by measuring the force required to restore a proofmass subjected to inertial forces to a null position

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GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT G01P15/00Measuring acceleration Measuring deceleration Measuring shock

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G01P15/13by measuring the force required to restore a proofmass subjected to inertial forces to a null position

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Patents Grantslast 30 patents

Information Patent Grant
Method for harmonising two inertial measurement units with one anot...
- Patent number 12,270,658
- Issue date Apr 8, 2025
- SAFRAN ELECTRONICS & DEFENSE
- Emmanuel Robert
- G01 - MEASURING TESTING
Information Patent Grant
Vibration remote sensor based on speckles tracking, which uses an o...
- Patent number 12,210,032
- Issue date Jan 28, 2025
- Spacearth Technology S.R.L.
- Emanuele Giacomozzi
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer including protective housing
- Patent number 12,210,034
- Issue date Jan 28, 2025
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Grant
Bias performance in force balance accelerometers
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- Issue date Nov 12, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Grant
Mems device, electronic apparatus, and vehicle
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- Issue date Oct 29, 2024
- Seiko Epson Corporation
- Fumiya Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor having stress relieving support structure
- Patent number 12,123,893
- Issue date Oct 22, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor, physical quantity sensor device, and meth...
- Patent number 12,123,891
- Issue date Oct 22, 2024
- Seiko Epson Corporation
- Kenta Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method for lithography process
- Patent number 12,066,756
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Hung Liao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Closed-loop microelectromechanical accelerometer with compensation...
- Patent number 11,965,906
- Issue date Apr 23, 2024
- STMicroelectronics S.r.l.
- Gabriele Gattere
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Information Patent Grant
Pendular accelerometer sensor with conditional capacitive detection
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- Issue date Feb 20, 2024
- SAFRAN ELECTRONICS & DEFENSE
- Philippe Ullah
- G01 - MEASURING TESTING
Information Patent Grant
Impact indicator
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- Issue date Jan 9, 2024
- Shock Watch, Inc.
- Anthony N. Fonk
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device, electronic apparatus, and vehicle
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- Issue date Jan 9, 2024
- Seiko Epson Corporation
- Fumiya Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vibration rectification error correction circuit, physical quantity...
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- Issue date Nov 7, 2023
- Seiko Epson Corporation
- Masayoshi Todorokihara
- G01 - MEASURING TESTING
Information Patent Grant
MEMS vibrating beam accelerometer with built-in test actuators
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- Issue date Jul 18, 2023
- Honeywell International Inc.
- John Reinke
- G01 - MEASURING TESTING
Information Patent Grant
High performance micro-electro-mechanical systems accelerometer
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- Issue date Mar 28, 2023
- Cambridge Enterprise Limited
- Xudong Zou
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device, electronic apparatus, and vehicle
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- Issue date Mar 14, 2023
- Seiko Epson Corporation
- Fumiya Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Resonant accelerometer
- Patent number 11,579,166
- Issue date Feb 14, 2023
- Meta Platforms Technologies, LLC
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Impact indicator
- Patent number 11,555,826
- Issue date Jan 17, 2023
- ShockWatch, Inc.
- Anthony N. Fonk
- G01 - MEASURING TESTING
Information Patent Grant
Bridge impact detection and classification systems and methods
- Patent number 11,551,092
- Issue date Jan 10, 2023
- Southern Methodist University
- Brett Story
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multilayer magnetic circuit assembly
- Patent number 11,521,772
- Issue date Dec 6, 2022
- Honeywell International Inc.
- Paul W. Dwyer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Single proof mass based three-axis accelerometer
- Patent number 11,493,533
- Issue date Nov 8, 2022
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Stress relieving sensor flange
- Patent number 11,422,152
- Issue date Aug 23, 2022
- Honeywell International Inc.
- Paul W. Dwyer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
MEMS sensor detection device and MEMS sensor system
- Patent number 11,401,160
- Issue date Aug 2, 2022
- INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES
- Zongwei Li
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Moisture detector, moisture detection method, electronic device, an...
- Patent number 11,397,047
- Issue date Jul 26, 2022
- MINEBEA MITSUMI INC.
- Taketomo Nakane
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Low-noise multi axis MEMS accelerometer
- Patent number 11,377,346
- Issue date Jul 5, 2022
- Murata Manufacturing Co., Ltd.
- Hannu Vesterinen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrostatically softened accelerometer spring
- Patent number 11,333,679
- Issue date May 17, 2022
- Facebook Technologies, LLC
- Doruk Senkal
- G01 - MEASURING TESTING
Information Patent Grant
Near-zero power wakeup electro-mechanical system
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- Issue date Apr 26, 2022
- Kionix, Inc.
- Andrew Hocking
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Resonant accelerometer
- Patent number 11,307,217
- Issue date Apr 19, 2022
- Facebook Technologies, LLC
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
High performance accelerometer
- Patent number 11,287,443
- Issue date Mar 29, 2022
- Invensense, Inc.
- Sriraman Dakshinamurthy
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Navigational grade resonant MicroElectroMechanical Systems (mems) a...
- Patent number 11,275,099
- Issue date Mar 15, 2022
- HRL Laboratories, LLC
