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G01J2003/2879
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PHYSICS
G01
Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/2879
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Patents Grants
last 30 patents
Information
Patent Grant
Dual-comb ranging with long ambiguity-free range
Patent number
12,130,136
Issue date
Oct 29, 2024
Thorlabs, Inc.
Oliver Heckl
G01 - MEASURING TESTING
Information
Patent Grant
Method to perform intrinsic hyper-spectral imaging
Patent number
12,106,520
Issue date
Oct 1, 2024
CENTER FOR QUANTITATIVE CYTOMETRY
Abraham Schwartz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for modulating sensitivity of a photometer
Patent number
12,050,171
Issue date
Jul 30, 2024
Idexx Laboratories Inc.
Garland Christian Misener
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic analysis device and spectroscopic analysis method
Patent number
12,050,128
Issue date
Jul 30, 2024
Yokogawa Electric Corporation
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating spectral sensor modules
Patent number
12,018,987
Issue date
Jun 25, 2024
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
On-chip temperature-insensitive read-out
Patent number
12,018,984
Issue date
Jun 25, 2024
Universiteit Gent
Fabio Pavanello
G01 - MEASURING TESTING
Information
Patent Grant
Methods for calibrating an optical emission spectrometer
Patent number
11,927,482
Issue date
Mar 12, 2024
Applied Materials, Inc.
Kin Pong Lo
G01 - MEASURING TESTING
Information
Patent Grant
Method for the identification of an incorrectly calibrated or non-c...
Patent number
11,913,875
Issue date
Feb 27, 2024
Evonik Operations GmbH
Ingolf Reimann
G01 - MEASURING TESTING
Information
Patent Grant
Tuneable Fabry-Perot cavity self-calibration method and spectrum ac...
Patent number
11,879,781
Issue date
Jan 23, 2024
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.
Bin Guo
G01 - MEASURING TESTING
Information
Patent Grant
Portable water quality instrument
Patent number
11,867,631
Issue date
Jan 9, 2024
OndaVia, Inc.
Mark C. Peterman
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Field calibration for near real-time Fabry Perot spectral measurements
Patent number
11,867,615
Issue date
Jan 9, 2024
TruTag Technologies, Inc.
Guocai Shu
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating spectral sensor modules
Patent number
11,821,790
Issue date
Nov 21, 2023
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
On-premises calibrator system for optical modules
Patent number
11,788,890
Issue date
Oct 17, 2023
Randy Yousey
G01 - MEASURING TESTING
Information
Patent Grant
FTIR data quality optimization
Patent number
11,732,694
Issue date
Aug 22, 2023
TPI Composites Inc.
Richard Mignacca
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Portable water quality instrument
Patent number
11,719,642
Issue date
Aug 8, 2023
OndaVia, Inc.
Mark C. Peterman
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Grant
Hyperspectral sensing system and method for qualitative analysis of...
Patent number
11,650,145
Issue date
May 16, 2023
SAFENET INTERNATIONAL LLC
Joseph Y. Fang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring a spectral radiometer
Patent number
11,598,668
Issue date
Mar 7, 2023
Instrument Systems Optische Messtechnik GmbH
Matthias Hoeh
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for spectroscopic identification and/or calib...
Patent number
11,525,731
Issue date
Dec 13, 2022
Photon Systems, Inc.
Michael R. Reid
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Compact infrared spectrometer systems and methods for measuring vib...
Patent number
11,378,450
Issue date
Jul 5, 2022
LIGHTSENSE TECHNOLOGY, INC.
Wade Martin Poteet
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of phase quality control for glass ceramics in manufacturing
Patent number
11,204,280
Issue date
Dec 21, 2021
Corning Incorporated
Chong Pyung An
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for calibrating spectrometers
Patent number
11,092,490
Issue date
Aug 17, 2021
Spectro Analytical Instruments GmbH
Heinz-Gerd Joosten
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system for attenuated total reflection spectrometry
Patent number
11,060,914
Issue date
Jul 13, 2021
Agilent Technologies, Inc.
