Biological samples

Industry

CPC
H01J2237/2004

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2004Biological samples

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Vacuum transfer assembly
- Patent number 11,994,663
- Issue date May 28, 2024
- HennyZ B.V.
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for nanoscale X-ray imaging
- Patent number 11,437,218
- Issue date Sep 6, 2022
- Massachusetts Institute of Technology
- Richard C. Lanza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Freezable fluid cell for cryo-electron microscopy
- Patent number 11,402,308
- Issue date Aug 2, 2022
- Brandeis University
- Joel Meyerson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Depth reconstruction for 3D images of samples in a charged particle...
- Patent number 11,380,529
- Issue date Jul 5, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrochemical measurement of electron beam-induced pH change duri...
- Patent number 11,264,199
- Issue date Mar 1, 2022
- University of Maryland, College Park
- Taylor Woehl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examination container and electron microscope
- Patent number 10,607,808
- Issue date Mar 31, 2020
- TAIWAN ELECTRON MICROSCOPE INSTRUMENT CORPORATION
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, electron microscope and sample observ...
- Patent number 10,204,761
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy sample support including porous metal foil
- Patent number 10,157,725
- Issue date Dec 18, 2018
- United Kingdom Research and Innovation
- Lori A. Passmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope having a carrier
- Patent number 9,842,722
- Issue date Dec 12, 2017
- Industrial Technology Research Institute
- Hsin-Hung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-ice grid assembly for cryo-electron microscopy
- Patent number 9,786,469
- Issue date Oct 10, 2017
- University of Washington
- Liguo Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Sample supporting member for observing scanning electron microscopi...
- Patent number 9,589,765
- Issue date Mar 7, 2017
- National Institute of Advanced Industrial Science and Technology
- Toshihiko Ogura
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron microscopic observation method for observing biological sa...
- Patent number 9,557,253
- Issue date Jan 31, 2017
- Japan Science and Technology Agency
- Takahiko Hariyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample base, charged particle beam device and sample observation me...
- Patent number 9,508,527
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
- Patent number 9,472,375
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscopy for imaging live cells
- Patent number 9,207,196
- Issue date Dec 8, 2015
- Vanderbilt University
- Niels De Jonge
- G01 - MEASURING TESTING
Information Patent Grant
Micro-reactor for observing particles in a fluid
- Patent number 9,162,211
- Issue date Oct 20, 2015
- FEI Company
- Gerard Anne Nicolaas Van Veen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for 4D tomography and ultrafast scanning electron...
- Patent number 8,841,613
- Issue date Sep 23, 2014
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and sample holding device for electron beam de...
- Patent number 8,604,429
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 8,158,937
- Issue date Apr 17, 2012
- Joel Ltd.
- Mitsuru Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting sample
- Patent number 8,119,994
- Issue date Feb 21, 2012
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of use of reusable sample holding device permitting ready lo...
- Patent number 8,102,523
- Issue date Jan 24, 2012
- The United States of America as represented by the Secretary of the Army
- Charles P. Marsh
- G02 - OPTICS
Information Patent Grant
Reusable sample holding device permitting ready loading of very sma...
- Patent number 8,059,271
- Issue date Nov 15, 2011
- The United States of America as represented by the Secretary of the Army
- Charles P. Marsh
- G02 - OPTICS
Information Patent Grant
Sample holder, method for observation and inspection, and apparatus...
- Patent number 7,928,380
- Issue date Apr 19, 2011
- Jeol Ltd.
- Mitsuo Suga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and reagent solution
- Patent number 7,906,760
- Issue date Mar 15, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Liquid medium for preventing charge-up in electron microscope and m...
- Patent number 7,880,144
- Issue date Feb 1, 2011
- Juridical Foundation Osaka Industrial Promotion Organization c/o Mydome Osaka
- Susumu Kuwabata
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder, specimen inspection apparatus, specimen inspection...
- Patent number 7,745,802
- Issue date Jun 29, 2010
- Jeol Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryo-charging specimen holder for electron microscope
- Patent number 7,659,510
- Issue date Feb 9, 2010
- Chih-Yu Chao
- G01 - MEASURING TESTING
Information Patent Grant
Circular silicon substrates with thin film membranes for electron m...
- Patent number 7,482,587
- Issue date Jan 27, 2009
- Dudley Sean Finch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen box for electron microscope capable of observing general s...
- Patent number 7,476,871
- Issue date Jan 13, 2009
- Contrel Technology Co., Ltd.
- Chih-Yu Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-closed observational environment for electron microscope
- Patent number 7,388,211
- Issue date Jun 17, 2008
