by acoustic microscopy

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G01N29/0681

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object

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G01N29/0681by acoustic microscopy

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Patents Grantslast 30 patents

Information Patent Grant
Ultrasound sub-surface probe microscopy device and corresponding me...
- Patent number 12,130,258
- Issue date Oct 29, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and photoacoustic microscope
- Patent number 11,959,882
- Issue date Apr 16, 2024
- Riken
- Masayuki Maruyama
- G02 - OPTICS
Information Patent Grant
Heterodyne scanning probe microscopy method and system
- Patent number 11,940,416
- Issue date Mar 26, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining the position of a target stru...
- Patent number 11,927,891
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic array detection and imaging
- Patent number 11,892,431
- Issue date Feb 6, 2024
- ThunderTech Inc.
- Alan Rock
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Frequency tracking for subsurface atomic force microscopy
- Patent number 11,402,405
- Issue date Aug 2, 2022
- Nederlandse Oganisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Paul Louis Maria Joseph Van Neer
- G01 - MEASURING TESTING
Information Patent Grant
Subsurface atomic force microscopy with guided ultrasound waves
- Patent number 11,327,092
- Issue date May 10, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device, system and method for imaging defects in a structure by tra...
- Patent number 11,313,837
- Issue date Apr 26, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Olivier Mesnil
- G01 - MEASURING TESTING
Information Patent Grant
Method, atomic force microscopy system and computer program product
- Patent number 11,289,367
- Issue date Mar 29, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Method of and atomic force microscopy system for performing subsurf...
- Patent number 11,268,935
- Issue date Mar 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for mid-infrared microscopy and analysis
- Patent number 11,193,886
- Issue date Dec 7, 2021
- Helmholtz Zentrum Munchen Deutsches Forschungszentrum Fur Gesundheit und Umwe...
- Vasilis Ntziachristos
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and systems to detect sub-surface defects in electronics mo...
- Patent number 11,193,913
- Issue date Dec 7, 2021
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Shailesh N. Joshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting an anomaly in a single crystal structure
- Patent number 11,099,143
- Issue date Aug 24, 2021
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Acoustical microscope
- Patent number 11,085,901
- Issue date Aug 10, 2021
- Dan Slater
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy system, method for mapping one or more subs...
- Patent number 11,035,878
- Issue date Jun 15, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Laurent Fillinger
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for detecting structures on or below the surfa...
- Patent number 11,029,329
- Issue date Jun 8, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy device, method and lithographic system
- Patent number 10,976,345
- Issue date Apr 13, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for performing detection on or characterizatio...
- Patent number 10,948,458
- Issue date Mar 16, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne atomic force microscopy device, method and lithographic...
- Patent number 10,942,200
- Issue date Mar 9, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Grant
Molecular manipulation system and method
- Patent number 10,941,437
- Issue date Mar 9, 2021
- AFS TECHNOLOGIES B.V.
- Erwin Johannes Gerard Peterman
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining an overlay error, method for manufacturing a...
- Patent number 10,935,568
- Issue date Mar 2, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Grant
Scanning acoustic microscopy system and method
- Patent number 10,823,710
- Issue date Nov 3, 2020
- Texas Instruments Incorporated
- Dat Tan Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for performing defect detection on or characte...
- Patent number 10,775,405
- Issue date Sep 15, 2020
- Nederlandse Organisatie voor toegepast-natuuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-resolution ultrasonic nondestructive imaging method
- Patent number 10,761,066
- Issue date Sep 1, 2020
- KBR WYLE Services, LLC
- Jeong K. Na
- G01 - MEASURING TESTING
Information Patent Grant
Method of tuning parameter settings for performing acoustic scannin...
- Patent number 10,746,702
- Issue date Aug 18, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method for the ultrasonic microscopic measurement of semiconductor...
- Patent number 10,677,760
- Issue date Jun 9, 2020
- OSRAM OLED GmbH
- Helmut Appel
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for oblique backscattering ultrasound transmissiv...
- Patent number 10,641,739
- Issue date May 5, 2020
- Trustees of Boston University
- Jerome Charles Mertz
- G01 - MEASURING TESTING
Information Patent Grant
Device for the volumetric analysis of an organic or inorganic sample
- Patent number 10,598,692
- Issue date Mar 24, 2020
- Universite de Bourgogne
- Eric Bourillot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOACOUSTIC MICROSCOPY PLATFORM
- Publication number 20240345031
- Publication date Oct 17, 2024
