by trimming or adjusting the delay

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H03K2005/00084

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HELECTRICITY H03Electronic circuits H03KPULSE TECHNIQUE

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H03K2005/00084by trimming or adjusting the delay

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Patents Grantslast 30 patents

Information Patent Grant
Deskew circuit for automated test systems
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- Issue date Jan 28, 2020
- Analog Devices, Inc.
- Andrew Nathan Mort
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Trimming of a pseudo-closed loop programmable delay line
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- Issue date Oct 2, 2012
- STMicroelectronics S.r.l.
- Luca Bettini
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Information Patent Grant
Method and apparatus for calibrating a delay chain
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- Issue date Jul 10, 2012
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- Chia-Liang Lin
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Information Patent Grant
Asynchronous circuit insensitive to delays with time delay insertio...
- Patent number 8,171,330
- Issue date May 1, 2012
- Tiempo
- Marc Renaudin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and electronic device having the same
- Patent number 8,095,104
- Issue date Jan 10, 2012
- Semiconductor Energy Laboratory Co., Ltd.
- Daisuke Kawae
- H03 - BASIC ELECTRONIC CIRCUITRY
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Digital electronic device and method of altering clock delays in a...
- Patent number 8,022,741
- Issue date Sep 20, 2011
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Circuit, apparatus and method of transmitting signal
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- Issue date Jun 7, 2011
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- Toshihiro Katoh
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Digital delay locked loop circuit
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- Yoshikazu Miyamoto
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Input circuit and semiconductor integrated circuit comprising the i...
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Method and device for determining trim solution
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- Issue date Jun 15, 2010
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Semiconductor device with delay section
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- Minari Arai
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Information Patent Grant
Auto-calibration method for delay circuit
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Information Patent Grant
Self-calibrating digital pulse-width modulator (DPWM)
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- Issue date Dec 2, 2008
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Semiconductor memory device with delay section
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- Issue date Aug 28, 2007
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Delay value adjusting method and semiconductor integrated circuit
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Frequency adjustment circuit
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Multiphase waveform generator capable of performing phase calibrati...
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Information Patent Grant
Use of analog-valued floating-gate transistors to match the electri...
- Patent number 7,049,872
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- Christopher J. Diorio
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Information Patent Grant
Timing generator and semiconductor test apparatus
- Patent number 7,034,518
- Issue date Apr 25, 2006
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- G01 - MEASURING TESTING
Information Patent Grant
Method of optimizing the timing between signals
- Patent number 7,024,326
- Issue date Apr 4, 2006
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- Aaron John Nygren
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Information Patent Grant
Oscillator and oscillator adjustment method with stepwise delay
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- Nobusuke Yamaoka
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System and method for accurate adjustment of discrete integrated ci...
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- Mark Ronald Sikkink
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Circuit and method for high speed bit stream capture using a digita...
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Precision trim circuit for delay lines
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- Issue date Mar 20, 2001
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- F. Erich Goetting
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Delay circuit
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- Hong-Sok Choi
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Programmable delay line
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- Issue date Aug 3, 1999
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Programmable delay lines
- Patent number 5,650,739
- Issue date Jul 22, 1997
- Dallas Semiconductor Corporation
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Information Patent Grant
Programmable deskewing of automatic test equipment
- Patent number 4,488,297
- Issue date Dec 11, 1984
- Fairchild Camera and Instrument Corp.
- Hoshang Vaid
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Local Interconnected Network Bus Repeater Delay Compensation
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- Artur Langner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DESKEW CIRCUIT FOR AUTOMATED TEST SYSTEMS
- Publication number 20180358957
- Publication date Dec 13, 2018
- Analog Devices, Inc.
- Andrew Nathan Mort
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE HAVING THE SAME
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- Publication date Apr 5, 2012
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Information Patent Application
TRIMMING OF A PSEUDO-CLOSED LOOP PROGRAMMABLE DELAY LINE
- Publication number 20110156785
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- STMicroelectronics S.r.l.
- Luca BETTINI
- H03 - BASIC ELECTRONIC CIRCUITRY
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DIGITAL ELECTRONIC DEVICE AND METHOD OF ALTERING CLOCK DELAYS IN A...
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- NXP, B.V.
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- G06 - COMPUTING CALCULATING COUNTING
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DIGITAL DELAY LOCKED LOOP CIRCUIT
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- Fujitsu Microelectronics Limited
- Yoshikazu Miyamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Asynchronous circuit insensitive to delays with time delay insertio...
- Publication number 20090307516
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- TIEMPO
- Marc Renaudin
- H03 - BASIC ELECTRONIC CIRCUITRY
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METHOD AND APPARATUS FOR CALIBRATING A DELAY CHAIN
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Circuit, apparatus and method of transmitting signal
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INPUT CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT COMPRISING THE I...
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- Publication date Jul 17, 2008
- Infineon Technologies North America Corp.
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Semiconductor device and electronic device having the same
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- Daisuke Kawae
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Semiconductor device with delay section
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Self-calibrating digital pulse-width modulator (DPWM)
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- Sipex Corporation
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Semiconductor memory device with delay section
- Publication number 20060227631
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Use of analog-valued floating-gate transistors to match the electri...
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Frequency adjustment circuit
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- H03 - BASIC ELECTRONIC CIRCUITRY
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Delay value adjusting method and semiconductor integrated circuit
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Auto-calibration method for delay circuit
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- Lin Shu Chen
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Information Patent Application
Method of optimizing the timing between signals
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- Kenneth Koch
- H03 - BASIC ELECTRONIC CIRCUITRY

