- Patent number 10,281,413
- Issue date May 7, 2019
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- G01 - MEASURING TESTING
Information Patent Grant
Nano-level evaluation of kerogen-rich reservoir rock
- Patent number 10,151,715
- Issue date Dec 11, 2018
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Grant
Nano-level evaluation of kerogen-rich reservoir rock
- Patent number 10,151,714
- Issue date Dec 11, 2018
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method of manufacturing a component
- Patent number 10,046,412
- Issue date Aug 14, 2018
- Rolls-Royce PLC
- Michael Lewis Blackmore
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Radiography and computed tomography with high-energy electron beams
- Patent number 9,995,695
- Issue date Jun 12, 2018
- Loma Linda University
- Reinhard W. Schulte
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Nano-level evaluation of kerogen-rich reservoir rock
- Patent number 9,869,649
- Issue date Jan 16, 2018
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Grant
CD-SEM technique for wafers fabrication control
- Patent number 9,824,852
- Issue date Nov 21, 2017
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic z-correction for basis weight sensors
- Patent number 9,612,213
- Issue date Apr 4, 2017
- Honeywell ASCA Inc.
- Reena Meijer Drees
- G01 - MEASURING TESTING
Information Patent Grant
Marking paper products
- Patent number 9,342,715
- Issue date May 17, 2016
- Xyleco, Inc.
- Marshall Medoff
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information Patent Grant
Marking paper products
- Patent number 9,317,722
- Issue date Apr 19, 2016
- Xyleco, Inc.
- Marshall Medoff
- D21 - PAPER-MAKING PRODUCTION OF CELLULOSE
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,024,280
- Issue date May 5, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 8,901,493
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast electron diffraction device
- Patent number 8,633,438
- Issue date Jan 21, 2014
- Kyoto University
- Shigeki Tokita
- G01 - MEASURING TESTING
Information Patent Grant
Fluidic density measurements based on beta particles detection
- Patent number 8,586,913
- Issue date Nov 19, 2013
- Schlumberger Technology Corporation
- Zilu Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method of electron diffraction tomography
- Patent number 8,476,588
- Issue date Jul 2, 2013
- FEI Company
- Haifeng He
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-beam system for high-speed electron-beam inspection
- Patent number 8,362,425
- Issue date Jan 29, 2013
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope having electron spectroscope
- Patent number 8,263,936
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Shohei Terada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...
- Publication number 20240280521
- Publication date Aug 22, 2024
- Ori Lieberman
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...
- Publication number 20240272092
- Publication date Aug 15, 2024
- FINAPP S.r.l.
- Luca STEVANATO
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
- Publication number 20240125718
- Publication date Apr 18, 2024
- Silanna UV Technologies Pte Ltd
- Petar Atanackovic
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...
- Publication number 20230213463
- Publication date Jul 6, 2023
- California Institute of Technology
- Jessica Burch
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE
- Publication number 20220317067
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD
- Publication number 20210372953
- Publication date Dec 2, 2021
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION INTENSITY FROM SINGLE CRYSTAL SILICON IN A PHO...
- Publication number 20210341399
- Publication date Nov 4, 2021
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREPARATION
- Publication number 20210310916
- Publication date Oct 7, 2021
- NANOSOFT, LLC.
- Michael Godfrin
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DEGREE-OF-FREEDOM SAMPLE HOLDER
- Publication number 20210287874
- Publication date Sep 16, 2021
- Zhejiang University
- Hongtao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...
- Publication number 20200219243
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Takeyoshi OHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK
- Publication number 20190017947
- Publication date Jan 17, 2019
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Application
NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK
- Publication number 20190003992
- Publication date Jan 3, 2019
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Application
Radiography and Computed Tomography with High-Energy Electron Beams
- Publication number 20180275077
- Publication date Sep 27, 2018
- LOMA LINDA UNIVERSITY
- Reinhard W. SCHULTE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK
- Publication number 20180195982
- Publication date Jul 12, 2018
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Application
NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK
- Publication number 20180156744
- Publication date Jun 7, 2018
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- E21 - EARTH DRILLING MINING
Information Patent Application
CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL
- Publication number 20170194125
- Publication date Jul 6, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY AND COMPUTED TOMOGRAPHY WITH HIGH-ENERGY ELECTRON BEAMS
- Publication number 20170160211
- Publication date Jun 8, 2017
- Reinhard W. SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK
- Publication number 20170067836
- Publication date Mar 9, 2017
- Saudi Arabian Oil Company
- Katherine Leigh Hull
- G01 - MEASURING TESTING
Information Patent Application
Marking Paper Products
- Publication number 20140299284
- Publication date Oct 9, 2014
- Marshall Medoff
- B32 - LAYERED PRODUCTS
Information Patent Application
MARKING PAPER PRODUCTS
- Publication number 20140299789
- Publication date Oct 9, 2014
- Marshall Medoff
- B32 - LAYERED PRODUCTS
Information Patent Application
MARKING PAPER PRODUCTS
- Publication number 20140299788
- Publication date Oct 9, 2014
- Marshall Medoff
- B32 - LAYERED PRODUCTS
Information Patent Application
Marking Paper Products
- Publication number 20140304863
- Publication date Oct 9, 2014
- Marshall Medoff
- B32 - LAYERED PRODUCTS
Information Patent Application
Marking Paper Products
- Publication number 20140298929
- Publication date Oct 9, 2014
- Marshall Medoff
- B32 - LAYERED PRODUCTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130075606
- Publication date Mar 28, 2013
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
ULTRAFAST ELECTRON DIFFRACTION DEVICE
- Publication number 20120312987
- Publication date Dec 13, 2012
- KYOTO UNIVERSITY
- Shigeki Tokita
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING A NUMBER OF LAYERS OF A MULTILAYE...
- Publication number 20120299735
- Publication date Nov 29, 2012
- David B. Smith
- G01 - MEASURING TESTING

