by interferometric means

Industry

CPC
G01D5/266

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Parent Industries

GPHYSICS G01Measuring instruments G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR G01D5/00Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable

Current Industry

G01D5/266by interferometric means

Industries

Patents Grantslast 30 patents

Information Patent Grant
Sensing method and sensor system
- Patent number 12,152,870
- Issue date Nov 26, 2024
- AMS SENSORS ASIA PTE. LTD.
- Jean-Francois Seurin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical sensor and physical quantity measurement device
- Patent number 12,104,933
- Issue date Oct 1, 2024
- Nagano Keiki Co., Ltd.
- Ayumu Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Optical microphone substrate
- Patent number 12,069,432
- Issue date Aug 20, 2024
- Sensibel AS
- Håkon Sagberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Solid-state information pattern discriminating switch
- Patent number 12,063,461
- Issue date Aug 13, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Paul C. Galambos
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Substrate support with real time force and film stress control
- Patent number 11,915,913
- Issue date Feb 27, 2024
- Applied Materials, Inc.
- Wendell Glenn Boyd
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Single-pixel optical technologies for instantly quantifying multice...
- Patent number 11,782,046
- Issue date Oct 10, 2023
- The Regents of the University of California
- Pei-Yu E. Chiou
- G01 - MEASURING TESTING
Information Patent Grant
Substrate support with real time force and film stress control
- Patent number 11,676,802
- Issue date Jun 13, 2023
- Applied Materials, Inc.
- Wendell Glenn Boyd
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Displacement detection device
- Patent number 11,512,942
- Issue date Nov 29, 2022
- DMG MORI CO., LTD.
- Akinori Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for contactless detection of rotational movement
- Patent number 11,365,989
- Issue date Jun 21, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Adrianus Johannes Hendricus Meskers
- G01 - MEASURING TESTING
Information Patent Grant
Rotary encoder
- Patent number 11,293,786
- Issue date Apr 5, 2022
- Topcon Corporation
- Satoshi Yanobe
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder and drive control device comprising a light receivi...
- Patent number 11,221,238
- Issue date Jan 11, 2022
- Canon Kabushiki Kaisha
- Chihiro Nagura
- G01 - MEASURING TESTING
Information Patent Grant
Sapphire sensor for measuring pressure and temperature with improve...
- Patent number 11,150,144
- Issue date Oct 19, 2021
- SENTEK INSTRUMENT LLC
- Bo Dong
- G01 - MEASURING TESTING
Information Patent Grant
Optical fibre sensor for measuring deformation, said sensor operati...
- Patent number 11,099,005
- Issue date Aug 24, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Guy Cheymol
- G01 - MEASURING TESTING
Information Patent Grant
Confocal displacement measurement device and a confocal thickness m...
- Patent number 11,060,917
- Issue date Jul 13, 2021
- Keyence Corporation
- Shoma Kuga
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric position sensor
- Patent number 10,928,192
- Issue date Feb 23, 2021
- MBDA UK Limited
- Ross Matthew Williams
- G01 - MEASURING TESTING
Information Patent Grant
Substrate support with real time force and film stress control
- Patent number 10,879,046
- Issue date Dec 29, 2020
- Applied Materials, Inc.
- Wendell Glen Boyd
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods for confocal optical protractor with structured light illum...
- Patent number 10,809,057
- Issue date Oct 20, 2020
- Northrop Grumman Systems Corporation
- Yisa S. Rumala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro or nanomechanical particle detection device
- Patent number 10,794,813
- Issue date Oct 6, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sebastien Hentz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for transduction of displacement to optical phase shift
- Patent number 10,788,687
- Issue date Sep 29, 2020
- Commissariat à l'énergies alternatives
