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CPC
G01N2223/03

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/03by transmission

Industries

Patents Grantslast 30 patents

Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 11,860,112
- Issue date Jan 2, 2024
- NEC Corporation
- Naoya Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Nondestructive inspection method and apparatus comprising a neutron...
- Patent number 11,841,335
- Issue date Dec 12, 2023
- Riken
- Yasuo Wakabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 11,808,565
- Issue date Nov 7, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor metrology and inspection based on an x-ray source wit...
- Patent number 11,719,652
- Issue date Aug 8, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-degree-of-freedom sample holder
- Patent number 11,670,478
- Issue date Jun 6, 2023
- Zhejiang University
- Hongtao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection device
- Patent number 11,598,729
- Issue date Mar 7, 2023
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and devices for determining metrology sites
- Patent number 11,436,506
- Issue date Sep 6, 2022
- Carl Zeiss SMT GmbH
- Abhilash Srikantha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample holder
- Patent number 11,293,882
- Issue date Apr 5, 2022
- Orexplore AB
- Alexander Hansson
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing methods and apparatus
- Patent number 11,275,036
- Issue date Mar 15, 2022
- Nanyang Technological University
- Xiao Hu
- G01 - MEASURING TESTING
Information Patent Grant
Specimen for analyzing shape of antistatic antifouling layer and me...
- Patent number 11,262,279
- Issue date Mar 1, 2022
- LG Chem, Ltd.
- Bo Ri Lee
- G01 - MEASURING TESTING
Information Patent Grant
X-ray single-pixel camera based on x-ray computational correlated i...
- Patent number 11,255,800
- Issue date Feb 22, 2022
- Institute of Physics, Chinese Academy of Sciences
- Aixin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, defect inspection method, and program
- Patent number 10,989,672
- Issue date Apr 27, 2021
- FUJIFILM Corporation
- Yasuhiko Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 10,969,220
- Issue date Apr 6, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
Ray transmission and fluorescence CT imaging system and method
- Patent number 10,914,693
- Issue date Feb 9, 2021
- Tsinghua University
- Liang Li
- G01 - MEASURING TESTING
Information Patent Grant
Self-propelled container and/or vehicle inspection device
- Patent number 10,761,236
- Issue date Sep 1, 2020
- Beijing Haulixing Technology Development Co., Ltd.
- Haibo Qu
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing an object in two stages using a transmission sp...
- Patent number 10,605,749
- Issue date Mar 31, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,571,412
- Issue date Feb 25, 2020
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,533,958
- Issue date Jan 14, 2020
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for fast inspecting vehicle based on measure lengths
- Patent number 10,527,525
- Issue date Jan 7, 2020
- Nuctech Company Limited
- Yanwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,502,699
- Issue date Dec 10, 2019
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detection device, radiation image acquiring system, radia...
- Patent number 10,393,676
- Issue date Aug 27, 2019
- Hamamatsu Photonics K.K.
- Toshiyasu Suyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for fast inspecting vehicle based on measured len...
- Patent number 10,337,960
- Issue date Jul 2, 2019
- Nuctech Company Limited
- Yanwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
Strain mapping in TEM using precession electron diffraction
- Patent number 9,568,442
- Issue date Feb 14, 2017
- Drexel University
- Mitra Lenore Taheri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing an un-distorted dark field strain map at high s...
- Patent number 9,551,674
- Issue date Jan 24, 2017
- GLOBALFOUNDRIES, INC.
- Yun-Yu Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray light valve based digital radiographic imaging systems
- Patent number 7,687,792
- Issue date Mar 30, 2010
- Sunnybrook Health Sciences Centre
- John Alan Rowlands
- G01 - MEASURING TESTING
Information Patent Grant
X-ray CT apparatus
- Patent number 7,263,158
- Issue date Aug 28, 2007
- GE Medical Systems Global Technology Company, LLC
- Yasuhiro Imai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Powder handling device for analytical instruments
- Patent number 7,113,265
- Issue date Sep 26, 2006
- The United States of America as represented by the administrator of the Natio...
- Philippe C. Sarrazin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT METHOD AND APPARATUS, AND RADIATION MEASURING DEVICE
- Publication number 20240027368
