by Terahertz time domain spectroscopy [THz-TDS]

Industry

CPC
G01N21/3586

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/3586by Terahertz time domain spectroscopy [THz-TDS]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Photoresist characteristics analysis method and characteristics ana...
- Patent number 12,174,113
- Issue date Dec 24, 2024
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz device
- Patent number 12,174,114
- Issue date Dec 24, 2024
- Rohm Co., Ltd.
- Kazuisao Tsuruda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma treatment apparatus, a method of monitoring a process of man...
- Patent number 12,170,233
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz three-dimensional spectral scanner apparatus and method o...
- Patent number 12,146,790
- Issue date Nov 19, 2024
- The Research Foundation for the State University of New York
- Mohammad Hassan Arbab
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method of operating a measuring device
- Patent number 12,146,733
- Issue date Nov 19, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-invasively determining egg properties
- Patent number 12,082,561
- Issue date Sep 10, 2024
- TERAHERTZ GROUP LTD.
- Eran Gabbai
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Measuring jig, and calibration method and terahertz wave measuring...
- Patent number 12,072,285
- Issue date Aug 27, 2024
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Super resolution time domain spectroscopy method and device for sam...
- Patent number 12,044,620
- Issue date Jul 23, 2024
- Centre National de la Recherche Scientifique
- Romain Peretti
- G01 - MEASURING TESTING
Information Patent Grant
Omnidirectional measurement system for time-varying characteristic...
- Patent number 11,994,431
- Issue date May 28, 2024
- PURPLE MOUNTAIN OBSERVATORY, CHINESE ACADEMY OF SCIENCES
- Zhenhui Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying chemical and structural variations through t...
- Patent number 11,906,424
- Issue date Feb 20, 2024
- The Regents of the University of California
- Mona Jarrahi
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz light detector and terahertz measurement device
- Patent number 11,867,621
- Issue date Jan 9, 2024
- Nikon Corporation
- Akira Tokuhisa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for dynamic characterization of materials
- Patent number 11,860,088
- Issue date Jan 2, 2024
- San Diego State University (SDSU) Foundation
- George Youssef
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz enhanced foreign object debris discrimination for optical...
- Patent number 11,726,035
- Issue date Aug 15, 2023
- Raytheon Technologies Corporation
- David L. Lincoln
- G01 - MEASURING TESTING
Information Patent Grant
Sample signal amplification method using terahertz band graphene ab...
- Patent number 11,703,448
- Issue date Jul 18, 2023
- Zhejiang University
- Yibin Ying
- G01 - MEASURING TESTING
Information Patent Grant
Cavity-enhanced fourier transform spectroscopy for chiral analysis
- Patent number 11,650,148
- Issue date May 16, 2023
- University of Virginia Patent Foundation
- Brooks Hart Pate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin-based detection of terahertz and sub-terahertz electromagnetic...
- Patent number 11,639,975
- Issue date May 2, 2023
- The Regents of the University of California
- Jing Shi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for performing terahertz near-field measurements
- Patent number 11,561,170
- Issue date Jan 24, 2023
- TECHNISCHE UNIVERSITEIT EINDHOVEN
- Niels Jacobus Johan Van Hoof
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting a pulsed THz beam with time of f...
- Patent number 11,513,068
- Issue date Nov 29, 2022
- ABB Schweiz AG
- Deran Maas
- G01 - MEASURING TESTING
Information Patent Grant
Device for THz generation and/or detection and methods for manufact...
- Patent number 11,499,915
- Issue date Nov 15, 2022
- ETH Zurich
- Yannick Salamin
- G02 - OPTICS
Information Patent Grant
Method of generating terahertz wave and apparatuses performing the...
- Patent number 11,408,822
- Issue date Aug 9, 2022
- Electronics and Telecommunications Research Institute
- Sun Hyok Chang