- Barbara Smith
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SPEED SCANNING PHOTO-ACOUSTIC IMAGE INPUT APPARATUS AND CONTRO...
- Publication number 20240044844
- Publication date Feb 8, 2024
- Pukyong National University Industry-University Cooperation Foundation
- Jung Hwan OH
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC MICROSCOPE SYSTEM AND METHOD FOR MEASURING AN OBJECT DISPO...
- Publication number 20230408452
- Publication date Dec 21, 2023
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Paul Louis Maria Joseph VAN NEER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR AUTOMATED DEFECT DETECTION
- Publication number 20230153989
- Publication date May 18, 2023
- SONIX, Inc.
- Kevin Ryan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER CHUCK FOR HANDLING A WAFER
- Publication number 20220328341
- Publication date Oct 13, 2022
- PVA TePla Analytical Systems GmbH
- Peter HOFFROGGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRASOUND SUB-SURFACE PROBE MICROSCOPY DEVICE AND CORRESPONDING ME...
- Publication number 20220236228
- Publication date Jul 28, 2022
- Maarten Hubertus VAN ES
- G01 - MEASURING TESTING
Information Patent Application
Haptic Feedback Microscope
- Publication number 20220236227
- Publication date Jul 28, 2022
- Dan Slater
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
METHOD AND SYSTEM FOR IMAGING STRUCTURES BELOW THE SURFACE OF A SAMPLE
- Publication number 20220205953
- Publication date Jun 30, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele PIRAS
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...
- Publication number 20220091069
- Publication date Mar 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus VAN ES
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY TRACKING FOR SUBSURFACE ATOMIC FORCE MICROSCOPY
- Publication number 20210389345
- Publication date Dec 16, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Paul Louis Maria Joseph VAN NEER
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Determining the Position of a Target Stru...
- Publication number 20210364936
- Publication date Nov 25, 2021
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System, Method and Apparatus for Ultrasonic Inspection
- Publication number 20210356439
- Publication date Nov 18, 2021
- SONIX, Inc.
- Young-Shin Kwon
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR RASTER-SCAN OPTOACOUSTIC IMAGING
- Publication number 20210307615
- Publication date Oct 7, 2021
- iThera Medical GMBH
- Mathias Schwarz
- G01 - MEASURING TESTING
Information Patent Application
Acoustic Array Detection and Imaging
- Publication number 20210302389
- Publication date Sep 30, 2021
- ThunderTech Inc.
- Alan Rock
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND SYSTEMS TO DETECT SUB-SURFACE DEFECTS IN ELECTRONICS MO...
- Publication number 20210239653
- Publication date Aug 5, 2021
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Shailesh N. Joshi
- G01 - MEASURING TESTING
Information Patent Application
SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES
- Publication number 20210109128
- Publication date Apr 15, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR IMAGING DEFECTS IN A STRUCTURE BY TRA...
- Publication number 20210080430
- Publication date Mar 18, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Olivier MESNIL
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND PHOTOACOUSTIC MICROSCOPE
- Publication number 20210055265
- Publication date Feb 25, 2021
- Riken
- Masayuki MARUYAMA
- G01 - MEASURING TESTING
Information Patent Application
SNAPSHOT PHOTOACOUSTIC PHOTOGRAPHY USING AN ERGODIC RELAY
- Publication number 20210010976
- Publication date Jan 14, 2021
- California Institute of Technology
- Lihong Wang
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MID-INFRARED MICROSCOPY AND ANALYSIS
- Publication number 20200355604
- Publication date Nov 12, 2020
- Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwe...
- Vasilis Ntziachristos
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...
- Publication number 20200309816
- Publication date Oct 1, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Laurent FILLINGER
- G01 - MEASURING TESTING
Information Patent Application
METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20200227311
- Publication date Jul 16, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING AN ANOMALY IN A SINGLE CRYSTAL STRUCTURE
- Publication number 20200225171
- Publication date Jul 16, 2020
- Rolls-Royce plc
- Jacqueline GRIFFITHS
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC...
- Publication number 20200124635
- Publication date Apr 23, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURF...
- Publication number 20200057028
- Publication date Feb 20, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR PERFORMING DETECTION ON OR CHARACTERIZATIO...
- Publication number 20190383774
- Publication date Dec 19, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR DETECTING STRUCTURES ON OR BELOW THE SURFA...
- Publication number 20190369140
- Publication date Dec 5, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC SYSTEM
- Publication number 20190369139
- Publication date Dec 5, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING AN OVERLAY ERROR, METHOD FOR MANUFACTURING A...
- Publication number 20190310284
- Publication date Oct 10, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE
- Publication number 20190227098
- Publication date Jul 25, 2019
- UNIVERSITE DE BOURGOGNE
- Eric Bourillot
- G01 - MEASURING TESTING

