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G01N27/22
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G01 - MEASURING TESTING
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The University of Melbourne
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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E21 - EARTH DRILLING MINING
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ION CHAT RESEARCH CORPORATE
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G01 - MEASURING TESTING
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ENDRESS+HAUSER SE+CO.KG
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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Timothy L. Cargol
G01 - MEASURING TESTING
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Friedrich Robert Honeyman
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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Xiaopu Li
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Shrenik Deliwala
G08 - SIGNALLING
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Akifumi Morishita
B32 - LAYERED PRODUCTS
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Tokyo Electron Limited
Takayuki Hatanaka
G01 - MEASURING TESTING
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TATA Consultancy Services Limited
Debankita De
G01 - MEASURING TESTING
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REALMFIVE, Inc.
Brant Burkey
G01 - MEASURING TESTING
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Toyo Corporation
Masaru Inoue
G01 - MEASURING TESTING
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ENCO ELECTRONIC SYSTEMS, LLC
Terry Lance Beasley
G01 - MEASURING TESTING
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Halliburton Energy Services, Inc.
Michael Linley Fripp
E21 - EARTH DRILLING MINING
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Franklin Sensors Inc.
David M. Dorrough
G01 - MEASURING TESTING
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Luke Armitage Beardslee
G01 - MEASURING TESTING
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Mathew G. Schmidt
G01 - MEASURING TESTING
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The Boeing Company
Om Prakash
B64 - AIRCRAFT AVIATION COSMONAUTICS
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Murata Manufacturing Co., Ltd.
Vivek Saraf
H01 - BASIC ELECTRIC ELEMENTS
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Applied Materials, Inc.
Yaoling Pan
G01 - MEASURING TESTING
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Robert Bosch GmbH
Paul Abbott
G01 - MEASURING TESTING
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GLOBALFOUNDRIES Singapore Ptd. Ltd.
Ee Jan Khor
H01 - BASIC ELECTRIC ELEMENTS
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GLOBALFOUNDRIES U.S. Inc.
Zhuojie Wu
G01 - MEASURING TESTING
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Patent Application
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Eric W. LIBERATO
G01 - MEASURING TESTING
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KRONES AG
Anton Niedermeier
G01 - MEASURING TESTING
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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G06 - COMPUTING CALCULATING COUNTING
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BOE TECHNOLOGY GROUP CO., LTD.
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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H01 - BASIC ELECTRIC ELEMENTS
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G01 - MEASURING TESTING
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H01 - BASIC ELECTRIC ELEMENTS
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James McGregor Scanlan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Massachusetts Institute of Technology
Brian L. Wardle
B82 - NANO-TECHNOLOGY
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Patent Application
Kabushiki Kaisha Toshiba
Yumi HAYASHI
G01 - MEASURING TESTING
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TILKOBLEDE BELGIUM BVBA
Benoit van de Sande
G01 - MEASURING TESTING
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UNIVERSITY OF COPENHAGEN
Anasua Chatterjee
G01 - MEASURING TESTING
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BERKEM DEVELOPPEMENT
Olivier FAHY
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Nitin Raut
G01 - MEASURING TESTING
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Nippon Telegraph and Telephone Corporation
Kenta Fukada
G01 - MEASURING TESTING
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KYOCERA CORPORATION
Katsumi NAKAMURA
G01 - MEASURING TESTING
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The Board of Trustees of the University of Alabama
Adam Hauser
G01 - MEASURING TESTING
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Patent Application
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Christlyn Faith ARIAS
G01 - MEASURING TESTING
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MEDISENS WIRELESS, INC.
Nitin Raut
G01 - MEASURING TESTING
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Fisher & Paykel Healthcare Limited
Peter Alan Seekup
G01 - MEASURING TESTING
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PPG INDUSTRIES OHIO, INC.
Cynthia Kutchko
G01 - MEASURING TESTING
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International Business Machines Corporation
Frank Robert Libsch
G01 - MEASURING TESTING
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Lenovo (Beijing) Limited
Yu-Che LIN
G01 - MEASURING TESTING
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SENSATIVE AB
Mats Pettersson
G01 - MEASURING TESTING
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International Business Machines Corporation
Frank Robert Libsch
G01 - MEASURING TESTING
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International Business Machines Corporation
Frank Robert Libsch
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Sebastian Böhm
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Deere & Company
Mohan A. Vadnere
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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FUJI CORPORATION
Satoshi SHIMIZU
G01 - MEASURING TESTING
