by investigating the ionisation of gases by investigating electric discharges

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G01N27/62

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means

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G01N27/62by investigating the ionisation of gases by investigating electric discharges

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Laterally-extended trapped ion mobility spectrometer
- Patent number 12,163,919
- Issue date Dec 10, 2024
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for two-dimensional mobility based filtering of...
- Patent number 12,163,920
- Issue date Dec 10, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aperture plate assembly
- Patent number 12,165,862
- Issue date Dec 10, 2024
- Micromass UK Limited
- Edward Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for separating ions at about or above atmospher...
- Patent number 12,154,779
- Issue date Nov 26, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 12,154,772
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Kenichi Mishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzer apparatus and method for controlling gas analyzer appa...
- Patent number 12,153,017
- Issue date Nov 26, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-throughput label-free enzymatic bioassays using DESI-MS
- Patent number 12,130,255
- Issue date Oct 29, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and mass spectrometer
- Patent number 12,111,285
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analysis apparatus
- Patent number 12,111,286
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 12,112,935
- Issue date Oct 8, 2024
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Grant
Mass analysis system, and method for determining performance of mas...
- Patent number 12,106,951
- Issue date Oct 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka Sumigama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source for spectrometry using inductively heated gas
- Patent number 12,100,583
- Issue date Sep 24, 2024
- Anil Mavanur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis device
- Patent number 12,092,608
- Issue date Sep 17, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon nanowire chip and silicon nanowire chip-based mass spectrum...
- Patent number 12,094,702
- Issue date Sep 17, 2024
- Hangzhou Well-Healthcare Technologies Co., LTD
- Jianmin Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, system, and method for transferring ions
- Patent number 12,089,932
- Issue date Sep 17, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- G01 - MEASURING TESTING
Information Patent Grant
Separating ions in an ion trap
- Patent number 12,080,534
- Issue date Sep 3, 2024
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzing apparatus and control method
- Patent number 12,078,611
- Issue date Sep 3, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, system and method for transporting biological samples be...
- Patent number 12,080,539
- Issue date Sep 3, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for rapid exchange of ion sources and ion transmission devices
- Patent number 12,080,540
- Issue date Sep 3, 2024
- Micromass UK Limited
- Paul Murray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sodium vaporizer and methods
- Patent number 12,073,951
- Issue date Aug 27, 2024
- TerraPower, LLC.
- Christopher M. Regan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion detector
- Patent number 12,061,166
- Issue date Aug 13, 2024
- Micromass UK Limited
- David Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Desorber for a spectrometer
- Patent number 12,061,167
- Issue date Aug 13, 2024
- BRUKER OPTICS GMBH & CO. KG
- Uwe Renner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing biological samples
- Patent number 12,061,136
- Issue date Aug 13, 2024
- Olfactomics Oy
- Antti Roine
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for generating interference spectra for low detec...
- Patent number 12,053,755
- Issue date Aug 6, 2024
- MLS ACQ, Inc
- Martin L. Spartz
- G01 - MEASURING TESTING
Information Patent Grant
Ion entry/exit device
- Patent number 12,051,583
- Issue date Jul 30, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable micro-preconcentrator to facilitate chemical sampling and...
- Patent number 12,048,893
- Issue date Jul 30, 2024
- The Regents of the University of California
- Cristina E. Davis
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Processing of spatially resolved, ion-spectrometric measurement sig...
- Patent number 12,040,169
- Issue date Jul 16, 2024
- Tobias Boskamp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacture for an ion mobility filter
- Patent number 12,031,944
- Issue date Jul 9, 2024
- Owlstone Medical Limited
- Jonathan Pearson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RECONFIGURABLE SEQUENTIALLY-PACKED ION (SPION) TRANSFER DEVICE
- Publication number 20250006481
- Publication date Jan 2, 2025
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFERENTIAL TRAPPED ION MOBILITY SEPARATOR
- Publication number 20250003923
- Publication date Jan 2, 2025
- Bruker Daltonics GmbH & Co. KG
- Melvin PARK
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL TRAPPED ION MOBILITY FILTER
- Publication number 20250003924