Christopher Ryan Moon
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for spectroscopic identification and/or calib...
Patent number
11,022,490
Issue date
Jun 1, 2021
Photon Systems, Inc.
Michael R. Reid
G01 - MEASURING TESTING
Information
Patent Grant
Advanced lighting effects investigation system and computerized method
Patent number
10,948,348
Issue date
Mar 16, 2021
Research Triangle Institute
Kelley Jo Rountree
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for spectroscopic identification and/or calib...
Patent number
10,732,037
Issue date
Aug 4, 2020
Photon Systems, Inc.
Michael R. Reid
G01 - MEASURING TESTING
Information
Patent Grant
Method for stabilizing a spectrometer using single spectral notch
Patent number
10,545,049
Issue date
Jan 28, 2020
Spectral Engines Oy
Jarkko Antila
G02 - OPTICS
Information
Patent Grant
Mirror plate for a fabry-perot interferometer and a fabry-perot int...
Patent number
10,495,514
Issue date
Dec 3, 2019
Teknologian tutkimuskeskus VTT Oy
Aapo Varpula
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Emission spectroscopic analyzer
Patent number
10,330,533
Issue date
Jun 25, 2019
Shimadzu Corporation
Tatsuya Kaishatsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for estimating an input spectrum from sensor data
Patent number
10,323,984
Issue date
Jun 18, 2019
Vito N.V.
Stefan Livens
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometry device, image forming apparatus, and spectrometry method
Patent number
10,247,609
Issue date
Apr 2, 2019
Seiko Epson Corporation
Masashi Kanai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CALIBRATING A SPECTROMETER DEVICE
Publication number
20240393178
Publication date
Nov 28, 2024
trinamiX GmbH
Robert LOVRINCIC
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MODULATING SENSITIVITY OF A PHOTOMETER
Publication number
20240385106
Publication date
Nov 21, 2024
IDEXX Laboratories Inc.
Garland Christian Misener
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR CALIBRATING AN OPTICAL EMISSION SPECTROMETER
Publication number
20240192055
Publication date
Jun 13, 2024
Applied Materials, Inc.
Kin Pong LO
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTION GRATING MONOCHROMATOR
Publication number
20240035887
Publication date
Feb 1, 2024
VIAVI SOLUTIONS INC.
Eberhard Lothar LOECKLIN
G01 - MEASURING TESTING
Information
Patent Application
GENERALIZED ARTIFICIAL INTELLIGENCE MODELER FOR ULTRA-WIDE-SCALE DE...
Publication number
20230304860
Publication date
Sep 28, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Hyperspectral Sensing System and Method for Qualitative Analysis of...
Publication number
20230296437
Publication date
Sep 21, 2023
SafeNet International LLC
Joseph Y. Fang
G01 - MEASURING TESTING
Information
Patent Application
ILLUMINANT CORRECTION IN AN IMAGING SYSTEM
Publication number
20230082539
Publication date
Mar 16, 2023
SPECTRICITY
Jonathan Borremans
G01 - MEASURING TESTING
Information
Patent Application
Hyperspectral Sensing System and Method for Qualitative Analysis of...
Publication number
20230043807
Publication date
Feb 9, 2023
SafeNet International LLC
Joseph Y. Fang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MODULATING SENSITIVITY OF A PHOTOMETER
Publication number
20220390358
Publication date
Dec 8, 2022
IDEXX Laboratories Inc.
Garland Christian Misener
G01 - MEASURING TESTING
Information
Patent Application
ON-CHIP TEMPERATURE-INSENSITIVE READ-OUT
Publication number
20220390280
Publication date
Dec 8, 2022
Universiteit Gent
Fabio PAVANELLO
G01 - MEASURING TESTING
Information
Patent Application
On-Premises Calibrator System For Optical Modules
Publication number
20220373390
Publication date
Nov 24, 2022
Custom Calibration Solutions, LLC
Randy Yousey
G01 - MEASURING TESTING
Information
Patent Application
DUAL-COMB RANGING WITH LONG AMBIGUITY-FREE RANGE
Publication number
20220316855
Publication date
Oct 6, 2022
THORLABS, INC.
