by introducing a delay in a signal path

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G11C29/842

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/842by introducing a delay in a signal path

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Write and read common leveling for 4-bit wide drams
- Patent number 11,456,052
- Issue date Sep 27, 2022
- Marvell Asia Pte, Ltd.
- David Da Wei Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device
- Patent number 10,902,905
- Issue date Jan 26, 2021
- Samsung Electronics Co., Ltd.
- Yong Sung Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Write and read common leveling for 4-bit wide DRAMS
- Patent number 10,892,032
- Issue date Jan 12, 2021
- Marvell Asia Pte, Ltd.
- David Da Wei Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair enablement
- Patent number 10,713,136
- Issue date Jul 14, 2020
- QUALCOMM Incorporated
- Fahad Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Write and read common leveling for 4-bit wide drams
- Patent number 10,497,413
- Issue date Dec 3, 2019
- Cavium, LLC
- David Da Wei Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Write and read common leveling for 4-bit wide DRAMs
- Patent number 10,418,125
- Issue date Sep 17, 2019
- Marvell Semiconductor
- David Da Wei Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Address control circuit and semiconductor device including the same
- Patent number 10,381,057
- Issue date Aug 13, 2019
- SK hynix Inc.
- Byeong Cheol Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Address control circuit and semiconductor device including the same
- Patent number 10,381,058
- Issue date Aug 13, 2019
- SK hynix Inc.
- Byeong Cheol Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit and precharge/active flag generation circuit
- Patent number 9,401,187
- Issue date Jul 26, 2016
- SK Hynic Inc.
- Hyun-Sung Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Bitline leakage detection in memories
- Patent number 9,208,902
- Issue date Dec 8, 2015
- Texas Instruments Incorporated
- Beena Pious
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line block/select circuit with repair address decision unit
- Patent number 8,194,494
- Issue date Jun 5, 2012
- Hynix Semiconductor Inc.
- Seong Nyuh Yoo
- G11 - INFORMATION STORAGE
Information Patent Grant
Block decoding circuits of semiconductor memory devices and methods...
- Patent number 7,978,548
- Issue date Jul 12, 2011
- Samsung Electronics Co., Ltd.
- Yong-ho Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line block/select circuit with repair address decision unit
- Patent number 7,916,573
- Issue date Mar 29, 2011
- Hynix Semiconductor Inc.
- Seong Nyuh Yoo
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 7,782,687
- Issue date Aug 24, 2010
- Panasonic Corporation
- Tomohiro Kurozumi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,577,047
- Issue date Aug 18, 2009
- Samsung Electronics Co., Ltd.
- In-Chul Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory apparatus
- Patent number 7,492,651
- Issue date Feb 17, 2009
- Hynix Semiconductor Inc.
- Khil-Ohk Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Repair circuit of semiconductor memory device
- Patent number 7,405,973
- Issue date Jul 29, 2008
- Hynix Semiconductor Inc.
- Young Soo Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having advanced repair circuit
- Patent number 7,379,357
- Issue date May 27, 2008
- Hynix Semiconductor, Inc.
- Sang-Hee Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 7,233,535
- Issue date Jun 19, 2007
- Elpida Memory, Inc.
- Yasushi Matsubara
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for providing a redundant memory array in a semic...
- Patent number 7,158,425
- Issue date Jan 2, 2007
- Mosaic Systems, Inc.
- Chao-Wu Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Flash memory having spare sector with shortened access time
- Patent number 7,082,066
- Issue date Jul 25, 2006
- Spansion LLC
- Shigekazu Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for implementing multiple memory redundancy wi...
- Patent number 7,068,554
- Issue date Jun 27, 2006
- International Business Machines Corporation
- James W. Dawson
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory device with a spare memory cell array
- Patent number 7,016,215
- Issue date Mar 21, 2006
- Kabushiki Kaisha Toshiba
- Masahiro Kamoshida
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with improved output operation margin
- Patent number 6,987,705
- Issue date Jan 17, 2006
- Hynix Semiconductor Inc.
- Si-Hong Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with common row interface
- Patent number 6,982,911
- Issue date Jan 3, 2006
- Infineon Technologies AG
- Jong-Hoon Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Antifuse option for row repair
- Patent number 6,937,536
- Issue date Aug 30, 2005
- Micron Technology, Inc.
- Brian M. Shirley
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and electronic information device using...
- Patent number 6,831,869
- Issue date Dec 14, 2004
- Sharp Kabushiki Kaisha
- Kaname Yamano
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing fuse method for delaying signals in a memory device
- Patent number 6,643,206
- Issue date Nov 4, 2003
- Micron Technology, Inc.
- Brian M. Shirley
