Calibrating of recording device

Industry

CPC
G01N27/9086

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means

Current Industry

G01N27/9086Calibrating of recording device

Industries

Patents Grantslast 30 patents

Information Patent Grant
Safety pipe loop and method for strain monitoring of mountainous pi...
- Patent number 11,402,194
- Issue date Aug 2, 2022
- SOUTHWEST PETROLEUM UNIVERSITY
- Tengjiao He
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Detecting device and method thereof
- Patent number 11,231,392
- Issue date Jan 25, 2022
- Industrial Technology Research Institute
- Chung-Fan Tu
- G01 - MEASURING TESTING
Information Patent Grant
Surface characteristic inspection method and surface characteristic...
- Patent number 10,962,503
- Issue date Mar 30, 2021
- Sintokogio, Ltd.
- Yoshiyasu Makino
- G01 - MEASURING TESTING
Information Patent Grant
Real-time fusion of ultrasound and eddy current data during non-des...
- Patent number 10,823,703
- Issue date Nov 3, 2020
- The Boeing Company
- Jeffrey R. Kollgaard
- G01 - MEASURING TESTING
Information Patent Grant
Calibration device for non-destructive inspection/measurement syste...
- Patent number 10,578,584
- Issue date Mar 3, 2020
- DAINICHI Machine and Engineering Co., Ltd.
- Kazuma Takakura
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current array technology for assessing wheels and rims of off...
- Patent number 10,502,662
- Issue date Dec 10, 2019
- OTR RIM CERTIFICATON, INC.
- Thomas Shumka
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining electrical conductivities in samples by mean...
- Patent number 10,429,349
- Issue date Oct 1, 2019
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Dieter Joneit
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point in situ calibration of electromagnetic pipe inspection...
- Patent number 10,393,703
- Issue date Aug 27, 2019
- Halliburton Energy Services, Inc.
- Ahmed E. Fouda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection methods with probe for substantially round hole
- Patent number 10,161,914
- Issue date Dec 25, 2018
- General Electric Company
- Robert William Bergman
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element sensor array calibration method
- Patent number 10,132,906
- Issue date Nov 20, 2018
- Rolls-Royce PLC
- Robert R Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Surface property inspection device and method
- Patent number 9,964,520
- Issue date May 8, 2018
- Sintokogio, Ltd.
- Yoshiyasu Makino
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor system
- Patent number 9,684,038
- Issue date Jun 20, 2017
- AMS AG
- András Mozsáry
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for removal of the double indication of defect...
- Patent number 9,476,857
- Issue date Oct 25, 2016
- Emmanuel Legendre
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method and system for eddy current device dynamic gain adjustment
- Patent number 9,465,008
- Issue date Oct 11, 2016
- General Electric Company
- Daniel Scott Groninger
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current based method for coating thickness measurement
- Patent number 9,377,287
- Issue date Jun 28, 2016
- Caterpillar Inc.
- Yong Tian
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inductive measurements—self test
- Patent number 9,091,717
- Issue date Jul 28, 2015
- Pruftechnik Dieter Busch AG
- Roland Hölzl
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inductive measurements—self test
- Patent number 8,421,471
- Issue date Apr 16, 2013
- Pruftechnik Dieter Busch AG
- Roland Hölzl
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of non-planar parts using multifrequency eddy current wi...
- Patent number 7,518,359
- Issue date Apr 14, 2009
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and system using multifrequency phase analysis
- Patent number 7,206,706
- Issue date Apr 17, 2007
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring a wall thickness of a hollow vane
- Patent number 6,806,703
- Issue date Oct 19, 2004
- SNECMA Moteurs
- Yann Le Bihan
- G01 - MEASURING TESTING
Information Patent Grant
Compliant laminar eddy current sensitivity standard
- Patent number 6,734,664
- Issue date May 11, 2004
- United Technologies Corporation
- David A. Bryson
- G01 - MEASURING TESTING
Information Patent Grant
Determining a surface profile of an object
- Patent number 6,734,670
- Issue date May 11, 2004
- Shell Oil Company
- Paulus Carolus Nicolaas Crouzen
- G01 - MEASURING TESTING
Information Patent Grant
Analogue eddy detecting apparatus and method for calibrating the same
- Patent number 6,429,646
- Issue date Aug 6, 2002
- Baoshan Iron and Steel Corporation
- Shiquan Han
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current calibration standard
- Patent number 6,356,069
- Issue date Mar 12, 2002
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING
Information Patent Grant
System and method for normalizing and calibrating a sensor array