by acoustic microscopy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ultrasound sub-surface probe microscopy device and corresponding me...

Optical device and photoacoustic microscope

Heterodyne scanning probe microscopy method and system

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Apparatus and methods for determining the position of a target stru...

Acoustic array detection and imaging

Heterodyne scanning probe microscopy method and scanning probe micr...

Frequency tracking for subsurface atomic force microscopy

Subsurface atomic force microscopy with guided ultrasound waves

Device, system and method for imaging defects in a structure by tra...

Method, atomic force microscopy system and computer program product

Method of and atomic force microscopy system for performing subsurf...

Device and method for mid-infrared microscopy and analysis

Methods and systems to detect sub-surface defects in electronics mo...

Method of detecting an anomaly in a single crystal structure

Acoustical microscope

Atomic force microscopy system, method for mapping one or more subs...

Method of and system for detecting structures on or below the surfa...

Atomic force microscopy device, method and lithographic system

Method of and system for performing detection on or characterizatio...

Heterodyne atomic force microscopy device, method and lithographic...

Molecular manipulation system and method

Method of determining an overlay error, method for manufacturing a...

Scanning acoustic microscopy system and method

Method of and system for performing defect detection on or characte...

Micro-resolution ultrasonic nondestructive imaging method

Method of tuning parameter settings for performing acoustic scannin...

Method for the ultrasonic microscopic measurement of semiconductor...

Method and system for oblique backscattering ultrasound transmissiv...

Device for the volumetric analysis of an organic or inorganic sample

Patents Applicationslast 30 patents

PHOTOACOUSTIC MICROSCOPY PLATFORM

HIGH-SPEED SCANNING PHOTO-ACOUSTIC IMAGE INPUT APPARATUS AND CONTRO...

ACOUSTIC MICROSCOPE SYSTEM AND METHOD FOR MEASURING AN OBJECT DISPO...

METHOD AND APPARATUS FOR AUTOMATED DEFECT DETECTION

WAFER CHUCK FOR HANDLING A WAFER

ULTRASOUND SUB-SURFACE PROBE MICROSCOPY DEVICE AND CORRESPONDING ME...

Haptic Feedback Microscope

METHOD AND SYSTEM FOR IMAGING STRUCTURES BELOW THE SURFACE OF A SAMPLE

CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...

FREQUENCY TRACKING FOR SUBSURFACE ATOMIC FORCE MICROSCOPY

Apparatus and Methods for Determining the Position of a Target Stru...

System, Method and Apparatus for Ultrasonic Inspection

DEVICE AND METHOD FOR RASTER-SCAN OPTOACOUSTIC IMAGING

Acoustic Array Detection and Imaging

METHODS AND SYSTEMS TO DETECT SUB-SURFACE DEFECTS IN ELECTRONICS MO...

SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES

DEVICE, SYSTEM AND METHOD FOR IMAGING DEFECTS IN A STRUCTURE BY TRA...

OPTICAL DEVICE AND PHOTOACOUSTIC MICROSCOPE

SNAPSHOT PHOTOACOUSTIC PHOTOGRAPHY USING AN ERGODIC RELAY

DEVICE AND METHOD FOR MID-INFRARED MICROSCOPY AND ANALYSIS

ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...

METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT

METHOD OF DETECTING AN ANOMALY IN A SINGLE CRYSTAL STRUCTURE

HETERODYNE ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC...

METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURF...

METHOD OF AND SYSTEM FOR PERFORMING DETECTION ON OR CHARACTERIZATIO...

METHOD OF AND SYSTEM FOR DETECTING STRUCTURES ON OR BELOW THE SURFA...

ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC SYSTEM

METHOD OF DETERMINING AN OVERLAY ERROR, METHOD FOR MANUFACTURING A...

DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE