by measuring inelastic scatter of gamma rays

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CPC
G01N23/20066

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/20066by measuring inelastic scatter of gamma rays

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Patents Grantslast 30 patents

Information Patent Grant
Materials classifier
- Patent number 12,044,635
- Issue date Jul 23, 2024
- BAE Systems plc
- Lionel William John Kent
- G01 - MEASURING TESTING
Information Patent Grant
Multi-modal Compton and single photon emission computed tomography...
- Patent number 11,998,374
- Issue date Jun 4, 2024
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Grant
Imaging method using jointly a PET reconstruction and a compton rec...
- Patent number 11,898,972
- Issue date Feb 13, 2024
- DAMAVAN IMAGING
- Alain Iltis
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting a spectral image
- Patent number 11,872,071
- Issue date Jan 16, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Odran Pivot
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Data processing apparatus, data processing method, and non-transito...
- Patent number 11,846,737
- Issue date Dec 19, 2023
- Canon Medical Systems Corporation
- Go Kawata
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Compton scattering correction methods for pixellated radiation dete...
- Patent number 11,701,065
- Issue date Jul 18, 2023
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
System and method for imaging by gamma radiation detection
- Patent number 11,703,605
- Issue date Jul 18, 2023
- A.N.D.R.A.
- Alain Iltis
- G01 - MEASURING TESTING
Information Patent Grant
Radiation diagnostic device comprising a first detector for detecti...
- Patent number 11,684,321
- Issue date Jun 27, 2023
- Canon Medical Systems Corporation
- Go Kawata
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multi-modal Compton and single photon emission computed tomography...
- Patent number 11,426,135
- Issue date Aug 30, 2022
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Grant
Device for producing high resolution backscatter images
- Patent number 11,409,019
- Issue date Aug 9, 2022
- MICRO-X LIMITED
- Brian Gonzales
- G01 - MEASURING TESTING
Information Patent Grant
Method and metrology apparatus for determining estimated scattered...
- Patent number 11,392,043
- Issue date Jul 19, 2022
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G01 - MEASURING TESTING
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
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- Issue date Apr 26, 2022
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of crystallographic properties in aerospace components
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- Issue date Nov 23, 2021
- Raytheon Technologies Corporation
- Iuliana Cernatescu
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Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
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- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Radiation-based thickness gauge
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- Issue date Aug 3, 2021
- NDC Technologies Inc.
- Vahe Ghazikhanian
- G01 - MEASURING TESTING
Information Patent Grant
Gamma-ray image acquisition device and gamma-ray image acquisition...
- Patent number 10,989,676
- Issue date Apr 27, 2021
- KYOTO UNIVERSITY
- Toru Tanimori
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing subsurface core samples
- Patent number 10,908,101
- Issue date Feb 2, 2021
- Core Laboratories LP
- Jason Michael Ashby
- G01 - MEASURING TESTING
Information Patent Grant
Full beam metrology for X-ray scatterometry systems
- Patent number 10,775,323
- Issue date Sep 15, 2020
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for scanning a structure
- Patent number 10,697,905
- Issue date Jun 30, 2020
- Johnson Matthey Public Limited Company
- Paul David Featonby
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analysis of material by neutron interrogation
- Patent number 10,527,561
- Issue date Jan 7, 2020
- SODERN
- Adrien Cheminet
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a degraded area of a metal structure covered b...
- Patent number 10,408,615
- Issue date Sep 10, 2019
- Inversa Systems LTD.
- John T. Bowles
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for X-ray analysis
- Patent number 10,359,376
- Issue date Jul 23, 2019
- Malvern Panalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency photon detection
- Patent number 10,126,255
- Issue date Nov 13, 2018
- Elwha LLC
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Grant
Collection of tomographic inspection data using compton scattering
- Patent number 10,024,808
- Issue date Jul 17, 2018
- Inversa Systems LTD.
- Paul Arsenault
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
More efficient method and apparatus for detector response correctio...
- Patent number 9,977,140
- Issue date May 22, 2018
- Toshiba Medical Systems Corporation
- Xiaolan Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ionizing radiation detection apparatus
- Patent number 9,885,675
- Issue date Feb 6, 2018
- Canon Kabushiki Kaisha
- Ikuo Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thin film thickness using x-ray
- Patent number 9,644,956
- Issue date May 9, 2017
- Nano CMS Co., Ltd
- Shi Surk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting an infrastructure, compton scattering inspect...
- Patent number 9,599,579
- Issue date Mar 21, 2017
- Inversa Systems LTD.
- Shawn Durette
- G01 - MEASURING TESTING
Information Patent Grant
Compton coincident volumetric imaging
- Patent number 9,535,016
- Issue date Jan 3, 2017
- Xiaochao Xu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for characterising a material by scattering of...