- Patent number 6,252,393
- Issue date Jun 26, 2001
- General Electric Company
- Kristina Helena Valborg Hedengren
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic induction inspection apparatus and method employing...
- Patent number 5,548,214
- Issue date Aug 20, 1996
- Kaisei Engineer Co., Ltd.
- Kazuhiko Yasohama
- G01 - MEASURING TESTING
Information Patent Grant
Device for nondestructive testing of a plurality of junction sections
- Patent number 5,406,500
- Issue date Apr 11, 1995
- Societe Anonyme dite: Aerospatiale Societe Nationale Industrielle
- Michel Floret
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current system with interference signal rejection
- Patent number 5,003,262
- Issue date Mar 26, 1991
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Harald Egner
- G01 - MEASURING TESTING
Information Patent Grant
Reference standard block for use in nondestructive test probe calib...
- Patent number 4,963,826
- Issue date Oct 16, 1990
- The United States of America as represented by the Secretary of Commerce
- Thomas E. Capobianco
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of eddy current profilometry
- Patent number 4,942,545
- Issue date Jul 17, 1990
- Combustion Engineering, Inc.
- Mark A. Sapia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PREDICTION OF MAGNETIC STRESS CALIBRATION &...
- Publication number 20240402126
- Publication date Dec 5, 2024
- Baker Hughes Holdings LLC
- David John Buttle
- G01 - MEASURING TESTING
Information Patent Application
SURFACE CHARACTERISTIC INSPECTION METHOD AND SURFACE CHARACTERISTIC...
- Publication number 20200011833
- Publication date Jan 9, 2020
- SINTOKOGIO, LTD.
- Yoshiyasu Makino
- G01 - MEASURING TESTING
Information Patent Application
MULTI-POINT IN SITU CALIBRATION OF ELECTROMAGNETIC PIPE INSPECTION...
- Publication number 20180106764
- Publication date Apr 19, 2018
- Halliburton Energy Services, Inc.
- Ahmed E. Fouda
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION DEVICE FOR NON-DESTRUCTIVE INSPECTION/MEASUREMENT SYSTE...
- Publication number 20180095056
- Publication date Apr 5, 2018
- DAINICHI Machine and Engineering Co., Ltd.
- Kazuma TAKAKURA
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT ARRAY TECHNOLOGY FOR ASSESSING WHEELS AND RIMS OF OFF...
- Publication number 20170176294
- Publication date Jun 22, 2017
- Thomas SHUMKA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROPERTY INSPECTION DEVICE AND METHOD
- Publication number 20160341699
- Publication date Nov 24, 2016
- SINTOKOGIO, LTD.
- Yoshiyasu MAKINO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING ELECTRICAL CONDUCTIVITIES IN SAMPLES BY MEAN...
- Publication number 20160003776
- Publication date Jan 7, 2016
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Dieter JONEIT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT
- Publication number 20150362462
- Publication date Dec 17, 2015
- GENERAL ELECTRIC COMPANY
- Daniel Scott Groninger
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Removal of The Double Indication of Defect...
- Publication number 20150127274
- Publication date May 7, 2015
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Emmanuel Legendre
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INDUCTIVE MEASUREMENTS - SELF TEST
- Publication number 20130214770
- Publication date Aug 22, 2013
- Prueftechnik Dieter Busch AG
- Roland HÖLZL
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT BASED METHOD FOR COATING THICKNESS MEASUREMENT
- Publication number 20130132012
- Publication date May 23, 2013
- Caterpillar Inc.
- YONG TIAN
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Removal of The Double Indication of Defect...
- Publication number 20120095686
- Publication date Apr 19, 2012
- Emmanuel Legendre
- E21 - EARTH DRILLING MINING
Information Patent Application
DEVICE AND METHOD FOR INDUCTIVE MEASUREMENTS - SELF TEST
- Publication number 20100295551
- Publication date Nov 25, 2010
- Pruftechnik Dieter Busch AG
- Roland Hölzl
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and system using multifrequency phase analysis
- Publication number 20060217908
- Publication date Sep 28, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Inspection of non-planar parts using multifrequency eddy current wi...
- Publication number 20060202687
- Publication date Sep 14, 2006
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Hollow vane wall thickness measurement method
- Publication number 20030184287
- Publication date Oct 2, 2003
- SNECMA MOTEURS
- Yann Le Bihan
- G01 - MEASURING TESTING
Information Patent Application
Determining a surface profile of an object
- Publication number 20030169035
- Publication date Sep 11, 2003
- Paulus Carolus Nicolaas Crouzen
- G01 - MEASURING TESTING
Information Patent Application
Compliant laminar eddy current sensitivity standard
- Publication number 20030020462
- Publication date Jan 30, 2003
- David A. Bryson
- G01 - MEASURING TESTING