- Boris Taurel
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, imprint apparatus, planarization device, detectio...
- Patent number 10,777,440
- Issue date Sep 15, 2020
- Canon Kabushiki Kaisha
- Toshiki Iwai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometric sensor
- Patent number 10,725,073
- Issue date Jul 28, 2020
- ABB Power Grids Switzerland AG
- Xun Gu
- G01 - MEASURING TESTING
Information Patent Grant
Confocal optical protractor
- Patent number 10,670,391
- Issue date Jun 2, 2020
- Northrop Grumman Systems Corporation
- Yisa S. Rumala
- G01 - MEASURING TESTING
Information Patent Grant
High sensitivity real-time bacterial monitor
- Patent number 10,656,085
- Issue date May 19, 2020
- BACTUSENSE TECHNOLOGIES LTD.
- Ofer Du-Nour
- G02 - OPTICS
Information Patent Grant
Scale device and two-axis displacement detection device
- Patent number 10,634,521
- Issue date Apr 28, 2020
- DMG MORI CO., LTD.
- Masayuki Niiya
- G01 - MEASURING TESTING
Information Patent Grant
Position detection method and optical module
- Patent number 10,557,755
- Issue date Feb 11, 2020
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sapphire sensor apparatus including an optical fiber for measuring...
- Patent number 10,495,525
- Issue date Dec 3, 2019
- SENTEK INSTRUMENT LLC
- Bo Dong
- G01 - MEASURING TESTING
Information Patent Grant
Transparent-block encoder head with isotropic wedged elements
- Patent number 10,488,228
- Issue date Nov 26, 2019
- Nikon Corporation
- Eric Peter Goodwin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical interferometry
- Patent number 10,466,032
- Issue date Nov 5, 2019
- Optonor AS
- Eiolf Vikhagen
- G01 - MEASURING TESTING
Information Patent Grant
Dual measurement displacement sensing technique
- Patent number 10,466,030
- Issue date Nov 5, 2019
- Auburn University
- Austin R. Gurley
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device having a plurality of rotary shafts and...
- Patent number 10,422,621
- Issue date Sep 24, 2019
- Adamant Namiki Precision Jewel Co., Ltd.
- Hiroshi Yamazaki
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MICROPHONE SUBSTRATE
- Publication number 20240373171
- Publication date Nov 7, 2024
- SensiBel AS
- Håkon Sagberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NON-CONTACT ENCODER FOR BOARD MEASUREMENT
- Publication number 20240255318
- Publication date Aug 1, 2024
- United States Gypsum Company
- Leslie Eversole
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
METHOD FOR DETERMINING A POSITION OF A MIRROR
- Publication number 20240255319
- Publication date Aug 1, 2024
- Carl Zeiss SMT GMBH
- Michael Patra
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE SUPPORT WITH REAL TIME FORCE AND FILM STRESS CONTROL
- Publication number 20240258075
- Publication date Aug 1, 2024
- Applied Materials, Inc.
- Wendell Glenn BOYD
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FIBER OPTIC ACTUATOR OVERLOAD TRIP SENSOR
- Publication number 20240239511
- Publication date Jul 18, 2024
- HAMILTON SUNDSTRAND CORPORATION
- Darrell E. Ankney
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
ROTATION SENSOR FOR A CROWN OF AN ELECTRONIC WATCH
- Publication number 20230400818
- Publication date Dec 14, 2023
- Apple Inc.
- Richard A. Davis
- G04 - HOROLOGY
Information Patent Application
Optical Sensor Module Including an Interferometric Sensor and Exten...
- Publication number 20230314185
- Publication date Oct 5, 2023
- Apple Inc.
- Tong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-CONTACT DISPLACEMENT MEASUREMENT FOR CRYOGENIC STABILIZATION
- Publication number 20230200016
- Publication date Jun 22, 2023
- IonQ, Inc.
- Sarah Margaret KREIKEMEIER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR TRACKING A PIPELINE INSPECTION GAUGE
- Publication number 20230133154
- Publication date May 4, 2023
- HIFI ENGINEERING INC
- Seyed Ehsan JALILIAN
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Through-Display Interferometric Proximity and Velocity Sensing
- Publication number 20230087691
- Publication date Mar 23, 2023
- Apple Inc.
- Tong Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SENSING METHOD AND SENSOR SYSTEM
- Publication number 20230047060