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz spectrum measurement method and system based on unequal o...
- Patent number 11,408,823
- Issue date Aug 9, 2022
- Shandong University of Science and Technology
- Dehua Li
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying authenticity and origin of Panax quinquefoli...
- Patent number 11,402,325
- Issue date Aug 2, 2022
- University of Shanghai for Science and Technology
- Yan Peng
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and terminal equipment of terahertz frequency ba...
- Patent number 11,385,175
- Issue date Jul 12, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for qualitative and quantitative determination of key substa...
- Patent number 11,353,396
- Issue date Jun 7, 2022
- University of Shanghai for Science and Technology
- Yan Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for measuring thickness of specimen and method for measuring...
- Patent number 11,346,659
- Issue date May 31, 2022
- Industry-University Cooperation Foundation Hanyang University
- Hak Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting petroleum with a staggered toroidal chip
- Patent number 11,346,778
- Issue date May 31, 2022
- Lin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Tomography method, system, and apparatus based on time-domain spect...
- Patent number 11,300,504
- Issue date Apr 12, 2022
- National Tsing Hua University
- Shang-Hua Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Terahertz spectral imaging data reconstruction method, apparatus, d...
- Patent number 11,293,860
- Issue date Apr 5, 2022
- Tsinghua University
- Xiao-Ping Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for in-situ detection of cadmium chelates in plants
- Patent number 11,287,373
- Issue date Mar 29, 2022
- Yong He
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-invasive condition detection using an...
- Patent number 11,262,299
- Issue date Mar 1, 2022
- 3DT Holdings, LLC
- Ghassan S. Kassab
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
THZ CROSS-CORRELATION DEVICE
- Publication number 20240426747
- Publication date Dec 26, 2024
- Danmarks Tekniske Universitet
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-SHOT MULTI-FRAME ULTRAFAST TERAHERTZ IMAGING METHOD AND SYSTEM
- Publication number 20240385110
- Publication date Nov 21, 2024
- Institut National de la Recherche Scientifique
- JUNLIANG DONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING A TRANSMISSION OF AN OBJECT FOR E...
- Publication number 20240369350
- Publication date Nov 7, 2024
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Device and Shape Measurement Device
- Publication number 20240319087
- Publication date Sep 26, 2024
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
ADULTERATION AND AUTHENTICITY ANALYSIS METHOD OF ORGANIC SUBSTANCES...
- Publication number 20240142372
- Publication date May 2, 2024
- BURSA TEKNIK UNIVERSITESI REKTORLUGU
- Turgut ÖZTÜRK
- G01 - MEASURING TESTING
Information Patent Application
PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...
- Publication number 20240102927
- Publication date Mar 28, 2024
- FEMTO Deployments Inc.
- Akira WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING A TIME DELAY BETWEEN PAIRS OF PU...
- Publication number 20240039235
- Publication date Feb 1, 2024
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Alexander WEIGEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESIDUAL STRESS ESTIMATION APPARATUS AND METHOD
- Publication number 20240011902
- Publication date Jan 11, 2024
- Hyundai Motor Company
- Eun Jeong CHOI
- G01 - MEASURING TESTING
Information Patent Application
PACKAGING MATERIAL FOR NON-DESTRUCTIVE DETECTION OF FOOD QUALITY, P...
- Publication number 20230391521
- Publication date Dec 7, 2023
- Zhejiang University
- Lijuan XIE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...
- Publication number 20230266413
- Publication date Aug 24, 2023
- The Regents of the University of California
- Jing Shi
- G01 - MEASURING TESTING
Information Patent Application
PULSE SHAPING USING DIFFRACTIVE NETWORK DEVICE WITH MODULAR DIFFRAC...
- Publication number 20230251189
- Publication date Aug 10, 2023
- The Regents of the University of California
- Aydogan Ozcan
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DEVICE
