Bit line control

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G11C2029/1204

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GPHYSICS G11Information storage G11CSTATIC STORES

Current Industry

G11C2029/1204Bit line control

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self test circuit for segmented static random access memor...
- Patent number 12,170,120
- Issue date Dec 17, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Hitesh Chawla
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit, memory array, and testing method of memory array
- Patent number 12,170,123
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory system with secure detection of virgin memory c...
- Patent number 12,154,643
- Issue date Nov 26, 2024
- NXP B.V.
- Soenke Ostertun
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 12,136,463
- Issue date Nov 5, 2024
- Samsung Electronics Co., Ltd.
- Kiheung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device, operating method thereof, controller fo...
- Patent number 12,094,552
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect detection during erase operations
- Patent number 12,094,549
- Issue date Sep 17, 2024
- Micron Technology, Inc.
- Jun Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Virtualized scan chain testing in a random access memory (RAM) array
- Patent number 12,087,383
- Issue date Sep 10, 2024
- Ampere Computing LLC
- David Hoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing operations for memory systems
- Patent number 12,067,257
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Yuan He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system
- Patent number 12,068,049
- Issue date Aug 20, 2024
- Kioxia Corporation
- Naomi Takeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory systems having memory devices therein with enhanced error co...
- Patent number 12,057,184
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system and computer program product for memory repair
- Patent number 12,014,790
- Issue date Jun 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Katherine H. Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing failure of memory, storage medium,...
- Patent number 11,967,392
- Issue date Apr 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chenggong Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Topology-based retirement in a memory system
- Patent number 11,942,174
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Chun S. Yeung
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method to detect word-line leakage and process defects...
- Patent number 11,935,607
- Issue date Mar 19, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Vikas Rana
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for column repair
- Patent number 11,901,033
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Jooyong Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for testing memory chip
- Patent number 11,901,024
- Issue date Feb 13, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Dong Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with error checking and correcting unit
- Patent number 11,894,089
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weibing Shang
- G11 - INFORMATION STORAGE
Information Patent Grant
Fail Bit repair method and device
- Patent number 11,887,685
- Issue date Jan 30, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-repair for sequential SRAM
- Patent number 11,869,617
- Issue date Jan 9, 2024
- Meta Platforms Technologies, LLC
- Huichu Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 11,862,273
- Issue date Jan 2, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable logic device with design for test functionality
- Patent number 11,848,066
- Issue date Dec 19, 2023
- QuickLogic Corporation
- Ket Chong Yap
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory chip having on-die mirroring function and method for testing...
- Patent number 11,848,068
- Issue date Dec 19, 2023
- Samsung Electronics Co., Ltd.
- Byoungsul Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for detecting anti-fuse memory cell state and memory
- Patent number 11,817,159
- Issue date Nov 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Rumin Ji
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device, operating method thereof, controller fo...
- Patent number 11,804,280
- Issue date Oct 31, 2023
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for fail bit repairing
- Patent number 11,791,010
- Issue date Oct 17, 2023
- Changxin Memory Technologies, Inc.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling memory including managing a correction value table
- Patent number 11,776,651
- Issue date Oct 3, 2023
- Kioxia Corporation
- Masanobu Shirakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Delay fault testing of pseudo static controls
- Patent number 11,768,726
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Aravinda Acharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for LUT-free memory repair
- Patent number 11,769,568
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Katherine H. Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory and operation method of memory
- Patent number 11,763,909
- Issue date Sep 19, 2023
- SK Hynix Inc.
- Jeong Jun Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Bipolar read retry
- Patent number 11,728,005
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Yen Chun Lee
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION DURING ERASE OPERATIONS
- Publication number 20240404615