- Chih-Yu Chao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELE...
- Publication number 20230073506
- Publication date Mar 9, 2023
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Sebastian TACKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPTH RECONSTRUCTION FOR 3D IMAGES OF SAMPLES IN A CHARGED PARTICLE...
- Publication number 20220102121
- Publication date Mar 31, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROCHEMICAL MEASUREMENT OF ELECTRON BEAM-INDUCED PH CHANGE DURI...
- Publication number 20210249219
- Publication date Aug 12, 2021
- University of Maryland, College Park
- Taylor Woehl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR NANOSCALE X-RAY IMAGING
- Publication number 20210151288
- Publication date May 20, 2021
- Massachusetts Institute of Technology
- Richard C. Lanza
- G01 - MEASURING TESTING
Information Patent Application
VACUUM TRANSFER ASSEMBLY
- Publication number 20210055534
- Publication date Feb 25, 2021
- HennyZ B.V.
- Hendrik Willem ZANDBERGEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORTING MEMBER FOR OBSERVING SCANNING ELECTRON MICROSCOPI...
- Publication number 20140346352
- Publication date Nov 27, 2014
- National Institute of Advanced Industrial Science and Technology
- Toshihiko Ogura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPIC OBSERVATION METHOD FOR OBSERVING BIOLOGICAL SA...
- Publication number 20140227734
- Publication date Aug 14, 2014
- Takahiko Hariyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE SURFACE TREATMENT OF A FLUID PRODUCT DISPENSING DEVICE
- Publication number 20130149459
- Publication date Jun 13, 2013
- APTAR FRANCE SAS
- Pascal Bruna
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
NANOFLUIDIC CELL
- Publication number 20120182548
- Publication date Jul 19, 2012
- INSIGHT NANOFLUIDICS INC
- Maher Harb
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPY FOR IMAGING LIVE CELLS
- Publication number 20120120226
- Publication date May 17, 2012
- Vanderbilt University
- Niels de Jonge
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD OF USE OF REUSABLE SAMPLE HOLDING DEVICE PERMITTING READY LO...
- Publication number 20120017415
- Publication date Jan 26, 2012
- CHARLES P. MARSH
- G02 - OPTICS
Information Patent Application
ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...
- Publication number 20110303845
- Publication date Dec 15, 2011
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR 4D TOMOGRAPHY AND ULTRAFAST SCANNING ELECTRON...
- Publication number 20110284744
- Publication date Nov 24, 2011
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder, Inspection Apparatus, and Inspection Method
- Publication number 20110284745
- Publication date Nov 24, 2011
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID
- Publication number 20110097706
- Publication date Apr 28, 2011
- FEI Company
- Gerard Anne Nicolaas van Veen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ELECTROCHEMICAL LIQUID CELL APPARATUS
- Publication number 20100276277
- Publication date Nov 4, 2010
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Inspecting Samples
- Publication number 20100243888
- Publication date Sep 30, 2010
- JEOL Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REUSABLE SAMPLE HOLDING DEVICE PERMITTING READY LOADING OF VERY SMA...
- Publication number 20100193398
- Publication date Aug 5, 2010
- CHARLES P. MARSH
- G02 - OPTICS
Information Patent Application
Particle Beam System
- Publication number 20100051803
- Publication date Mar 4, 2010
- JEOL Ltd.
- Mitsuru Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
- Publication number 20100019146
- Publication date Jan 28, 2010
- JEOL Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pre-Cryogenic Electron Microscope Specimen Holder
- Publication number 20090283696
- Publication date Nov 19, 2009
- E HONG INSTRUMENTS CO., LTD.
- Chih-Yuan Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method and Reagent Solution
- Publication number 20090250609
- Publication date Oct 8, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Inspecting Sample
- Publication number 20090242762
- Publication date Oct 1, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Cryo-charging specimen holder for electron microscope
- Publication number 20090242795
- Publication date Oct 1, 2009
- Chih-Yu Chao
- G01 - MEASURING TESTING
Information Patent Application
Liquid Medium For Preventing Charge-Up in Electron Microscope and M...
- Publication number 20090173882
- Publication date Jul 9, 2009
- Susumu Kuwabata
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder, Method for Observation and Inspection, and Apparatus...
- Publication number 20090166536
- Publication date Jul 2, 2009
- JEOL Ltd.
- Mitsuo Suga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample enclosure for inspection and methods of use thereof
- Publication number 20090045349
- Publication date Feb 19, 2009
- David Sprinzak
- G01 - MEASURING TESTING
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection...
- Publication number 20080308731
- Publication date Dec 18, 2008
- JEOL Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen box for electron microscope capable of observing general s...
- Publication number 20070145287
- Publication date Jun 28, 2007
- LEE, Bing-Huan
- Chih-Yu Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Closed observational device for electron microscope
- Publication number 20070145289
- Publication date Jun 28, 2007
- LEE, Bing-Huan
- Chih-Yu Chao
- H01 - BASIC ELECTRIC ELEMENTS