- Publication date Jan 25, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Liangjie YAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY
- Publication number 20230135352
- Publication date May 4, 2023
- United Kingdom Research and Innovation
- Greg MCMULLAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATING THIN FILM LIQUID CELLS
- Publication number 20230025535
- Publication date Jan 26, 2023
- Universiteit Leiden
- Pauline Marthe Gerardina VAN DEURSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20220299454
- Publication date Sep 22, 2022
- NEC Corporation
- Naoya NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SINGLE-PIXEL CAMERA BASED ON X-RAY COMPUTATIONAL CORRELATED I...
- Publication number 20220042928
- Publication date Feb 10, 2022
- INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES
- Aixin ZHANG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DEGREE-OF-FREEDOM SAMPLE HOLDER
- Publication number 20210287874
- Publication date Sep 16, 2021
- Zhejiang University
- Hongtao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYSING A ROD-SHAPED SMOKING ARTICLE
- Publication number 20210235745
- Publication date Aug 5, 2021
- MPRD LTD
- Matthew James COX
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION
- Publication number 20210199429
- Publication date Jul 1, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Andrea BRAMBILLA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION TRANSMISSION INSPECTION METHOD AND DEVICE, AND METHOD OF...
- Publication number 20210181125
- Publication date Jun 17, 2021
- TORAY INDUSTRIES, INC.
- Mitsuru WATANABE
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS
- Publication number 20210033542
- Publication date Feb 4, 2021
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Method of Detection and Measurement of a Life Force Energy, Also Kn...
- Publication number 20200271684
- Publication date Aug 27, 2020
- William John Martin
- G01 - MEASURING TESTING
Information Patent Application
Specimen for Analyzing Shape of Antistatic Antifouling Layer and Me...
- Publication number 20200209116
- Publication date Jul 2, 2020
- LG CHEM, LTD.
- Bo Ri Lee
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER
- Publication number 20200096460
- Publication date Mar 26, 2020
- OREXPLORE AB
- Alexander Hansson
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE TESTING METHODS AND APPARATUS
- Publication number 20190317026
- Publication date Oct 17, 2019
- Nanyang Technological University
- Xiao HU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FAST INSPECTING VEHICLE
- Publication number 20190301976
- Publication date Oct 3, 2019
- Nuctech Company Limited
- Yanwei XU
- G01 - MEASURING TESTING
Information Patent Application
Self-Propelled Container and/or Vehicle Inspection Device
- Publication number 20190250302
- Publication date Aug 15, 2019
- Beijing Hualixing Technology Development Co., Ltd.
- Haibo Qu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND PROGRAM
- Publication number 20190170665
- Publication date Jun 6, 2019
- FUJIFILM CORPORATION
- Yasuhiko Kaneko
- G01 - MEASURING TESTING
Information Patent Application
RAY TRANSMISSION AND FLUORESCENCE CT IMAGING SYSTEM AND METHOD
- Publication number 20190056338
- Publication date Feb 21, 2019
- TSINGHUA UNIVERSITY
- Liang LI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY APPARATUS AND STRUCTURE PRODUCTION METHOD
- Publication number 20170219499
- Publication date Aug 3, 2017
- Nikon Corporation
- Toshihisa TANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FAST INSPECTING VEHICLE
- Publication number 20170160168
- Publication date Jun 8, 2017
- Nuctech Company Limited
- Yanwei XU
- G01 - MEASURING TESTING
Information Patent Application
A Method Of Analyzing An Object In Two Stages Using A Transmission...
- Publication number 20170131224
- Publication date May 11, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Radiation Inspection On Moving Object
- Publication number 20170003415
- Publication date Jan 5, 2017
- Powerscan Company Limited
- Shaofeng Wang
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION
- Publication number 20160363442
- Publication date Dec 15, 2016
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Andrea BRAMBILLA
- G01 - MEASURING TESTING
Information Patent Application
Strain Mapping in TEM Using Precession Electron Diffraction
- Publication number 20160139063
- Publication date May 19, 2016
- Drexel University
- Mitra Lenore Taheri
- G01 - MEASURING TESTING
Information Patent Application
X-ray light valve based digital radiographic imaging systems
- Publication number 20070201616
- Publication date Aug 30, 2007
- John Alan Rowlands
- G02 - OPTICS
Information Patent Application
X-ray CT apparatus
- Publication number 20060256922
- Publication date Nov 16, 2006
- GE Medical Systems Global Technology Company, LLC
- Yasuhiro Imai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