- Publication date Jan 2, 2025
- Bruker Daltonics GmbH & Co. KG
- Karsten MICHELMANN
- G01 - MEASURING TESTING
Information Patent Application
CONDENSATION MITIGATION IN IONIZATION SENSING
- Publication number 20250003925
- Publication date Jan 2, 2025
- Douglas Bailey
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT SCREENING AND QUANTIFICATION FOR TARGET ANALYTES US...
- Publication number 20250003929
- Publication date Jan 2, 2025
- DH Technologies Development Pte. Ltd.
- Aaron Stella
- G01 - MEASURING TESTING
Information Patent Application
QUANTIFYING A SUBSTANCE PRESENT IN A SAMPLE
- Publication number 20250006479
- Publication date Jan 2, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Pedro José Navarro Álvarez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE COMPENSATION VOLTAGE FRACTION COLLECTION
- Publication number 20240402124
- Publication date Dec 5, 2024
- Thermo Finnigan LLC
- Michael Belford
- G01 - MEASURING TESTING
Information Patent Application
System and method for mass spectrometry imaging
- Publication number 20240389905
- Publication date Nov 28, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEPARATING IONS IN AN ION TRAP
- Publication number 20240395523
- Publication date Nov 28, 2024
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF DMS SEPARATIONS USING ACOUSTIC EJECTION MASS SPECTR...
- Publication number 20240379338
- Publication date Nov 14, 2024
- DH Technologies Development Pte. Ltd.
- Bradley B. Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILAMIN A BINDING PROTEINS AND USES THEREOF
- Publication number 20240368257
- Publication date Nov 7, 2024
- BPGbio, Inc.
- Wenfang Sybil WU
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
METHOD AND SYSTEM FOR GENERATING INTERFERENCE SPECTRA FOR LOW DETEC...
- Publication number 20240359153
- Publication date Oct 31, 2024
- MLS ACQ, Inc. D/B/A Max Analytical Technologies
- Martin L. Spartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFORMS IN AN ION MOBILITY SPECTROMETER
- Publication number 20240361274
- Publication date Oct 31, 2024
- Battelle Memorial Institute
- Adam L. Hollerbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEBULISER OUTLET ASSEMBLY
- Publication number 20240363322
- Publication date Oct 31, 2024
- Micromass UK Limited
- Suloke Mathai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREDICTION OF PRECURSOR CHARGE STATE IN DM-SWATH ANALYSIS
- Publication number 20240355605
- Publication date Oct 24, 2024
- DH Technologies Development Pte. Ltd.
- Yves LE BLANC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENTRY/EXIT DEVICE
- Publication number 20240355606
- Publication date Oct 24, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISEASE OR HEALTH CONDITION EXAMINATION METHOD AND EXAMINATION SYSTEM
- Publication number 20240331865
- Publication date Oct 3, 2024
- DAIKIN INDUSTRIES, LTD.
- Akira MATSUBARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS
- Publication number 20240319137
- Publication date Sep 26, 2024
- Zijin Mining Group Co., Ltd.
- Youye ZHENG
- G01 - MEASURING TESTING
Information Patent Application
TANDEM DIFFERENTIAL MOBILITY ION MOBILITY SPECTROMETRY
- Publication number 20240319138
- Publication date Sep 26, 2024
- HAMILTON SUNDSTRAND CORPORATION
- Ben D. Gardner
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING OF SPATIALLY RESOLVED, ION-SPECTROMETRIC MEASUREMENT SIG...
- Publication number 20240321565
- Publication date Sep 26, 2024
- Bruker Daltonics GmbH & Co. KG
- Tobias BOSKAMP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR DEVICE
- Publication number 20240310329
- Publication date Sep 19, 2024
- Sharp Display Technology Corporation
- Kei IKUTA
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRESSURE ION OPTICAL DEVICES
- Publication number 20240310330
- Publication date Sep 19, 2024
- Philip MARRIOTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD
- Publication number 20240310327
- Publication date Sep 19, 2024
- OSAKA UNIVERSITY
- Michisato TOYODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PRESSURE ION OPTICAL DEVICES
- Publication number 20240310328
- Publication date Sep 19, 2024
- Philip MARRIOTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF AMPLITUDE AUTO-CALIBRATION FOR MASS SPECTROMETRY
- Publication number 20240282562
- Publication date Aug 22, 2024
- DH TECHNOLOGIES DEVELOPMENT PTD. LTD.
- Manuel Faur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED SYSTEMS AND METHODS FOR SEPARATING COMPOUNDS
- Publication number 20240282564
- Publication date Aug 22, 2024
- DH Technologies Development Pte. Ltd.
- Leigh BEDFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radon Gas Detector with Integrated Collection and Processing Functi...
- Publication number 20240272119
- Publication date Aug 15, 2024
- LIMIN ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DISCHARGING DEVICE, REFRIGERANT EVALUATION DEVICE, AND REFRIGERANT...
- Publication number 20240272120
- Publication date Aug 15, 2024
- DAIKIN INDUSTRIES, LTD.
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF DIFFERENTIAL MOBILITY SPECTROMETRY (DMS)...
- Publication number 20240272121
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Bradley B. SCHNEIDER
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20240264116
- Publication date Aug 8, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS

by investigating the ionisation of gases by investigating electric discharges

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Laterally-extended trapped ion mobility spectrometer

Systems and methods for two-dimensional mobility based filtering of...

Aperture plate assembly

Systems and methods for separating ions at about or above atmospher...

Imaging mass spectrometer

Gas analyzer apparatus and method for controlling gas analyzer appa...

High-throughput label-free enzymatic bioassays using DESI-MS

Mass spectrometry method and mass spectrometer

Ion mobility analysis apparatus

Ion guide

Mass analysis system, and method for determining performance of mas...

Method for the analytical measurement of sample material on a sampl...

Electrospray ion source for spectrometry using inductively heated gas

Ion analysis device

Silicon nanowire chip and silicon nanowire chip-based mass spectrum...

Apparatus, system, and method for transferring ions

Separating ions in an ion trap

Gas analyzing apparatus and control method

Apparatus, system and method for transporting biological samples be...

Device for rapid exchange of ion sources and ion transmission devices

Sodium vaporizer and methods

Ion detector

Desorber for a spectrometer

Method and apparatus for analyzing biological samples

Method and system for generating interference spectra for low detec...

Ion entry/exit device

Portable micro-preconcentrator to facilitate chemical sampling and...

Processing of spatially resolved, ion-spectrometric measurement sig...

Ion analyzer

Method of manufacture for an ion mobility filter

Patents Applicationslast 30 patents

RECONFIGURABLE SEQUENTIALLY-PACKED ION (SPION) TRANSFER DEVICE

DIFFERENTIAL TRAPPED ION MOBILITY SEPARATOR

DIFFERENTIAL TRAPPED ION MOBILITY FILTER

CONDENSATION MITIGATION IN IONIZATION SENSING

HIGH THROUGHPUT SCREENING AND QUANTIFICATION FOR TARGET ANALYTES US...

QUANTIFYING A SUBSTANCE PRESENT IN A SAMPLE

MULTIPLE COMPENSATION VOLTAGE FRACTION COLLECTION

System and method for mass spectrometry imaging

SEPARATING IONS IN AN ION TRAP

OPTIMIZATION OF DMS SEPARATIONS USING ACOUSTIC EJECTION MASS SPECTR...

FILAMIN A BINDING PROTEINS AND USES THEREOF

METHOD AND SYSTEM FOR GENERATING INTERFERENCE SPECTRA FOR LOW DETEC...

WAVEFORMS IN AN ION MOBILITY SPECTROMETER

NEBULISER OUTLET ASSEMBLY

PREDICTION OF PRECURSOR CHARGE STATE IN DM-SWATH ANALYSIS

ION ENTRY/EXIT DEVICE

DISEASE OR HEALTH CONDITION EXAMINATION METHOD AND EXAMINATION SYSTEM

METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS

TANDEM DIFFERENTIAL MOBILITY ION MOBILITY SPECTROMETRY

PROCESSING OF SPATIALLY RESOLVED, ION-SPECTROMETRIC MEASUREMENT SIG...

DETECTOR DEVICE

HIGH PRESSURE ION OPTICAL DEVICES

MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD

HIGH PRESSURE ION OPTICAL DEVICES

RF AMPLITUDE AUTO-CALIBRATION FOR MASS SPECTROMETRY

AUTOMATED SYSTEMS AND METHODS FOR SEPARATING COMPOUNDS

Radon Gas Detector with Integrated Collection and Processing Functi...

DISCHARGING DEVICE, REFRIGERANT EVALUATION DEVICE, AND REFRIGERANT...

AUTOMATED OPTIMIZATION OF DIFFERENTIAL MOBILITY SPECTROMETRY (DMS)...

Monitoring Radical Particle Concentration Using Mass Spectrometry