- Publication number 20230213442
- Publication date Jul 6, 2023
- Rohm Co., Ltd.
- Kazuisao TSURUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ MODULATION SYSTEM AND METHOD OF MODULATING A TERAHERTZ SI...
- Publication number 20230184672
- Publication date Jun 15, 2023
- ECOLE DE TECHNOLOGIE SUPERIEURE
- François BLANCHARD
- G01 - MEASURING TESTING
Information Patent Application
SUPER RESOLUTION TIME DOMAIN SPECTROSCOPY METHOD AND DEVICE FOR SAM...
- Publication number 20230112535
- Publication date Apr 13, 2023
- Centre National de la Recherche Scientifique
- Romain PERETTI
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DATA COLLECTION FOR ELECTRONIC OBJECT CLASSIFICATION AND...
- Publication number 20230077838
- Publication date Mar 16, 2023
- University of Florida Research Foundation, Incorporated
- Navid Asadi-Zanjani
- G01 - MEASURING TESTING
Information Patent Application
Method for Identifying Chemical and Structural Variations Through T...
- Publication number 20230016600
- Publication date Jan 19, 2023
- The Regents of the University of California
- Mona Jarrahi
- G01 - MEASURING TESTING
Information Patent Application
MEASURING JIG, AND CALIBRATION METHOD AND TERAHERTZ WAVE MEASURING...
- Publication number 20220390364
- Publication date Dec 8, 2022
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DYNAMIC CHARACTERIZATION OF MATERIALS
- Publication number 20220373458
- Publication date Nov 24, 2022
- San Diego State University (SDSU) Fourndation, dba San Diego State University...
- George YOUSSEF
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SIGNAL AMPLIFICATION METHOD USING TERAHERTZ BAND GRAPHENE AB...
- Publication number 20220341846
- Publication date Oct 27, 2022
- ZHEJIANG UNIVERSITY
- Yibin YING
- G01 - MEASURING TESTING
Information Patent Application
CAVITY-ENHANCED FOURIER TRANSFORM SPECTROSCOPY FOR CHIRAL ANALYSIS
- Publication number 20220268699
- Publication date Aug 25, 2022
- Universtiy of Virginia Patent Foundation
- Brooks Hart Pate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ THREE-DIMENSIONAL SPECTRAL SCANNER APPARATUS AND METHOD O...
- Publication number 20220221335
- Publication date Jul 14, 2022
- The Research Foundation for the State University of New York
- Mohammad Hassan ARBAB
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ ENHANCED FOREIGN OBJECT DEBRIS DISCRIMINATION FOR OPTICAL...
- Publication number 20220187202
- Publication date Jun 16, 2022
- Raytheon Technologies Corporation
- David L. Lincoln
- G01 - MEASURING TESTING
Information Patent Application
PLASMA TREATMENT APPARATUS, A METHOD OF MONITORING A PROCESS OF MAN...
- Publication number 20220181219
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- MEEHYUN LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR DETECTING PETROLEUM WITH A STAGGERED TOROIDAL CHIP
- Publication number 20220146419
- Publication date May 12, 2022
- University of Shanghai for Science and Technology
- Lin Chen
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ LIGHT DETECTOR AND TERAHERTZ MEASUREMENT DEVICE
- Publication number 20220146420
- Publication date May 12, 2022
- Nikon Corporation
- Akira Tokuhisa
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SPECTRUM MEASUREMENT METHOD AND SYSTEM BASED ON UNEQUAL O...
- Publication number 20220107268
- Publication date Apr 7, 2022
- Shandong University of Science and Technology
- Dehua LI
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ MEASURING DEVICE AND METHOD OF OPERATING A TERAHERTZ MEAS...
- Publication number 20220091028
- Publication date Mar 24, 2022
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IN-SITU DETECTION OF CADMIUM CHELATES IN PLANTS
- Publication number 20220034801
- Publication date Feb 3, 2022
- Zhejiang University
- YONG HE
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHY METHOD, SYSTEM, AND APPARATUS BASED ON TIME-DOMAIN SPECT...
- Publication number 20210364426
- Publication date Nov 25, 2021
- National Tsing-Hua University
- Shang-Hua Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING TERAHERTZ NEAR-FIELD MEASUREMENTS
- Publication number 20210270733
- Publication date Sep 2, 2021
- Technische Universiteit Eindhoven
- Niels Jacobus Johan VAN HOOF
- G01 - MEASURING TESTING