- Publication date Dec 5, 2024
- Micron Technology, Inc.
- Jun Xu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY FAILURE ANALYSIS BASED ON BITLINE THRESHOLD VOLTAGE DISTRIBU...
- Publication number 20240395348
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Kyle B. Brock-Petersen
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR DETECTING AN ERROR IN AN ELECTRONIC MEMORY
- Publication number 20240386967
- Publication date Nov 21, 2024
- INSTITUT MINES TELECOM
- Jean-Max DUTERTRE
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20240363186
- Publication date Oct 31, 2024
- KIOXIA Corporation
- Naomi TAKEDA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...
- Publication number 20240339168
- Publication date Oct 10, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, CONTROL METHOD, AND CONTROL DEVICE
- Publication number 20240331789
- Publication date Oct 3, 2024
- WINBOND ELECTRONICS CORP.
- Takahiko SATO
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR
- Publication number 20240331795
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. CHIANG
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE
- Publication number 20240321334
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Kosuke HATSUDA
- G11 - INFORMATION STORAGE
Information Patent Application
TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM
- Publication number 20240290411
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Chun S. Yeung
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND TEST METHOD THEREOF
- Publication number 20240221855
- Publication date Jul 4, 2024
- MACRONIX INTERNATIONAL CO, LTD.
- Chih-Wei Hu
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY SYSTEM WITH SECURE DETECTION OF VIRGIN MEMORY C...
- Publication number 20240203518
- Publication date Jun 20, 2024
- NXP B.V.
- Soenke Ostertun
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE PERFORMING SENSING OPERATION AND METHOD OF OPERATING...
- Publication number 20240185939
- Publication date Jun 6, 2024
- SK HYNIX INC.
- Se Chun PARK
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE LOGIC DEVICE WITH DESIGN FOR TEST FUNCTIONALITY
- Publication number 20240170087
- Publication date May 23, 2024
- QuickLogic Corporation
- Ket Chong Yap
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED...
- Publication number 20240161850
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- Byeongho Kim
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR SINGLE-PASS ACCESS OF ECC INFORMATION,...
- Publication number 20240161856
- Publication date May 16, 2024
- Micron Technology, Inc.
- Scott E. Smith
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ERROR CHECKING AND CORRECTING UNIT
- Publication number 20240145022
- Publication date May 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Weibing SHANG
- G11 - INFORMATION STORAGE
Information Patent Application
AT-SPEED TRANSITION FAULT TESTING FOR A MULTI-PORT AND MULTI-CLOCK...
- Publication number 20240112748
- Publication date Apr 4, 2024
- STMicroelectronics International N.V.
- Tanuj KUMAR
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING OPERATIONS FOR MEMORY SYSTEMS
- Publication number 20240094921
- Publication date Mar 21, 2024
- Micron Technology, Inc.
- Yuan He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY
- Publication number 20240079080
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE APPARATUS
- Publication number 20240071551
- Publication date Feb 29, 2024
- ABLIC Inc.
- Yasushi IMAI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF TEST CIRCUIT FOR SEGMENTED STATIC RANDOM ACCESS MEMOR...
- Publication number 20240071546
- Publication date Feb 29, 2024
- STMicroelectronics International N.V.
- Hitesh CHAWLA
- G11 - INFORMATION STORAGE
Information Patent Application
DATA CODING DEVICE, MEMORY CONTROLLER, AND STORAGE DEVICE
- Publication number 20240038317
- Publication date Feb 1, 2024
- SK HYNIX INC.
- Ie Ryung PARK
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM REFRESH WITH GATE-INDUCED DRAIN LEAKAGE
- Publication number 20240038316
- Publication date Feb 1, 2024
- Micron Technology, Inc.
- Huai-Yuan Tseng
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REPAIRING MUTLIPLE BIT LINES WITH A SAM...
- Publication number 20240029781
- Publication date Jan 25, 2024
- Micron Technology, Inc.
- JOHN F. SCHRECK
- G11 - INFORMATION STORAGE
Information Patent Application
VIRTUALIZED SCAN CHAIN TESTING IN A RANDOM ACCESS MEMORY (RAM) ARRAY
- Publication number 20240006012
- Publication date Jan 4, 2024
- Ampere Computing LLC
- David Hoff
- G11 - INFORMATION STORAGE
Information Patent Application
OPERATING AND TESTING SEMICONDUCTOR DEVICES
- Publication number 20240006008
- Publication date Jan 4, 2024
- Samsung Electronics Co., Ltd.
- Taewook PARK
- G11 - INFORMATION STORAGE
Information Patent Application
Design for Testability Circuit and Read and Write Path Decoupling C...
- Publication number 20230410928
- Publication date Dec 21, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY AND OPERATION METHOD THEREOF
- Publication number 20230384942
- Publication date Nov 30, 2023
- SK HYNIX INC.
- Sang Woo YOON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR LUT-FREE MEMORY REPAIR
- Publication number 20230368858
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. Chiang
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE LOGIC DEVICE WITH DESIGN FOR TEST FUNCTIONALITY
- Publication number 20230317192
- Publication date Oct 5, 2023
- QuickLogic Corporation
- Ket Chong Yap
- G11 - INFORMATION STORAGE

