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H01J49/0063
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/00
Particle spectrometer or separator tubes
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H01J49/0063
by applying a resonant excitation voltage
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last 30 patents
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Patent Grant
Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...
Patent number
11,830,718
Issue date
Nov 28, 2023
Centre National de la Recherche Scientifique
Mathieu Kociak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry
Patent number
11,600,483
Issue date
Mar 7, 2023
The University of Warwick
Peter O'Connor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer
Patent number
11,393,669
Issue date
Jul 19, 2022
Shimadzu Corporation
Tomoyoshi Matsushita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of separating different ions having similar mass to charge r...
Patent number
11,114,291
Issue date
Sep 7, 2021
Micromass UK Limited
Boris Kozlov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry device
Patent number
10,229,821
Issue date
Mar 12, 2019
Hitachi High-Technologies Corporation
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flow through MS3 for improved selectivity
Patent number
10,074,525
Issue date
Sep 11, 2018
DH Technologies Development Pte. Ltd.
Bruce Andrew Collings
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for tandem mass spectrometry analysis in ion trap mass analyzer
Patent number
9,640,377
Issue date
May 2, 2017
FUDAN UNIVERSITY
Fuxing Xu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Targeted analysis for tandem mass spectrometry
Patent number
9,287,101
Issue date
Mar 15, 2016
Thermo Fisher Scientific (Bremen) GmbH
Alexander A. Makarov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of operating a linear ion trap to provide low pressure short...
Patent number
8,309,914
Issue date
Nov 13, 2012
DH Technologies Development Pte. Ltd.
Mircea Guna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass-analysis method and mass-analysis apparatus
Patent number
8,097,844
Issue date
Jan 17, 2012
Shimadzu Corporation
Osamu Furuhashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Collision-induced decomposition of ions in RF ion traps
Patent number
7,847,246
Issue date
Dec 7, 2010
Bruker Daltonik, GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap mass spectrometer
Patent number
7,759,641
Issue date
Jul 20, 2010
Hitachi, Ltd.
Hideki Hasegawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for axial ejection and in-trap fragmentation using auxiliary...
Patent number
7,692,143
Issue date
Apr 6, 2010
MDS Analytical Technologies, a business unit of MDS Inc.
Mircea Guna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-Q pulsed fragmentation in ion traps
Patent number
7,528,370
Issue date
May 5, 2009
Thermo Finnigan LLC.
Jae C. Schwartz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of selectively inhibiting reaction between ions
Patent number
7,355,169
Issue date
Apr 8, 2008
Purdue Research Foundation
Scott A. McLuckey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fragmentation of ions by resonant excitation in a high order multip...
Patent number
7,227,137
Issue date
Jun 5, 2007
MDS Inc.
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for ion fragmentation cut-off
Patent number
7,166,837
Issue date
Jan 23, 2007
Agilent Technologies, Inc.
Alex Mordehai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-Q pulsed fragmentation in ion traps
Patent number
7,102,129
Issue date
Sep 5, 2006
Thermo Finnigan LLC.
Jae C. Schwartz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer
Patent number
7,078,685
Issue date
Jul 18, 2006
Hitachi, Ltd.
Yasuaki Takada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of selectively inhibiting reaction between ions
Patent number
7,064,317
Issue date
Jun 20, 2006
Purdue Research Foundation
Scott A. McLuckey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chemical substance detection apparatus and chemical substance detec...
Patent number
7,064,323
Issue date
Jun 20, 2006
Mitsubishi Heavy Industries, Ltd.
Hideo Yamakoshi
F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
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Patent Grant
Fragmentation of ions by resonant excitation in a high order multip...
Patent number
7,049,580
Issue date
May 23, 2006
MDS Inc.
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for analyzing a substance using MSn analysis
Patent number
6,992,285
Issue date
Jan 31, 2006
MDS Inc.
Lisa Cousins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-Q pulsed fragmentation in ion traps
Patent number
6,949,743
Issue date
Sep 27, 2005
Thermo Finnigan LLC.
Jae C. Schwartz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Space charge adjustment of activation frequency
Patent number
6,884,996
Issue date
Apr 26, 2005
Thermo Finnigan LLC.
Michael W. Senko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap mass spectrometer and spectrometry
Patent number
6,683,303
Issue date
Jan 27, 2004
Hitachi, Ltd.
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of and apparatus for selective collision-induced dissociatio...
Patent number
6,512,226
Issue date
Jan 28, 2003
University of Manitoba
Alexandre V. Loboda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fragmentation in quadrupole ion trap mass spectrometers
Patent number
6,410,913
Issue date
Jun 25, 2002
Bruker Daltonik GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for performing a scan function on quadrupole ion trap mass s...