- Patent number 9,535,017
- Issue date Jan 3, 2017
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY
- Publication number 20240377341
- Publication date Nov 14, 2024
- SAFRAN
- Cédric FRAGNAUD
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...
- Publication number 20240293095
- Publication date Sep 5, 2024
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR HIGH PHOTON ENERGIES IMAGING
- Publication number 20240288595
- Publication date Aug 29, 2024
- Bar Ilan University
- Eliahu COHEN
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For X-Ray Scatterometry Measurements Employing...
- Publication number 20240060914
- Publication date Feb 22, 2024
- KLA Corporation
- Mohsen Mahvash
- G01 - MEASURING TESTING
Information Patent Application
MEDICAL IMAGE PROCESSING DEVICE, COMPUTER PROGRAM, AND NUCLEAR MEDI...
- Publication number 20230218243
- Publication date Jul 13, 2023
- NATIONAL INSTITUTES FOR QUANTUM SCIENCE AND TECHNOLOGY
- Hideaki TASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING METHOD USING JOINTLY A PET RECONSTRUCTION AND A COMPTON REC...
- Publication number 20220357291
- Publication date Nov 10, 2022
- DAMAVAN IMAGING
- Alain ILTIS
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...
- Publication number 20220330909
- Publication date Oct 20, 2022
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Application
MATERIALS CLASSIFIER
- Publication number 20220334071
- Publication date Oct 20, 2022
- BAE Systems plc
- Lionel William John Kent
- G01 - MEASURING TESTING
Information Patent Application
Full Beam Metrology For X-Ray Scatterometry Systems
- Publication number 20220268714
- Publication date Aug 25, 2022
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION DIAGNOSTIC DEVICE, CORRECTION METHOD FOR COMPTON SCATTERI...
- Publication number 20220065803
- Publication date Mar 3, 2022
- Canon Medical Systems Corporation
- Go KAWATA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...
- Publication number 20210282728
- Publication date Sep 16, 2021
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR IMAGING BY GAMMA RADIATION DETECTION
- Publication number 20210199821
- Publication date Jul 1, 2021
- A.N.D.R.A.
- Alain ILTIS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CAMERA COMPTON MULTI-CAPTURE ET PROCEDE D'IMAGERIE
- Publication number 20200400593
- Publication date Dec 24, 2020
- DAMAVAN IMAGING
- Alain ILTIS
- G01 - MEASURING TESTING
Information Patent Application
COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...
- Publication number 20200367839
- Publication date Nov 26, 2020
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
GAMMA-RAY IMAGE ACQUISITION DEVICE AND GAMMA-RAY IMAGE ACQUISITION...
- Publication number 20200319123
- Publication date Oct 8, 2020
- KYOTO UNIVERSITY
- Toru TANIMORI
- G01 - MEASURING TESTING
Information Patent Application
Full Beam Metrology For X-Ray Scatterometry Systems
- Publication number 20200300790
- Publication date Sep 24, 2020
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR ANALYZING SUBSURFACE CORE SAMPLES
- Publication number 20200158666
- Publication date May 21, 2020
- CORE LABORATORIES LP
- Jason Michael Ashby
- G01 - MEASURING TESTING
Information Patent Application
Method and Metrology Apparatus for Determining Estimated Scattered...
- Publication number 20200057386
- Publication date Feb 20, 2020
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYSIS OF MATERIAL BY NEUTRON INTERROGATION
- Publication number 20190094157
- Publication date Mar 28, 2019
- SODERN
- Adrien Cheminet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MULTI MATERIAL DECOMPOSITION
- Publication number 20190069865
- Publication date Mar 7, 2019
- Liran GOSHEN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHOD FOR SCANNING A STRUCTURE
- Publication number 20180100816
- Publication date Apr 12, 2018
- Johnson Matthey Public Limited Company
- Paul David FEATONBY
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A DEGRADED AREA OF A METAL STRUCTURE COVERED B...
- Publication number 20170248417
- Publication date Aug 31, 2017
- INVERSA SYSTEMS LTD.
- John T. BOWLES
- G01 - MEASURING TESTING
Information Patent Application
HIGH EFFICIENCY PHOTON DETECTION
- Publication number 20170205361
- Publication date Jul 20, 2017
- Elwha LLC
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING AN INFRASTRUCTURE, COMPTON SCATTERING INSPECT...
- Publication number 20170052126
- Publication date Feb 23, 2017
- INVERSA SYSTEMS LTD.
- Shawn Durette
- G01 - MEASURING TESTING
Information Patent Application
IONIZING RADIATION DETECTION APPARATUS
- Publication number 20160341676
- Publication date Nov 24, 2016
- Canon Kabushiki Kaisha
- Ikuo Watanabe
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ESTIMATING MATERIAL DENSITY
- Publication number 20160161385
- Publication date Jun 9, 2016
- GENERAL ELECTRIC COMPANY
- Michael Anthony Lexa
- G01 - MEASURING TESTING
Information Patent Application
COLLECTION OF TOMOGRAPHIC INSPECTION DATA USING COMPTON SCATTERING
- Publication number 20150377804
- Publication date Dec 31, 2015
- INVERSA SYSTEMS LTD.
- PAUL ARSENAULT
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ELEMENTAL CONCENTRATION USING COMPTON SCATTERING
- Publication number 20150204803
- Publication date Jul 23, 2015
- Northeastern University
- Arun Bansil
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE
- Publication number 20150185168
- Publication date Jul 2, 2015
- HELMHOLTZ-ZENTRUM BERLIN FUER MATERIALIEN UND ENERGIE GMBH
- Alexei Erko
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Characterising A Material By Scattering Of...
- Publication number 20140369473
- Publication date Dec 18, 2014
- Caroline Paulus
- G01 - MEASURING TESTING