Bit line control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Built-in self test circuit for segmented static random access memor...

Memory test circuit, memory array, and testing method of memory array

Non-volatile memory system with secure detection of virgin memory c...

Semiconductor memory devices and methods of operating semiconductor...

Non-volatile memory device, operating method thereof, controller fo...

Defect detection during erase operations

Virtualized scan chain testing in a random access memory (RAM) array

Testing operations for memory systems

Memory system

Memory systems having memory devices therein with enhanced error co...

Method, system and computer program product for memory repair

Method and apparatus for testing failure of memory, storage medium,...

Topology-based retirement in a memory system

Circuit and method to detect word-line leakage and process defects...

Memory device for column repair

Method and device for testing memory chip

Memory with error checking and correcting unit

Fail Bit repair method and device

Self-repair for sequential SRAM

Storage devices and methods of operating storage devices

Programmable logic device with design for test functionality

Memory chip having on-die mirroring function and method for testing...

Circuit for detecting anti-fuse memory cell state and memory

Non-volatile memory device, operating method thereof, controller fo...

Method and device for fail bit repairing

Controlling memory including managing a correction value table

Delay fault testing of pseudo static controls

Method for LUT-free memory repair

Memory and operation method of memory

Bipolar read retry

Patents Applicationslast 30 patents

DEFECT DETECTION DURING ERASE OPERATIONS

MEMORY FAILURE ANALYSIS BASED ON BITLINE THRESHOLD VOLTAGE DISTRIBU...

METHOD FOR DETECTING AN ERROR IN AN ELECTRONIC MEMORY

MEMORY SYSTEM

MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...

SEMICONDUCTOR MEMORY DEVICE, CONTROL METHOD, AND CONTROL DEVICE

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR

STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE

TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM

MEMORY DEVICE AND TEST METHOD THEREOF

NON-VOLATILE MEMORY SYSTEM WITH SECURE DETECTION OF VIRGIN MEMORY C...

MEMORY DEVICE PERFORMING SENSING OPERATION AND METHOD OF OPERATING...

PROGRAMMABLE LOGIC DEVICE WITH DESIGN FOR TEST FUNCTIONALITY

MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED...

APPARATUSES AND METHODS FOR SINGLE-PASS ACCESS OF ECC INFORMATION,...

MEMORY WITH ERROR CHECKING AND CORRECTING UNIT

AT-SPEED TRANSITION FAULT TESTING FOR A MULTI-PORT AND MULTI-CLOCK...

TESTING OPERATIONS FOR MEMORY SYSTEMS

MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY

SEMICONDUCTOR STORAGE APPARATUS

BUILT-IN SELF TEST CIRCUIT FOR SEGMENTED STATIC RANDOM ACCESS MEMOR...

DATA CODING DEVICE, MEMORY CONTROLLER, AND STORAGE DEVICE

PROGRAM REFRESH WITH GATE-INDUCED DRAIN LEAKAGE

APPARATUSES AND METHODS FOR REPAIRING MUTLIPLE BIT LINES WITH A SAM...

VIRTUALIZED SCAN CHAIN TESTING IN A RANDOM ACCESS MEMORY (RAM) ARRAY

OPERATING AND TESTING SEMICONDUCTOR DEVICES

Design for Testability Circuit and Read and Write Path Decoupling C...

MEMORY AND OPERATION METHOD THEREOF

METHOD FOR LUT-FREE MEMORY REPAIR

PROGRAMMABLE LOGIC DEVICE WITH DESIGN FOR TEST FUNCTIONALITY