Calibrating of recording device

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Safety pipe loop and method for strain monitoring of mountainous pi...

Detecting device and method thereof

Surface characteristic inspection method and surface characteristic...

Real-time fusion of ultrasound and eddy current data during non-des...

Calibration device for non-destructive inspection/measurement syste...

Eddy current array technology for assessing wheels and rims of off...

Method for determining electrical conductivities in samples by mean...

Multi-point in situ calibration of electromagnetic pipe inspection...

Inspection methods with probe for substantially round hole

Multi-element sensor array calibration method

Surface property inspection device and method

Magnetic field sensor system

Method and apparatus for removal of the double indication of defect...

Method and system for eddy current device dynamic gain adjustment

Eddy current based method for coating thickness measurement

Device and method for inductive measurements—self test

Device and method for inductive measurements—self test

Inspection of non-planar parts using multifrequency eddy current wi...

Inspection method and system using multifrequency phase analysis

Method for measuring a wall thickness of a hollow vane

Compliant laminar eddy current sensitivity standard

Determining a surface profile of an object

Analogue eddy detecting apparatus and method for calibrating the same

Eddy current calibration standard

System and method for normalizing and calibrating a sensor array

Electromagnetic induction inspection apparatus and method employing...

Device for nondestructive testing of a plurality of junction sections

Eddy current system with interference signal rejection

Reference standard block for use in nondestructive test probe calib...

Calibration of eddy current profilometry

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR PREDICTION OF MAGNETIC STRESS CALIBRATION &...

SURFACE CHARACTERISTIC INSPECTION METHOD AND SURFACE CHARACTERISTIC...

MULTI-POINT IN SITU CALIBRATION OF ELECTROMAGNETIC PIPE INSPECTION...

CALIBRATION DEVICE FOR NON-DESTRUCTIVE INSPECTION/MEASUREMENT SYSTE...

EDDY CURRENT ARRAY TECHNOLOGY FOR ASSESSING WHEELS AND RIMS OF OFF...

SURFACE PROPERTY INSPECTION DEVICE AND METHOD

METHOD FOR DETERMINING ELECTRICAL CONDUCTIVITIES IN SAMPLES BY MEAN...

METHOD AND SYSTEM FOR EDDY CURRENT DEVICE DYNAMIC GAIN ADJUSTMENT

Method and Apparatus for Removal of The Double Indication of Defect...

DEVICE AND METHOD FOR INDUCTIVE MEASUREMENTS - SELF TEST

EDDY CURRENT BASED METHOD FOR COATING THICKNESS MEASUREMENT

Method and Apparatus for Removal of The Double Indication of Defect...

DEVICE AND METHOD FOR INDUCTIVE MEASUREMENTS - SELF TEST

Inspection method and system using multifrequency phase analysis

Inspection of non-planar parts using multifrequency eddy current wi...

Hollow vane wall thickness measurement method

Determining a surface profile of an object

Compliant laminar eddy current sensitivity standard