by transmission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample mounting system for an X-ray analysis apparatus

Inspection system and inspection method

X-ray collimator and related X-ray inspection apparatus

Nondestructive inspection method and apparatus comprising a neutron...

Methods and systems for acquiring three-dimensional electron diffra...

Characterizing a sample by material basis decomposition

Semiconductor metrology and inspection based on an x-ray source wit...

Multi-degree-of-freedom sample holder

X-ray inspection device

Method and devices for determining metrology sites

Sample holder

Non-destructive testing methods and apparatus

Specimen for analyzing shape of antistatic antifouling layer and me...

X-ray single-pixel camera based on x-ray computational correlated i...

Defect inspection device, defect inspection method, and program

Characterizing a sample by material basis decomposition

Ray transmission and fluorescence CT imaging system and method

Self-propelled container and/or vehicle inspection device

Method of analyzing an object in two stages using a transmission sp...

X-ray apparatus and structure production method

X-ray apparatus and structure production method

Method and system for fast inspecting vehicle based on measure lengths

X-ray apparatus and structure production method

Radiation detection device, radiation image acquiring system, radia...

Method and system for fast inspecting vehicle based on measured len...

Strain mapping in TEM using precession electron diffraction

Method of producing an un-distorted dark field strain map at high s...

X-ray light valve based digital radiographic imaging systems

X-ray CT apparatus

Powder handling device for analytical instruments

Patents Applicationslast 30 patents

MEASUREMENT METHOD AND APPARATUS, AND RADIATION MEASURING DEVICE

SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY

FABRICATING THIN FILM LIQUID CELLS

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

INSPECTION SYSTEM AND INSPECTION METHOD

X-RAY SINGLE-PIXEL CAMERA BASED ON X-RAY COMPUTATIONAL CORRELATED I...

MULTI-DEGREE-OF-FREEDOM SAMPLE HOLDER

APPARATUS FOR ANALYSING A ROD-SHAPED SMOKING ARTICLE

CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION

RADIATION TRANSMISSION INSPECTION METHOD AND DEVICE, AND METHOD OF...

NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS

Method of Detection and Measurement of a Life Force Energy, Also Kn...

Specimen for Analyzing Shape of Antistatic Antifouling Layer and Me...

SAMPLE HOLDER

NON-DESTRUCTIVE TESTING METHODS AND APPARATUS

METHOD AND SYSTEM FOR FAST INSPECTING VEHICLE

Self-Propelled Container and/or Vehicle Inspection Device

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND PROGRAM

RAY TRANSMISSION AND FLUORESCENCE CT IMAGING SYSTEM AND METHOD

X-RAY APPARATUS AND STRUCTURE PRODUCTION METHOD

METHOD AND SYSTEM FOR FAST INSPECTING VEHICLE

A Method Of Analyzing An Object In Two Stages Using A Transmission...

System And Method For Radiation Inspection On Moving Object

CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION

Strain Mapping in TEM Using Precession Electron Diffraction

X-ray light valve based digital radiographic imaging systems

X-ray CT apparatus