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of and apparatus for providing look ahead column redundancy...
- Patent number 6,571,348
- Issue date May 27, 2003
- Genesis Semiconductor, Inc.
- Terry T. Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device testing
- Patent number 6,560,150
- Issue date May 6, 2003
- Micron Technology, Inc.
- Ebrahim Abedifard
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE
- Publication number 20200321046
- Publication date Oct 8, 2020
- Samsung Electronics Co., Ltd.
- Yong Sung CHO
- G11 - INFORMATION STORAGE
Information Patent Application
ADDRESS CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
- Publication number 20190198076
- Publication date Jun 27, 2019
- SK HYNIX INC.
- Byeong Cheol LEE
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF ACCESSING SEMICONDUCTOR MEMORY AND SEMICONDUCTOR CIRCUIT
- Publication number 20140247677
- Publication date Sep 4, 2014
- Samsung Electronics Co., Ltd.
- Young-Soo SOHN
- G11 - INFORMATION STORAGE
Information Patent Application
WORD LINE BLOCK/SELECT CIRCUIT WITH REPAIR ADDRESS DECISION UNIT
- Publication number 20110149664
- Publication date Jun 23, 2011
- Hynix Semiconductor Inc.
- Seong Nyuh Yoo
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE AND REDUNDANCY METHOD
- Publication number 20100246299
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Takayuki IWAI
- G11 - INFORMATION STORAGE
Information Patent Application
Bitline Leakage Detection in Memories
- Publication number 20100110807
- Publication date May 6, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Beena Pious
- G11 - INFORMATION STORAGE
Information Patent Application
Block decoding circuits of semiconductor memory devices and methods...
- Publication number 20090196112
- Publication date Aug 6, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Yong-ho Cho
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090097334
- Publication date Apr 16, 2009
- Tomohiro KUROZUMI
- G11 - INFORMATION STORAGE
Information Patent Application
Word line block select circuit with repair address decision unit
- Publication number 20090003118
- Publication date Jan 1, 2009
- Hynix Semiconductor Inc.
- Seong Nyuh Yoo
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20080056033
- Publication date Mar 6, 2008
- Samsung Electronics, Co., Ltd.
- In-Chul Jeong
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory apparatus
- Publication number 20080002492
- Publication date Jan 3, 2008
- Hynix Semiconductor Inc.
- Khil-Ohk Kang
- G11 - INFORMATION STORAGE
Information Patent Application
Repair circuit of semiconductor memory device
- Publication number 20070081402
- Publication date Apr 12, 2007
- Hynix Semiconductor Inc.
- Young Soo Park
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20060140029
- Publication date Jun 29, 2006
- ELPIDA MEMORY, INC.
- Yasushi Matsubara
- G11 - INFORMATION STORAGE
Information Patent Application
Flash memory having spare sector with shortened access time
- Publication number 20050254322
- Publication date Nov 17, 2005
- Shigekazu Yamada
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH COMMON ROW INTERFACE
- Publication number 20050207258
- Publication date Sep 22, 2005
- Infineon Technologies North America Corp.
- Jong-Hoon Oh
- G11 - INFORMATION STORAGE
Information Patent Application
Memory device with improved output operation margin
- Publication number 20050105377
- Publication date May 19, 2005
- Si-Hong Kim
- G11 - INFORMATION STORAGE
Information Patent Application
System and method for providing a redundant memory array in a semic...
- Publication number 20050024912
- Publication date Feb 3, 2005
- Mosaic Systems, Inc.
- Chao-Wu Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having advanced repair circuit
- Publication number 20040218433
- Publication date Nov 4, 2004
- Sang-Hee Kang
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20040114414
- Publication date Jun 17, 2004
- Masahiro Kamoshida
- G11 - INFORMATION STORAGE
Information Patent Application
Antifuse option for row repair
- Publication number 20040062110
- Publication date Apr 1, 2004
- Micron Technology, Inc.
- Brian M. Shirley
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device and electronic information device using...
- Publication number 20030142563
- Publication date Jul 31, 2003
- Kaname Yamano
- G11 - INFORMATION STORAGE
Information Patent Application
Memory device testing
- Publication number 20020172086
- Publication date Nov 21, 2002
- Micron Technology, Inc.
- Ebrahim Abedifard
- G11 - INFORMATION STORAGE
Information Patent Application
Timing fuse method for delaying signals in a memory device
- Publication number 20020039318
- Publication date Apr 4, 2002
- Micron Technology, Inc.
- Brian M. Shirley
- G11 - INFORMATION STORAGE
Information Patent Application
Synchronous semiconductor memory device capable of high speed readi...
- Publication number 20010043507
- Publication date Nov 22, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tsukasa Ooishi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit
- Publication number 20010035537
- Publication date Nov 1, 2001
- FUJITSU LIMITED
- Naoharu Shinozaki
- G11 - INFORMATION STORAGE
Information Patent Application
TIMING FUSE OPTION FOR ROW REPAIR
- Publication number 20010012221
- Publication date Aug 9, 2001
- BRIAN M. SHIRLEY
- G11 - INFORMATION STORAGE

