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CPC
G01N2223/201
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/201
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Patents Grants
last 30 patents
Information
Patent Grant
Subsea computed tomography system with flat panel detectors
Patent number
10,989,673
Issue date
Apr 27, 2021
Oceaneering International, Inc.
Rajashekar Venkatachalam
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting moving target
Patent number
10,365,234
Issue date
Jul 30, 2019
Tsinghua University
Liming Wang
G01 - MEASURING TESTING
Information
Patent Grant
X-ray computer tomograph and method for examining a test piece usin...
Patent number
7,583,783
Issue date
Sep 1, 2009
GE Homeland Protection, Inc.
Geoffrey Harding
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
Publication number
20240094147
Publication date
Mar 21, 2024
Rapiscan Holdings, Inc.
Mark Procter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Subsea Computed Tomography system with flat panel detectors
Publication number
20190346383
Publication date
Nov 14, 2019
OCEANEERING INTERNATIONAL, INC.
Rajashekar Venkatachalam
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING MOVING TARGET
Publication number
20170269006
Publication date
Sep 21, 2017
TSINGHUA UNIVERSITY
Liming Wang
G01 - MEASURING TESTING
Information
Patent Application
X-RAY COMPUTER TOMOGRAPH AND METHOD FOR EXAMINING A TEST PIECE USIN...
Publication number
20070153970
Publication date
Jul 5, 2007
Geoffrey Harding
G01 - MEASURING TESTING