by measuring inelastic scatter of gamma rays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Materials classifier

Multi-modal Compton and single photon emission computed tomography...

Imaging method using jointly a PET reconstruction and a compton rec...

Method for correcting a spectral image

Data processing apparatus, data processing method, and non-transito...

Compton scattering correction methods for pixellated radiation dete...

System and method for imaging by gamma radiation detection

Radiation diagnostic device comprising a first detector for detecti...

Multi-modal Compton and single photon emission computed tomography...

Device for producing high resolution backscatter images

Method and metrology apparatus for determining estimated scattered...

Full beam metrology for x-ray scatterometry systems

Detection of crystallographic properties in aerospace components

Graphene-based electro-microfluidic devices and methods for protein...

Radiation-based thickness gauge

Gamma-ray image acquisition device and gamma-ray image acquisition...

System and method for analyzing subsurface core samples

Full beam metrology for X-ray scatterometry systems

Apparatus and method for scanning a structure

Device and method for analysis of material by neutron interrogation

Method of inspecting a degraded area of a metal structure covered b...

Sample holder for X-ray analysis

High efficiency photon detection

Collection of tomographic inspection data using compton scattering

More efficient method and apparatus for detector response correctio...

Ionizing radiation detection apparatus

Method and apparatus for measuring thin film thickness using x-ray

Method for inspecting an infrastructure, compton scattering inspect...

Compton coincident volumetric imaging

Method and apparatus for characterising a material by scattering of...

Patents Applicationslast 30 patents

METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY

MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...

METHOD AND SYSTEM FOR HIGH PHOTON ENERGIES IMAGING

Methods And Systems For X-Ray Scatterometry Measurements Employing...

MEDICAL IMAGE PROCESSING DEVICE, COMPUTER PROGRAM, AND NUCLEAR MEDI...

IMAGING METHOD USING JOINTLY A PET RECONSTRUCTION AND A COMPTON REC...

MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...

MATERIALS CLASSIFIER

Full Beam Metrology For X-Ray Scatterometry Systems

RADIATION DIAGNOSTIC DEVICE, CORRECTION METHOD FOR COMPTON SCATTERI...

MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...

SYSTEM AND METHOD FOR IMAGING BY GAMMA RADIATION DETECTION

CAMERA COMPTON MULTI-CAPTURE ET PROCEDE D'IMAGERIE

COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...

GAMMA-RAY IMAGE ACQUISITION DEVICE AND GAMMA-RAY IMAGE ACQUISITION...

Full Beam Metrology For X-Ray Scatterometry Systems

SYSTEM AND METHOD FOR ANALYZING SUBSURFACE CORE SAMPLES

Method and Metrology Apparatus for Determining Estimated Scattered...

DEVICE AND METHOD FOR ANALYSIS OF MATERIAL BY NEUTRON INTERROGATION

APPARATUS FOR MULTI MATERIAL DECOMPOSITION

APPARATUS AND METHOD FOR SCANNING A STRUCTURE

METHOD OF INSPECTING A DEGRADED AREA OF A METAL STRUCTURE COVERED B...

HIGH EFFICIENCY PHOTON DETECTION

METHOD FOR INSPECTING AN INFRASTRUCTURE, COMPTON SCATTERING INSPECT...

IONIZING RADIATION DETECTION APPARATUS

SYSTEM AND METHOD FOR ESTIMATING MATERIAL DENSITY

COLLECTION OF TOMOGRAPHIC INSPECTION DATA USING COMPTON SCATTERING

DETERMINING ELEMENTAL CONCENTRATION USING COMPTON SCATTERING

DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE

Method And Apparatus For Characterising A Material By Scattering Of...