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G01N27/426
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N27/00
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
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G01N27/426
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Patents Grants
last 30 patents
Information
Patent Grant
Plating device
Patent number
10,988,855
Issue date
Apr 27, 2021
Yamamoto-MS Co., Ltd.
Wataru Yamamoto
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Rotating cylinder-throwing power electrode
Patent number
5,275,711
Issue date
Jan 4, 1994
AT&T Bell Laboratories
Joseph A. Abys
G01 - MEASURING TESTING
Information
Patent Grant
2643223
Patent number
2,643,223
Issue date
Jun 23, 1953
G01 - MEASURING TESTING
Information
Patent Grant
2566676
Patent number
2,566,676
Issue date
Sep 4, 1951
G01 - MEASURING TESTING
Information
Patent Grant
2544802
Patent number
2,544,802
Issue date
Mar 13, 1951
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PLATING DEVICE
Publication number
20190352793
Publication date
Nov 21, 2019
YAMAMOTO-MS Co., Ltd.
Wataru YAMAMOTO
G01 - MEASURING TESTING