- Publication date Feb 16, 2023
- ams Sensors Asia Pte. Ltd.
- Jean-Francois Seurin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL MICROPHONE SUBSTRATE
- Publication number 20220408198
- Publication date Dec 22, 2022
- SensiBel AS
- Håkon Sagberg
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR MEASURING MAGNETIC FLUX DENSITY AND OTH...
- Publication number 20220397429
- Publication date Dec 15, 2022
- QUANTUM TECHNOLOGIES UG (HAFTUNGSBESCHRÄNKT)
- Bernd Burchard
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR AND PHYSICAL QUANTITY MEASUREMENT DEVICE
- Publication number 20220357185
- Publication date Nov 10, 2022
- NAGANO KEIKI CO., LTD.
- Ayumu Sakamoto
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ARBITRARY OPTICAL WAVEFORM GENERATION
- Publication number 20220341760
- Publication date Oct 27, 2022
- Institut National de la Recherche Scientifique
- Bennet FISCHER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HETERODYNE TWO-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING M...
- Publication number 20220228890
- Publication date Jul 21, 2022
- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
- WENHAO LI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBRE SENSOR FOR MEASURING DEFORMATION, SAID SENSOR OPERATI...
- Publication number 20210156673
- Publication date May 27, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Guy CHEYMOL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTACTLESS DETECTION OF ROTATIONAL MOVEMENT
- Publication number 20210156718
- Publication date May 27, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Adrianus Johannes Hendricus Meskers
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER AND DRIVE CONTROL DEVICE
- Publication number 20210003425
- Publication date Jan 7, 2021
- Canon Kabushiki Kaisha
- Chihiro NAGURA
- G01 - MEASURING TESTING
Information Patent Application
SCALE ELEMENT FOR AN OPTICAL MEASURING DEVICE
- Publication number 20200386580
- Publication date Dec 10, 2020
- PHYSIK INSTRUMENTE (Pl) GMBH & CO. KG
- Rainer GLÖSS
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION CURRENT AND MAGNETIC FIELD SENSOR
- Publication number 20200225066
- Publication date Jul 16, 2020
- SIEMENS ENERGY, INC.
- Evangelos V. Diatzikis
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL OPTICAL PROTRACTOR
- Publication number 20200132443
- Publication date Apr 30, 2020
- Northrop Grumman Systems Corporation
- YISA S. RUMALA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sapphire Sensor for Measuring Pressure and Temperature
- Publication number 20200132561
- Publication date Apr 30, 2020
- Sentek Instrument, LLC
- Bo Dong
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-PIXEL OPTICAL TECHNOLOGIES FOR INSTANTLY QUANTIFYING MULTICE...
- Publication number 20200116696
- Publication date Apr 16, 2020
- The Regents of the University of California
- Pei-Yu E. Chiou
- G01 - MEASURING TESTING
Information Patent Application
ROTARY ENCODER
- Publication number 20200103255
- Publication date Apr 2, 2020
- TOPCON CORPORATION
- Satoshi YANOBE
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, IMPRINT APPARATUS, PLANARIZATION DEVICE, DETECTIO...
- Publication number 20190371642
- Publication date Dec 5, 2019
- Canon Kabushiki Kaisha
- Toshiki Iwai
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC POSITION SENSOR
- Publication number 20190257645
- Publication date Aug 22, 2019
- MBDA UK LIMITED
- Ross Matthew WILLIAMS
- G01 - MEASURING TESTING
Information Patent Application
MOVABLE BODY DRIVE METHOD, MOVABLE BODY DRIVE SYSTEM, PATTERN FORMA...
- Publication number 20190121243
- Publication date Apr 25, 2019
- Nikon Corporation
- Yuichi Shibazaki
- G01 - MEASURING TESTING
Information Patent Application
Confocal Displacement Measurement Device And A Confocal Thickness M...
- Publication number 20190094074
- Publication date Mar 28, 2019
- KEYENCE CORPORATION
- Shoma Kuga
- G01 - MEASURING TESTING
Information Patent Application
POSITION SENSING ARRANGEMENT AND LITHOGRAPHIC APPARATUS INCLUDING S...
- Publication number 20190049866
- Publication date Feb 14, 2019
- ASML NETHERLANDS B.V.
- Simon Reinald HUISMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