by Terahertz time domain spectroscopy [THz-TDS]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Photoresist characteristics analysis method and characteristics ana...

Terahertz device

Plasma treatment apparatus, a method of monitoring a process of man...

Terahertz three-dimensional spectral scanner apparatus and method o...

Measuring device and method of operating a measuring device

System and method for non-invasively determining egg properties

Measuring jig, and calibration method and terahertz wave measuring...

Super resolution time domain spectroscopy method and device for sam...

Omnidirectional measurement system for time-varying characteristic...

Method for identifying chemical and structural variations through t...

Terahertz light detector and terahertz measurement device

Apparatus and method for dynamic characterization of materials

Terahertz enhanced foreign object debris discrimination for optical...

Sample signal amplification method using terahertz band graphene ab...

Cavity-enhanced fourier transform spectroscopy for chiral analysis

Spin-based detection of terahertz and sub-terahertz electromagnetic...

Method and system for performing terahertz near-field measurements

Method and apparatus for detecting a pulsed THz beam with time of f...

Device for THz generation and/or detection and methods for manufact...

Method of generating terahertz wave and apparatuses performing the...

Terahertz spectrum measurement method and system based on unequal o...

Method for identifying authenticity and origin of Panax quinquefoli...

Calibration method and terminal equipment of terahertz frequency ba...

Method for qualitative and quantitative determination of key substa...

Device for measuring thickness of specimen and method for measuring...

Method for detecting petroleum with a staggered toroidal chip

Tomography method, system, and apparatus based on time-domain spect...

Terahertz spectral imaging data reconstruction method, apparatus, d...

Method and system for in-situ detection of cadmium chelates in plants

Method and apparatus for non-invasive condition detection using an...

Patents Applicationslast 30 patents

THZ CROSS-CORRELATION DEVICE

SINGLE-SHOT MULTI-FRAME ULTRAFAST TERAHERTZ IMAGING METHOD AND SYSTEM

METHOD AND DEVICE FOR DETERMINING A TRANSMISSION OF AN OBJECT FOR E...

Spectroscopic Device and Shape Measurement Device

ADULTERATION AND AUTHENTICITY ANALYSIS METHOD OF ORGANIC SUBSTANCES...

PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...

METHOD AND APPARATUS FOR MEASURING A TIME DELAY BETWEEN PAIRS OF PU...

RESIDUAL STRESS ESTIMATION APPARATUS AND METHOD

PACKAGING MATERIAL FOR NON-DESTRUCTIVE DETECTION OF FOOD QUALITY, P...

SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...

PULSE SHAPING USING DIFFRACTIVE NETWORK DEVICE WITH MODULAR DIFFRAC...

TERAHERTZ DEVICE

TERAHERTZ MODULATION SYSTEM AND METHOD OF MODULATING A TERAHERTZ SI...

SUPER RESOLUTION TIME DOMAIN SPECTROSCOPY METHOD AND DEVICE FOR SAM...

TERAHERTZ DATA COLLECTION FOR ELECTRONIC OBJECT CLASSIFICATION AND...

Method for Identifying Chemical and Structural Variations Through T...

MEASURING JIG, AND CALIBRATION METHOD AND TERAHERTZ WAVE MEASURING...

APPARATUS AND METHOD FOR DYNAMIC CHARACTERIZATION OF MATERIALS

SAMPLE SIGNAL AMPLIFICATION METHOD USING TERAHERTZ BAND GRAPHENE AB...

CAVITY-ENHANCED FOURIER TRANSFORM SPECTROSCOPY FOR CHIRAL ANALYSIS

TERAHERTZ THREE-DIMENSIONAL SPECTRAL SCANNER APPARATUS AND METHOD O...

TERAHERTZ ENHANCED FOREIGN OBJECT DEBRIS DISCRIMINATION FOR OPTICAL...

PLASMA TREATMENT APPARATUS, A METHOD OF MONITORING A PROCESS OF MAN...

A METHOD FOR DETECTING PETROLEUM WITH A STAGGERED TOROIDAL CHIP

TERAHERTZ LIGHT DETECTOR AND TERAHERTZ MEASUREMENT DEVICE

TERAHERTZ SPECTRUM MEASUREMENT METHOD AND SYSTEM BASED ON UNEQUAL O...

TERAHERTZ MEASURING DEVICE AND METHOD OF OPERATING A TERAHERTZ MEAS...

METHOD AND SYSTEM FOR IN-SITU DETECTION OF CADMIUM CHELATES IN PLANTS

TOMOGRAPHY METHOD, SYSTEM, AND APPARATUS BASED ON TIME-DOMAIN SPECT...

METHOD AND SYSTEM FOR PERFORMING TERAHERTZ NEAR-FIELD MEASUREMENTS