Oliver Heckl
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD
Publication number
20220291040
Publication date
Sep 15, 2022
YOKOGAWA ELECTRIC CORPORATION
Kodai MURAYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR CALIBRATING AN OPTICAL EMISSION SPECTROMETER
Publication number
20220178747
Publication date
Jun 9, 2022
Applied Materials, Inc.
Kin Pong LO
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATING SPECTRAL SENSOR MODULES
Publication number
20220136901
Publication date
May 5, 2022
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATION METHOD FOR TUNEABLE FABRY-PEROT CAVITY AND SPECTRU...
Publication number
20220099493
Publication date
Mar 31, 2022
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.
Bin GUO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE IDENTIFICATION OF AN INCORRECTLY CALIBRATED OR NON-C...
Publication number
20220026350
Publication date
Jan 27, 2022
Evonik Operations GmbH
Ingolf REIMANN
G01 - MEASURING TESTING
Information
Patent Application
FTIR DATA QUALITY OPTIMIZATION
Publication number
20210317821
Publication date
Oct 14, 2021
TPI Composites, Inc.
Richard Mignacca
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING A SPECTRAL RADIOMETER
Publication number
20210270670
Publication date
Sep 2, 2021
INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GmbH
Mathias HOH
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATING SPECTROMETERS
Publication number
20200200605
Publication date
Jun 25, 2020
Spectro Analytical Instruments GmbH
Heinz-Gerd JOOSTEN
G01 - MEASURING TESTING
Information
Patent Application
Calibration System for Attenuated Total Reflection Spectrometry
Publication number
20200103278
Publication date
Apr 2, 2020
Agilent Technologies, Inc.
Christopher Ryan Moon
G01 - MEASURING TESTING
Information
Patent Application
ADVANCED LIGHTING EFFECTS INVESTIGATION SYSTEM AND COMPUTERIZED METHOD
Publication number
20200072669
Publication date
Mar 5, 2020
Research Triangle Institute
Kelley Jo Rountree
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL EMISSION SPECTROSCOPY SYSTEM, METHOD OF CALIBRATING THE SAM...
Publication number
20200049560
Publication date
Feb 13, 2020
Samsung Electronics Co., Ltd.
Jeongil MUN
G01 - MEASURING TESTING
Information
Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
Publication number
20180292261
Publication date
Oct 11, 2018
TruTag Technologies, Inc.
Timothy Learmonth
G01 - MEASURING TESTING
Information
Patent Application
EMISSION SPECTROSCOPIC ANALYZER
Publication number
20180238736
Publication date
Aug 23, 2018
SHIMADZU CORPORATION
TATSUYA KAIHATSU
G01 - MEASURING TESTING
Information
Patent Application
A MIRROR PLATE FOR A FABRY-PEROT INTERFEROMETER AND A FABRY-PEROT I...
Publication number
20180052049
Publication date
Feb 22, 2018
Teknologian Tutkimuskeskus VTT Oy
Aapo Varpula
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR ESTIMATING AN INPUT SPECTRUM FROM SENSOR DATA
Publication number
20170363473
Publication date
Dec 21, 2017
VITO NV
Stefan LIVENS
G01 - MEASURING TESTING
Information
Patent Application
Stabilized spectrometer and a method for stabilizing a spectrometer
Publication number
20170146401
Publication date
May 25, 2017
Spectral Engines Oy
Jarkko Antila
G01 - MEASURING TESTING
Information
Patent Application
A method for determining the spectral scale of a spectrometer and a...
Publication number
20170138790
Publication date
May 18, 2017
Spectral Engines Oy
Jarkko Antila
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY DEVICE, IMAGE FORMING APPARATUS, AND SPECTROMETRY METHOD
Publication number
20160282183
Publication date
Sep 29, 2016
SEIKO EPSON CORPORATION
Masashi KANAI
G01 - MEASURING TESTING