by optical means

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CPC
G01Q20/02

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q20/00Monitoring the movement or position of the probe

Current Industry

G01Q20/02by optical means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Truncated nonlinear interferometer-based sensor system
- Patent number 12,181,773
- Issue date Dec 31, 2024
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nano robotic system for high throughput single cell DNA sequencing
- Patent number 12,163,979
- Issue date Dec 10, 2024
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Method and device for simultaneous independent motion measurement o...
- Patent number 11,892,471
- Issue date Feb 6, 2024
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
- Patent number 11,846,653
- Issue date Dec 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Grant
Systems, method and computer-accessible medium for providing balanc...
- Patent number 11,835,545
- Issue date Dec 5, 2023
- The Trustees of Columbia University In the City of New York
- Alexander Swinton McLeod
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
3D multipurpose scanning microscopy probes
- Patent number 11,815,527
- Issue date Nov 14, 2023
- New York University
- Mohammad A. Qasaimeh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
- Patent number 11,789,037
- Issue date Oct 17, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope using artificial intelligence object recogn...
- Patent number 11,709,180
- Issue date Jul 25, 2023
- Chungbuk National University Industry-Academic Cooperation Foundation
- Man Hee Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 11,668,730
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for examining and/or processing a sample
- Patent number 11,592,461
- Issue date Feb 28, 2023
- Carl Zeiss SMT GmbH
- Christof Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe for detecting near field and near-field detecting system incl...
- Patent number 11,579,168
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Ikseon Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,577,286
- Issue date Feb 14, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Truncated non-linear interferometer-based sensor system
- Patent number 11,561,453
- Issue date Jan 24, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Torsion wing probe assembly
- Patent number 11,555,827
- Issue date Jan 17, 2023
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for aligning a probe for scanning probe micros...
- Patent number 11,549,963
- Issue date Jan 10, 2023
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning probe microscope optical axi...
- Patent number 11,519,936
- Issue date Dec 6, 2022
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 11,519,935
- Issue date Dec 6, 2022
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Scanning type probe microscope and control device for scanning type...
- Patent number 11,454,647
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,391,664
- Issue date Jul 19, 2022
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and optical axis adjustment method in sca...
- Patent number 11,346,856
- Issue date May 31, 2022
- Shimadzu Corporation
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Metal coated spike array
- Patent number 11,320,608
- Issue date May 3, 2022
- Waymo LLC
- John Simpson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240426870
- Publication date Dec 26, 2024
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...
- Publication number 20240275130
- Publication date Aug 15, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...
- Publication number 20240077516
- Publication date Mar 7, 2024
- Virginia Commonwealth University
- Jason REED
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
- Publication number 20240069095
- Publication date Feb 29, 2024
- Intel Corporation
- Huei Hao YAP
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE
- Publication number 20240012021
- Publication date Jan 11, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...
- Publication number 20230393169
- Publication date Dec 7, 2023
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...
- Publication number 20230324433
- Publication date Oct 12, 2023
- PARK SYSTEMS CORP.
- Ahjin JO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...
- Publication number 20230204624
- Publication date Jun 29, 2023
- Park Systems Corp.
- JeongHun AN
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
Debris Removal From High Aspect Structures
- Publication number 20230158555
- Publication date May 25, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...
- Publication number 20230018874
- Publication date Jan 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
- Publication number 20230019239
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT O...
- Publication number 20230020068
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...
- Publication number 20220373575
- Publication date Nov 24, 2022
- CHUNGBUK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Man Hee LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
- Publication number 20220260611
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...
- Publication number 20220229088
- Publication date Jul 21, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Sri Ram Shankar RAJADURAI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR EXAMINING AND/OR PROCESSING A SAMPLE
- Publication number 20220178965
- Publication date Jun 9, 2022
- Carl Zeiss SMT GMBH
- Christof Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...
- Publication number 20220155340
- Publication date May 19, 2022
- Samsung Electronics Co., Ltd.
- Ikseon Jeon
- G01 - MEASURING TESTING
Information Patent Application
3D MULTIPURPOSE SCANNING MICROSCOPY PROBES
- Publication number 20220146549
- Publication date May 12, 2022
- New York University in Abu Dhabi corporation
- Mohammad A. Qasaimeh
- G01 - MEASURING TESTING
Information Patent Application
Torsion Wing Probe Assembly
- Publication number 20220107339
- Publication date Apr 7, 2022
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING

by optical means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Truncated nonlinear interferometer-based sensor system

Nano robotic system for high throughput single cell DNA sequencing

Automated optimization of AFM light source positioning

Metrological scanning probe microscope

Debris removal from high aspect structures

Method and device for simultaneous independent motion measurement o...

Scanning probe microscope and method for resonance-enhanced detecti...

Systems, method and computer-accessible medium for providing balanc...

3D multipurpose scanning microscopy probes

Apparatus and method for a scanning probe microscope

Integrated dual-probe rapid in-situ switching measurement method an...

Method of imaging a surface using a scanning probe microscope

Cantilever, scanning probe microscope, and measurement method using...

Atomic force microscope using artificial intelligence object recogn...

Method and apparatus for examining a measuring tip of a scanning pr...

High speed atomic force profilometry of large areas

Automated optimization of AFM light source positioning

Heterodyne scanning probe microscopy method and scanning probe micr...

Apparatus and method for examining and/or processing a sample

Probe for detecting near field and near-field detecting system incl...

Debris removal in high aspect structures

Truncated non-linear interferometer-based sensor system

Torsion wing probe assembly

Method and apparatus for aligning a probe for scanning probe micros...

Scanning probe microscope and scanning probe microscope optical axi...

Atomic force microscope

Scanning type probe microscope and control device for scanning type...

Debris removal from high aspect structures

Scanning probe microscope and optical axis adjustment method in sca...

Metal coated spike array

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

POSITIONING SYSTEM AND METHOD

LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...

DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...

ATOMIC FORCE MICROSCOPE

ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SUR...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORC...

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

Debris Removal From High Aspect Structures

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...

INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...

METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT O...

ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...

APPARATUS AND METHOD FOR EXAMINING AND/OR PROCESSING A SAMPLE

PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...

3D MULTIPURPOSE SCANNING MICROSCOPY PROBES

Torsion Wing Probe Assembly