- Logan D. Sorenson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ACCELEROMETER INCLUDING SINGLE MAGNET
- Publication number 20250172584
- Publication date May 29, 2025
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
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SERVO-TYPE VIBRATION DETECTOR AND EVALUATION METHOD FOR SERVO-TYPE...
- Publication number 20250130098
- Publication date Apr 24, 2025
- TOKKYOKIKI CORPORATION
- Teruo MARUYAMA
- G01 - MEASURING TESTING
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MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20250012829
- Publication date Jan 9, 2025
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
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ACCELEROMETER WITH THERMAL EXPANSION STRAIN PROTECTION
- Publication number 20240409394
- Publication date Dec 12, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
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OPTICAL DISPLACEMENT SENSORS
- Publication number 20240329077
- Publication date Oct 3, 2024
- SensiBel AS
- Sigbjørn Kolberg
- G01 - MEASURING TESTING
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ACCELERATION SENSOR
- Publication number 20240302404
- Publication date Sep 12, 2024
- Rohm Co., Ltd.
- Daisuke Nishinohara
- G01 - MEASURING TESTING
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OPTICAL ACCELEROMETER SYSTEM
- Publication number 20240295581
- Publication date Sep 5, 2024
- Northrop Grumman Systems Corporation
- Vyacheslav Lebedev
- G02 - OPTICS
Information Patent Application
MEMS Device And Inertial Measurement Unit
- Publication number 20240142491
- Publication date May 2, 2024
- SEIKO EPSON CORPORATION
- Satoru TANAKA
- G01 - MEASURING TESTING
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ACCELEROMETER INCLUDING PROTECTIVE HOUSING
- Publication number 20240118306
- Publication date Apr 11, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
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ACCELEROMETER FORMING A RECESS ENCLOSING AN ELECTROMAGNETIC COIL
- Publication number 20240118309
- Publication date Apr 11, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
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MEMS ACCELEROMETER SYSTEMS
- Publication number 20240094238
- Publication date Mar 21, 2024
- Simmonds Precision Products, Inc.
- Richard A. Hull
- G01 - MEASURING TESTING
Information Patent Application
MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20240094239
- Publication date Mar 21, 2024
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
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SENSOR HAVING STRESS RELIEVING SUPPORT STRUCTURE
- Publication number 20240061012
- Publication date Feb 22, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
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BIAS PERFORMANCE IN FORCE BALANCE ACCELEROMETERS
- Publication number 20240044933
- Publication date Feb 8, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
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Physical Quantity Sensor And Inertial Measurement Unit
- Publication number 20240003936
- Publication date Jan 4, 2024
- SEIKO EPSON CORPORATION
- Satoru TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensor And Inertial Measurement Module
- Publication number 20230314466
- Publication date Oct 5, 2023
- SEIKO EPSON CORPORATION
- Kazuyuki NAGATA
- G01 - MEASURING TESTING
Information Patent Application
Physical Quantity Sensor And Inertial Measurement Unit
- Publication number 20230266359
- Publication date Aug 24, 2023
- SEIKO EPSON CORPORATION
- Koichiro KOMIZO
- G01 - MEASURING TESTING
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MODE LOCALISED ACCELEROMETER
- Publication number 20230204621
- Publication date Jun 29, 2023
- CAMBRIDGE ENTERPRISE LIMITED
- Ashwin SESHIA
- G01 - MEASURING TESTING
Information Patent Application
MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20230176086
- Publication date Jun 8, 2023
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical Quantity Sensor and Inertial Measurement Device
- Publication number 20230136163
- Publication date May 4, 2023
- SEIKO EPSON CORPORATION
- Satoru TANAKA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MEANS OR MODULE FOR DETERMINING A DISPLACEMENT OR DEFLECTION...
- Publication number 20230137254
- Publication date May 4, 2023
- Electrolux Appliances Aktiebolag
- Gerhard KLEIN
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION REMOTE SENSOR BASED ON SPECKLES TRACKING, WHICH USES AN O...
- Publication number 20230105395
- Publication date Apr 6, 2023
- SPACEARTH TECHNOLOGY S.R.L.
- Emanuele GIACOMOZZI
- G02 - OPTICS
Information Patent Application
Physical Quantity Detection Element, Physical Quantity Sensor, And...
- Publication number 20230055371
- Publication date Feb 23, 2023
- SEIKO EPSON CORPORATION
- Kenta SATO
- G01 - MEASURING TESTING
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TEMPERATURE DEPENDENT ACCELERATION CURRENT SOURCE CIRCUITRY
- Publication number 20230055100
- Publication date Feb 23, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Carsten Ingo Stoerk
- G01 - MEASURING TESTING
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PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, AND METH...
- Publication number 20230032633
- Publication date Feb 2, 2023
- SEIKO EPSON CORPORATION
- Kenta Sato
- G01 - MEASURING TESTING
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PENDULAR ACCELEROMETER SENSOR WITH CONDITIONAL CAPACITIVE DETECTION
- Publication number 20230026178
- Publication date Jan 26, 2023
- SAFRAN ELECTRONICS & DEFENSE
- Philippe ULLAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR LITHOGRAPHY PROCESS
- Publication number 20220404390
- Publication date Dec 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Hung LIAO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MECHANICALLY-SENSITIVE SEMICONDUCTING TRIODE CAPACITOR
- Publication number 20220252635
- Publication date Aug 11, 2022
- Kionix, Inc.
- Jonah DEWALL
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
IMPACT INDICATOR
- Publication number 20220128592
- Publication date Apr 28, 2022
- ShockWatch, Inc.
- Anthony N. Fonk
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER INCLUDING RECTANGULAR COIL AND RECTANGULAR POLE PIECE
- Publication number 20220018872
- Publication date Jan 20, 2022
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING

by measuring the force required to restore a proofmass subjected to inertial forces to a null position

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for harmonising two inertial measurement units with one anot...

Vibration remote sensor based on speckles tracking, which uses an o...

Accelerometer including protective housing

Bias performance in force balance accelerometers

Mems device, electronic apparatus, and vehicle

Sensor having stress relieving support structure

Physical quantity sensor, physical quantity sensor device, and meth...

Method for lithography process

Closed-loop microelectromechanical accelerometer with compensation...

Pendular accelerometer sensor with conditional capacitive detection

Impact indicator

MEMS device, electronic apparatus, and vehicle

Vibration rectification error correction circuit, physical quantity...

MEMS vibrating beam accelerometer with built-in test actuators

High performance micro-electro-mechanical systems accelerometer

MEMS device, electronic apparatus, and vehicle

Resonant accelerometer

Impact indicator

Bridge impact detection and classification systems and methods

Multilayer magnetic circuit assembly

Single proof mass based three-axis accelerometer

Stress relieving sensor flange

MEMS sensor detection device and MEMS sensor system

Moisture detector, moisture detection method, electronic device, an...

Low-noise multi axis MEMS accelerometer

Electrostatically softened accelerometer spring

Near-zero power wakeup electro-mechanical system

Resonant accelerometer

High performance accelerometer

Navigational grade resonant MicroElectroMechanical Systems (mems) a...

Patents Applicationslast 30 patents

ACCELEROMETER INCLUDING SINGLE MAGNET

SERVO-TYPE VIBRATION DETECTOR AND EVALUATION METHOD FOR SERVO-TYPE...

MEMS Device, Electronic Apparatus, And Vehicle

ACCELEROMETER WITH THERMAL EXPANSION STRAIN PROTECTION

OPTICAL DISPLACEMENT SENSORS

ACCELERATION SENSOR

OPTICAL ACCELEROMETER SYSTEM

MEMS Device And Inertial Measurement Unit

ACCELEROMETER INCLUDING PROTECTIVE HOUSING

ACCELEROMETER FORMING A RECESS ENCLOSING AN ELECTROMAGNETIC COIL

MEMS ACCELEROMETER SYSTEMS

MEMS Device, Electronic Apparatus, And Vehicle

SENSOR HAVING STRESS RELIEVING SUPPORT STRUCTURE

BIAS PERFORMANCE IN FORCE BALANCE ACCELEROMETERS

Physical Quantity Sensor And Inertial Measurement Unit

Inertial Sensor And Inertial Measurement Module

Physical Quantity Sensor And Inertial Measurement Unit

MODE LOCALISED ACCELEROMETER

MEMS Device, Electronic Apparatus, And Vehicle

Physical Quantity Sensor and Inertial Measurement Device

SENSOR MEANS OR MODULE FOR DETERMINING A DISPLACEMENT OR DEFLECTION...

VIBRATION REMOTE SENSOR BASED ON SPECKLES TRACKING, WHICH USES AN O...

Physical Quantity Detection Element, Physical Quantity Sensor, And...

TEMPERATURE DEPENDENT ACCELERATION CURRENT SOURCE CIRCUITRY

PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, AND METH...

PENDULAR ACCELEROMETER SENSOR WITH CONDITIONAL CAPACITIVE DETECTION

METHOD FOR LITHOGRAPHY PROCESS

MECHANICALLY-SENSITIVE SEMICONDUCTING TRIODE CAPACITOR

IMPACT INDICATOR

ACCELEROMETER INCLUDING RECTANGULAR COIL AND RECTANGULAR POLE PIECE