by introducing a delay in a signal path

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Write and read common leveling for 4-bit wide drams

Memory device

Write and read common leveling for 4-bit wide DRAMS

Memory repair enablement

Write and read common leveling for 4-bit wide drams

Write and read common leveling for 4-bit wide DRAMs

Address control circuit and semiconductor device including the same

Address control circuit and semiconductor device including the same

Integrated circuit and precharge/active flag generation circuit

Bitline leakage detection in memories

Word line block/select circuit with repair address decision unit

Block decoding circuits of semiconductor memory devices and methods...

Word line block/select circuit with repair address decision unit

Semiconductor device

Semiconductor memory device

Semiconductor memory apparatus

Repair circuit of semiconductor memory device

Semiconductor memory device having advanced repair circuit

Semiconductor memory device

System and method for providing a redundant memory array in a semic...

Flash memory having spare sector with shortened access time

Apparatus and method for implementing multiple memory redundancy wi...

Ferroelectric memory device with a spare memory cell array

Memory device with improved output operation margin

Memory device with common row interface

Antifuse option for row repair

Semiconductor memory device and electronic information device using...

Timing fuse method for delaying signals in a memory device

Method of and apparatus for providing look ahead column redundancy...

Memory device testing

Patents Applicationslast 30 patents

MEMORY DEVICE

ADDRESS CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME

METHOD OF ACCESSING SEMICONDUCTOR MEMORY AND SEMICONDUCTOR CIRCUIT

WORD LINE BLOCK/SELECT CIRCUIT WITH REPAIR ADDRESS DECISION UNIT

SEMICONDUCTOR STORAGE DEVICE AND REDUNDANCY METHOD

Bitline Leakage Detection in Memories

Block decoding circuits of semiconductor memory devices and methods...

SEMICONDUCTOR DEVICE

Word line block select circuit with repair address decision unit

Semiconductor memory device

Semiconductor memory apparatus

Repair circuit of semiconductor memory device

Semiconductor memory device

Flash memory having spare sector with shortened access time

MEMORY DEVICE WITH COMMON ROW INTERFACE

Memory device with improved output operation margin

System and method for providing a redundant memory array in a semic...

Semiconductor memory device having advanced repair circuit

Semiconductor memory device

Antifuse option for row repair

Semiconductor memory device and electronic information device using...

Memory device testing

Timing fuse method for delaying signals in a memory device

Synchronous semiconductor memory device capable of high speed readi...

Semiconductor integrated circuit

TIMING FUSE OPTION FOR ROW REPAIR