TREA

by thermal pick-up

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  • CPC
  • G01P15/0897
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Parent Industries

GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT G01P15/00Measuring acceleration Measuring deceleration Measuring shock

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G01P15/0897by thermal pick-up
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Electronic device for measuring a physical parameter
    • Patent number 10,976,340
    • Issue date Apr 13, 2021
    • EM Microelectronic-Marin SA
    • Sylvain Grosjean
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Acceleration sensor
    • Patent number 9,261,529
    • Issue date Feb 16, 2016
    • Renesas Electronics Corporation
    • Akira Tanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Functional device
    • Patent number 8,003,193
    • Issue date Aug 23, 2011
    • Hitachi, Ltd.
    • Shohei Hata
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Micro-accelerometer
    • Patent number 7,080,553
    • Issue date Jul 25, 2006
    • Samsung Electronics Co., Ltd.
    • Xiao-bing Luo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3416373
    • Patent number 3,416,373
    • Issue date Dec 17, 1968
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRONIC DEVICE FOR MEASURING A PHYSICAL PARAMETER
    • Publication number 20190178909
    • Publication date Jun 13, 2019
    • EM Microelectronic-Marin SA
    • Sylvain Grosjean
    • G01 - MEASURING TESTING
  • Information Patent Application

    ACCELERATION SENSOR
    • Publication number 20160124012
    • Publication date May 5, 2016
    • RENESAS ELECTRONICS CORPORATION
    • Akira TANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    ACCELERATION SENSOR
    • Publication number 20140060187
    • Publication date Mar 6, 2014
    • RENESAS ELECTRONICS CORPORATION
    • Akira TANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
    • Publication number 20120217609
    • Publication date Aug 30, 2012
    • Renesas Electronics Corporation
    • Akira TANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Functional Device
    • Publication number 20080233349
    • Publication date Sep 25, 2008
    • Shohei Hata
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Micro-accelerometer
    • Publication number 20060005626
    • Publication date Jan 12, 2006
    • SAMSUNG ELECTRONICS CO., LTD.
    • Xiao-bing Luo
    • G01 - MEASURING TESTING