beta or electrons

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for temperature monitoring in cryo-electron microscopy

Method and system to determine crystal structure

Method for improving an EBSD/TKD map

Electron diffraction intensity from single crystal silicon in a pho...

Nanopatterned electron beams for temporal coherence and determinist...

X-ray analysis device including a spectrometer to detect characteri...

Cryogenic transmission electron microscopy sample preparation

Multi-degree-of-freedom sample holder

Shutter assembly for x-ray detection

Image processing device, image processing method and charged partic...

Marking paper products

Nano-level evaluation of kerogen-rich reservoir rock

Scanning transmission electron microscope and method of image gener...

Nano-level evaluation of kerogen-rich reservoir rock

Nano-level evaluation of kerogen-rich reservoir rock

Nano-level evaluation of kerogen-rich reservoir rock

Method of manufacturing a component

Radiography and computed tomography with high-energy electron beams

Nano-level evaluation of kerogen-rich reservoir rock

CD-SEM technique for wafers fabrication control

Automatic z-correction for basis weight sensors

Marking paper products

Marking paper products

Composite charged particle beam apparatus

Electron microscope

Ultrafast electron diffraction device

Fluidic density measurements based on beta particles detection

Method of electron diffraction tomography

Multiple-beam system for high-speed electron-beam inspection

Transmission electron microscope having electron spectroscope

Patents Applicationslast 30 patents

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

BONDING WIRE FOR SEMICONDUCTOR DEVICES

CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...

SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...

Analyzing Method and Analyzer

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...

METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE

METHOD FOR IMPROVING AN EBSD/TKD MAP

X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD

ELECTRON DIFFRACTION INTENSITY FROM SINGLE CRYSTAL SILICON IN A PHO...

CRYOGENIC TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREPARATION

MULTI-DEGREE-OF-FREEDOM SAMPLE HOLDER

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...

NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK

NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK

Radiography and Computed Tomography with High-Energy Electron Beams

NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK

NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK

CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL

RADIOGRAPHY AND COMPUTED TOMOGRAPHY WITH HIGH-ENERGY ELECTRON BEAMS

NANO-LEVEL EVALUATION OF KEROGEN-RICH RESERVOIR ROCK

Marking Paper Products

MARKING PAPER PRODUCTS

MARKING PAPER PRODUCTS

Marking Paper Products

Marking Paper Products

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

ULTRAFAST ELECTRON DIFFRACTION DEVICE

METHODS AND SYSTEMS FOR MEASURING A NUMBER OF LAYERS OF A MULTILAYE...