Patent number
6,147,348
Issue date
Nov 14, 2000
University of Florida
Scott T. Quarmby
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of ion fragmentation in a quadrupole ion trap
Patent number
6,124,591
Issue date
Sep 26, 2000
Finnigan Corporation
Jae C. Schwartz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MASS SPECTROMETER
Publication number
20200350153
Publication date
Nov 5, 2020
Shimadzu Corporation
Kei KODERA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometry
Publication number
20200335321
Publication date
Oct 22, 2020
THE UNIVERSITY OF WARWICK
Peter O'Connor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STIMULATED OR NON-EQUILIBRIUM ENERGY-LOSS AND ENERGY-GAIN SPECTROSC...
Publication number
20200312649
Publication date
Oct 1, 2020
Centre National de la Recherche Scientifique
Mathieu KOCIAK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER
Publication number
20200185210
Publication date
Jun 11, 2020
Shimadzu Corporation
Tomoyoshi Matsushita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF SEPARATING DIFFERENT IONS HAVING SIMILAR MASS TO CHARGE R...
Publication number
20190393023
Publication date
Dec 26, 2019
Micromass UK Limited
Boris Kozlov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometry Device
Publication number
20180269049
Publication date
Sep 20, 2018
Hitachi High-Technologies Corporation
Kiyomi YOSHINARI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR TANDEM MASS SPECTROMETRY ANALYSIS IN ION TRAP MASS ANALYZER
Publication number
20160365231
Publication date
Dec 15, 2016
Fudan University
Fuxing XU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Targeted Analysis for Tandem Mass Spectrometry
Publication number
20150340217
Publication date
Nov 26, 2015
Thermo Fisher Scientific (Bremen) GmbH
Alexander A. MAKAROV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Targeted Analysis for Tandem Mass Spectrometry
Publication number
20140131567
Publication date
May 15, 2014
Thermo Fisher Scientific (Bremen) GmbH
Alexander Makarov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TANDEM MASS SPECTROMETRY USING COMPOSITE WAVEFORMS
Publication number
20130299693
Publication date
Nov 14, 2013
Yu Xia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS
Publication number
20110127424
Publication date
Jun 2, 2011
Bruker Daltonik GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF OPERATING A LINEAR ION TRAP TO PROVIDE LOW PRESSURE SHORT...
Publication number
20090194684
Publication date
Aug 6, 2009
MDS Analytical Technologies, a business unit of MDS Inc. doing business throu...
Mircea Guna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS-ANALYSIS METHOD AND MASS-ANALYSIS APPARATUS
Publication number
20090032698
Publication date
Feb 5, 2009
SHIMADZU CORPORATION
Osamu Furuhashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COLLISION-INDUCED DECOMPOSITION OF IONS IN RF ION TRAPS
Publication number
20080135747
Publication date
Jun 12, 2008
Bruker Daltonik GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR AXIAL EJECTION AND IN-TRAP FRAGMENTATION USING AUXILIARY...
Publication number
20080078927
Publication date
Apr 3, 2008
MDS Analytical Technologies, a business unit of MDS Inc. doing business throu...
Mircea Guna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-Q Pulsed Fragmentation in Ion Traps
Publication number
20070295903
Publication date
Dec 27, 2007
Thermo Finnigan LLC
Jae C. Schwartz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer
Publication number
20070181803
Publication date
Aug 9, 2007
Hideki Hasegawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of selectively inhibiting reaction between ions
Publication number
20060219898
Publication date
Oct 5, 2006
Scott A. McLuckey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for ion fragmentation cut-off
Publication number
20060192112
Publication date
Aug 31, 2006
Alex Mordehal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-Q pulsed fragmentation in ion traps
Publication number
20060054808
Publication date
Mar 16, 2006
Jae C. Schwartz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fragmentation of ions by resonant excitation in a high order multip...
Publication number
20050178963
Publication date
Aug 18, 2005
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer
Publication number
20050067565
Publication date
Mar 31, 2005
Hitachi., Ltd.
Yasuaki Takada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Chemical substance detection apparatus and chemical substance detec...
Publication number
20050009172
Publication date
Jan 13, 2005
Hideo Yamakoshi
F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information
Patent Application
Space charge adjustment of activation frequency
Publication number
20040245461
Publication date
Dec 9, 2004
Michael W. Senko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of selectively inhibiting reaction between ions
Publication number
20040173740
Publication date
Sep 9, 2004
Scott A. McLuckey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fragmentation of ions by resonant excitation in a low pressure ion...
Publication number
20030189168
Publication date
Oct 9, 2003
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fragmentation of ions by resonant excitation in a high order multip...
Publication number
20030189171
Publication date
Oct 9, 2003
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap mass spectrometer and spectrometry
Publication number
20020162958
Publication date
Nov 7, 2002
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS