Calibration of the apparatus

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

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H01J49/0009Calibration of the apparatus

Industries

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Patents Grantslast 30 patents

Information Patent Grant
IROA metabolomics workflow for improved accuracy, identification an...
- Patent number 12,230,488
- Issue date Feb 18, 2025
- Iroa Technologies, LLC
- Christopher Beecher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 12,224,168
- Issue date Feb 11, 2025
- HITACHI HIGH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating data from mass spectrometry, mass spectrometr...
- Patent number 12,210,020
- Issue date Jan 28, 2025
- Tobias Boskamp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrum processing device and mass spectrum processing method
- Patent number 12,198,917
- Issue date Jan 14, 2025
- Joel Ltd.
- Takaya Satoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for checking a validity of a mass axis calibration of a...
- Patent number 12,165,859
- Issue date Dec 10, 2024
- Roche Diagnostics Operations, Inc.
- Stefan Quint
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration of mass spectrometry systems
- Patent number 12,159,773
- Issue date Dec 3, 2024
- Roche Diagnostics Operations, Inc.
- Nadja Arens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Iodo-functionalized polymers as mass spectrometry calibrants with a...
- Patent number 12,146,028
- Issue date Nov 19, 2024
- POLYMER FACTORY SWEDEN AB
- Scott M. Grayson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive intrinsic lock mass correction
- Patent number 12,148,602
- Issue date Nov 19, 2024
- Micromass UK Limited
- Keith George Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis system, and method for determining performance of mas...
- Patent number 12,106,951
- Issue date Oct 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka Sumigama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tuned synthetic dendrimer calibrants for mass spectrometry
- Patent number 12,087,564
- Issue date Sep 10, 2024
- The Administrators of the Tulane Educational Fund
- Scott Grayson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for filtering ions defined by a targeted charge t...
- Patent number 12,087,570
- Issue date Sep 10, 2024
- Universite de Strasbourg
- Emil Traykov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform quadrupole calibration method
- Patent number 12,080,531
- Issue date Sep 3, 2024
- DH Technologies Development Pte. Ltd.
- James Hager
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating at least one mass spectrometry device
- Patent number 12,074,015
- Issue date Aug 27, 2024
- Roche Diagnostics Operations, Inc.
- Andrea Geistanger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two dimensional MSMS
- Patent number 12,062,532
- Issue date Aug 13, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coaxial introduction of calibrant in a flow path with analyte to an...
- Patent number 12,051,582
- Issue date Jul 30, 2024
- Waters Technologies Corporation
- Michael O. Fogwill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-calibration of high resolution mass spectrum
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- Issue date Jun 25, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrum processing apparatus and method
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- Issue date Jun 18, 2024
- Jeol Ltd.
- Takaya Satoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for tuning with unresolved peaks on quadrupole mass spectrom...
- Patent number 11,984,307
- Issue date May 14, 2024
- Thermo Finnigan LLC.
- Johnathan W. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 11,942,313
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Yusuke Tagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,915,919
- Issue date Feb 27, 2024
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample dispenser including an internal standard and methods of use...
- Patent number 11,867,684
- Issue date Jan 9, 2024
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
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Instrument, including an electrostatic linear ion trap with charge...
- Patent number 11,862,448
- Issue date Jan 2, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Functionalized calibrants for spectrometry and chromatography
- Patent number 11,862,446
- Issue date Jan 2, 2024
- POLYMER FACTORY SWEDEN AB
- Scott M. Grayson
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems and methods for reducing lab-to-lab and/or instrument-to-in...
- Patent number 11,854,779
- Issue date Dec 26, 2023
- Amgen Inc.
- Zhongqi Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two dimensional MSMS
- Patent number 11,769,654
- Issue date Sep 26, 2023
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
General-purpose nanochip for mass spectrum analysis, preparation me...
- Patent number 11,764,047
- Issue date Sep 19, 2023
- Hangzhou Well-Healthcare Technologies Co., LTD
- Jianmin Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coaxial introduction of calibrant in a flow path with analyte to an...
- Patent number 11,764,049
- Issue date Sep 19, 2023
- Waters Technologies Corporation
- Michael O. Fogwill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating analysis device, method of calibrating analysi...
- Patent number 11,754,526
- Issue date Sep 12, 2023
- Shimadzu Corporation
- Yukihiko Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating data from mass spectrometry, mass spectrometr...
- Patent number 11,747,343
- Issue date Sep 5, 2023
- Tobias Boskamp
- G01 - MEASURING TESTING
Information Patent Grant
Quality control reagents and methods
- Patent number 11,692,983
- Issue date Jul 4, 2023
- Promega Corporation
- Joshua Jacques Coon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING DATA FROM MASS SPECTROMETRY, MASS SPECTROMETR...
- Publication number 20250093366
- Publication date Mar 20, 2025
- Bruker Daltonics GmbH & Co. KG
- Tobias BOSKAMP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Emitter for an Ion Reaction Device of a Mass Spectrometer...
- Publication number 20250087474
- Publication date Mar 13, 2025
- DH Technologies Development Pte. Ltd.
- Sebin CHERIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ERROR CORRECTION IN FAST SAMPLE READERS
- Publication number 20250069873
- Publication date Feb 27, 2025
- DH Technologies Development Pte. Ltd.
- Gordana IVOSEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZATION OF A MASS SPECTROMETRY INSTRUMENT COMPR...
- Publication number 20250069875
- Publication date Feb 27, 2025
- Roche Diagnostics Operations, Inc.
- Stefan Quint
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALIBRATING MASS DISCRIMINATION EFFECT OF NEON ISOTOPE R...
- Publication number 20250069872
- Publication date Feb 27, 2025
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Xuhang ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATING A MASS SPECTROMETER
- Publication number 20250062108
- Publication date Feb 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen SCHLUETER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTION MASS SPECTROMETER
- Publication number 20250062111
- Publication date Feb 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRUM DATA PROCESSING
- Publication number 20250054741
- Publication date Feb 13, 2025
- Luxembourg Institute of Science and Technology (LIST)
- Hung Quang HOANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE INTRINSIC LOCK MASS CORRECTION
- Publication number 20250046592
- Publication date Feb 6, 2025
- Micromass UK Limited
- Keith George RICHARDSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-PARTICLE INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY PARTIC...
- Publication number 20250020567
- Publication date Jan 16, 2025
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Cedric David KOOLEN
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUPPORT
- Publication number 20250014881
- Publication date Jan 9, 2025
- Hamamatsu Photonics K.K.
- Takamasa IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING MOLECULAR MASS
- Publication number 20240412962
- Publication date Dec 12, 2024
- DH Technologies Development Pte. Ltd.
- Eva DUCHOSLAV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-F...
- Publication number 20240395520
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Rapid Mass Spectrometric Calibration
- Publication number 20240395521
- Publication date Nov 28, 2024
- Queen's University at Kingston
- Richard D. Oleschuk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF DMS SEPARATIONS USING ACOUSTIC EJECTION MASS SPECTR...
- Publication number 20240379338
- Publication date Nov 14, 2024
- DH Technologies Development Pte. Ltd.
- Bradley B. Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL INSTRUMENT CALIBRATION
- Publication number 20240371618
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Daniel Marc Mourad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO DIMENSIONAL MSMS
- Publication number 20240363321
- Publication date Oct 31, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Mass Spectrometry and Mass Spectrometer
- Publication number 20240355609
- Publication date Oct 24, 2024
- Shimadzu Corporation
- Hiroko UEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY SYSTEM FOR DETERMINING A MEASURE OF A RATE OF DECAY
- Publication number 20240355608
- Publication date Oct 24, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Jan-Peter HAUSCHILD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TUNING WITH UNRESOLVED PEAKS ON QUADRUPOLE MASS SPECTROM...
- Publication number 20240347329
- Publication date Oct 17, 2024
- Thermo Finnigan LLC
- Johnathan W. SMITH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSIS SYSTEM
- Publication number 20240331994
- Publication date Oct 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM
- Publication number 20240297029
- Publication date Sep 5, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INFERRING CONTENT RATIO OF COMPONENT IN SAMPLE, COMPOSITI...
- Publication number 20240297031
- Publication date Sep 5, 2024
- National Institute for Materials Science
- Masanobu NAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION TECHNIQUES FOR MASS SPECTROMETRY SYSTEM
- Publication number 20240297028
- Publication date Sep 5, 2024
- DH Technologies Development Pte. Ltd.
- Scott DANIELS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MS Calibration for OPI-MS
- Publication number 20240290595
- Publication date Aug 29, 2024
- DH Technologies Development Pte. Ltd.
- Thomas COVEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALIBRATING A MASS SPECTROMETER
- Publication number 20240290596
- Publication date Aug 29, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Erik COUZIJN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Injecting Ions into an Electrostatic Linear...
- Publication number 20240274429
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY
- Publication number 20240274424
- Publication date Aug 15, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Machine Difference Corrrection Method for Mass Spectrometry Apparatus
- Publication number 20240266158
- Publication date Aug 8, 2024
- SHIMADZU CORPORATION
- Naoki KANEKO
- H01 - BASIC ELECTRIC ELEMENTS

Calibration of the apparatus

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

IROA metabolomics workflow for improved accuracy, identification an...

Mass spectrometer and mass spectrometry method

Method for evaluating data from mass spectrometry, mass spectrometr...

Mass spectrum processing device and mass spectrum processing method

Techniques for checking a validity of a mass axis calibration of a...

Calibration of mass spectrometry systems

Iodo-functionalized polymers as mass spectrometry calibrants with a...

Adaptive intrinsic lock mass correction

Mass analysis system, and method for determining performance of mas...

Tuned synthetic dendrimer calibrants for mass spectrometry

Method and system for filtering ions defined by a targeted charge t...

Fourier transform quadrupole calibration method

Method for calibrating at least one mass spectrometry device

Two dimensional MSMS

Coaxial introduction of calibrant in a flow path with analyte to an...

Self-calibration of high resolution mass spectrum

Mass spectrum processing apparatus and method

Method for tuning with unresolved peaks on quadrupole mass spectrom...

Mass spectrometer and mass spectrometry method

Mass spectrometer

Sample dispenser including an internal standard and methods of use...

Instrument, including an electrostatic linear ion trap with charge...

Functionalized calibrants for spectrometry and chromatography

Systems and methods for reducing lab-to-lab and/or instrument-to-in...

Two dimensional MSMS

General-purpose nanochip for mass spectrum analysis, preparation me...

Coaxial introduction of calibrant in a flow path with analyte to an...

Method of evaluating analysis device, method of calibrating analysi...

Method for evaluating data from mass spectrometry, mass spectrometr...

Quality control reagents and methods

Patents Applicationslast 30 patents

METHOD FOR EVALUATING DATA FROM MASS SPECTROMETRY, MASS SPECTROMETR...

Electron Emitter for an Ion Reaction Device of a Mass Spectrometer...

SYSTEMS AND METHODS FOR ERROR CORRECTION IN FAST SAMPLE READERS

METHOD FOR CHARACTERIZATION OF A MASS SPECTROMETRY INSTRUMENT COMPR...

METHOD FOR CALIBRATING MASS DISCRIMINATION EFFECT OF NEON ISOTOPE R...

CALIBRATING A MASS SPECTROMETER

MULTI-REFLECTION MASS SPECTROMETER

MASS SPECTRUM DATA PROCESSING

ADAPTIVE INTRINSIC LOCK MASS CORRECTION

SINGLE-PARTICLE INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY PARTIC...

SAMPLE SUPPORT

METHODS AND SYSTEMS FOR DETERMINING MOLECULAR MASS

METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-F...

Method and Apparatus for Rapid Mass Spectrometric Calibration

OPTIMIZATION OF DMS SEPARATIONS USING ACOUSTIC EJECTION MASS SPECTR...

ANALYTICAL INSTRUMENT CALIBRATION

TWO DIMENSIONAL MSMS

Method for Mass Spectrometry and Mass Spectrometer

MASS SPECTROMETRY SYSTEM FOR DETERMINING A MEASURE OF A RATE OF DECAY

METHOD FOR TUNING WITH UNRESOLVED PEAKS ON QUADRUPOLE MASS SPECTROM...

TIME OF FLIGHT MASS ANALYSIS SYSTEM

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM

METHOD OF INFERRING CONTENT RATIO OF COMPONENT IN SAMPLE, COMPOSITI...

CALIBRATION TECHNIQUES FOR MASS SPECTROMETRY SYSTEM

MS Calibration for OPI-MS

METHOD OF CALIBRATING A MASS SPECTROMETER

Methods and Systems for Injecting Ions into an Electrostatic Linear...

TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY

Machine Difference Corrrection Method for Mass Spectrometry Apparatus