by diffraction, scatter or reflection

Industry

CPC
G01N2223/05

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/05by diffraction, scatter or reflection

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Methods for determining crystal structure and apparatus for carryin...
- Patent number 12,072,305
- Issue date Aug 27, 2024
- FYZIKALNI USTAV AV CR. V.V.I
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Locating mining sites using neutron detection
- Patent number 12,044,636
- Issue date Jul 23, 2024
- LUNAR HELIUM-3 MINING, LLC
- Chris Salvino
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Materials classifier
- Patent number 12,044,635
- Issue date Jul 23, 2024
- BAE Systems plc
- Lionel William John Kent
- G01 - MEASURING TESTING
Information Patent Grant
Mesh-based crystal sample holder for serial crystallography
- Patent number 12,031,926
- Issue date Jul 9, 2024
- Korea University Research and Business Foundation
- Ki Hyun Nam
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis of cause of degradation of lithium secondary battery
- Patent number 12,013,356
- Issue date Jun 18, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method to adjust a kinetics model of surface reactions d...
- Patent number 11,966,203
- Issue date Apr 23, 2024
- KLA Corporation
- Ankur Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Crosslinked fluoropolymer resin and control method for same
- Patent number 11,946,924
- Issue date Apr 2, 2024
- PROTERIAL, LTD.
- Kazufumi Suenaga
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
- Patent number 11,927,549
- Issue date Mar 12, 2024
- KLA Corporation
- Qian Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
- Publication number 20240345007
- Publication date Oct 17, 2024
- Zhejiang University
- Haikuo WANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
- Publication number 20240345006
- Publication date Oct 17, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...
- Publication number 20240272096
- Publication date Aug 15, 2024
- STF Technologies LLC
- Norman J. Wagner
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
- Publication number 20240159690
- Publication date May 16, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hanae SHIRATORI
- G01 - MEASURING TESTING
Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20240060913
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Forming and Testing Inorganic Salts
- Publication number 20240009661
- Publication date Jan 11, 2024
- Saudi Arabian Oil Company
- Hamad Al Saiari
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
- Publication number 20230375484
- Publication date Nov 23, 2023
- The University of North Carolina at Chapel Hill
- Christina Inscoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPONENT RESIDUAL STRESS TESTING PLATFORM BASED ON NEUTRON DIFFRAC...
- Publication number 20230358693
- Publication date Nov 9, 2023
- NCS TESTING TECHNOLOGY CO., LTD
- LIXIA YANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349841
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230324317
- Publication date Oct 12, 2023
- KIOXIA Corporation
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION DEVICE
- Publication number 20230288351
- Publication date Sep 14, 2023
- KIOXIA Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Application
Advanced X-Ray Emission Spectrometers
- Publication number 20230288352
- Publication date Sep 14, 2023
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS
- Publication number 20230288348
- Publication date Sep 14, 2023
- Rigaku Corporation
- Masashi KAGEYAMA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
- Publication number 20230280290
- Publication date Sep 7, 2023
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20230258584
- Publication date Aug 17, 2023
- MALVERN PANALYTICAL B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
- Publication number 20230243765
- Publication date Aug 3, 2023
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS
- Publication number 20230236141
- Publication date Jul 27, 2023
- SMITHS DETECTION INC.
- Joseph BENDAHAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS SYSTEM AND METHOD WITH MULTI-SOURCE DESIGN
- Publication number 20230236143
- Publication date Jul 27, 2023
- Shenzhen Angstrom Excellence Technology Co. Ltd
- Xuena ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Petro-Steering Methodologies During Under Balanced Coiled Tubing (U...
- Publication number 20230221267
- Publication date Jul 13, 2023
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- E21 - EARTH DRILLING MINING

by diffraction, scatter or reflection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

Methods and apparatus for electron backscatter diffraction sample c...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Method for the detection and correction of lens distortions in an e...

Method for temperature monitoring in cryo-electron microscopy

Methods for determining crystal structure and apparatus for carryin...

Petro-steering methodologies during under balanced coiled tubing (U...

Rotational X-ray inspection system and method

Locating mining sites using neutron detection

Materials classifier

Mesh-based crystal sample holder for serial crystallography

Transmissive small-angle scattering device

Diagnosis of cause of degradation of lithium secondary battery

Methods and systems for compact, small spot size soft x-ray scatter...

X-ray beam shaping apparatus and method

Patterned x-ray emitting target

Method and system to determine crystal structure

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Sample inspection system comprising a beam former to project a poly...

System and method to adjust a kinetics model of surface reactions d...

Crosslinked fluoropolymer resin and control method for same

Method for improving an EBSD/TKD map

Inspection apparatus and inspection method

System and method for in-situ X-ray diffraction-based real-time mon...

Device for hosting a probe solution of molecules in a plurality of...

Shielding strategy for mitigation of stray field for permanent magn...

Sample mounting system for an X-ray analysis apparatus

Inspection apparatus and inspection method

Patents Applicationslast 30 patents

METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

BIFOCAL ELECTRON MICROSCOPE

HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...

Laue Measurement System With Turntable And Method Of Operating The...

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

Apparatus for Forming and Testing Inorganic Salts

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...

COMPONENT RESIDUAL STRESS TESTING PLATFORM BASED ON NEUTRON DIFFRAC...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...

EVALUATION DEVICE

Advanced X-Ray Emission Spectrometers

METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS

DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...

SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...

SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS

X-RAY ANALYSIS SYSTEM AND METHOD WITH MULTI-SOURCE DESIGN

Petro-Steering Methodologies During Under Balanced Coiled Tubing (U...