Biological samples

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vacuum transfer assembly

Apparatus and method for nanoscale X-ray imaging

Freezable fluid cell for cryo-electron microscopy

Depth reconstruction for 3D images of samples in a charged particle...

Electrochemical measurement of electron beam-induced pH change duri...

Examination container and electron microscope

Charged particle beam device, electron microscope and sample observ...

Electron microscopy sample support including porous metal foil

Electron microscope having a carrier

Thin-ice grid assembly for cryo-electron microscopy

Sample supporting member for observing scanning electron microscopi...

Electron microscopic observation method for observing biological sa...

Sample base, charged particle beam device and sample observation me...

Charged particle beam device, sample stage unit, and sample observa...

Transmission electron microscopy for imaging live cells

Micro-reactor for observing particles in a fluid

Method and system for 4D tomography and ultrafast scanning electron...

Electron beam device and sample holding device for electron beam de...

Particle beam system

Apparatus and method for inspecting sample

Method of use of reusable sample holding device permitting ready lo...

Reusable sample holding device permitting ready loading of very sma...

Sample holder, method for observation and inspection, and apparatus...

Inspection method and reagent solution

Liquid medium for preventing charge-up in electron microscope and m...

Specimen holder, specimen inspection apparatus, specimen inspection...

Cryo-charging specimen holder for electron microscope

Circular silicon substrates with thin film membranes for electron m...

Specimen box for electron microscope capable of observing general s...

Semi-closed observational environment for electron microscope

Patents Applicationslast 30 patents

WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELE...

DEPTH RECONSTRUCTION FOR 3D IMAGES OF SAMPLES IN A CHARGED PARTICLE...

ELECTROCHEMICAL MEASUREMENT OF ELECTRON BEAM-INDUCED PH CHANGE DURI...

APPARATUS AND METHOD FOR NANOSCALE X-RAY IMAGING

VACUUM TRANSFER ASSEMBLY

SAMPLE SUPPORTING MEMBER FOR OBSERVING SCANNING ELECTRON MICROSCOPI...

ELECTRON MICROSCOPIC OBSERVATION METHOD FOR OBSERVING BIOLOGICAL SA...

METHOD FOR THE SURFACE TREATMENT OF A FLUID PRODUCT DISPENSING DEVICE

NANOFLUIDIC CELL

TRANSMISSION ELECTRON MICROSCOPY FOR IMAGING LIVE CELLS

METHOD OF USE OF REUSABLE SAMPLE HOLDING DEVICE PERMITTING READY LO...

ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...

METHOD AND SYSTEM FOR 4D TOMOGRAPHY AND ULTRAFAST SCANNING ELECTRON...

Sample Holder, Inspection Apparatus, and Inspection Method

MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID

ELECTROCHEMICAL LIQUID CELL APPARATUS

Apparatus and Method for Inspecting Samples

REUSABLE SAMPLE HOLDING DEVICE PERMITTING READY LOADING OF VERY SMA...

Particle Beam System

Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...

Pre-Cryogenic Electron Microscope Specimen Holder

Inspection Method and Reagent Solution

Apparatus and Method for Inspecting Sample

Cryo-charging specimen holder for electron microscope

Liquid Medium For Preventing Charge-Up in Electron Microscope and M...

Sample Holder, Method for Observation and Inspection, and Apparatus...

Sample enclosure for inspection and methods of use thereof

Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection...

Specimen box for electron microscope capable of observing general s...

Closed observational device for electron microscope