by trimming or adjusting the delay

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Deskew circuit for automated test systems

Trimming of a pseudo-closed loop programmable delay line

Method and apparatus for calibrating a delay chain

Asynchronous circuit insensitive to delays with time delay insertio...

Semiconductor device and electronic device having the same

Digital electronic device and method of altering clock delays in a...

Circuit, apparatus and method of transmitting signal

Digital delay locked loop circuit

Input circuit and semiconductor integrated circuit comprising the i...

Method and device for determining trim solution

Semiconductor device with delay section

Auto-calibration method for delay circuit

Self-calibrating digital pulse-width modulator (DPWM)

Semiconductor memory device with delay section

Delay value adjusting method and semiconductor integrated circuit

Frequency adjustment circuit

Multiphase waveform generator capable of performing phase calibrati...

Use of analog-valued floating-gate transistors to match the electri...

Timing generator and semiconductor test apparatus

Method of optimizing the timing between signals

Oscillator and oscillator adjustment method with stepwise delay

System and method for accurate adjustment of discrete integrated ci...

Circuit and method for high speed bit stream capture using a digita...

Precision trim circuit for delay lines

Delay circuit

Programmable delay line

Programmable delay lines

Programmable deskewing of automatic test equipment

Patents Applicationslast 30 patents

Local Interconnected Network Bus Repeater Delay Compensation

DESKEW CIRCUIT FOR AUTOMATED TEST SYSTEMS

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE HAVING THE SAME

TRIMMING OF A PSEUDO-CLOSED LOOP PROGRAMMABLE DELAY LINE

DIGITAL ELECTRONIC DEVICE AND METHOD OF ALTERING CLOCK DELAYS IN A...

DIGITAL DELAY LOCKED LOOP CIRCUIT

Asynchronous circuit insensitive to delays with time delay insertio...

METHOD AND APPARATUS FOR CALIBRATING A DELAY CHAIN

Circuit, apparatus and method of transmitting signal

INPUT CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT COMPRISING THE I...

Method and device for determining trim solution

Semiconductor device and electronic device having the same

Semiconductor device with delay section

Self-calibrating digital pulse-width modulator (DPWM)

Semiconductor memory device with delay section

Use of analog-valued floating-gate transistors to match the electri...

Frequency adjustment circuit

Delay value adjusting method and semiconductor integrated circuit

Auto-calibration method for delay circuit

Method of optimizing the timing between signals

Multiphase waveform generator capable of performing phase calibrati...

Timing generator and semiconductor test apparatus

Use of analog-valued floating-gate transistors to match the electri...

Pulse shaping circuit and method