by interferometric means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensing method and sensor system

Optical sensor and physical quantity measurement device

Optical microphone substrate

Solid-state information pattern discriminating switch

Substrate support with real time force and film stress control

Single-pixel optical technologies for instantly quantifying multice...

Substrate support with real time force and film stress control

Displacement detection device

Method and system for contactless detection of rotational movement

Rotary encoder

Optical encoder and drive control device comprising a light receivi...

Sapphire sensor for measuring pressure and temperature with improve...

Optical fibre sensor for measuring deformation, said sensor operati...

Confocal displacement measurement device and a confocal thickness m...

Interferometric position sensor

Substrate support with real time force and film stress control

Methods for confocal optical protractor with structured light illum...

Micro or nanomechanical particle detection device

System for transduction of displacement to optical phase shift

Detection device, imprint apparatus, planarization device, detectio...

Interferometric sensor

Confocal optical protractor

High sensitivity real-time bacterial monitor

Scale device and two-axis displacement detection device

Position detection method and optical module

Sapphire sensor apparatus including an optical fiber for measuring...

Transparent-block encoder head with isotropic wedged elements

Optical interferometry

Dual measurement displacement sensing technique

Optical measurement device having a plurality of rotary shafts and...

Patents Applicationslast 30 patents

OPTICAL MICROPHONE SUBSTRATE

NON-CONTACT ENCODER FOR BOARD MEASUREMENT

METHOD FOR DETERMINING A POSITION OF A MIRROR

SUBSTRATE SUPPORT WITH REAL TIME FORCE AND FILM STRESS CONTROL

FIBER OPTIC ACTUATOR OVERLOAD TRIP SENSOR

ROTATION SENSOR FOR A CROWN OF AN ELECTRONIC WATCH

Optical Sensor Module Including an Interferometric Sensor and Exten...

NON-CONTACT DISPLACEMENT MEASUREMENT FOR CRYOGENIC STABILIZATION

METHODS AND SYSTEMS FOR TRACKING A PIPELINE INSPECTION GAUGE

Through-Display Interferometric Proximity and Velocity Sensing

SENSING METHOD AND SENSOR SYSTEM

OPTICAL MICROPHONE SUBSTRATE

METHODS AND APPARATUSES FOR MEASURING MAGNETIC FLUX DENSITY AND OTH...

OPTICAL SENSOR AND PHYSICAL QUANTITY MEASUREMENT DEVICE

SYSTEM AND METHOD FOR ARBITRARY OPTICAL WAVEFORM GENERATION

HETERODYNE TWO-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING M...

OPTICAL FIBRE SENSOR FOR MEASURING DEFORMATION, SAID SENSOR OPERATI...

METHOD AND SYSTEM FOR CONTACTLESS DETECTION OF ROTATIONAL MOVEMENT

OPTICAL ENCODER AND DRIVE CONTROL DEVICE

SCALE ELEMENT FOR AN OPTICAL MEASURING DEVICE

HIGH RESOLUTION CURRENT AND MAGNETIC FIELD SENSOR

CONFOCAL OPTICAL PROTRACTOR

Sapphire Sensor for Measuring Pressure and Temperature

SINGLE-PIXEL OPTICAL TECHNOLOGIES FOR INSTANTLY QUANTIFYING MULTICE...

ROTARY ENCODER

DETECTION DEVICE, IMPRINT APPARATUS, PLANARIZATION DEVICE, DETECTIO...

INTERFEROMETRIC POSITION SENSOR

MOVABLE BODY DRIVE METHOD, MOVABLE BODY DRIVE SYSTEM, PATTERN FORMA...

Confocal Displacement Measurement Device And A Confocal Thickness M...

POSITION SENSING ARRANGEMENT AND LITHOGRAPHIC APPARATUS INCLUDING S...