by investigating the electric dipolar moment

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means

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G01N27/007by investigating the electric dipolar moment

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Patents Grantslast 30 patents

Information Patent Grant
System and method for high voltage leak detection
- Patent number 11,592,352
- Issue date Feb 28, 2023
- Packaging Technologies & Inspection, LLC
- Ross Treloar
- G01 - MEASURING TESTING
Information Patent Grant
Method for phonon assisted creation and annihilation of subsurface...
- Patent number 11,360,048
- Issue date Jun 14, 2022
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA
- Edward R. Generazio
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for programming a crystal lattice structure of...
- Patent number 11,305,343
- Issue date Apr 19, 2022
- Nanom Inc.
- Antonijo Licitar
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
System and method for high voltage leak detection
- Patent number 11,067,473
- Issue date Jul 20, 2021
- Packaging Technologies & Inspection, LLC
- Ross Treloar
- G01 - MEASURING TESTING
Information Patent Grant
Method for phonon assisted creation and annihilation of subsurface...
- Patent number 10,900,930
- Issue date Jan 26, 2021
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Edward R. Generazio
- G01 - MEASURING TESTING
Information Patent Grant
Transient induced molecular electronic spectroscopy method for stud...
- Patent number 10,890,546
- Issue date Jan 12, 2021
- The Regents of the University of California
- Yu-Hwa Lo
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 10,473,636
- Issue date Nov 12, 2019
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 9,702,861
- Issue date Jul 11, 2017
- Board of Regents of the Nevada System of Higher Education, on Behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Extremum seeking algorithm in a variable time interval to detect an...
- Patent number 9,080,938
- Issue date Jul 14, 2015
- GM Global Technology Operations LLC
- Jun Cai
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 8,713,711
- Issue date Apr 29, 2014
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 8,434,160
- Issue date Apr 30, 2013
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 8,434,161
- Issue date Apr 30, 2013
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 8,220,067
- Issue date Jul 10, 2012
- Board of Regents of the Nevada System of Higher Education
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered probe detector with piezoelectric element
- Patent number 7,694,346
- Issue date Apr 6, 2010
- Board of Regents of the Nevada System of Higher Education on behalf of the Un...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for examining substances and mixtures of su...
- Patent number 4,323,364
- Issue date Apr 6, 1982
- Michael Scherz
- G01 - MEASURING TESTING
Information Patent Grant
Metal-alloy thermoelectric characteristic analyzer
- Patent number 4,320,344
- Issue date Mar 16, 1982
- William R. Nicholas
- G01 - MEASURING TESTING
Information Patent Grant
3680358
- Patent number 3,680,358
- Issue date Aug 1, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3367185
- Patent number 3,367,185
- Issue date Feb 6, 1968
- G01 - MEASURING TESTING
Information Patent Grant
2819614
- Patent number 2,819,614
- Issue date Jan 14, 1958
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING ELECTRIC POLARIZATION OF SOLID SYSTEM, AND E...
- Publication number 20240402111
- Publication date Dec 5, 2024
- Beijing Youzhuju Network Technology Co., Ltd.
- Xiang LI
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL SENSOR SYSTEM
- Publication number 20240319139
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Yoshiaki Sugizaki
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HIGH VOLTAGE LEAK DETECTION
- Publication number 20210293656
- Publication date Sep 23, 2021
- Packaging Technologies & Inspection, LLC
- Ross Treloar
- G01 - MEASURING TESTING
Information Patent Application
Method for Phonon Assisted Creation and Annihilation of Subsurface...
- Publication number 20210148857
- Publication date May 20, 2021
- United States of America as represented by the Administrator of NASA
- Edward R. Generazio
- G01 - MEASURING TESTING
Information Patent Application
TRANSIENT INDUCED MOLECULA ELECTRONIC SPECTROSCOPY METHOD FOR STUDY...
- Publication number 20190094166
- Publication date Mar 28, 2019
- The Regents of the University of California
- Yu-Hwa Lo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT
- Publication number 20170269052
- Publication date Sep 21, 2017
- BOARD OF REGENTS OF THE NEVADA SYSTEM OF HIGHER EDUCATION, ON BEHALF OF THE U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT
- Publication number 20140219315
- Publication date Aug 7, 2014
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT
- Publication number 20140079093
- Publication date Mar 20, 2014
- Board of Regents of the Nevada Systems of Higher Education, on behalf of the...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
EXTREMUM SEEKING ALGORITHM IN A VARIABLE TIME INTERVAL TO DETECT AN...
- Publication number 20140026633
- Publication date Jan 30, 2014
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Jun Cai
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT
- Publication number 20130116137
- Publication date May 9, 2013
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT
- Publication number 20130101466
- Publication date Apr 25, 2013
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT
- Publication number 20100288015
- Publication date Nov 18, 2010
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
Cantilevered Probe Detector With Piezoelectric Element
- Publication number 20080085212
- Publication date Apr 10, 2008
- Jesse D. Adams
- G01 - MEASURING TESTING

by investigating the electric dipolar moment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for high voltage leak detection

Method for phonon assisted creation and annihilation of subsurface...

Apparatus and method for programming a crystal lattice structure of...

System and method for high voltage leak detection

Method for phonon assisted creation and annihilation of subsurface...

Transient induced molecular electronic spectroscopy method for stud...

Cantilevered probe detector with piezoelectric element

Cantilevered probe detector with piezoelectric element

Extremum seeking algorithm in a variable time interval to detect an...

Cantilevered probe detector with piezoelectric element

Cantilevered probe detector with piezoelectric element

Cantilevered probe detector with piezoelectric element

Cantilevered probe detector with piezoelectric element

Cantilevered probe detector with piezoelectric element

Method of and apparatus for examining substances and mixtures of su...

Metal-alloy thermoelectric characteristic analyzer

3680358

3367185

2819614

Patents Applicationslast 30 patents

METHOD FOR DETERMINING ELECTRIC POLARIZATION OF SOLID SYSTEM, AND E...

CHEMICAL SENSOR SYSTEM

SYSTEM AND METHOD FOR HIGH VOLTAGE LEAK DETECTION

Method for Phonon Assisted Creation and Annihilation of Subsurface...

TRANSIENT INDUCED MOLECULA ELECTRONIC SPECTROSCOPY METHOD FOR STUDY...

CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT

CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT

CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT

EXTREMUM SEEKING ALGORITHM IN A VARIABLE TIME INTERVAL TO DETECT AN...

CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT

CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT

CANTILEVERED PROBE DETECTOR WITH PIEZOELECTRIC ELEMENT

Cantilevered Probe Detector With Piezoelectric Element